Patents by Inventor Masaki Hasegawa

Masaki Hasegawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250105288
    Abstract: In a negative electrode (12) for a secondary battery which is one example of an embodiment of the present invention, a negative electrode active substance layer (41) has a first active substance layer (41A) and a second active substance layer (41B). A tortuosity ?2 of the second active substance layer (41B) is smaller than a tortuosity ?1 of the first active substance layer (41A), and the B value calculated using equation 2 is equal to 1.7 to 1 divided by the A value.
    Type: Application
    Filed: January 11, 2023
    Publication date: March 27, 2025
    Applicant: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Masaki Hasegawa, Takashi Watanabe, Naomichi Sato
  • Patent number: 12257842
    Abstract: A liquid discharge apparatus includes a discharge head including a discharge surface formed with a plurality of discharge openings from which a liquid is discharged, a cap configured to be detachably attached to the discharge head and form a holding space for a cleaning liquid such that the cleaning liquid contacts the discharge surface, a supply portion configured to connect to the cap and to supply the cleaning liquid to the holding space, and an outlet portion configured to connect to the cap and to drain the cleaning liquid from the holding space. The supply portion is formed at a position facing the discharge surface. The outlet portion is formed at a position outside the supply portion in an inside-outside direction of the discharge surface.
    Type: Grant
    Filed: December 2, 2022
    Date of Patent: March 25, 2025
    Assignee: Canon Kabushiki Kaisha
    Inventors: Masaki Ishida, Noriyasu Hasegawa, Moena Oku
  • Publication number: 20250054270
    Abstract: Provided is a training data creation assistance device which, for an image on which a plurality of defects in an image are reflected, enables the efficient collection/selection of a training image by specifying a feature amount corresponding to each of the defects in a way that a peripheral area of the defect is also considered and by mapping the specified feature amount to a low dimensional space.
    Type: Application
    Filed: December 17, 2021
    Publication date: February 13, 2025
    Applicant: Hitachi High-Tech Corporation
    Inventors: Toshinori YAMAUCHI, Yasuhiro YOSHIDA, Masayoshi ISHIKAWA, Takefumi KAKINUMA, Masaki HASEGAWA, Kentaro OHIRA, Yasutaka TOYODA
  • Publication number: 20250020860
    Abstract: Provided is a light diffusion device capable of uniformly emitting light from the outer circumferential surface of a light-emitting part of an optical fiber.
    Type: Application
    Filed: November 24, 2022
    Publication date: January 16, 2025
    Inventors: Hideaki HASEGAWA, Keisuke TAKE, Masaki IWAMA, Shun-ichi MATSUSHITA
  • Patent number: 12148917
    Abstract: A negative electrode for a non-aqueous electrolyte secondary battery includes a negative electrode material mixture including a negative electrode active material capable of electrochemically absorbing and desorbing lithium ions, a carbon nanotube; and an acrylic resin. The negative electrode active material includes a composite material including a silicate phase, and silicon particles dispersed in the silicate phase, and the silicate phase includes at least one selected from the group consisting of alkali metal elements and Group 2 elements.
    Type: Grant
    Filed: February 17, 2020
    Date of Patent: November 19, 2024
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Takahiro Fukuoka, Masaki Hasegawa, Masahiro Soga, Yuto Horiuchi, Takashi Yamamoto
  • Publication number: 20240047686
    Abstract: A negative electrode material for a secondary battery includes a negative electrode active material and a carbon nanotube, wherein the negative electrode active material includes graphite and a material including a silicon element, and the carbon nanotube has an average fiber diameter of 0.5 nm to 6 nm and an average fiber length of 1.2 ?m to 8 ?m. A secondary battery includes a negative electrode including the negative electrode material for a secondary battery, a positive electrode, a separator interposed between the positive electrode and the negative electrode, and an electrolyte.
    Type: Application
    Filed: December 23, 2021
    Publication date: February 8, 2024
    Applicant: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Masaki Hasegawa, Norihisa Yamamoto, Takashi Watanabe
  • Publication number: 20230335725
    Abstract: A negative electrode for a non-aqueous electrolyte secondary battery includes a negative electrode current collector, and a negative electrode mixture layer supported on the negative electrode current collector. The negative electrode mixture layer includes a silicon material, a carbon material capable of electrochemically absorbing and releasing lithium ions, and electrically conductive fibers. The silicon material has a lithium-ion conductive phase, and silicon particles dispersed in the lithium-ion conductive phase. When the negative electrode mixture layer is divided into two layers, a first region and a second region, having the same thickness, the first region is nearer to the negative electrode current collector than the second region is, the silicon material is contained more in the second region than in the first region, and the conductive fibers are contained in the second region.
