Abstract: An A/D converter includes: a first wiring layer including a first A/D conversion circuit including a first capacitor group in which a plurality of weighted unit capacitors are connected in parallel and a second capacitor group in which a plurality of unit capacitors are connected in parallel, the second capacitor group being connected in parallel with the first capacitor group; and a second wiring layer including a second A/D conversion circuit including a third capacitor group in which a plurality of weighted unit capacitors are connected in parallel and a fourth capacitor group in which a plurality of unit capacitors are connected in parallel, the fourth capacitor group being connected in parallel with the third capacitor group, in which the first wiring layer and the second wiring layer are stacked such that the first A/D conversion circuit and the second A/D conversion circuit are disposed at overlapping positions.

Abstract: An imaging element includes: a plurality of pixels where each pixel is configured to generate an imaging signal; a noise eliminating circuit configured to eliminate a noise component included in the imaging signal; a plurality of column source follower buffers where each column source follower buffer is configured to amplify the imaging signal from which the noise component has been eliminated by the noise eliminating circuit, and output the amplified signal; a horizontal scanning circuit configured to sequentially select the column source follower buffer and output the imaging signal; and a buffer circuit which is connected with the column source follower buffer sequentially selected by the horizontal scanning circuit to form a voltage follower circuit, the buffer circuit being configured to perform impedance conversion on a voltage of the imaging signal output from the column source follower buffer, and output the converted signal to an outside.

Abstract: A signal processing system includes: a transmission channel; a common-mode signal transmitting circuit configured to output an uplink signal to the transmission channel in a common mode; a common-mode signal detecting circuit configured to detect a common-mode signal from the uplink signal transmitted by the transmission channel; a downlink reference clock signal generating circuit configured to generate a downlink reference clock signal at a second frequency with reference to the first clock edge of the common-mode signal detected by the common-mode signal detecting circuit; a downlink data generating circuit configured to generate downlink data; a differential signal transmitting circuit configured to output, as a downlink signal, the downlink data generated by the downlink data generating circuit to the transmission channel in a differential mode; and a differential signal receiving circuit configured to extract a differential signal from the downlink signal.

Abstract: A disclosed analog-to-digital converter includes; a sampling circuit to sample a pair of analog signals as a differential input signal; a binary capacitance holding the sampled pair of analog signals and reflecting a level of a reference signal to the analog signals through the binary capacitance to generate a pair of voltage signals; a comparator including a transistor to which the voltage signals are input, to compare one of the voltage signals with the other; a correction circuit provided previously to the comparator, to output to the comparator the pair of voltage signals in which voltage dependency of stray capacitance in the input transistor is cancelled; and a controller that successively determines a value of each bit of a digital signal corresponding to the binary capacitance based on a comparison by the comparison circuit, and reflects the value of each bit of the digital signal to the reference signal.

Abstract: A semiconductor device is provided that includes an amplification circuit, a downstream circuit, and a clipping circuit. The amplification circuit includes a sampling capacitor, a feedback capacitor, and an operational amplifier circuit. The sampling capacitor holds air input signal on which sampling is performed, as a signal whose reference is a first reference voltage. The signal that is held in the sampling capacitor is transferred to the feedback capacitor. The operational amplifier circuit amplifies the signal that is held in the sampling capacitor, according to a ratio between values of the sampling capacitor and the feedback capacitor, and outputs the amplified signal, as a signal whose reference is a second reference voltage. The clipping circuit limits a voltage of an output signal of the operational amplifier circuit to a predetermined voltage or below.

Abstract: A semiconductor device includes a pixel array, a plurality of column circuits, an amplifier, switch arrays of a first layer to an nth layer, and signal lines of the first layer to the nth layer. n is an integer of two or more. The switch array of an ith layer is disposed between the switch array of an (i+1)th layer and the amplifier. i is an integer of one or more and less than n. The signal line of the first layer is connected to the nth amplifier. The signal line of the nth layer is connected to the switch array of the nth layer. Each of the plurality of switches included in the switch array of the nth layer is connected to the column circuit.

