Abstract: A LiDAR device according to an embodiment includes a rotating mirror having reflective surfaces, first/second light emitters each emitting light toward the rotating mirror, and first/second light receivers each receiving light reflected by the rotating mirror and converting the received light into an electrical signal. The first light emitter emits light in an orientation where an upper section of a distance measurement range is scanned. The second light emitter emits light in an orientation where a lower section of the distance measurement range is scanned. The first light receiver is provided at a position where light emitted by the first light emitter and reflected at the distance measurement range is received via the rotating mirror. The second light receiver is provided at a position where light emitted by the second light emitter and reflected at the distance measurement range is received via the rotating mirror.

Abstract: A gas detection device according to an embodiment includes a first light source irradiating infrared, a second light source irradiating visible light, a low-pass filter that transmits the infrared irradiated from the first light source, reflects the visible light irradiated from the second light source, and aligns an optical axis of the visible light with an optical axis of the infrared, a first retroreflector on which the infrared and the visible light having the aligned optical axes are incident, a first detecting part detecting the infrared reflected by the first retroreflector, and a scattering body located at a center of the first retroreflector.

Abstract: According to one embodiment, a transmitting device for a quantum key distribution system includes a light source, a beam splitter, an encoder, and a beam combiner. The light source is configured to generate an optical pulse. The beam splitter is configured to split the optical pulse into a signal pulse that travels through a first path and a polarization control pulse that travels through a second path, the second path being different in an optical path length from the first path. The encoder is provided at the first path and is configured to encode information with respect to the signal pulse. The beam combiner is configured to combine the signal pulse passing through the encoder and the polarization control pulse.

Abstract: According to one embodiment, a LIDAR system includes a laser oscillator, a collimator lens, a scan device, and a prism. The laser oscillator emits laser light. The collimator lens converts the laser light to parallel light. The scan device includes a reflective surface on which the laser light that has passed through the collimator lens is reflected, and a rotation device rotating the reflective surface around a rotation axis. The prism has a first surface and a second surface, and emits, from the second surface, the laser light that has been reflected on the reflective surface to enter the first surface.

Abstract: According to one embodiment, a distance measurement device includes a light projecting unit and a light receiving unit. The light projecting unit projects light to a target. The light receiving unit detects the light reflected by the target. The light projecting unit includes a light source emitting light, a first reflecting surface allowing the light to partially pass through the first reflecting surface, and a second reflecting surface facing the first reflecting surface and reflecting the light. The light is reflected a plurality of times by each of the first reflecting surface and the second reflecting surface.

Abstract: A distance measuring device includes a laser light source, an irradiation optical system comprising a beam spreader which is configured to spread the laser light about a first optical axis, a light reception optical system having a second optical axis different from the first optical axis and positioned to receive reflected light of the laser light from the object for measuring a distance to the object, a sensor with light receiving elements arranged in a first direction, the sensor being positioned to receive light reflected from the object which has passed through the light reception optical system, and a distance measuring unit configured to acquire distance information relating to the object based on the difference in time between emission of the laser light source and the reception of the reflected light at each of the plurality of light receiving elements.

Abstract: According to one embodiment, a quantum communication system includes a transmitting apparatus and a receiving apparatus. The transmitting apparatus includes a plurality of light sources configured to generate a plurality of optical pulses having different wavelengths, an encoder including a single first modulator configured to modulate the optical pulses to encode information, and a transmitting part configured to transmit an optical pulse train including the modulated optical pulses to the receiving apparatus. The receiving apparatus includes a receiving part configured to receive the optical pulse train from the transmitting apparatus, and a decoder configured to obtain information based on the received optical pulse train.

Abstract: According to one embodiment, a quantum communication system includes a transmitting apparatus and a receiving apparatus. The transmitting apparatus includes a plurality of light sources configured to generate a plurality of optical pulses having different wavelengths, an encoder including a single first modulator configured to modulate the optical pulses to encode information, and a transmitting part configured to transmit an optical pulse train including the modulated optical pulses to the receiving apparatus. The receiving apparatus includes a receiving part configured to receive the optical pulse train from the transmitting apparatus, and a decoder configured to obtain information based on the received optical pulse train.

