Patents by Inventor Masuyoshi Yamada
Masuyoshi Yamada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7882754Abstract: A gas component collector comprises a filter assembly 3 comprising an adsorbent and an adsorbent holding plate having a first face, a second face and a plurality of holes that are bored through from the first face to the second face and are filled with the adsorbent adsorbing at least one gas component to be analyzed, the filter assembly satisfying (AL?V)2/L3?0.003 mm3 and V/AL?0.3, where V is a total volume of the adsorbent, A is a sum of an opening areas of the holes, and L is an average length of the holes, and a holding container 2 housing the filter assembly 3. On at least one of the holding container 2 a first opening portion for introducing gas and a second opening portion for allowing the introduced gas to be discharged are formed.Type: GrantFiled: October 18, 2007Date of Patent: February 8, 2011Assignee: Hitachi, Ltd.Inventors: Masao Suga, Masuyoshi Yamada, Izumi Waki
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Publication number: 20090039250Abstract: In a mass spectrometer having ion sources capable of switching between atmospheric pressure chemical ionization and electron impact ionization, a first gas chromatography device capable of separating a sample to meet a condition suitable for atmospheric pressure chemical ionization measurement is connected to upstream of an atmospheric pressure chemical ionization ion source. Part of the sample separated by the first gas chromatography device is introduced to a second gas chromatography device by distributing a flow channel. In the second gas chromatography device, a target substance and background ingredients contained in the sample are further separated and are introduced to an electron impact ionization ion source. By separating the target substance from the background ingredients, an electron impact ionization spectrum of the target substance is obtained without an effect of the background ingredients.Type: ApplicationFiled: February 29, 2008Publication date: February 12, 2009Inventors: Masako ISHIMARU, Masuyoshi Yamada
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Patent number: 7420180Abstract: A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.Type: GrantFiled: January 30, 2007Date of Patent: September 2, 2008Assignee: Hitachi, Ltd.Inventors: Masuyoshi Yamada, Masao Suga, Izumi Waki
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Publication number: 20080128615Abstract: An analyzer carrying out analysis with a high degree of qualitative accuracy by separating impurities which hinder the analysis while analyzing in real time. An introducing tube is branched with one branched tube directly leading to an ion source for real time analysis. The other branched tube leads to the ion source so as to introduce the sample gas into the ion source at a later time. When a result of the real time analysis shows that a spectrum pattern on a MS spectrum is changed and an increase in the concentration of an impurity is observed, the introducing path for the sample gas is changed so that the sample gas is introduced into the ion source after the impurity is separated at the separation part.Type: ApplicationFiled: November 27, 2007Publication date: June 5, 2008Inventors: Masuyoshi Yamada, Masako Ishimaru
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Patent number: 7375316Abstract: A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.Type: GrantFiled: March 2, 2007Date of Patent: May 20, 2008Assignee: Hitachi, Ltd.Inventors: Masuyoshi Yamada, Masao Suga, Izumi Waki
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Publication number: 20080092629Abstract: A gas component collector comprises a filter assembly 3 comprising an adsorbent and an adsorbent holding plate having a first face, a second face and a plurality of holes that are bored through from the first face to the second face and are filled with the adsorbent adsorbing at least one gas component to be analyzed, the filter assembly satisfying (AL?V)2/L3?0.003 mm3 and V/AL?0.3, where V is a total volume of the adsorbent, A is a sum of an opening areas of the holes, and L is an average length of the holes, and a holding container 2 housing the filter assembly 3. On at least one of the holding container 2 a first opening portion for introducing gas and a second opening portion for allowing the introduced gas to be discharged are formed.Type: ApplicationFiled: October 18, 2007Publication date: April 24, 2008Inventors: Masao Suga, Masuyoshi Yamada, Izumi Waki
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Publication number: 20070181801Abstract: A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.Type: ApplicationFiled: January 30, 2007Publication date: August 9, 2007Inventors: Masuyoshi Yamada, Masao Suga, Izumi Waki
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Publication number: 20070181802Abstract: A mass spectrometer capable of measuring under switching two ion sources at different pressure levels in which a sample gas separated by GC column is branched, and separately introduced to a first ion source (for example, APCI ion source) and a second ion source (for example, EI ion source) at a pressure level lower than that of the first ion source respectively. Preferably, the flow rate of the sample gas introduced to the APCI ion source is made more than the flow rate of the sample gas introduced to the EI ion source, so that the pressure for each of the ion sources can be maintained and analysis can be conducted by each ionization at a good balance in view of the sensitivity.Type: ApplicationFiled: March 2, 2007Publication date: August 9, 2007Inventors: Masuyoshi Yamada, Masao Suga, Izumi Waki