Abstract: There is provided a method of driving a solid-state imaging device, the solid-state imaging device including a plurality of column circuits which are arranged for each column of pixels and an amplification and selection circuit configured to amplify a differential signal based on a column pixel signal and a column reset signal, the method including causing the amplification and selection circuit to perform at least two operations among a first operation of sampling the column pixel signal, a second operation of sampling the column reset signal, and a third operation of output the amplified differential signal in parallel in the same period; and causing components connected to different horizontal signal lines to perform operations corresponding to the first to third operation in that order, and causing the components to perform different operations in parallel in the same period with respect to the first to third operations.

Abstract: A successive approximation type A/D conversion circuit includes a first capacitor circuit, a second capacitor circuit, a plurality of comparison circuits, a determination circuit, and a control circuit. The determination circuit counts a first number of first state and a second number of second state with respect to a plurality of first digital signals output from the plurality of comparison circuits. The determination circuit outputs a control signal for stopping the plurality of comparison circuits to the control circuit when an absolute value of a difference between the first number and the second number is equal to or smaller than 1. The control circuit stops the plurality of comparison circuits on the basis of the control signal.

Abstract: An AD converter includes a first DAC circuit, a second DAC circuit, a comparison circuit, a control circuit, and a control switch. The comparison circuit is connected to a first output node of the first DAC circuit and a second output node of the second DAC circuit and compares an electric potential of the first output node with an electric potential of the second output node. The control circuit controls the first DAC circuit and the second DAC circuit in accordance with a result of the comparison acquired by the comparison circuit. The control switch controls turning on and off of connection between a first input node of the first DAC circuit and a second input node of the second DAC circuit.

Abstract: A noise removing circuit includes a capacitor, a buffer circuit, and a switch. The capacitor includes a first terminal and a second terminal. The buffer circuit includes a third terminal and a fourth terminal. The switch sets the capacitor and the buffer circuit to be in one of a first state and a second state. In the first state, the first terminal is connected to the fourth terminal, a reference voltage is input to the second terminal, and the third terminal is connected to the signal source. In the second state, the first terminal is connected to the signal source, and the second terminal is connected to the third terminal.

Abstract: In an AD converter, a first DAC circuit performs a first operation in parallel with a second operation performed by a second DAC circuit, and the first DAC circuit performs the second operation in parallel with the first operation performed by the second DAC circuit. In the first operation, electric charge corresponding to an input signal of the first DAC circuit or an input signal of the second DAC circuit is sampled. In the second operation, an AD conversion is sequentially performed on the basis of the electric charge sampled in the first operation. The first DAC circuit and the second DAC circuit alternately perform the first operation and the second operation.

Abstract: In an AD converter, a first capacitor DAC circuit performs a first operation in parallel with a second operation by a second capacitor DAC circuit, and the first capacitor DAC circuit performs the second operation in parallel with the first operation by the second capacitor DAC circuit. Electric charge corresponding to an input signal is sampled in the first operation. AD conversions are sequentially performed on the basis of the electric charge sampled in each first capacitor included in a plurality of first capacitors or each second capacitor included in a plurality of second capacitors in the second operation. The first capacitor DAC circuit and the second capacitor DAC circuit alternately perform the first operation and the second operation.

Abstract: An A/D converter includes: a first wiring layer including a first A/D conversion circuit including a first capacitor group in which a plurality of weighted unit capacitors are connected in parallel and a second capacitor group in which a plurality of unit capacitors are connected in parallel, the second capacitor group being connected in parallel with the first capacitor group; and a second wiring layer including a second A/D conversion circuit including a third capacitor group in which a plurality of weighted unit capacitors are connected in parallel and a fourth capacitor group in which a plurality of unit capacitors are connected in parallel, the fourth capacitor group being connected in parallel with the third capacitor group, in which the first wiring layer and the second wiring layer are stacked such that the first A/D conversion circuit and the second A/D conversion circuit are disposed at overlapping positions.

