Patents by Inventor Matthieu Richard
Matthieu Richard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12248255Abstract: A system for measuring the difference between a property of a first target and a property of a second target, the system comprising a first member and a second member, wherein the first member comprises a first pattern, and the speed of rotation of the first member is configured to be based on the property of the first target; and the second member comprises a second pattern wherein, the speed of rotation of the second member is configured to be based on the property of the second target, further wherein the first and second pattern are angularly-varying and are configured to generate an interference pattern by their interaction when the first and second members have a relative difference in their rotational speeds, the interference pattern being indicative of the magnitude of this difference.Type: GrantFiled: March 9, 2021Date of Patent: March 11, 2025Assignee: ASML NETHERLANDS B.V.Inventors: Hubert Matthieu Richard Steijns, Pulkit Aggarwal
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Publication number: 20230415491Abstract: A method for aligning printing heads (12) of a printing device is provided, the printing heads (12) being two-dimensional printing heads (12) comprising a plurality of nozzles (30). In one method step, an ink drop is dispensed at a plurality of nozzles (30) of every printing head (12) simultaneously to print an image, preferably at all nozzles (30) of every printing head (12). In another step, the printed image is captured by a camera (20) whose resolution may be smaller than the print resolution. The position and/or orientation of each of the printing heads (12) is determined based on the image captured by the camera (20) and the deviation of the position and/or orientation of each printing head (12) from a target position and/or orientation is determined. The position and/or the orientation of the printing heads (12) is adjusted based on the determined deviation. Moreover, a printing device (10) is provided.Type: ApplicationFiled: June 21, 2023Publication date: December 28, 2023Applicant: BOBST MEX SAInventor: Matthieu RICHARD
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Publication number: 20230415492Abstract: A method for fine adjustment of the position of ink drops printed by at least one printing head (12) of a printing device, the printing head (12) being a two-dimensional printing head (12) comprising a plurality of nozzles (30). In one method step, an ink drop is dispensed at a plurality of nozzles (30) of the at least one printing head (12) simultaneously to print an image, preferably at all nozzles (30) of the printing head (12). In another method step, the printed image is captured by a camera (20), wherein the camera (20) captures the pattern of dots printed by the printing head (12) and the captured pattern is compared to a pattern (36) of the nozzles (30) of the printing head (12).Type: ApplicationFiled: June 21, 2023Publication date: December 28, 2023Applicant: BOBST MEX SAInventor: Matthieu RICHARD
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Publication number: 20230152718Abstract: A system for measuring the difference between a property of a first target and a property of a second target, the system comprising a first member and a second member, wherein the first member comprises a first pattern, and the speed of rotation of the first member is configured to be based on the property of the first target; and the second member comprises a second pattern wherein, the speed of rotation of the second member is configured to be based on the property of the second target, further wherein the first and second pattern are angularly-varying and are configured to generate an interference pattern by their interaction when the first and second members have a relative difference in their rotational speeds, the interference pattern being indicative of the magnitude of this difference.Type: ApplicationFiled: March 9, 2021Publication date: May 18, 2023Applicant: ASML Netherlands B.V.Inventors: Hubert Matthieu Richard STEIJNS, Pulkit AGGARWAL
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Patent number: 11448501Abstract: An image capturing system (10), and a corresponding method, for determining the position of an embossed structure (30) on a sheet element (4) moved though a viewing area (18). It includes a camera (12) adapted for capturing a line image of the surface of the sheet element (4) in the viewing area (18), and an illumination unit (14) with a plurality of light sources (20, 21, . . . ) each adapted for illuminating the viewing area (18). The light sources (20, 21, . . . ) are arranged at different inclinations with respect to the viewing area (18). An image evaluation unit (16) determines an inclination-related parameter for the surface of the sheet element (4) in the viewing area (18) across the viewing area (18).Type: GrantFiled: May 17, 2017Date of Patent: September 20, 2022Inventors: Matthieu Richard, Francis Pilloud