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Publication number: 20060266353Abstract: For collecting a component of an exhaled air, a filter comprises an adsorbent for adsorbing the component of the exhaled air, and a collector body including a passage hole which the adsorbent is contained and through which the exhaled air is capable of passing.Type: ApplicationFiled: August 25, 2005Publication date: November 30, 2006Inventors: Masuyoshi Yamada, Masao Suga, Izumi Waki
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Patent number: 7064320Abstract: A mass spectrometer has an atmospheric pressure chemical ionization source that includes a first ionization portion including a needle electrode, for generating a primary ion by discharge of the needle electrode a primary ion introduction aperture, and a second ionization portion including an introduction aperture, for generating a sample ion by the reaction between the primary ion and the sample gas introduced from an end of a column of gas chromatography, a sample ion movement aperture; and a mass analysis portion; wherein the end is arranged at a position satisfying the relation r?2R where R is a radius of an inner diameter of the aperture and r is a distance between an axis connecting the center of the aperture and the center of the aperture, and the end.Type: GrantFiled: March 4, 2005Date of Patent: June 20, 2006Assignee: Hitachi, Ltd.Inventors: Masuyoshi Yamada, Izumi Waki, Hideo Kasima
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Publication number: 20060054806Abstract: A mass spectrometer has an atmospheric pressure chemical ionization source that includes a first ionization portion including a needle electrode, for generating a primary ion by discharge of the needle electrode a primary ion introduction aperture, and a second ionization portion including an introduction aperture, for generating a sample ion by the reaction between the primary ion and the sample gas introduced from an end of a column of gas chromatography, a sample ion movement aperture; and a mass analysis portion; wherein the end is arranged at a position satisfying the relation r?2R where R is a radius of an inner diameter of the aperture and r is a distance between an axis connecting the center of the aperture and the center of the aperture, and the end.Type: ApplicationFiled: March 4, 2005Publication date: March 16, 2006Inventors: Masuyoshi Yamada, Izumi Waki, Hideo Kasima
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Patent number: 6852970Abstract: There will be provided a mass spectrometer for detecting impurity in sample gas of a low flow rate. A mass spectrometer including: an atmospheric pressure chemical ionization source having a primary ionization part 28 for generating a primary ion by means of electric discharge of reagent gas, and a secondary ionization part 23 for generating an ion of the sample by a reaction of the primary ion and the sample; a mass spectrometric part 11 for performing mass spectrometric analysis of the ion generated; a mixing portion 33 for mixing the sample to be introduced into the secondary ionization part with dilution gas; and a mean 30 for controlling a flow rate of the dilution gas for flowing through the mixing portion; and a mean 12-1 or 12-2 or 12-3 for controlling a flow rate of the sample gas, wherein mixed gas obtained by mixing the sample with the dilution gas is introduced into the secondary ionization part and the sample is ionized.Type: GrantFiled: November 4, 2003Date of Patent: February 8, 2005Assignee: Hitachi, Ltd.Inventors: Masuyoshi Yamada, Izumi Waki
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Patent number: 6840120Abstract: An explosive detection system includes an X-ray inspection apparatus, a mover for moving an object to be inspected to the X-ray inspection apparatus, a sample introduction probe for sampling a gas sample from the object to be inspected, a pipe for introducing the sampled gas into a corona discharge region and for subjecting the sampled gas to negative corona discharge to ionize the sampled gas and to generate negative ions. A mass spectrometer is provided to analyze the mass of the negative ions of the sampled gas and to provide results thereof. Inspection by the X-ray inspection apparatus is performed in relation to sampling of the gas sample, and explosive detection system inspects whether or not an explosive is present in the object to be inspected, from the analysis results of the sampled gas.Type: GrantFiled: May 22, 2003Date of Patent: January 11, 2005Assignee: Hitachi, Ltd.Inventors: Minoru Sakairi, Masao Suga, Yuichiro Hashimoto, Masuyoshi Yamada
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Patent number: 6838664Abstract: An ion source using a corona discharge for ionizing a sample at high efficient is provided. In the corona discharge generated at a tip end of a needle electrode by application of high voltage thereto, the direction in which the sample is introduced to the region of corona discharge and the direction in which ions are drawn out of the corona discharge region are substantially opposed to each other to improve the efficiency of ionization and to maintain a stable discharge for a long period of time.Type: GrantFiled: September 2, 2003Date of Patent: January 4, 2005Assignee: Hitachi, Ltd.Inventors: Minoru Sakairi, Yuichiro Hashimoto, Masuyoshi Yamada, Masao Suga, Kyoko Kojima