Abstract: A successive approximation type A/D conversion circuit includes a first capacitor circuit, a second capacitor circuit, a plurality of comparison circuits, a determination circuit, and a control circuit. The determination circuit counts a first number of first state and a second number of second state with respect to a plurality of first digital signals output from the plurality of comparison circuits. The determination circuit outputs a control signal for stopping the plurality of comparison circuits to the control circuit when an absolute value of a difference between the first number and the second number is equal to or smaller than 1. The control circuit stops the plurality of comparison circuits on the basis of the control signal.

Abstract: An image sensor includes n light receiving elements including first to n-th light receiving elements, each of the light receiving elements generating photoelectric conversion signals, n sequencers including first to n-th sequencers, each of the sequencers having both a sequencer input terminal to which a k-th horizontal control signal is input, and a sequencer output terminal from which a (k+1)-th horizontal control signal is output, and n switches including first to n-th switches, each of the switches having a switch input terminal to which a signal corresponding to the photoelectric conversion signal is input, a switch control terminal to which a k-th pixel control signal is input, and a switch output terminal which is electrically connected to the switch input terminal, wherein n is a natural number of 2 or more, and k is a natural number of 1 to n.

Abstract: There is provided a method of driving a solid-state imaging device, the solid-state imaging device including a plurality of column circuits which are arranged for each column of pixels and an amplification and selection circuit configured to amplify a differential signal based on a column pixel signal and a column reset signal, the method including causing the amplification and selection circuit to perform at least two operations among a first operation of sampling the column pixel signal, a second operation of sampling the column reset signal, and a third operation of output the amplified differential signal in parallel in the same period; and causing components connected to different horizontal signal lines to perform operations corresponding to the first to third operation in that order, and causing the components to perform different operations in parallel in the same period with respect to the first to third operations.

Abstract: In a semiconductor device, a first variable gain amplifier and a second variable gain amplifier constitute a switched capacitor type variable gain amplifier. A selection switch switches connection among the first variable gain amplifier, the second variable gain amplifier, and a load circuit such that the first variable gain amplifier and the load circuit are connected to each other when an amplification factor of the first variable gain amplifier is a predetermined gain or less, and the second variable gain amplifier is connected between the first variable gain amplifier and the load circuit when the amplification factor of the first variable gain amplifier is larger than the predetermined gain.

Abstract: A semiconductor device is provided that includes an amplification circuit, a downstream circuit, and a clipping circuit. The amplification circuit includes a sampling capacitor, a feedback capacitor, and an operational amplifier circuit. The sampling capacitor holds air input signal on which sampling is performed, as a signal whose reference is a first reference voltage. The signal that is held in the sampling capacitor is transferred to the feedback capacitor. The operational amplifier circuit amplifies the signal that is held in the sampling capacitor, according to a ratio between values of the sampling capacitor and the feedback capacitor, and outputs the amplified signal, as a signal whose reference is a second reference voltage. The clipping circuit limits a voltage of an output signal of the operational amplifier circuit to a predetermined voltage or below.

Abstract: In a semiconductor device, a first variable gain amplifier and a second variable gain amplifier constitute a switched capacitor type variable gain amplifier. A selection switch switches connection among the first variable gain amplifier, the second variable gain amplifier, and a load circuit such that the first variable gain amplifier and the load circuit are connected to each other when an amplification factor of the first variable gain amplifier is a predetermined gain or less, and the second variable gain amplifier is connected between the first variable gain amplifier and the load circuit when the amplification factor of the first variable gain amplifier is larger than the predetermined gain.

Abstract: A semiconductor device includes a pixel array, a plurality of column circuits, an amplifier, switch arrays of a first layer to an nth layer, and signal lines of the first layer to the nth layer. n is an integer of two or more. The switch array of an ith layer is disposed between the switch array of an (i+1)th layer and the amplifier. i is an integer of one or more and less than n. The signal line of the first layer is connected to the nth amplifier. The signal line of the nth layer is connected to the switch array of the nth layer. Each of the plurality of switches included in the switch array of the nth layer is connected to the column circuit.