Patents by Inventor Masato Hara

Masato Hara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210309814
    Abstract: A resin composite material, containing a polyolefin resin, and the following (a) and (b) dispersed in the polyolefin resin: (a) resin particles containing cellulose fibers and a resin different from the polyolefin resin, and having a maximum diameter of 10 ?m or more; and (b) resin particles containing a resin different from the polyolefin resin, having a maximum diameter of 10 ?m or more, and having an aspect ratio of 5 or more.
    Type: Application
    Filed: June 17, 2021
    Publication date: October 7, 2021
    Applicant: FURUKAWA ELECTRIC CO., LTD.
    Inventors: Hidekazu HARA, Jae Kyung KIM, Jiro SAKATO, Jirou HIROISHI, Toshihiro SUZUKI, Masami TAZUKE, Masato IKEUCHI
  • Publication number: 20210268608
    Abstract: In a laser cutting method, a cut slit of a welding protruding-tab configured to be bent by laser cutting along an outline of a processed part and press a peripheral surface of the processed part is laser-cut in advance in a periphery of the processed part that is cut from a workpiece, and an outline slit is formed by performing laser cutting along the outline of the processed part and a free end of the welding protruding-tab is welded to the peripheral surface of the processed part. According to the above described laser cutting method, it is possible to retain the processed part reliably and stably for a long period, and it is possible to easily separate the processed part from the workpiece with almost no trace left on the processed part.
    Type: Application
    Filed: September 6, 2019
    Publication date: September 2, 2021
    Inventors: Hideo HARA, Masato KUNIHIRO
  • Publication number: 20160087529
    Abstract: A bootstrap circuit includes an N-channel MOS transistor including: a first N-type semiconductor layer formed on a surface of a P-type semiconductor substrate and electrically connected to a bootstrap capacitor; a P-type semiconductor layer formed on a surface of the first N-type semiconductor layer; a second N-type semiconductor layer formed on a surface of the P-type semiconductor layer; a first electrode electrically connected to the P-type semiconductor layer; a second electrode electrically connected to the second N-type semiconductor layer; and a power-source terminal connected to each of the first electrode and the second electrode for supplying a power-source voltage thereto, the N-channel MOS transistor supplying power to the bootstrap capacitor, and a current limiting element connected between the power-source terminal and the first electrode.
    Type: Application
    Filed: September 19, 2014
    Publication date: March 24, 2016
    Applicant: Sanken Electric Co., LTD.
    Inventors: Kunitaka Sakai, Yuuya Maekawa, Masato Hara, Hideyuki Kubota
  • Patent number: 8415989
    Abstract: A switching device has a main IGFET having a Schottky barrier diode D3 for blocking an inverse current built therein, a protective switch means, and a protective switch control means. The protective switch means is connected in between a drain electrode D and a gate electrode G of the main IGFET. The protective switch control means turns on the protective switch means when an inverse voltage is impressed to the main IGFET. Thereby, the main IGFET is protected from the inverse voltage.
    Type: Grant
    Filed: March 29, 2011
    Date of Patent: April 9, 2013
    Assignee: Sanken Electric Co., Ltd.
    Inventors: Akihiro Shinoda, Masato Hara
  • Publication number: 20110227630
    Abstract: A switching device has a main IGFET having a Schottky barrier diode D3 for blocking an inverse current built therein, a protective switch means, and a protective switch control means. The protective switch means is connected in between a drain electrode D and a gate electrode G of the main IGFET. The protective switch control means turns on the protective switch means when an inverse voltage is impressed to the main IGFET. Thereby, the main IGFET is protected from the inverse voltage.
    Type: Application
    Filed: March 29, 2011
    Publication date: September 22, 2011
    Applicant: Sanken Electric Co., Ltd.
    Inventors: Akihiro SHINODA, Masato HARA
  • Patent number: 7859138
    Abstract: A drive circuit for a switching circuit has a high-side drive circuit to turn on/off, according to a control signal, a switching element QH arranged on a high side of a DC power source Vin and a low-side drive circuit to turn on/off alternately with the switching element QH according to the control signal a switching element QL arranged on a low side of the DC power source and connected in series with the switching element QH. Ends of an auxiliary power source Vcc1 are connected in series with a switch element Qn1, a capacitor C1, and a switch element Qn2. Both ends of the capacitor C1 are connected in series with a switch element Qp1, a capacitor C2, and a switch element Qp2. A control circuit alternately turns on/off the switch elements Qn1 and Qn2 and the switch elements Qp1 and Qp2. The capacitor C2 provides the high-side drive circuit with source power.
    Type: Grant
    Filed: May 1, 2006
    Date of Patent: December 28, 2010
    Assignee: Sanken Electric Co., Ltd.
