Abstract: An apparatus relating generally to an error detection system is disclosed. The apparatus includes a first data bus and a second data bus. A first circuit is coupled for communication via the first data bus. A plurality of storage elements are coupled to the first data bus and the second data bus. A second circuit is coupled for communication via the second data bus. The error detection system is coupled to the first data bus and the second data bus. The error detection system is coupled to compare first data on the first data bus with corresponding second data on the second data bus. The error detection system is configured to generate an error signal responsive to mismatch between the first data and the second data.

Abstract: In a method for buffering, a buffer buffers data responsive to read and write clock signals. A flag signal from the buffer is for a fill level thereof. The flag signal is toggled responsive to the data buffered being either above or below a set point for the fill level. A phase of the write clock signal is adjusted to a phase of the read clock signal responsive to the toggling of the flag signal. The write clock signal is used to control latency of the buffer. The adjusting of the phase of the write clock signal includes: generating an override signal responsive to the toggling of the flag signal; and inputting the read clock signal and the override signal to a phase adjuster to controllably adjust the phase of the write clock signal to the phase of the read clock signal during operation.

Abstract: Estimating power consumption of a circuit design includes associating, using a processor, each partition of a plurality of partitions of a circuit design with a probability distribution (315). For each partition, the associated probability distribution specifies a distribution for a probability distribution parameter correlated with power consumption for the partition. Using the processor, an output probability distribution specifying power consumption of the circuit design can be calculated according to the probability distribution of each partition of the circuit design (320).

Abstract: An embodiment of a memory module is disclosed. This memory module is a configurable hard macro. A portion of this memory module includes a data input multiplexer coupled to select between cascaded data and direct/bused data. Such portion further includes, a memory coupled to receive output from the data input multiplexer for storage therein, and a register input multiplexer coupled to select between read data from the memory and the cascaded data. This memory module further includes: a register coupled to receive output from the register input multiplexer, a latch/register mode multiplexer coupled to select between the read data from the memory and registered data from the register, and a data output multiplexer coupled to select between the cascaded data and output from the latch/register mode multiplexer to provide output data.

Abstract: A method and circuit for device specific configuration of an operating voltage is provided. A circuit design is analyzed to determine a maximum gate-level delay for the circuit design. A minimum voltage value corresponding to the maximum gate-level delay is determined along with a default voltage value corresponding to a default gate-level delay. A voltage scaling factor corresponding to the minimum voltage and default voltage values is determined. The circuit design is synthesized such that the synthesized design includes the voltage scaling value. The synthesized design specifies setting an operating voltage to a value of a startup voltage value scaled by the voltage scaling value.

Abstract: In the disclosed methods, integrated circuit (IC) dice are manufactured from a common specification, and the IC dice are tested for defective circuitry. Respective defect sets are generated to indicate defective circuitry in the IC die. The dice are assigned to bins based on the respective defect sets. For each bin, all IC dice assigned to the bin have equivalent respective defect sets. Product definitions are provided, and each product definition indicates a respective set of circuitry required for a corresponding product. Respective sets of packages are manufactured for each product. In the manufacturing of each package of a respective set of packages for each product, one or more IC dice are selected from a subset of the plurality of bins such that the IC dice have respective defect sets allowed by the product definition of the product. The selected IC dice are then manufactured into the package.

Abstract: A semiconductor package includes an interposer and a plurality of integrated circuit (IC) dice disposed on and intercoupled via the interposer. A first IC die has a clock speed rating that is greater than a clock speed rating of another of the IC dice. A plurality of programmable voltage tuners are coupled to the plurality of IC dice, respectively. A first voltage tuner is coupled to the first IC die, and the first voltage tuner is programmed to reduce a voltage level of voltage input to the first voltage tuner and output the reduced voltage to the first IC die.

Abstract: Reducing jitter in a circuit design includes selecting a plurality of circuit elements of a circuit design clocked using a first clock signal and assigning, using a processor, the plurality of circuit elements to different ones of a plurality of groups according to a balancing criterion. The circuit elements assigned to a first group of the plurality of groups are clocked using the first clock signal. The circuit elements assigned to a second group of the plurality of groups are clocked using a second clock signal different from the first clock signal.

Abstract: An embodiment of an apparatus includes a detector to receive a first input signal and a second input signal to provide a first error signal and a second error signal. A pulse width determination block receives the first and second error signals, as well as a digital oscillating signal, to output a first pulse width value and a second pulse width value, respectively. A pulse width accumulator accumulates the first and second pulse width values responsive to at least one cycle of the digital oscillating signal to provide a first accumulated value and a second accumulated value. An error generator provides an error value as a difference between the first accumulated value and the second accumulated value. The error value represents a pulse width difference between the first input signal and the second input signal indicative of a phase difference between the first input signal and the second input signal.

Abstract: A circuit can include address evaluation circuitry coupled to an address bus of a memory and configured to generate a first control signal responsive to determining that an address on the address bus has not changed for a current clock cycle from a previous clock cycle. The circuit can include write enable evaluation circuitry coupled to the memory and configured to generate a second control signal responsive to determining that a write enable signal of the memory is de-asserted for the current clock cycle and for the previous clock cycle. The circuit can include clock enable circuitry coupled to a clock enable port of the memory and configured to generate a clock enable signal to the clock enable port of the memory responsive to the first control signal and the second control signal.

