Abstract: An objective for total internal reflection microscopy includes a diaphragm disposed near to or in the plane of the objective pupil. The diaphragm includes a middle area impermeable to illumination light and permeable to detection light of a microscope, and includes an edge area permeable to the illumination light. The illumination light has a focus in the plane of the objective pupil.

Abstract: A method for blind deconvolution of microscopic images in which only a single parameter is varied for the estimation of the PSF. The single parameter takes account of the optical properties of the environment of the object (40) between the objective (20) of the microscope (1) and the region above the object. The single parameter represents a functional relationship among the parameters of the individual layers.

Abstract: A microscope includes an interference contrast transmitted-light device having an analyzer disposed in the microscope imaging beam path, the analyzer causing a beam deflection. A fluorescence device is provided, the fluorescence device and the interference contrast transmitted-light device being selectably and alternatively insertable into the imaging beam path. A pair of glass wedge plates are arranged behind the analyzer in the imaging direction so as to compensate to zero for the beam deflection caused by the analyzer.

Abstract: The invention relates to a reflected-light microscope comprising a light source for generating an illumination light beam, which can be directed through a lens along an illumination beam path onto a sample. Said microscope is provided with imaging optics, which generate a plane that optically corresponds to the pupil plane. At least one attenuation element, which acts in an essentially uniform manner over the entire cross-section of the illumination light beam, can be introduced into the illumination beam path on the optically corresponding plane.

Abstract: The automated microscope system (30) comprises a box in which at least one control and power supply unit (34) is installed. The box is arranged physically separately from the microscope stand (32) and is connected to the microscope stand (32) with a cable (38). In one exemplary embodiment, a computer unit (36) is connected to the box that contains at least one control and power supply unit (34).

Abstract: Process for video microscopy in which an image of an object (9) on a microscope stage (7) generated by a microscope (1) is recorded with a video camera, digitized, stored temporarily, and displayed on the monitor (13) of a personal computer (12). At one known magnification V1, an image detail (15) is selected. Its image coordinates {right arrow over (r)}1=(x1, y1) relative to the center (18) of the image on the monitor screen (17) are determined at the proper scale. After a change in magnification from magnification V1 to another magnification Vm the position of the image detail (15) on the monitor screen is kept the same by moving the microscope stage (7) in the proper direction by {right arrow over (r)}1(1/Vm?1/V).

Abstract: The invention relates to a device for laser cutting preparations which comprises an XY table (2) that defines a table surface (4). A holding device (14) for accommodating an object support (6) with a preparation (8) is arranged above the table surface (4) and is joined to the XY table (2) in a manner that permits it to be displaced in the Y direction (20a) in the X direction (22a). An open working space (16) is defined between the holding device (14) and the table surface (4). A catching device (10), which has at least one receptacle (12) for catching a preparation part that has been cut out, can be introduced into said working space. The invention also relates to a microscope that is equipped with the aforementioned laser cutting device.

Abstract: A method for blind deconvolution of microscopic images in which only a single parameter is varied for the estimation of the PSF. The single parameter takes account of the optical properties of the environment of the object (40) between the objective (20) of the microscope (1) and the region above the object. The single parameter represents a functional relationship among the parameters of the individual layers.

Abstract: A microscope includes an interference contrast transmitted-light device having an analyzer disposed in the microscope imaging beam path, the analyzer causing a beam deflection. A fluorescence device is provided, the fluorescence device and the interference contrast transmitted-light device being selectably and alternatively insertable into the imaging beam path. A pair of glass wedge plates are arranged behind the analyzer in the imaging direction so as to compensate to zero for the beam deflection caused by the analyzer.

Abstract: A method and an apparatus for laser microdissection of specimen regions (23) of interest of a specimen (4) are described. In a first step, an incomplete cut line (25) enclosing the specimen region (23) of interest is generated by means of a laser beam (7). At the incomplete point of the cut line (25), there remains a web (26) which joins the specimen region (23) of interest to the surrounding specimen (4). In a second step, the web (26) is severed with a single laser pulse directed onto it, thereby completing the cut line. The specimen region (23) of interest is in that context detached from the specimen (4) and falls by the action of gravity into a collection vessel (19).

Abstract: The automated microscope system (30) comprises a box in which at least one control and power supply unit (34) is installed. The box is arranged physically separately from the microscope stand (32) and is connected to the microscope stand (32) with a cable (38). In one exemplary embodiment, a computer unit (36) is connected to the box that contains at least one control and power supply unit (34).

Abstract: The automated microscope system (30) comprises a box in which at least one control and power supply unit (34) is installed. The box is arranged physically separately from the microscope stand (32) and is connected to the microscope stand (32) with a cable (38). In one exemplary embodiment, a computer unit (36) is connected to the box that contains at least one control and power supply unit (34).

