Patents by Inventor Masao Iga

Masao Iga has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6983756
    Abstract: A substrate treatment apparatus comprises a treatment vessel, a substrate holder for rotating the substrate in a horizontal plane in the treatment vessel, a nozzle unit arranged in an upper part of the treatment vessel such that a liquid is downwardly fed, a feed line for feeding the liquid to the nozzle unit, and a chamber enclosing therein the apparatus in its entirety. The nozzle unit is constructed in a form of a bar such that as viewed in plan, the liquid ejected from the nozzle unit reaches the substrate with an area range having a length not smaller than a diameter of the substrate and a width smaller than the diameter of the substrate.
    Type: Grant
    Filed: April 20, 2004
    Date of Patent: January 10, 2006
    Assignee: m - FSI Ltd.
    Inventors: Kousaku Matsuno, Masao Iga
  • Publication number: 20050183749
    Abstract: A substrate cleaning apparatus comprises an outer shell constructed such that the outer shell is selectively openable or hermetically closable to form a sealed space, an inner shell enclosed within the outer shell and having a holding member for holding a substrate, and a dispenser unit for feeding at least one of gas and liquid into the inner shell. Within the sealed space formed by the outer shell, a highly gas-tight space is formed by the inner shell to permit cleaning of the substrate within the highly gas-tight space. Also disclosed are a dispenser, a substrate holding mechanism and a substrate cleaning chamber, which are suitable for use with the substrate cleaning apparatus, and substrate cleaning processes making use of these dispenser, substrate holding mechanism and substrate cleaning chamber, respectively.
    Type: Application
    Filed: March 2, 2005
    Publication date: August 25, 2005
    Applicant: m-FSI LTD.
    Inventors: Kousaku Matsuno, Masao Iga, Takeji Ueda, Jun Kanayasu, Satoshi Shikami
  • Publication number: 20050183750
    Abstract: A substrate cleaning apparatus comprises an outer shell constructed such that the outer shell is selectively openable or hermetically closable to form a sealed space, an inner shell enclosed within the outer shell and having a holding member for holding a substrate, and a dispenser unit for feeding at least one of gas and liquid into the inner shell. Within the sealed space formed by the outer shell, a highly gas-tight space is formed by the inner shell to permit cleaning of the substrate within the highly gas-tight space. Also disclosed are a dispenser, a substrate holding mechanism and a substrate cleaning chamber, which are suitable for use with the substrate cleaning apparatus, and substrate cleaning processes making use of these dispenser, substrate holding mechanism and substrate cleaning chamber, respectively.
    Type: Application
    Filed: March 2, 2005
    Publication date: August 25, 2005
    Applicant: m-FSI LTD.
    Inventors: Kousaku Matsuno, Masao Iga, Takeji Ueda, Jun Kanayasu, Satoshi Shikami
  • Publication number: 20050150530
    Abstract: A substrate cleaning apparatus comprises an outer shell constructed such that the outer shell is selectively openable or hermetically closable to form a sealed space, an inner shell enclosed within the outer shell and having a holding member for holding a substrate, and a dispenser unit for feeding at least one of gas and liquid into the inner shell. Within the sealed space formed by the outer shell, a highly gas-tight space is formed by the inner shell to permit cleaning of the substrate within the highly gas-tight space. Also disclosed are a dispenser, a substrate holding mechanism and a substrate cleaning chamber, which are suitable for use with the substrate cleaning apparatus, and substrate cleaning processes making use of these dispenser, substrate holding mechanism and substrate cleaning chamber, respectively.
    Type: Application
    Filed: March 2, 2005
    Publication date: July 14, 2005
    Applicant: m-FSI LTD.
    Inventors: Kousaku Matsuno, Masao Iga, Takeji Ueda, Jun Kanayasu, Satoshi Shikami
  • Patent number: 6874516
    Abstract: A substrate cleaning apparatus comprises an outer shell constructed such that the outer shell is selectively openable or hermetically closable to form a sealed space, an inner shell enclosed within the outer shell and having a holding member for holding a substrate, and a dispenser unit for feeding at least one of gas and liquid into the inner shell. Within the sealed space formed by the outer shell, a highly gas-tight space is formed by the inner shell to permit cleaning of the substrate within the highly gas-tight space. Also disclosed are a dispenser, a substrate holding mechanism and a substrate cleaning chamber, which are suitable for use with the substrate cleaning apparatus, and substrate cleaning processes making use of these dispenser, substrate holding mechanism and substrate cleaning chamber, respectively.
    Type: Grant
    Filed: May 30, 2002
    Date of Patent: April 5, 2005
    Assignee: m•FSI Ltd.