Abstract: A method for determining a critical junction temperature for a user-design implemented in a field programmable gate array (programmable device), includes: obtaining a static power vs. temperature curve for the user-design implemented in the programmable device; obtaining a system thermal curve for the user-design implemented in the programmable device; and using the static power vs. temperature curve for the user-design implemented in the programmable device and the system thermal curve for the user-design implemented in the programmable device to determine the critical junction temperature.

Abstract: A circuit generates an output clock signal synchronized to an input clock signal. The circuit includes a reference clock port, a phase interpolator, and a phase controller. The reference clock port receives a reference clock signal. The phase interpolator generates the output clock signal that, as a function of a variable control value, is an interpolation between two reference phases. The reference phases are generated from the reference clock signal and have a reference frequency. The phase controller generates the variable control value providing a phase rotation rate. An output frequency of the output clock signal equals a sum of the reference frequency and the phase rotation rate. The output frequency matches an input frequency of the input clock signal.

Abstract: A method, non-transitory computer readable medium, and apparatus for performing single event upset detection and correction are disclosed. For example, the method comprises: setting, by a processor, at least one starting address for each of a plurality of rows of a design for an integrated circuit, setting, by the processor, at least one ending address for each of the plurality of rows of the design, and performing, by the processor, the single event upset detection and correction scan in parallel, from the at least one starting address for each of the plurality of rows to the at least one ending address for each of the plurality of rows.

Abstract: A memory structure can include a first memory block including a plurality of memory cells corresponding to a first subset of addresses of a range of addresses and a second memory block including a plurality of memory cells corresponding to a second subset of addresses of the range of addresses. The memory structure can include control circuitry coupled to the first memory block and the second memory block and configured to provide control signals to the first memory block and the second memory block. The first memory block and the second memory block can be configured to implement a reduced power mode independently of one another responsive to the control signals.

Abstract: Dynamic power savings and efficient use of resources are achieved in a programmable logic device (PLD) such as a field programmable gate array (FPGA) or complex programmable logic device (CPLD) by receiving a design netlist specifying a circuit including clock signals, clock buffers, clock enable signals and synchronous elements, examining the design netlist to identify synchronous elements coupled to common clock and clock enable signals, cutting the clock signals to the synchronous elements to form a modified design netlist, inserting gated clock buffers into the modified netlist to output gated clock signals to the synchronous elements, responsive to the clock enable signals, and performing placement and routing on the modified netlist. A system for performing the method on an EDA tool is provided. The methods may be provided as executable instructions stored on a computer readable medium which cause a programmable processor to perform the methods.

Abstract: Circuits and methods for facilitating distribution of gated clocks in a programmable integrated circuit such as a field programmable gate array (FPGA) are described. Dynamic power savings are achieved in a FPGA by providing gated clock driver circuitry at various places in a hierarchical clock distribution network. The gated clock circuitry provides a clock signal gated by an enable signal to clocked elements. Configurable logic blocks (CLBs) comprising the clocked elements and programmable interconnect tiles are disposed in the gate array. Clock signals are distributed to the CLBs via a clock distribution network. Clock enable signals are provided corresponding to some of the clock signals. Clock buffers or drivers are provided within the clock distribution network that drive gated clock signals to CLBs. By disabling certain clocked elements using one or more embodiments of the invention when portions of the FPGA are inactive, dynamic power consumption is reduced.

Abstract: A method and circuit for device specific configuration of an operating voltage is provided. A circuit design is analyzed to determine a maximum gate-level delay for the circuit design. A minimum voltage value corresponding to the maximum gate-level delay is determined along with a default voltage value corresponding to a default gate-level delay. A voltage scaling factor corresponding to the minimum voltage and default voltage values is determined. The circuit design is synthesized such that the synthesized design includes the voltage scaling value. The synthesized design specifies setting an operating voltage to a value of a startup voltage value scaled by the voltage scaling value.

Abstract: A circuit has a programmable mode control section, and a receiver section with first and second input terminals and an output terminal. The method and apparatus involve setting the mode control section to one of first and second states in response to user input, and operating the receiver section in first and second operational mode when the mode control section respectively has the first and second states, wherein in the first operational mode the receiver section provides higher performance and consumes more power than in the second operational mode.

Abstract: An embodiment of a method for operation of an input/output block is disclosed. For this embodiment of the method, a first attribute is set for a first disable signal for an input driver. A first tri-state condition is removed from an output driver. In response to the removing of the first tri-state condition, the input driver is placed in a second tri-state condition.

Abstract: An input/output (I/O) structure includes a delay element usable for the input path, the output path, or both input and output paths in a user design. In a first mode, the delay element is included in the input path. In a second mode, the delay element is included in the output path. In a third mode, the I/O structure includes the delay in both outgoing signal paths and incoming signal paths, e.g., by utilizing an output tristate signal to control the direction of the delay line. When the output buffer is driving, the delay is inserted in the output path. When the output buffer is tristated, the delay is inserted in the input path. Thus, a single delay element is dynamically shared by both input and output signals that use the same I/O pad. In an optional fourth mode, the delay element is bypassed by both input and output signals.