    Type: Application
    Filed: January 21, 2021
    Publication date: October 19, 2023
    Applicant: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Masaki Hasegawa, Shunsuke Nambuya, Yuto Horiuchi
  • Publication number: 20230109890
    Abstract: This negative electrode for secondary batteries is provided with a negative electrode mixture that contains a negative electrode active material, an additive and a conductive agent. The negative electrode active material contains an Si-containing material; the additive contains an alkali metal sulfate salt; and the conductive agent contains carbon nanotubes. The content of the alkali metal sulfate salt in the negative electrode mixture is from 0.0025% by mass to 0.1% by mass relative to the total mass of the negative electrode active material.
    Type: Application
    Filed: January 26, 2021
    Publication date: April 13, 2023
    Applicant: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Kyohei Sakamoto, Nobuhiko Hojo, Masaki Hasegawa
  • Publication number: 20220392187
    Abstract: According to the present invention, an image recognition system calculates importance of a feature for each target shape recognized in an image and for each type of feature, and determines correctness of a recognition result by comparing the importance with a statistic for each type of feature, for each target shape.
    Type: Application
    Filed: May 10, 2022
    Publication date: December 8, 2022
    Applicant: Hitachi High-Tech Corporation
    Inventors: Toshinori YAMAUCHI, Masayoshi ISHIKAWA, Takefumi KAKINUMA, Masaki HASEGAWA, Kentaro OHIRA, Yasutaka TOYODA
  • Patent number: 11515121
    Abstract: In an electron beam device provided with two columns including an irradiation optical system and an imaging optical system, a photoelectron image for use in adjusting the irradiation optical system is made sharper. The electron beam device includes: an irradiation optical system which irradiates a sample placed on a stage with an electron beam; a light irradiation unit 50 which irradiates the sample with light containing ultraviolet rays; a sample voltage control unit 44 which applies a negative voltage to the sample so that, before the electron beam reaches the sample, the electron orbit inverts; and an imaging optical system which acquires a mirror electron image by forming an image of mirror electrons reflected by application of the negative voltage.
    Type: Grant
    Filed: October 22, 2019
    Date of Patent: November 29, 2022
    Assignee: Hitachi High-Tech Corporation
    Inventors: Tomohiko Ogata, Hisaya Murakoshi, Masaki Hasegawa, Noriyuki Kaneoka, Katsunori Onuki
  • Publication number: 20220302451
    Abstract: A negative electrode for a secondary battery including a negative electrode active material capable of absorbing and releasing lithium ions. The negative electrode active material includes a first carbon material as a main component, and includes a second carbon material and a silicon-containing material which are present between particles of the first carbon material. The first carbon material has an average particle diameter A, the second carbon material has an average particle diameter B, and the silicon-containing material has an average particle diameter C, satisfying A>C?B.
    Type: Application
    Filed: July 21, 2020
    Publication date: September 22, 2022
    Applicant: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Masahiro Soga, Masaki Hasegawa, Takahiro Fukuoka
  • Publication number: 20220190320
    Abstract: A negative electrode for a non-aqueous electrolyte secondary battery includes a negative electrode material mixture including a negative electrode active material capable of electrochemically absorbing and desorbing lithium ions, a carbon nanotube; and an acrylic resin. The negative electrode active material includes a composite material including a silicate phase, and silicon particles dispersed in the silicate phase, and the silicate phase includes at least one selected from the group consisting of alkali metal elements and Group 2 elements.
    Type: Application
    Filed: February 17, 2020
    Publication date: June 16, 2022
    Applicant: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Takahiro Fukuoka, Masaki Hasegawa, Masahiro Soga, Yuto Horiuchi, Takashi Yamamoto
  • Patent number: 11342211
    Abstract: The present disclosure provides a wafer inspection technology that involves less degradation of the image quality even when an object to be observed has a variation in height due to warpage, etc. of a wafer. This wafer inspection apparatus obtains an image with less degradation by: adjusting the focal point of an observation optical system to a height measured by a height sensor for measuring wafer surface heights; and further, correcting a switching signal for a CCD line sensor on the basis of stage position data and optical magnification data corresponding to the height so as to make a correction corresponding to the wafer surface height.
    Type: Grant
    Filed: May 30, 2018
    Date of Patent: May 24, 2022
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Akira Doi, Minoru Sasaki, Masaki Hasegawa, Hironori Ogawa, Tomohiko Ogata, Yuko Okada
  • Publication number: 20220107280
    Abstract: Provided is a quantification method for evaluating the quality of a sample on the basis of a mirror electron image acquired by a mirror electron microscope. In this invention, a mirror electron image is expressed numerically through counting of the brightness values of each pixel composing the mirror electron image, the creation of a brightness histogram, and the calculation, from the distribution of the brightness histogram, of a standard deviation. If brightness contrast is formed on the mirror electron image by, for example, a scratch on or latent damage in a sample, because the brightness values of the pixels will fluctuate, there will be more variation in the brightness values than in an image obtained from a satisfactory sample with no defects, and this will result in the brightness values of the mirror electron image having a larger standard deviation.