    Inventors: Kousaku Matsuno, Masao Iga, Takeji Ueda, Jun Kanayasu, Satoshi Shikami
  • Publication number: 20040194812
    Abstract: A substrate treatment process is disclosed to remove organic matter existing on a substrate such as a wafer, glass substrate or ceramic. The process comprises treating the substrate with ozone water and then with hydrogen water, or treating the substrate with ozone-hydrogen water or treating the substrate with ozone water and hydrogen water at the same time. A substrate treatment apparatus is also disclosed for a substrate. The apparatus comprises a treatment vessel, a substrate holder for rotating the substrate in a horizontal plane in the treatment vessel, a nozzle unit arranged in an upper part of the treatment vessel such that a liquid is downwardly fed, a feed line for feeding the liquid to the nozzle unit, and a chamber enclosing therein the apparatus in its entirety.
    Type: Application
    Filed: April 20, 2004
    Publication date: October 7, 2004
    Applicant: m. FSI LTD.
    Inventors: Kousaku Matsuno, Masao Iga
  • Patent number: 6743301
    Abstract: A substrate treatment process is disclosed to remove organic matter existing on a substrate such as a wafer, glass substrate or ceramic. The process comprises treating the substrate with ozone water and then with hydrogen water, or treating the substrate with ozone-hydrogen water or treating the substrate with ozone water and hydrogen water at the same time.
    Type: Grant
    Filed: December 22, 2000
    Date of Patent: June 1, 2004
    Assignee: m&Circlesolid;FSI Ltd.
    Inventors: Kousaku Matsuno, Masao Iga
  • Publication number: 20030005948
    Abstract: A substrate cleaning apparatus comprises an outer shell constructed such that the outer shell is selectively openable or hermetically closable to form a sealed space, an inner shell enclosed within the outer shell and having a holding member for holding a substrate, and a dispenser unit for feeding at least one of gas and liquid into the inner shell. Within the sealed space formed by the outer shell, a highly gas-tight space is formed by the inner shell to permit cleaning of the substrate within the highly gas-tight space. Also disclosed are a dispenser, a substrate holding mechanism and a substrate cleaning chamber, which are suitable for use with the substrate cleaning apparatus, and substrate cleaning processes making use of these dispenser, substrate holding mechanism and substrate cleaning chamber, respectively.
    Type: Application
    Filed: May 30, 2002
    Publication date: January 9, 2003
    Applicant: m-FSI LTD.
    Inventors: Kousaku Matsuno, Masao Iga, Takeji Ueda, Jun Kanayasu, Satoshi Shikami
  • Publication number: 20010009155
    Abstract: A substrate treatment process is disclosed to remove organic matter existing on a substrate such as a wafer, glass substrate or ceramic. The process comprises treating the substrate with ozone water and then with hydrogen water, or treating the substrate with ozone-hydrogen water or treating the substrate with ozone water and hydrogen water at the same time. A substrate treatment apparatus is also disclosed for a substrate. The apparatus comprises a treatment vessel, a substrate holder for rotating the substrate in a horizontal plane in the treatment vessel, a nozzle unit arranged in an upper part of the treatment vessel such that a liquid is downwardly fed, a feed line for feeding the liquid to the nozzle unit, and a chamber enclosing therein the apparatus in its entirety.
    Type: Application
    Filed: December 22, 2000
    Publication date: July 26, 2001
    Applicant: m . FSI LTD.
    Inventors: Kousaku Matsuno, Masao Iga
  • Patent number: 6024045
    Abstract: A method for treating the surface of a semiconductor layer includes the step of removing an oxide from the surface of a semiconductor layer by adding fluorine or fluoride to hydrogen radicals separately from plasma atmosphere and thereafter exposing the semiconductor layer to the mixed gas and hydrogen-terminating the surface.
    Type: Grant
    Filed: October 26, 1998
    Date of Patent: February 15, 2000
    Assignee: Fujitsu Limited
    Inventors: Jun Kikuchi, Shuzo Fujimura, Masao Iga
  • Patent number: 5919336
    Abstract: A method for treating the surface of a semiconductor layer includes the step of removing an oxide from the surface of a semiconductor layer by adding fluorine or fluoride to hydrogen radicals separately from plasma atmosphere and thereafter exposing the semiconductor layer to the mixed gas and hydrogen-terminating the surface.
    Type: Grant
    Filed: November 17, 1997
    Date of Patent: July 6, 1999
    Assignee: Fujitsu Limited
    Inventors: Jun Kikuchi, Shuzo Fujimura, Masao Iga