Abstract: A multi-hull boat having a plurality of pontoons. The pontoons are coupled together by cross members that are recessed within the pontoons. A multi-panel floor or deck is coupled to the pontoons with joints that receive edges of the panels.

Abstract: A method for testing semiconductor memories, in accordance with the invention includes providing a tester having a plurality of data channels. The tester operates at a first clock rate. A memory device to be tested is included with a plurality of data ports connected to the data channels. The memory device has a data compression circuit for compressing test data such that a number of the plurality of data ports are available for other functions. Data is transferred between the memory device and the tester at a rate higher than the first clock rate by employing the plurality of data ports including the number of the plurality of data ports, such that the memory device operates at the higher rate and the tester operates at the first rate. In other embodiments data ports are made available by employing an on-chip addressing method. In still other embodiments, an on-chip clock receiver provides double data rate clocking of the memory device.

Abstract: A method for displaying failure information for semiconductor devices, in accordance with the present invention, includes testing a semiconductor device with a tester to determine failures, and performing a redundancy calculation to repair the failures. The results of the redundancy calculation are stored in a file which identifies only addresses of components which have failed. The file is converted to a display format and the display format is displayed to provide a bit fail map for the semiconductor device such that sparse failures are displayed in addition to row and column failures without employing the tester to regenerate fail data.

Abstract: A method for yield correlation for semiconductor chips, in accordance with the present invention, includes providing test data for a plurality of tests on each of a plurality of semiconductor chips. A global parameter is assigned to each chip as a quality measure based on the test data for that chip. Values for a plurality of parameter classes are determined, and each parameter class represents a parameter measured for each chip tested. A correlation between the values of the parameter classes and the global parameter values for the plurality of chips is then determined. The correlation for each of the parameter classes is compared to identify at least one parameter class, which detracts from chip yield.

Abstract: A method for providing specific test programs from a production test program for testing semiconductor devices, in accordance with the present invention, includes providing a semiconductor device to be tested by a tester and initiating a production test program. The production test program includes a plurality of program files and test code sequences. The production test program is held at a test which is to be extracted, and register information and settings are extracted from the tester for the test to be extracted. The register information and settings are stored in a storage file, and the storage file is assembled and translated to provide an executable test program for an extracted test for testing the semiconductor device or other semiconductor devices.

Abstract: The invention relates to a new aviadenovirus which was isolated from a pigeon. The aviadenovirus according to the present invention comprises group-I specific antigen and cannot be neutralized by antiserum against any of the FAV serotypes 1-12. The present invention also relates to an antibody or antiserum immunoreactive with a fibre of the new aviadenovirus, a fibre thereof as well as a vaccin against PiAV related diseases comprising a chemically or physically inactivated virus an attenuated virus, a fibre or fragment thereof, a host cell transformed with a nucleic acid sequence encoding an amino acid sequence comprising an immunogenic determent or a functional variant thereof of a fibre of the aviadenovirus according to the present invention, together with a pharmaceutical carrier.

Abstract: It is possible to manufacture articles out of thermoplastic materials and to metallize the articles at their surface. In this way one can manufacture reflectors and similar articles. Most thermoplastic materials require processing steps prior to the metallization like application of primers, chemical etching and the like. The invention is based on the discovery that a certain type of materials can be metallized without any extra processing steps. The materials involved are polyestercarbonates or blends of polyestercarbonates and polycarbonate. This is quite surprising since polycarbonates can not be metallized in good quality without extra processing steps prior to the metallization step.

Abstract: A method is provided for producing a sterile and pyrogen-free column containing coupled protein for use in removing a predetermined substance from the blood of a human subject. The method abrogates sterilization of the finished protein-containing product by providing sterile and pyrogen-free raw materials at each production step. The method provides a pathogen-free, purified solution of protein which binds to a predetermined substance in human blood such as LDL or immunoglobulin. Typically, the protein is anti-human LDL immunoglobulin or anti-human Ig immunoglobulin. The method also provides a sterile and pyrogen-free column matrix material such as an agarose which is chemically activated, either using CNBr and triethylamine or using 1,1'-carbonyldiimidazole.