Abstract: A silica gel based heat-resistant and weatherproof antimicrobial composition having an aluminosilicate layer on the surfaces of pores in the silica gel as substituted by silver and an optional antimicrobial metal, said composition containing ion-exchangeable metals that are chiefly an alkali metal and that are present in an amount of up to 2.57 mmol per gram of said composition on an anhydrous basis.

Abstract: The present invention provides a novel antimicrobial composition and a process for preparing the composition which composition is useful as antimicrobial and/or bactericidal material. The antimicrobial composition of the invention comprises silica gel and an antimicrobial coat of aluminosilicate on the surface of the silica gel, said composition having a pore volume of at least 0.3 cm.sup.3 /g and a specific surface area of at least 100 m.sup.2 /g. The aluminosilicate coat consists of either partial or complete substitution of ion-exchangeable metal ion (M) in aluminosilicate solid particles represented by the formulaxM.sub.2/n O.Al.sub.2 O.sub.3.ySiO.sub.2.zH.sub.2 O,wherein x and y represent the numbers of molecules of the metal oxide and silicon dioxide, respectively, M is an ion-exchangeable metal, n is the atomic valence of M, and z is the number of molecules of water.

Abstract: Probe card is a part which is incorporated into probing equipment to test finished IC chips. This card is customarily mounted with a plurality of probes, very fine needle and generally L letter shaped, each of which is disposed so that its front end may project downwardly toward an IC chip. Conventional probes are difficult to align all the probe front ends with electrical ends on the IC chip. Overdrive is normally taken to produce adequate contact pressures with respective probes after all contacts between the probe front ends and the IC ends are formed, but this action often causes conventional probe ends to slip down from the IC ends. The proposed probe card includes a new provision of a resin layer of an elastic, insulative characteristic to fill the central open area of the supporter which is assembled into the probe card. The filling, by such a resin layer, makes the probe front ends resiliently held in position so that a deviation from proper respective dispositions by overdrive becomes avoidable.

Abstract: Probe card is a part which is incorporated into probing equipment to test finished IC chips. This card is customarily mounted with a plurality of probes, very fine needle and generally L letter shaped, each of which is disposed so that its front end may project downwardly toward an IC chip. Conventional probes are difficult to align all the probe front ends with electrical ends on the IC chip. Overdrive is normally taken to produce adequate contact pressures with respective probes after all contacts between the probe front ends and the IC ends are formed, but this action often causes conventional probe ends to slip down from the IC ends. The proposed probe card includes a new provision of a resin layer of an elastic, insulative characteristic to fill the central open area of the supporter which is assembled into the probe card. The filling, by such a resin layer, makes the probe front ends resiliently held in position so that a deviation from proper respective dispositions by overdrive becomes avoidable.

Abstract: An ion emmisive head for fusing a metal to emit ion beam is disclosed, wherein a fused metal is designed to infiltrate through a porous portion for flow control and to reach an extremely sharpened needle which is provided after infiltration and wherefrom the fused metal is converted to ion beam by electrical action. Thus, ionized metallic beam is rendered to have smaller width or more focused ray. Submicron technology used in the IC industry, for instance, desires far thinner, finer beam line to attain more compact circuits, which need will be responded in the present invention by disposing a tipping needle to extend out of a porous tip portion which receives the fused metal from melting zone. Appropriate combination of sharpness at the needle point and provision of a beam guiding electrode in neighborhood of an emitting needle point enable to produce about 0.1 micron beam width by prevention of plasma ball which will otherwise diffuse the emitted beam.

Abstract: This invention relates to a manufacturing process for plate or forging (bar, stamp work or the like) of ferrite-austenite two-phase stainless steel, containing C at 0.03% or below, Si at 2.0% or below, Mn at 2.0% or below, Cr at 25 to 35%, Ni at 6 to 15%, N at 0.35% or below, and Fe and inevitable impurity for the remainder with or without adding B at 0.001 to 0.030% with the following nickel balance value specified at -3 to -9 and comprising an average crystal grain size at 0.015 mm or below from heating an ingot of the above mentioned ferrite-austenite two-phase stainless steel at 1,200.degree. C. or below and keeping a forging ratio by hot working at 5 or over.Ni balance value=Ni %+0.5 Mn %+30.times.(C+N) %-1.1(Cr %+1.5 Si %)+8.

