Abstract: The present invention provides methods for detecting and correcting transmission errors in inter-router links of Network-on-Chip (NoC) architectures. A NoC has repeaters along its bus lines. The output of a main repeater is compared and multiplexed with the output of a shadow repeater. If these outputs are the same the multiplexer outputs the output of the main repeater, otherwise an error is detected and the multiplexer outputs the output of the shadow repeater.

Abstract: The present invention provides methods for connecting routers and transmitting data along inter-router links within Nework-on-Chip (NoC) architectures.

Abstract: An Integrated Circuit Design tool incorporating a Stochastic Analysis Process (“SAP”) is described. The SAP can be applied on many levels of circuit components including transistor devices, logic gate devices, and System-on-Chip or chip designs. The SAP replaces the large number of traditional Monte Carlo simulations with operations using a small number of sampling points or corners. The SAP is a hierarchical approach using a model fitting process to generate a model that can be used with any number of performance metrics to generate performance variation predictions along with corresponding statistical information (e.g., mean, three-sigma probability, etc.). A hierarchical SAP process breaks an overall circuit into a plurality of subcircuits and performs circuit simulation and SAP analysis steps on each subcircuit. An integration and reduction process combines the analysis results of each subcircuit, and a final SPICE/SAP process provides a model for the overall circuit based on the subcircuits.

Abstract: An Integrated Circuit Design tool incorporating a Stochastic Analysis Process (“SAP”) is described. The SAP can be applied on many levels of circuit components including transistor devices, logic gate devices, and System-on-Chip or chip designs. The SAP replaces a large number of traditional Monte Carlo simulations with operations using a small number of sampling points or corners. The SAP is a hierarchical approach using a model fitting process to generate a model that can be used with any number of performance memos to generate performance variation predictions along with corresponding statistical information (e.g., mean, three-sigma probability, etc.). The SAP provides an efficient way of modeling the circuit or system variation due to global parameters such as device dimensions, interconnect wiring variations, economic variations, and manufacturing variations.

Abstract: An Integrated Circuit Design tool incorporating a Stochastic Analysis Process (“SAP”) is described. The SAP can be applied on many levels of circuit components including transistor devices, logic gate devices, and System-on-Chip or chip designs. The SAP replaces the large number of traditional Monte Carlo simulations with operations using a small number of sampling points or corners. The SAP is a hierarchical approach using a model fitting process to generate a model that can be used with any number of performance metrics to generate performance variation predictions along with corresponding statistical information (e.g., mean, three-sigma probability, etc.). The SAP provides an efficient way of modeling the circuit or system variation due to global parameters such as device dimensions, interconnect wiring variations, economic variations, and manufacturing variations.

Abstract: A dietary supplement composition, dosage forms, and methods of use are provided which comprise an effective amount of at least one compound selected from the group consisting of acetic acid, citric acid, and malic acid; and, at least one carrier selected from the group consisting of a cyclodextrin, a porous starch, a KONJAC powder, and a carboxyl methyl cellulose (CMC).