Abstract: An inspection method and apparatus comprising, a step of reflecting linearly-polarized light having a predetermined wavelength using an non-polarizing beam splitter after transmitting the linearly-polarized light through a half-wave plate, irradiating a sample with the linearly-polarized light having a polarization plane of a predetermined angle, causing the light reflected by the sample to be incident to an image capturing sensor through a lens, the non-polarizing beam splitter, and an analyzer, and acquiring an optical image of a pattern formed on the sample; acquiring a plurality of optical images by changing an angle of the analyzer or the half-wave plate, and obtaining an angle of the analyzer or the half-wave plate such that a value of (?/?A) becomes a minimum; and a step of inspecting whether a defect of the pattern exists, wherein the pattern is a repetitive pattern having a period at a resolution limit or less.

Abstract: According to one embodiment, a transmitting device for a quantum key distribution system includes a light source, a beam splitter, an encoder, and a beam combiner. The light source is configured to generate an optical pulse. The beam splitter is configured to split the optical pulse into a signal pulse that travels through a first path and a polarization control pulse that travels through a second path, the second path being different in an optical path length from the first path. The encoder is provided at the first path and is configured to encode information with respect to the signal pulse. The beam combiner is configured to combine the signal pulse passing through the encoder and the polarization control pulse.

Abstract: An inspection apparatus comprising, an optical system emitting light having a predetermined wavelength, illuminating a sample while the light is converted into light having a polarization plane not in the range of ?5 degrees to 5 degrees and 85 degrees to 95 degrees with respect to a direction of a repetitive pattern on the sample, an optical system for acquiring an image and forming said image on an image sensor using a lens, a half-wave plate, a first image sensor, a second image sensor, an inspection analyzer, wherein these differ in a transmission axis direction, a processor that obtains an average gray level and a standard deviation in each predetermined unit region of the image, and a defect detector, wherein a resolution limit defined by a wavelength of the light source and a numerical aperture of the lens is a value in which the pattern is not resolved.

Abstract: An inspection method and apparatus comprising, a step of reflecting linearly-polarized light having a predetermined wavelength using an non-polarizing beam splitter after transmitting the linearly-polarized light through a half-wave plate, irradiating a sample with the linearly-polarized light having a polarization plane of a predetermined angle, causing the light reflected by the sample to be incident to an image capturing sensor through a lens, the non-polarizing beam splitter, and an analyzer, and acquiring an optical image of a pattern formed on the sample; acquiring a plurality of optical images by changing an angle of the analyzer or the half-wave plate, and obtaining an angle of the analyzer or the half-wave plate such that a value of (?/?A) becomes a minimum; and a step of inspecting whether a defect of the pattern exists, wherein the pattern is a repetitive pattern having a period at a resolution limit or less.

Abstract: An inspection method and apparatus comprising, a step of reflecting linearly-polarized light having a predetermined wavelength using an non-polarizing beam splitter after transmitting the linearly-polarized light through a half-wave plate, irradiating a sample with the linearly-polarized light having a polarization plane of a predetermined angle, causing the light reflected by the sample to be incident to an image capturing sensor through a lens, the non-polarizing beam splitter, and an analyzer, and acquiring an optical image of a pattern formed on the sample; acquiring a plurality of optical images by changing an angle of the analyzer or the half-wave plate, and obtaining an angle of the analyzer or the half-wave plate such that a value of (?/?A) becomes a minimum; and a step of inspecting whether a defect of the pattern exists, wherein the pattern is a repetitive pattern having a period at a resolution limit or less.

Abstract: A distance measuring device includes a laser light source, an irradiation optical system comprising a beam spreader which is configured to spread the laser light about a first optical axis, a light reception optical system having a second optical axis different from the first optical axis and positioned to receive reflected light of the laser light from the object for measuring a distance to the object, a sensor with light receiving elements arranged in a first direction, the sensor being positioned to receive light reflected from the object which has passed through the light reception optical system, and a distance measuring unit configured to acquire distance information relating to the object based on the difference in time between emission of the laser light source and the reception of the reflected light at each of the plurality of light receiving elements.