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Publication number: 20040104342Abstract: There will be provided a mass spectrometer for detecting impurity in sample gas of a low flow rate. A mass spectrometer including: an atmospheric pressure chemical ionization source having a primary ionization part 28 for generating a primary ion by means of electric discharge of reagent gas, and a secondary ionization part 23 for generating an ion of the sample by a reaction of the primary ion and the sample; a mass spectrometric part 11 for performing mass spectrometric analysis of the ion generated; a mixing portion 33 for mixing the sample to be introduced into the secondary ionization part with dilution gas; and a mean 30 for controlling a flow rate of the dilution gas for flowing through the mixing portion; and a mean 12-1 or 12-2 or 12-3 for controlling a flow rate of the sample gas, wherein mixed gas obtained by mixing the sample with the dilution gas is introduced into the secondary ionization part and the sample is ionized.Type: ApplicationFiled: November 4, 2003Publication date: June 3, 2004Applicant: Hitachi., Ltd.Inventors: Masuyoshi Yamada, Izumi Waki
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Publication number: 20040036020Abstract: An ion source using a corona discharge for ionizing a sample at high efficient is provided. In the corona discharge generated at a tip end of a needle electrode by application of high voltage thereto, the direction in which the sample is introduced to the region of corona discharge and the direction in which ions are drawn out of the corona discharge region are substantially opposed to each other to improve the efficiency of ionization and to maintain a stable discharge for a long period of time.Type: ApplicationFiled: September 2, 2003Publication date: February 26, 2004Inventors: Minoru Sakairi, Yuichiro Hashimoto, Masuyoshi Yamada, Masao Suga, Kyoko Kojima
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Patent number: 6686592Abstract: An ion source using a corona discharge for ionizing a sample at high efficient is provided. In the corona discharge generated at a tip end of a needle electrode by application of high voltage thereto, the direction in which the sample is introduced to the region of corona discharge and the direction in which ions are drawn out of the corona discharge region are substantially opposed to each other to improve the efficiency of ionization and to maintain a stable discharge for a long period of time.Type: GrantFiled: September 18, 2000Date of Patent: February 3, 2004Assignee: Hitachi, Ltd.Inventors: Minoru Sakairi, Yuichiro Hashimoto, Masuyoshi Yamada, Masao Suga, Kyoko Kojima
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Publication number: 20040016310Abstract: An explosive detection system includes an X-ray inspection apparatus, a mover for moving an object to be inspected to the X-ray inspection apparatus, a sample introduction probe for sampling a gas sample from the object to be inspected, a pipe for introducing the sampled gas into a corona discharge region and for subjecting the sampled gas to negative corona discharge to ionize the sampled gas and to generate negative ions. A mass spectrometer is provided to analyze the mass of the negative ions of the sampled gas and to provide results thereof. Inspection by the X-ray inspection apparatus is performed in relation to sampling of the gas sample, and explosive detection system inspects whether or not an explosive is present in the object to be inspected, from the analysis results of the sampled gas.Type: ApplicationFiled: May 22, 2003Publication date: January 29, 2004Inventors: Minoru Sakairi, Masao Suga, Yuichiro Hashimoto, Masuyoshi Yamada
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Patent number: 6677582Abstract: An apparatus for detecting the minor constituents of a sample with high efficiency in positive and negative ion monitoring modes. The directions in which the sample gas is forced to flow in the ionized region within the ion source are properly switched in the positive and negative ion monitoring modes, respectively, thereby enabling both positive ions and negative ions to be detected with high sensitivity.Type: GrantFiled: August 30, 2001Date of Patent: January 13, 2004Assignee: Hitachi, Ltd.Inventors: Masuyoshi Yamada, Yasuaki Takada, Masao Suga
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Patent number: 6639215Abstract: To provide a mass spectrometer having a high sensitivity to dioxins. In the mass spectrometer including: a sample supply tube for supplying a sample solution containing a sample to be measured; a nebulizer for nebulizing the sample solution supplied from the sample supply tube; an ion source having a needle electrode for ionizing the sample nebulized and vaporized in the nebulizer; and a mass analyzer for analyzing ions formed in the ion source, and a gas of a flow rate corresponding to the flow rate of the sample solution is mixed to the vaporized sample, and a moving direction of the sample is made opposite to a moving direction of ions at a tip of the needle electrode.Type: GrantFiled: January 24, 2002Date of Patent: October 28, 2003Assignee: Hitachi, Ltd.Inventors: Yasuaki Takada, Masuyoshi Yamada, Masao Suga, Yuichiro Hashimoto