    Inventors: Akio Iwabuchi, Masato Hara
  • Publication number: 20100052648
    Abstract: A drive circuit for a switching circuit has a high-side drive circuit to turn on/off, according to a control signal, a switching element QH arranged on a high side of a DC power source Vin and a low-side drive circuit to turn on/off alternately with the switching element QH according to the control signal a switching element QL arranged on a low side of the DC power source and connected in series with the switching element QH. Ends of an auxiliary power source Vcc1 are connected in series with a switch element Qn1, a capacitor C1, and a switch element Qn2. Both ends of the capacitor C1 are connected in series with a switch element Qp1, a capacitor C2, and a switch element Qp2. A control circuit alternately turns on/off the switch elements Qn1 and Qn2 and the switch elements Qp1 and Qp2. The capacitor C2 provides the high-side drive circuit with source power.
    Type: Application
    Filed: May 1, 2006
    Publication date: March 4, 2010
    Applicant: Sanken Electric Co., Ltd.
    Inventors: Akio Iwabuchi, Masato Hara
  • Patent number: 6853441
    Abstract: The projection aligner transfers a mask pattern formed on a mask to a substrate. A collimated light beam is emitted from a light source toward the mask. The light beam passed through the mask is deflected by a first mirror formed on a deflector toward a lens unit having a positive power. A reflector is provided at the other side of the lens unit to reflect back the light beam passed through the lens unit. The light beam reflected by the reflector passed through the lend unit again and then deflected by a second mirror formed on the deflector toward the substrate to form an image of the mask pattern. The size of the image formed on the substrate is adjusted by moving the reflector along the optical axis of the lens unit, and the deflector along the optical path of the light beam passed through the mask.
    Type: Grant
    Filed: December 26, 2002
    Date of Patent: February 8, 2005
    Assignee: PENTAX Corporation
    Inventors: Yoshinori Kobayashi, Shigetomo Ishibashi, Masato Hara
  • Patent number: 6839124
    Abstract: A projection aligner scans a plurality of light beams over a mask in a main scanning direction to transfer an image of a mask pattern on an object by the light beams passed through the mask. The projection aligner has a plurality of optical systems for projecting light beams passed through the mask onto the object. Each of the optical system includes a lens unit, a reflector provided to one side of the lens unit and a deflector provided to the other side of the lens unit. The light beam passed through the mask is deflected by the deflector, passes through the lens unit, reflected back by the reflector, passes through the lens unit again, and deflected by the deflector toward the object. The size of the image formed by the light beam is varied by moving the reflector in the main scanning direction and moving the deflector in a direction perpendicular to the object. The location of the image on the object in the auxiliary direction is adjusted by further moving the reflector in the auxiliary direction.
    Type: Grant
    Filed: December 26, 2002
    Date of Patent: January 4, 2005
    Assignee: PENTAX Corporation
    Inventors: Yoshinori Kobayashi, Shigetomo Ishibashi, Masato Hara
  • Patent number: 6807013
    Abstract: The projection aligner for transferring an image of a mask pattern of a mask onto an object to be exposed comprises a projection optical system that forms the image of the mask pattern onto the object, an expansion ratio determiner that measures lengths of the object in first and second directions and determines first and second expansion ratios, which are expansion ratios of the object in the first and second directions, respectively, based on those lengths, and a magnification controller that adjusts the magnification of the projection optical system to a value between the first and second expansion ratios.
    Type: Grant
    Filed: December 26, 2002
    Date of Patent: October 19, 2004
    Assignee: PENTAX Corporation
    Inventors: Yoshinori Kobayashi, Shigetomo Ishibashi, Masato Hara
  • Patent number: 6804386
    Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: October 12, 2004
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Masato Hara, Masayuki Sugiura, Atsushi Kida
  • Patent number: 6788804
    Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: September 7, 2004
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Masato Hara, Masayuki Sugiura, Atsushi Kida
  • Patent number: 6727979
    Abstract: The projection aligner transfers the image of the pattern formed on the mask to the object by scanning a light beam across the mask and the object. The projection aligner includes a driving mechanism for synchronously moving the mask and the object and thereby scanning the light beam across the mask and the object in a predetermined beam scanning direction. The light beam scanning the mask passes through the mask and is projected onto the object by a projection optical system of which magnification is adjusted by a magnification adjusting mechanism. The magnification adjusting mechanism and the driving mechanism are controlled by a controller such that the difference between the magnification of said projection optical system and a velocity ratio of the mask and the object moved by the driving mechanism becomes below a predetermined maximum value which is determined based on a line width of the pattern formed on the mask.
