Patents by Inventor Masaki Hasegawa

Masaki Hasegawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220382824
    Abstract: A search initiated by a user within an internet browsing application using a search phrase can be detected. A similarity between the search phrase and each of one or more existing groups can be determined, each of the one or more existing groups including one or more saved web pages. An existing group of the one or more existing groups can be selected based on the determined similarity. A current browsed web page returned from the search can be obtained, and the current browsed web page can be added to the existing group.
    Type: Application
    Filed: May 27, 2021
    Publication date: December 1, 2022
    Inventors: Yasumasa Kajinaga, Tohru Hasegawa, SHUNSUKE ISHIKAWA, DAIKI TSUZUKU, Masaki Komedani, KEISUKE NITTA
  • Patent number: 11515121
    Abstract: In an electron beam device provided with two columns including an irradiation optical system and an imaging optical system, a photoelectron image for use in adjusting the irradiation optical system is made sharper. The electron beam device includes: an irradiation optical system which irradiates a sample placed on a stage with an electron beam; a light irradiation unit 50 which irradiates the sample with light containing ultraviolet rays; a sample voltage control unit 44 which applies a negative voltage to the sample so that, before the electron beam reaches the sample, the electron orbit inverts; and an imaging optical system which acquires a mirror electron image by forming an image of mirror electrons reflected by application of the negative voltage.
    Type: Grant
    Filed: October 22, 2019
    Date of Patent: November 29, 2022
    Assignee: Hitachi High-Tech Corporation
    Inventors: Tomohiko Ogata, Hisaya Murakoshi, Masaki Hasegawa, Noriyuki Kaneoka, Katsunori Onuki
  • Publication number: 20220302451
    Abstract: A negative electrode for a secondary battery including a negative electrode active material capable of absorbing and releasing lithium ions. The negative electrode active material includes a first carbon material as a main component, and includes a second carbon material and a silicon-containing material which are present between particles of the first carbon material. The first carbon material has an average particle diameter A, the second carbon material has an average particle diameter B, and the silicon-containing material has an average particle diameter C, satisfying A>C?B.
    Type: Application
    Filed: July 21, 2020
    Publication date: September 22, 2022
    Applicant: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Masahiro Soga, Masaki Hasegawa, Takahiro Fukuoka
  • Patent number: 11443869
    Abstract: A wiring member includes a plurality of wire-like transmission members each including a transmission wire body and a coat covering the transmission wire body and a flattening member keeping the plurality of wire-like transmission members in a flat state. For example, the flattening member is considered to include a first flattening member which is a member formed separately from the plurality of wire-like transmission members.
    Type: Grant
    Filed: February 25, 2019
    Date of Patent: September 13, 2022
    Assignees: AUTONETWORKS TECHNOLOGIES, LTD., SUMITOMO WIRING SYSTEMS, LTD., SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Yuki Matsuo, Tetsuya Nishimura, Ryuta Takakura, Masaki Mizushita, Haruka Nakano, Yuya Fukami, Suguru Yasuda, Hitoshi Hasegawa, Kenta Arai, Housei Mizuno
  • Publication number: 20220190320
    Abstract: A negative electrode for a non-aqueous electrolyte secondary battery includes a negative electrode material mixture including a negative electrode active material capable of electrochemically absorbing and desorbing lithium ions, a carbon nanotube; and an acrylic resin. The negative electrode active material includes a composite material including a silicate phase, and silicon particles dispersed in the silicate phase, and the silicate phase includes at least one selected from the group consisting of alkali metal elements and Group 2 elements.
    Type: Application
    Filed: February 17, 2020
    Publication date: June 16, 2022
    Applicant: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Takahiro Fukuoka, Masaki Hasegawa, Masahiro Soga, Yuto Horiuchi, Takashi Yamamoto
  • Patent number: 11342211
    Abstract: The present disclosure provides a wafer inspection technology that involves less degradation of the image quality even when an object to be observed has a variation in height due to warpage, etc. of a wafer. This wafer inspection apparatus obtains an image with less degradation by: adjusting the focal point of an observation optical system to a height measured by a height sensor for measuring wafer surface heights; and further, correcting a switching signal for a CCD line sensor on the basis of stage position data and optical magnification data corresponding to the height so as to make a correction corresponding to the wafer surface height.