Abstract: An ion source having a sintered metal head for ionizing various substances is disclosed. This ion source comprises a container made of a material which has a higher fusing point than that of the substance which is to be ionized, and a tip formed of a molded sintered metal of a higher fusing point than that of the substance which is to be ionized. The head is formed into a nearly conical shape and has a porosity capable of allowing the substance which is to be ionized to infiltrate therethrough in the molten state and the tip of the head is positioned at the opening of one end of the container for the ionizable material and arranged in such a manner that it protrudes beyond the end of the container.

Abstract: This invention relates to a welding material of ferrite-austenite two-phase stainless steel capable of producing a weld metal having a high resistance to corrosion, particularly in an environment containing nitric acid, and the method of application therefor. The welding material consists essentially of not more than 0.03% of C, not more than 2.0% of Si, not more than 2.0% of Mn, 25 to 30% of Cr, 7 to 12% of Ni, not more than 0.35% of N, and the balance Fe and inevitable impurities. The Ni balance value given by the following formula ranges between -11.7 and -6.7:Ni balance value=Ni%+0.5.times.Mn%+30.times.(C+N)%-1.1 (Cr%+1.5.times.Si%)+8.2.

Abstract: A probe card includes a printed circuit plate having an aperture at the center thereof and a ring fixed around said aperture on either side of the plate. The ring is adapted to support probe needles in radial arrays with respect to the aperture. Each of the arrays has a multilayer of probe needles which have their terminal tips aligned on a plane in parallel with the plate and their opposite terminal ends connected to the printed circuit for external connection.

Abstract: A testing apparatus of semiconductor wafers includes a base plate and a probe card including probe needles, wherein the probe card is detachably affixed to the base plate under air suction, which is derived from a vacuum produced in an airtightly sealed space provided between the base plate and the probe card.

Abstract: A method for improving surface defect of specific steel resistant to concentrated nitric acid, wherein the specific steel in a molten state, either a stainless steel comprising C.ltoreq.0.1 wt %, 2.5.ltoreq.Si.ltoreq.5 wt %, Mn.ltoreq.2 wt %,15.ltoreq.Cr.ltoreq.20 wt %, 10.ltoreq.Ni.ltoreq.22 wt %,C.times.10.ltoreq. at least one of Nb, Ta and Zr.ltoreq.2.5 wt %,the balance being iron and inevitable impurities,or a high-silicon-nickel-chromium steel comprisingC.ltoreq.0.03 wt %, 5.ltoreq.Si.ltoreq.7 wt %, Mn.ltoreq.10 wt %,7.ltoreq.Cr.ltoreq.16 wt %, 10.ltoreq.Ni.ltoreq.19 wt %,C.times.4.ltoreq. at least one of Nb, Ta and Zr.ltoreq.2 wt %,the balance being iron and inevitable impurities,is admixed with titanium (0.05.ltoreq.Ti.ltoreq.0.2 wt %) when producing said steel.

Abstract: A high-silicon-nickel-chromium steel resistant to concentrated nitric acid with a good workability and a good weldability, comprisingcarbon in an amount of not more than 0.03% (C.ltoreq.0.03%),silicon in an amount of from more than 5% to not more than 7% (5%<Si.ltoreq.7%),manganese in an amount of not more than 10% (Mn.ltoreq.10%),chromium in an amount of from not less than 7% to not more than 16% (7%.ltoreq.Cr.ltoreq.16%),nickel in an amount of from not less than 10% to less than 19% (10%.ltoreq.Ni.ltoreq.19%),and the balance being iron and inevitable impurities,percentages being by weight.

Abstract: An anticorrosive bellows made of stainless steel containing 0.10% by weight or less of C, 2.5-5% by weight of Si, 2% by weight or less of Mn, 15-20% by weight of Cr, 10-22% by weight of Ni, 10 times or more as much as the C content but at most 2.5% by weight of at least one element selected from the group consisting of Ta and Zr, and the remainder consisiting substantially of Fe shows excellent corrosion resistance even under strongly corrosive circumstances, e.g. fuming or concentrated nitric acid. Said stainless steel has improved workability, weldability and endurance and the produced bellows can be used as a bellows valve, a bellows joint, and the like.

Abstract: Corrosion of an SO.sub.2 regeneration apparatus is prevented upon suspending its operation by introducing an inert gas into the apparatus to produce an air concentration of not more than 5% by volume therein and maintaining that concentration while reducing temperature in the apparatus to room temperature.