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Patent number: 11169095Abstract: A surface inspection system for inspecting the surface of sheet elements present in an inspection area: The system includes two light sources arranged adjacent each other on opposite sides of an illumination plane, and a camera for capturing line images of the inspection area along a viewing plane. The illumination plane and the viewing plane are arranged on opposite sides of a median plane perpendicular to an inspection plane. The angle between the illumination plane and the median plane is the same as the angle between the viewing plane and the median plane. In a method of using the system, the first light source illuminates the sheet element before the second light sources does. An image evaluation unit compares the captured line images with each other.Type: GrantFiled: May 29, 2017Date of Patent: November 9, 2021Inventors: Matthieu Richard, Francis Pilloud
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Patent number: 11022553Abstract: A surface inspection system (10) for inspecting the surface of sheet elements (4) present in an inspection area (20). The system includes an image evaluation unit (18), a camera (12), a dark-field illuminator (14) and a bright-field illuminator (16). The image evaluation unit (18) subtracts a line image captured under bright-field illumination conditions from a line image captured under dark-field illumination conditions.Type: GrantFiled: May 29, 2017Date of Patent: June 1, 2021Inventors: Matthieu Richard, Francis Pilloud
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Patent number: 10571405Abstract: A quality control station (2) for a sheet element processing machine, having at least one camera (6) arranged for capturing images of sheet elements (4) transported through the quality control station (2), and further having an illumination unit (5) with at least one light emitter (16) and two reflectors (12, 14), the illumination unit (5) directing light onto a viewing area of the camera (6) such that the illumination intensity is constant despite changing media thickness. An illumination unit for such quality control station is disclosed.Type: GrantFiled: May 17, 2017Date of Patent: February 25, 2020Assignee: BOBST MEX SAInventors: Matthieu Richard, Francis Pilloud
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Publication number: 20190178812Abstract: A surface inspection system (10) for inspecting the surface of sheet elements (2) present in an inspection area (5): The system includes an image evaluation unit (18), two light sources (12, 14) arranged adjacent each other on opposite sides of an illumination plane (O11) and oriented for illuminating the inspection area (5), and a camera (16) for capturing line images (I12, I14) of the inspection area (5) along a viewing plane (O16). The illumination plane (O11) and the viewing plane (O16) are arranged on opposite sides of a median plane (M) which is perpendicular to an inspection plane. The angle (?) between the illumination plane (O11) and the median plane (M) is the same as the angle (?) between the viewing plane (O16) and the median plane (M).Type: ApplicationFiled: May 29, 2017Publication date: June 13, 2019Applicant: BOBST MEX SAInventors: Matthieu RICHARD, Francis PILLOUD
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Publication number: 20190154589Abstract: A quality control station (2) for a sheet element processing machine, having at least one camera (6) arranged for capturing images of sheet elements (4) transported through the quality control station (2), and further having an illumination unit (5) with at least one light emitter (16) and two reflectors (12, 14), the illumination unit (5) directing light onto a viewing area of the camera (6) such that the illumination intensity is constant despite changing media thickness. An illumination unit for such quality control station is disclosed.Type: ApplicationFiled: May 17, 2017Publication date: May 23, 2019Inventors: Matthieu RICHARD, Francis PILLOUD
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Publication number: 20190154578Abstract: A surface inspection system (10) for inspecting the surface of sheet elements (4) present in an inspection area (20). The system includes an image evaluation unit (18), a camera (12), a dark-field illuminator (14) and a bright-field illuminator (16). The image evaluation unit (18) subtracts a line image captured under bright-field illumination conditions from a line image captured under dark-field illumination conditions.Type: ApplicationFiled: May 29, 2017Publication date: May 23, 2019Inventors: Matthieu RICHARD, Francis PILLOUD