Abstract: An inspection method and apparatus comprising, a step of reflecting linearly-polarized light having a predetermined wavelength using an non-polarizing beam splitter after transmitting the linearly-polarized light through a half-wave plate, irradiating a sample with the linearly-polarized light having a polarization plane of a predetermined angle, causing the light reflected by the sample to be incident to an image capturing sensor through a lens, the non-polarizing beam splitter, and an analyzer, and acquiring an optical image of a pattern formed on the sample; acquiring a plurality of optical images by changing an angle of the analyzer or the half-wave plate, and obtaining an angle of the analyzer or the half-wave plate such that a value of (?/?A) becomes a minimum; and a step of inspecting whether a defect of the pattern exists, wherein the pattern is a repetitive pattern having a period at a resolution limit or less.

Abstract: An inspection method and apparatus comprising, a step of reflecting linearly-polarized light having a predetermined wavelength using an non-polarizing beam splitter after transmitting the linearly-polarized light through a half-wave plate, irradiating a sample with the linearly-polarized light having a polarization plane of a predetermined angle, causing the light reflected by the sample to be incident to an image capturing sensor through a lens, the non-polarizing beam splitter, and an analyzer, and acquiring an optical image of a pattern formed on the sample; acquiring a plurality of optical images by changing an angle of the analyzer or the half-wave plate, and obtaining an angle of the analyzer or the half-wave plate such that a value of (?/?A) becomes a minimum; and a step of inspecting whether a defect of the pattern exists, wherein the pattern is a repetitive pattern having a period at a resolution limit or less.

Abstract: An LED lighting device of embodiment comprising an LED light source which generates an ultraviolet light or a visible light, an axisymmetric transparent member which is provided over the light source and which is transparent to visible light, and an axisymmetric light scattering member disposed in the transparent member apart from the light source. A distance of closest approach L2 between the light source and the light scattering member, and an area C of a light emitting surface of the light source satisfy the settled relation. A length L1 of the light scattering member, and an absorption coefficient ? (1/mm) of the light scattering member satisfy the settled relation. A diameter d1 of the bottom surface of the light scattering member, the distance of closest approach L2, and a refractive index n of the transparent member satisfy the settled relation.

Abstract: According to one embodiment, a defect inspection device includes a first beam splitter configured to branch light into a first optical path and a second optical path, a first optical system on the first optical path, a second optical system on the second optical path, a first aperture configured to form an illumination field of an inspection sample by light from the first optical system, a second aperture configured to form an illumination field of the inspection sample by light from the second optical system, and a third optical system configured to illuminate, with a first illumination, an image of the first aperture on a first area of the inspection sample, and to illuminate, with a second illumination, an image of the second aperture on a second area of the inspection sample.

Abstract: According to an embodiment, a light beam scanner includes a first mirror and an angular magnification unit. The first mirror makes a normal direction of a reflecting surface change repeatedly. The angular magnification unit is configured to return, when viewed from a first direction, reflected light from the first mirror to the first mirror so that light is reflected at substantially the same points on the first mirror for a plural number of times, and increase, when viewed from the first direction, an angle each time light is reflected from the first mirror, the angle being between the normal direction of the reflecting surface and a reflection direction of light. Light is emitted from the angular magnification unit after the light is reflected from the first mirror for a predetermined number of times.

Abstract: According to one embodiment, a defect inspection device includes a first beam splitter configured to branch light into a first optical path and a second optical path, a first optical system on the first optical path, a second optical system on the second optical path, a first aperture configured to form an illumination field of an inspection sample by light from the first optical system, a second aperture configured to form an illumination field of the inspection sample by light from the second optical system, and a third optical system configured to illuminate, with a first illumination, an image of the first aperture on a first area of the inspection sample, and to illuminate, with a second illumination, an image of the second aperture on a second area of the inspection sample.