    Type: Grant
    Filed: January 10, 2003
    Date of Patent: April 27, 2004
    Assignee: PENTAX Corporation
    Inventors: Yoshinori Kobayashi, Shigetomo Ishibashi, Masato Hara
  • Patent number: 6717683
    Abstract: A target, which is photographed with an object at a spot for a photogrammtric analytical measurement, comprises first, second, third standard point members and assistant point members. The standard point members and the assistant point members are covered by a reflecting sheet. A distance between the first and second standard point members equals a distance between the second and third standard point members. Two assistant point members are positioned on a first straight line connecting the first and second standard point members. One assistant point member is positioned on a second straight line connecting the second and third standard point members. The distance between the first and second standard point members, the distance between the second and third standard point members, and an angle defined by the first and second straight lines, are predetermined.
    Type: Grant
    Filed: September 29, 1999
    Date of Patent: April 6, 2004
    Assignee: PENTAX Corporation
    Inventors: Shigeru Wakashiro, Masato Hara, Atsumi Kaneko, Toshihiro Nakayama, Atsushi Kida, Masami Shirai, Kiyoshi Yamamoto
  • Patent number: 6697513
    Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: February 24, 2004
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Masato Hara, Masayuki Sugiura, Atsushi Kida
  • Patent number: 6636625
    Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: October 21, 2003
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Masato Hara, Masayuki Sugiura, Atsushi Kida
  • Patent number: 6628803
    Abstract: A three points range of high brightness and a four points range of high brightness in a photographed image are selected. It is checked if an identical end point is shared by the three and four points range selected. It is checked if a center of gravity corresponding to the identical end point, a center of gravity corresponding to another end point of the three points rage opposite to the identical end point, and a center of gravity corresponding to another end point of the four points range opposite to the identical end point, meet a positional relationship between standard points of a target.
    Type: Grant
    Filed: November 26, 1999
    Date of Patent: September 30, 2003
    Assignee: PENTAX Corporation
    Inventors: Shigeru Wakashiro, Masato Hara, Atsumi Kaneko, Toshihiro Nakayama, Atsushi Kida
  • Publication number: 20030133089
    Abstract: The projection aligner transfers the image of the pattern formed on the mask to the object by scanning a light beam across the mask and the object. The projection aligner includes a driving mechanism for synchronously moving the mask and the object and thereby scanning the light beam across the mask and the object in a predetermined beam scanning direction. The light beam scanning the mask passes through the mask and is projected onto the object by a projection optical system of which magnification is adjusted by a magnification adjusting mechanism. The magnification adjusting mechanism and the driving mechanism are controlled by a controller such that the difference between the magnification of said projection optical system and a velocity ratio of the mask and the object moved by the driving mechanism becomes below a predetermined maximum value which is determined based on a line width of the pattern formed on the mask.
    Type: Application
    Filed: January 10, 2003
    Publication date: July 17, 2003
    Applicant: PENTAX Corporation
    Inventors: Yoshinori Kobayashi, Shigetomo Ishibashi, Masato Hara
  • Publication number: 20030117602
    Abstract: The projection aligner includes a lens unit having an optical axis parallel to a mask, a reflector provided to one side of the lens unit to reflect back light passed therethrough, a light source that emits a light beam toward the object through the mask, and a deflector being inserted in an optical path of the light beam at the other side of the lens unit movably along the optical axis of said lens unit. The deflector has first and second mirrors which are inclined against the optical axis of the lens unit in opposite, directions to each other. The first mirror is arranged to deflect the light beam coming from the mask toward the reflector through the lens unit. The second mirror is arranged to deflect the light beam reflected by the reflector and passed through the lens unit toward the object.
    Type: Application
    Filed: December 26, 2002
    Publication date: June 26, 2003
    Applicant: PENTAX Corporation
    Inventors: Yoshinori Kobayashi, Shigetomo Ishibashi, Masato Hara
  • Publication number: 20030117607
    Abstract: A projection aligner scans a plurality of light beams over a mask in a main scanning direction to transfer an image of a mask pattern on an object by the light beams passed through the mask. The projection aligner has a plurality of optical systems for projecting light beams passed through the mask onto the object. Each of the optical system includes a lens unit, a reflector provided to one side of the lens unit and a deflector provided to the other side of the lens unit. The light beam passed through the mask is deflected by the deflector, passes through the lens unit, reflected back by the reflector, passes through the lens unit again, and deflected by the deflector toward the object. The size of the image formed by the light beam is varied by moving the reflector in the main scanning direction and moving the deflector in a direction perpendicular to the object. The location of the image on the object in the auxiliary direction is adjusted by further moving the reflector in the auxiliary direction.
    Type: Application
    Filed: December 26, 2002
    Publication date: June 26, 2003
    Applicant: PENTAX Corporation
    Inventors: Yoshinori Kobayashi, Shigetomo Ishibashi, Masato Hara