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Publication number: 20190145760Abstract: An image capturing system (10), and a corresponding method, for determining the position of an embossed structure (30) on a sheet element (4) moved though a viewing area (18). It includes a camera (12) adapted for capturing a line image of the surface of the sheet element (4) in the viewing area (18), and an illumination unit (14) with a plurality of light sources (20, 21, . . . ) each adapted for illuminating the viewing area (18). The light sources (20, 21, . . . ) are arranged at different inclinations with respect to the viewing area (18). An image evaluation unit (16) determines an inclination-related parameter for the surface of the sheet element (4) in the viewing area (18) across the viewing area (18).Type: ApplicationFiled: May 17, 2017Publication date: May 16, 2019Inventors: Matthieu RICHARD, Francis PILLOUD
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Patent number: 10268128Abstract: A lithographic apparatus comprising an illumination system configured to condition a radiation beam, a support structure constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate table constructed to hold a substrate, and a projection system configured to project the patterned radiation beam onto the substrate, the lithographic apparatus being provided with a first cooling fluid circuit which is configured to cool components to a first temperature, and provided with a second cooling fluid circuit which is configured to cool components to a second temperature that is lower than the first temperature.Type: GrantFiled: June 14, 2016Date of Patent: April 23, 2019Assignee: ASML Netherlands B.V.Inventors: Franciscus Johannes Joseph Janssen, Johannes Paul Marie De La Rosette, Edwin Cornelis Kadijk, Nicolas Alban Lallemant, Jan Liefooghe, Markus Rolf Werner Matthes, Marcel Johannus Elisabeth Hubertus Muitjens, Hubert Matthieu Richard Steijns, André Gillis Van De Velde, Marinus Aart Van Den Brink
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Publication number: 20180196361Abstract: A lithographic apparatus comprising an illumination system configured to condition a radiation beam, a support structure constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate table constructed to hold a substrate, and a projection system configured to project the patterned radiation beam onto the substrate, the lithographic apparatus being provided with a first cooling fluid circuit which is configured to cool components to a first temperature, and provided with a second cooling fluid circuit which is configured to cool components to a second temperature that is lower than the first temperature.Type: ApplicationFiled: June 14, 2016Publication date: July 12, 2018Applicant: ASML Netherlands B.V.Inventors: Franciscus Johannes Joseph JANSSEN, Johannes Paul Marie DE LA ROSETTE, Edwin Cornelis KADIJK, Nicolas Alban LALLEMANT, Jan LIEFOOGHE, Markus Rolf Werner MATTHES, Marcel Johannus Elisabeth MUITJENS, Hubert Matthieu Richard STEIJNS, André Gillis VAN DE VELDE, Marinus Aart VAN DEN BRINK
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Patent number: 8675554Abstract: A wireless communication device is operable to perform neighbor cell analysis functions while operating in a continuous packet connectivity (CPC) mode and without requiring dedicated time periods for performing the neighbor cell analysis functions as part of a discontinuous reception (DRX) phase of the CPC mode. The DRX phase includes discontinuous (e.g., periodic) time periods for monitoring a downlink control channel from a serving base station. A receiver of the wireless communication device receives a control signal over the downlink control channel during each time period of the discontinuous time periods. A processor of the wireless communication device performs a portion of a neighbor cell analysis function during each time period of a quantity of the discontinuous time periods to produce neighbor cell analysis data. The processor accumulates the neighbor cell analysis data over the quantity of time periods to complete the neighbor cell analysis function.Type: GrantFiled: November 8, 2010Date of Patent: March 18, 2014Assignee: Intel CorporationInventors: Matthieu Richard Joachim Baglin, Marek J. Gil