    Type: Application
    Filed: February 15, 2019
    Publication date: April 7, 2022
    Inventors: Kentaro OHIRA, Masaki HASEGAWA
  • Patent number: 11193895
    Abstract: It is necessary to guarantee performance by quantitatively evaluating the defect detection sensitivity of an inspection device for using the mirror electron image to detect defect in a semiconductor substrate. The size and position of accidentally formed defects are random, however, and this type of quantitative evaluation has been difficult. This semiconductor substrate 101 for evaluation is for evaluating the defect detection sensitivity of an inspection device and comprises a plurality of first indentations 104 that are formed through the pressing, with a first pressing load, of an indenter having a prescribed hardness and shape into the semiconductor substrate for evaluation. Further, a mirror electron image of the plurality of first indentations of the semiconductor substrate for evaluation is acquired, and the defect detection sensitivity of an inspection device is evaluated through the calculation of the defect detection rate of the plurality of first indentations in the acquired mirror electron image.
    Type: Grant
    Filed: October 30, 2017
    Date of Patent: December 7, 2021
    Assignee: Hitachi High-Tech Corporation
    Inventors: Kentaro Ohira, Masaki Hasegawa, Tomohiko Ogata, Katsunori Onuki, Noriyuki Kaneoka
  • Publication number: 20210313138
    Abstract: Provided is a mirror electronic inspection device which is a defect inspection device for detecting a defect of a semiconductor substrate or the like, and evaluates temperature dependence of the defect in a vacuum. A heating stage including a heater (heat generating element) covered with an electrically insulated insulating material, a heater base on which a sample is mounted, and a heat shielding plate and equipotential surface is mounted on a moving stage installed in a sample chamber of a device via an electrically insulated and thermally insulated fixing member. A heater power supply is connected to the heater (heat generating element), and a sample application power supply is connected to the heater base. The heater power supply and the sample application power supply are electrically separated.
    Type: Application
    Filed: September 12, 2018
    Publication date: October 7, 2021
    Applicant: Hitachi High-Tech Corporation
    Inventors: Masahiro YAMAOKA, Masaki HASEGAWA, Masakazu SUGAYA, Akihiro FURUKAWA, Katsunori ONUKI
  • Patent number: 11107655
    Abstract: In order to optimize defect contrast in a charged particle beam device that inverts charged particles directly above a sample and observes the electrons, this charged particle beam device is provided with a charged particle source, an electron gun control device which applies a first voltage to the charged particle source, a substrate voltage control device which applies a second voltage to a sample, an image forming optical system which includes an imaging lens for imaging charged particles incident from the direction of the sample, a detector which includes a camera for detecting the charged particles, and an image processing device which processes the detected signal, wherein the imaging optical system is configured so as not to image secondary electrons emitted from the sample, but forms an image with mirror electrons bounced back by the electric field formed on the sample by means of the potential difference between the first and the second voltages.
    Type: Grant
    Filed: September 20, 2017
    Date of Patent: August 31, 2021
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tomohiko Ogata, Masaki Hasegawa, Katsunori Onuki, Noriyuki Kaneoka, Hisaya Murakoshi
  • Patent number: 11059986
    Abstract: The present invention relates to a composition comprising a nanosized light emitting material, and method for preparing of said composition. The present invention further relates to a light luminescent medium, a light emitting device, the present invention further more relates to method for preparing of a composition and to method for preparing of a light emitting medium.
    Type: Grant
    Filed: November 27, 2017
    Date of Patent: July 13, 2021
    Assignee: MERCK PATENT GMBH
    Inventors: Masaki Hasegawa, Noriyuki Matsuda
  • Publication number: 20210198566
    Abstract: The present invention relates to a formulation comprising at least a polymer, a particle, and an organic solvent.
    Type: Application
    Filed: May 21, 2019
    Publication date: July 1, 2021
    Applicant: Merck Patent GmbH
    Inventor: Masaki HASEGAWA
  • Patent number: 11002687
    Abstract: A defect inspection device includes a sample support member, a negative voltage, an imaging element, an ultraviolet light source, a movement stage, and a control device. The control device controls the movement stage such that a portion of a linear part included in the image or a location on an extensional line of the linear part is positioned at a specific location in an irradiated region of the electron beam. The control device also repeats the control of the movement stage until an end of the linear part is positioned within the irradiated region of the electron beam.
    Type: Grant
    Filed: March 16, 2016
    Date of Patent: May 11, 2021
    Assignee: Hitachi High-Tech Corporation
    Inventors: Masaki Hasegawa, Katsunori Onuki, Noriyuki Kaneoka, Hisaya Murakoshi, Tomohiko Ogata