    Type: Grant
    Filed: May 30, 2018
    Date of Patent: May 24, 2022
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Akira Doi, Minoru Sasaki, Masaki Hasegawa, Hironori Ogawa, Tomohiko Ogata, Yuko Okada
  • Publication number: 20220107280
    Abstract: Provided is a quantification method for evaluating the quality of a sample on the basis of a mirror electron image acquired by a mirror electron microscope. In this invention, a mirror electron image is expressed numerically through counting of the brightness values of each pixel composing the mirror electron image, the creation of a brightness histogram, and the calculation, from the distribution of the brightness histogram, of a standard deviation. If brightness contrast is formed on the mirror electron image by, for example, a scratch on or latent damage in a sample, because the brightness values of the pixels will fluctuate, there will be more variation in the brightness values than in an image obtained from a satisfactory sample with no defects, and this will result in the brightness values of the mirror electron image having a larger standard deviation.
    Type: Application
    Filed: February 15, 2019
    Publication date: April 7, 2022
    Inventors: Kentaro OHIRA, Masaki HASEGAWA
  • Patent number: 11193895
    Abstract: It is necessary to guarantee performance by quantitatively evaluating the defect detection sensitivity of an inspection device for using the mirror electron image to detect defect in a semiconductor substrate. The size and position of accidentally formed defects are random, however, and this type of quantitative evaluation has been difficult. This semiconductor substrate 101 for evaluation is for evaluating the defect detection sensitivity of an inspection device and comprises a plurality of first indentations 104 that are formed through the pressing, with a first pressing load, of an indenter having a prescribed hardness and shape into the semiconductor substrate for evaluation. Further, a mirror electron image of the plurality of first indentations of the semiconductor substrate for evaluation is acquired, and the defect detection sensitivity of an inspection device is evaluated through the calculation of the defect detection rate of the plurality of first indentations in the acquired mirror electron image.
    Type: Grant
    Filed: October 30, 2017
    Date of Patent: December 7, 2021
    Assignee: Hitachi High-Tech Corporation
    Inventors: Kentaro Ohira, Masaki Hasegawa, Tomohiko Ogata, Katsunori Onuki, Noriyuki Kaneoka
  • Publication number: 20210313138
    Abstract: Provided is a mirror electronic inspection device which is a defect inspection device for detecting a defect of a semiconductor substrate or the like, and evaluates temperature dependence of the defect in a vacuum. A heating stage including a heater (heat generating element) covered with an electrically insulated insulating material, a heater base on which a sample is mounted, and a heat shielding plate and equipotential surface is mounted on a moving stage installed in a sample chamber of a device via an electrically insulated and thermally insulated fixing member. A heater power supply is connected to the heater (heat generating element), and a sample application power supply is connected to the heater base. The heater power supply and the sample application power supply are electrically separated.
    Type: Application
    Filed: September 12, 2018
    Publication date: October 7, 2021
    Applicant: Hitachi High-Tech Corporation
    Inventors: Masahiro YAMAOKA, Masaki HASEGAWA, Masakazu SUGAYA, Akihiro FURUKAWA, Katsunori ONUKI
  • Patent number: 11107655
    Abstract: In order to optimize defect contrast in a charged particle beam device that inverts charged particles directly above a sample and observes the electrons, this charged particle beam device is provided with a charged particle source, an electron gun control device which applies a first voltage to the charged particle source, a substrate voltage control device which applies a second voltage to a sample, an image forming optical system which includes an imaging lens for imaging charged particles incident from the direction of the sample, a detector which includes a camera for detecting the charged particles, and an image processing device which processes the detected signal, wherein the imaging optical system is configured so as not to image secondary electrons emitted from the sample, but forms an image with mirror electrons bounced back by the electric field formed on the sample by means of the potential difference between the first and the second voltages.