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Patent number: 8611022Abstract: An optical receiver lens has a three-dimensional lens surface, for receiving the laser radiation of a laser distance measuring device, said laser radiation being reflected at an object, wherein the receiver lens can be described in a three-dimensional coordinate system having three axes x, y, z arranged at right angles with respect to one another and wherein the z-axis coincides with the optical axis of the receiver lens. At least one non-spherical area section of the lens surface can be described by addition of a first area, the flexure of which along the z-axis is a first function (f1) of x and y, in particular of (I) and a second area, the flexure of which along the z-axis is a second function (f2) of x and not of y. A distance measuring device is also described.Type: GrantFiled: October 20, 2009Date of Patent: December 17, 2013Assignee: Robert Bosch GmbHInventors: Matthieu Richard, Cedric Pahud, Bjoern Haase
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Patent number: 8395759Abstract: The invention relates to a device for optical distance measurement, particularly to a handheld device, comprising a transmission unit (12) with a light source (17, 18) for emitting optical measurement radiation (13, 20, 22) onto a target object (15), and comprising a receiving unit (14) arranged at a distance from the optical axis (38) of the transmission unit (12) and equipped with at least one optical detector (54) for receiving optical radiation (16, 49, 50) reflected from the target object (15). According to the invention, the detector (54) of the receiving unit (14) comprises a detection surface (66), the optical surface of which has varying optical sensitivity.Type: GrantFiled: October 14, 2008Date of Patent: March 12, 2013Assignee: Robert Bosch GmbHInventors: Peter Wolf, Matthieu Richard, Andreas Braun, Joerg Stierle, Bjoern Haase, Kai Renz
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Publication number: 20120127480Abstract: A device for analyzing the topography of a surface (2) of a substrate (1) travelling on a substantially planar course with axes X, Y and Z defining an orthonormal frame of reference of the space. The surface (2) is substantially parallel to the plane XY. A device (10) for structured lighting of the surface (2) engages with a device (20) for measuring light backscattered by the surface (2) in order to analyze topography of the surface(2) during travel of the substrate (1). The lighting device (10) projecting a light beam (F) with an angle of incidence ‘a’ onto the surface (2), to form a plurality ‘n’ of luminous streaks (S1, S2, . . . Sn) thereon. Each luminous streak (S) forms an angle ‘b’ with the axis X1. The measurement device (20) includes a linear camera located in a plane P secant to the plane XY and the plane XZ, the intersection of the plane P with the plane XY forming angles.Type: ApplicationFiled: July 16, 2010Publication date: May 24, 2012Applicant: BOBST SAInventors: Francis Pilloud, Matthieu Richard, Benoît Rosset
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Publication number: 20120113825Abstract: A wireless communication device is operable to perform neighbor cell analysis functions while operating in a continuous packet connectivity (CPC) mode and without requiring dedicated time periods for performing the neighbor cell analysis functions as part of a discontinuous reception (DRX) phase of the CPC mode. The DRX phase includes discontinuous (e.g., periodic) time periods for monitoring a downlink control channel from a serving base station. A receiver of the wireless communication device receives a control signal over the downlink control channel during each time period of the discontinuous time periods. A processor of the wireless communication device performs a portion of a neighbor cell analysis function during each time period of a quantity of the discontinuous time periods to produce neighbor cell analysis data. The processor accumulates the neighbor cell analysis data over the quantity of time periods to complete the neighbor cell analysis function.Type: ApplicationFiled: November 8, 2010Publication date: May 10, 2012Inventors: Matthieu Richard Joachim Baglin, Marek J. Gil
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Publication number: 20120013918Abstract: An optical receiver lens has a three-dimensional lens surface, for receiving the laser radiation of a laser distance measuring device, said laser radiation being reflected at an object, wherein the receiver lens can be described in a three-dimensional coordinate system having three axes x, y, z arranged at right angles with respect to one another and wherein the z-axis coincides with the optical axis of the receiver lens. At least one non-spherical area section of the lens surface can be described by addition of a first area, the flexure of which along the z-axis is a first function (f1) of x and y, in particular of (I) and a second area, the flexure of which along the z-axis is a second function (f2) of x and not of y. A distance measuring device is also described.Type: ApplicationFiled: October 20, 2009Publication date: January 19, 2012Applicant: Robert Bosch GmbHInventors: Matthieu Richard, Cedrie Pahud, Bjoern Haase