Abstract: A method and an apparatus for laser microdissection of specimen regions (23) of interest of a specimen (4) are described. In a first step, a perforation with webs (26, 27, 28) is generated by means of a focused laser beam (7) along a cut line (25) enclosing the specimen region (23) of interest. The perforation has at least two webs (26, 27, 28) which interrupt the cut line (25) and join the specimen region (23) of interest to the surrounding specimen (4). In a second step, the webs (26, 27, 28) are broken with a single laser pulse of the defocused laser beam (7) directed onto the specimen region (23) of interest, thereby detaching the specimen region (23) of interest from the specimen (4).

Abstract: The invention relates to a device for laser cutting preparations which comprises an XY table (2) that defines a table surface (4). A holding device (14) for accommodating an object support (6) with a preparation (8) is arranged above the table surface (4) and is joined to the XY table (2) in a manner that permits it to be displaced in the Y direction (20a) in the X direction (22a). An open working space (16) is defined between the holding device (14) and the table surface (4). A catching device (10), which has at least one receptacle (12) for catching a preparation part that has been cut out, can be introduced into said working space. The invention also relates to a microscope that is equipped with the aforementioned laser cutting device.

Abstract: A method and an apparatus for measuring thickness of transparent films is described in which an illumination beam is directed through an objective onto an object comprising a transparent film. A structured focusing aid is disposed in the illumination beam, a camera is disposed in an imaging beam. The focusing aid and the camera each are disposed in locations conjugated with the focal plane of the objective. The focal plane of the objective is displaced stepwise through the object. At each position, a camera image is recorded and its focus score is determined, the image of the focusing aid being used as the contrast indicator. The positions with maximal focus scores are assigned to the locations of the interfaces. The thickness of the transparent film is calculated from the difference between the positions of its interfaces.

Abstract: The invention describes an apparatus for changing objective lenses in a microscope, the microscope being used primarily with a microscope stage that has a so-called fixed stage arrangement. The disposition of the objective lens turret in the microscope makes it possible to avoid damaging manipulators or samples during an objective lens change. The damage is avoided due to a lateral tilt of the rotational axis of the objective lens turret relative to the first and the second side walls of the microscope. The lateral tilt of the turret also ensures that a particular part of the sample remains located in the field of view of the microscope after the lens change. The entire process of objective lens change, as well as the magnification setting and focusing necessary for the purpose, is performed in a completely automatic and motorized fashion.

Abstract: The invention relates to a method and a device for laser cutting microscopic samples. The device for laser cutting microscopic samples comprises a microscope (1) having at least one lens (6) for observing a sample (12) that is to be cut The lens (6) defines an optical axis (14) and a lens aperture (34). A laser (4) is also connected to the microscope (1). The laser (4) generates a laser beam (41) that is injected into the lens (6) by means of at least one optical system (16). A diaphragm (18) is provided, which generates a dimmed laser beam (4b), whereby the laser aperture (36) generated by the lens (6) is smaller than the lens aperture (34) of the lens (6) itself.

Abstract: A method and an apparatus for laser microdissection of specimen regions (23) of interest of a specimen (4) are described. In a first step, an incomplete cut line (25) enclosing the specimen region (23) of interest is generated by means of a laser beam (7). At the incomplete point of the cut line (25), there remains a web (26) which joins the specimen region (23) of interest to the surrounding specimen (4). In a second step, the web (26) is severed with a single laser pulse directed onto it, thereby completing the cut line. The specimen region (23) of interest is in that context detached from the specimen (4) and falls by the action of gravity into a collection vessel (19).

Abstract: A method and an apparatus for laser microdissection of specimen regions (23) of interest of a specimen (4) are described. In a first step, a perforation with webs (26, 27, 28) is generated by means of a focused laser beam (7) along a cut line (25) enclosing the specimen region (23) of interest. The perforation has at least two webs (26, 27, 28) which interrupt the cut line (25) and join the specimen region (23) of interest to the surrounding specimen (4). In a second step, the webs (26, 27, 28) are broken with a single laser pulse of the defocused laser beam (7) directed onto the specimen region (23) of interest, thereby detaching the specimen region (23) of interest from the specimen (4).

Abstract: An illumination system (1) for a microscope, in which a first light source (2), a collector lens (3), an aperture diaphragm (4), and a condenser lens ((5) are arranged in the illumination beam path (6), is described. The illumination light is directed through the aperture diaphragm (4) via the condenser lens (5) into the object plane (9). Arranged in the illumination beam path (6) on the optical axis (20) is a second light source (8) that is imaged at infinity by the condenser lens (5).