    Type: Grant
    Filed: September 20, 2017
    Date of Patent: August 31, 2021
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tomohiko Ogata, Masaki Hasegawa, Katsunori Onuki, Noriyuki Kaneoka, Hisaya Murakoshi
  • Patent number: 11059986
    Abstract: The present invention relates to a composition comprising a nanosized light emitting material, and method for preparing of said composition. The present invention further relates to a light luminescent medium, a light emitting device, the present invention further more relates to method for preparing of a composition and to method for preparing of a light emitting medium.
    Type: Grant
    Filed: November 27, 2017
    Date of Patent: July 13, 2021
    Assignee: MERCK PATENT GMBH
    Inventors: Masaki Hasegawa, Noriyuki Matsuda
  • Publication number: 20210198566
    Abstract: The present invention relates to a formulation comprising at least a polymer, a particle, and an organic solvent.
    Type: Application
    Filed: May 21, 2019
    Publication date: July 1, 2021
    Applicant: Merck Patent GmbH
    Inventor: Masaki HASEGAWA
  • Patent number: 11002687
    Abstract: A defect inspection device includes a sample support member, a negative voltage, an imaging element, an ultraviolet light source, a movement stage, and a control device. The control device controls the movement stage such that a portion of a linear part included in the image or a location on an extensional line of the linear part is positioned at a specific location in an irradiated region of the electron beam. The control device also repeats the control of the movement stage until an end of the linear part is positioned within the irradiated region of the electron beam.
    Type: Grant
    Filed: March 16, 2016
    Date of Patent: May 11, 2021
    Assignee: Hitachi High-Tech Corporation
    Inventors: Masaki Hasegawa, Katsunori Onuki, Noriyuki Kaneoka, Hisaya Murakoshi, Tomohiko Ogata
  • Patent number: 10991981
    Abstract: This nonaqueous electrolyte secondary battery is provided with a positive electrode, a negative electrode and a non-aqueous electrolyte. The non-aqueous electrolyte contains: a non-aqueous solvent that contains a fluorine-containing cyclic carbonate; an isocyanuric acid derivative such as triallyl isocyanurate; and a cyclic carboxylic acid anhydride such as diglycolic acid anhydride.
    Type: Grant
    Filed: December 14, 2017
    Date of Patent: April 27, 2021
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Masaki Hasegawa, Yuanlong Zhong
  • Publication number: 20210118710
    Abstract: The present disclosure provides a wafer inspection technology that involves less degradation of the image quality even when an object to be observed has a variation in height due to warpage, etc. of a wafer. This wafer inspection apparatus obtains an image with less degradation by: adjusting the focal point of an observation optical system to a height measured by a height sensor for measuring wafer surface heights; and further, correcting a switching signal for a CCD line sensor on the basis of stage position data and optical magnification data corresponding to the height so as to make a correction corresponding to the wafer surface height.
    Type: Application
    Filed: May 30, 2018
    Publication date: April 22, 2021
    Inventors: Akira DOI, Minoru SASAKI, Masaki HASEGAWA, Hironori OGAWA, Tomohiko OGATA, Yuko OKADA
  • Patent number: 10923315
    Abstract: A purpose of the present invention is to provide a charged particle beam apparatus that performs apparatus adjustment based on a proper evaluation of a beam. To achieve the abovementioned purpose, with the present invention, proposed is a charged particle beam apparatus comprising: an irradiation optical system including a lens for converging charged particle beams emitted from a charged particle source; and an imaging optical system for imaging the charged particles obtained by irradiating the charged particle beams toward a sample on an imaging element, wherein the charged particle beam apparatus comprises a control apparatus for controlling the lens, and the control apparatus evaluates for each lens condition the size of a specific brightness area obtained by the charged particle beam being made to reach the sample, and selects the lens condition for which the size information fulfills a designated condition.
    Type: Grant
    Filed: March 24, 2017
    Date of Patent: February 16, 2021
    Assignee: Hitachi High-Tech Corporation
    Inventors: Masaki Hasegawa, Tomohiko Ogata, Noriyuki Kaneoka, Hisaya Murakoshi, Katsunori Onuki
  • Publication number: 20210020990
    Abstract: Provided is a non-aqueous electrolyte secondary battery comprising: a positive electrode including a positive electrode active material; a negative electrode; and a non-aqueous electrolyte, wherein the positive electrode active material has a composite oxide containing Ni and Li, the proportion of Ni being at least 33 mol % with respect to the total number of moles of metal elements other than Li, and the non-aqueous electrolyte contains: a non-aqueous solvent containing a fluorine-containing cyclic carbonate; an isocyanurate derivative such as triallyl isocyanurate; and a cyclic carboxylic anhydride such as a succinic anhydride.
    Type: Application
    Filed: January 22, 2019
    Publication date: January 21, 2021
    Applicant: Panasonic Intellectual Property Management Co., Ltd.
    Inventors: Yuanlong ZHONG, Masaki HASEGAWA
  • Patent number: 10879015
    Abstract: A viologen compound is a crystalline compound including a heterocyclic moiety in which a carboxylate of an alkali metal is bound directly or indirectly to both ends of a basic skeleton containing 4,4?-bipyridinium and an anionic moiety that pairs with 4,4?-bipyridinium. The viologen compound can be used, for example, as a negative electrode active material for an electricity storage device including a negative electrode containing the negative electrode active material, a positive electrode containing a positive electrode active material capable of giving and receiving anions, and an ion-conducting medium that is disposed between the positive electrode and the negative electrode and conducts anions.
    Type: Grant
    Filed: November 23, 2018
    Date of Patent: December 29, 2020
    Assignee: KABUSHIKI KAISHA TOYOTA CHUO KENKYUSHO
    Inventors: Hitoshi Kumagai, Yuka Makino, Masaki Hasegawa, Nobuhiro Ogihara
  • Publication number: 20200340930
    Abstract: It is necessary to guarantee performance by quantitatively evaluating the defect detection sensitivity of an inspection device for using the mirror electron image to detect defect in a semiconductor substrate. The size and position of accidentally formed defects are random, however, and this type of quantitative evaluation has been difficult. This semiconductor substrate 101 for evaluation is for evaluating the defect detection sensitivity of an inspection device and comprises a plurality of first indentations 104 that are formed through the pressing, with a first pressing load, of an indenter having a prescribed hardness and shape into the semiconductor substrate for evaluation. Further, a mirror electron image of the plurality of first indentations of the semiconductor substrate for evaluation is acquired, and the defect detection sensitivity of an inspection device is evaluated through the calculation of the defect detection rate of the plurality of first indentations in the acquired mirror electron image.
    Type: Application
    Filed: October 30, 2017
    Publication date: October 29, 2020
    Inventors: Kentaro OHIRA, Masaki HASEGAWA, Tomohiko OGATA, Katsunori ONUKI, Noriyuki KANEOKA
  • Publication number: 20200292466
    Abstract: The purpose of the present invention is to provide a defect inspection device that can evaluate a defect having a long latent flaw with high precision. A defect inspection device of the present invention is characterized by being provided with: a sample support member that supports a sample irradiated by an electron beam emitted from an electron source; an imaging element at which an image of electrons (mirror electrons) reflected without reaching the sample is formed via a retarding electric field formed on the sample; an ultraviolet light source that emits an ultraviolet light toward the sample; a movement stage that moves the sample support member; and a control device that controls the movement stage.
    Type: Application
    Filed: March 16, 2016
    Publication date: September 17, 2020
    Inventors: Masaki HASEGAWA, Katsunori ONUKI, Noriyuki KANEOKA, Hisaya MURAKOSHI, Tomohiko OGATA