Patents by Inventor Michael Ganser

Michael Ganser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20060209398
    Abstract: An objective for total internal reflection microscopy includes a diaphragm disposed near to or in the plane of the objective pupil. The diaphragm includes a middle area impermeable to illumination light and permeable to detection light of a microscope, and includes an edge area permeable to the illumination light. The illumination light has a focus in the plane of the objective pupil.
    Type: Application
    Filed: February 28, 2006
    Publication date: September 21, 2006
    Applicant: Leica Microsystems CMS GmbH
    Inventors: Albrecht Weiss, Michael Ganser
  • Patent number: 7091990
    Abstract: A method for blind deconvolution of microscopic images in which only a single parameter is varied for the estimation of the PSF. The single parameter takes account of the optical properties of the environment of the object (40) between the objective (20) of the microscope (1) and the region above the object. The single parameter represents a functional relationship among the parameters of the individual layers.
    Type: Grant
    Filed: November 28, 2002
    Date of Patent: August 15, 2006
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Michael Ganser, Joachim Wesner
  • Patent number: 7079316
    Abstract: A microscope includes an interference contrast transmitted-light device having an analyzer disposed in the microscope imaging beam path, the analyzer causing a beam deflection. A fluorescence device is provided, the fluorescence device and the interference contrast transmitted-light device being selectably and alternatively insertable into the imaging beam path. A pair of glass wedge plates are arranged behind the analyzer in the imaging direction so as to compensate to zero for the beam deflection caused by the analyzer.
    Type: Grant
    Filed: May 6, 2004
    Date of Patent: July 18, 2006
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Albrecht Weiss, Michael Ganser
  • Publication number: 20060056013
    Abstract: The invention relates to a reflected-light microscope comprising a light source for generating an illumination light beam, which can be directed through a lens along an illumination beam path onto a sample. Said microscope is provided with imaging optics, which generate a plane that optically corresponds to the pupil plane. At least one attenuation element, which acts in an essentially uniform manner over the entire cross-section of the illumination light beam, can be introduced into the illumination beam path on the optically corresponding plane.
    Type: Application
    Filed: November 13, 2003
    Publication date: March 16, 2006
    Inventors: Michael Ganser, Albecht Weiss
  • Patent number: 6975452
    Abstract: The automated microscope system (30) comprises a box in which at least one control and power supply unit (34) is installed. The box is arranged physically separately from the microscope stand (32) and is connected to the microscope stand (32) with a cable (38). In one exemplary embodiment, a computer unit (36) is connected to the box that contains at least one control and power supply unit (34).
    Type: Grant
    Filed: December 5, 2003
    Date of Patent: December 13, 2005
    Assignee: Leica Microsystems Wetzlar GmbH
    Inventor: Michael Ganser
  • Patent number: 6944326
    Abstract: Process for video microscopy in which an image of an object (9) on a microscope stage (7) generated by a microscope (1) is recorded with a video camera, digitized, stored temporarily, and displayed on the monitor (13) of a personal computer (12). At one known magnification V1, an image detail (15) is selected. Its image coordinates {right arrow over (r)}1=(x1, y1) relative to the center (18) of the image on the monitor screen (17) are determined at the proper scale. After a change in magnification from magnification V1 to another magnification Vm the position of the image detail (15) on the monitor screen is kept the same by moving the microscope stage (7) in the proper direction by {right arrow over (r)}1(1/Vm?1/V).
    Type: Grant
    Filed: March 11, 2000
    Date of Patent: September 13, 2005
    Assignee: Leica Microsystems Wetzlar GmbH
    Inventor: Michael Ganser
  • Patent number: 6907798
    Abstract: The invention relates to a device for laser cutting preparations which comprises an XY table (2) that defines a table surface (4). A holding device (14) for accommodating an object support (6) with a preparation (8) is arranged above the table surface (4) and is joined to the XY table (2) in a manner that permits it to be displaced in the Y direction (20a) in the X direction (22a). An open working space (16) is defined between the holding device (14) and the table surface (4). A catching device (10), which has at least one receptacle (12) for catching a preparation part that has been cut out, can be introduced into said working space. The invention also relates to a microscope that is equipped with the aforementioned laser cutting device.
    Type: Grant
    Filed: March 21, 2001
    Date of Patent: June 21, 2005
    Assignee: Leica Microsystems Wetzlar GmbH
    Inventors: Michael Ganser, Albrecht Weiss, Ruediger Stenzel
  • Publication number: 20050062759
    Abstract: A method for blind deconvolution of microscopic images in which only a single parameter is varied for the estimation of the PSF. The single parameter takes account of the optical properties of the environment of the object (40) between the objective (20) of the microscope (1) and the region above the object. The single parameter represents a functional relationship among the parameters of the individual layers.
    Type: Application
    Filed: November 28, 2002
    Publication date: March 24, 2005
    Inventors: Michael Ganser, Joachim Wesner
  • Publication number: 20040223215
    Abstract: A microscope includes an interference contrast transmitted-light device having an analyzer disposed in the microscope imaging beam path, the analyzer causing a beam deflection. A fluorescence device is provided, the fluorescence device and the interference contrast transmitted-light device being selectably and alternatively insertable into the imaging beam path. A pair of glass wedge plates are arranged behind the analyzer in the imaging direction so as to compensate to zero for the beam deflection caused by the analyzer.
    Type: Application
    Filed: May 6, 2004
    Publication date: November 11, 2004
    Applicant: Leica Microsystems Wetzlar GmbH
    Inventors: Albrecht Weiss, Michael Ganser
  • Patent number: 6787301
    Abstract: A method and an apparatus for laser microdissection of specimen regions (23) of interest of a specimen (4) are described. In a first step, an incomplete cut line (25) enclosing the specimen region (23) of interest is generated by means of a laser beam (7). At the incomplete point of the cut line (25), there remains a web (26) which joins the specimen region (23) of interest to the surrounding specimen (4). In a second step, the web (26) is severed with a single laser pulse directed onto it, thereby completing the cut line. The specimen region (23) of interest is in that context detached from the specimen (4) and falls by the action of gravity into a collection vessel (19).
    Type: Grant
    Filed: August 31, 2001
    Date of Patent: September 7, 2004
    Assignee: Leica Microsystems Wetzlar GmbH
    Inventors: Michael Ganser, Albrecht Weiss, Joachim Wesner, Gerhard Johannsen
  • Publication number: 20040114220
    Abstract: The automated microscope system (30) comprises a box in which at least one control and power supply unit (34) is installed. The box is arranged physically separately from the microscope stand (32) and is connected to the microscope stand (32) with a cable (38). In one exemplary embodiment, a computer unit (36) is connected to the box that contains at least one control and power supply unit (34).
    Type: Application
    Filed: December 5, 2003
    Publication date: June 17, 2004
    Inventor: Michael Ganser
  • Patent number: 6717725
    Abstract: The automated microscope system (30) comprises a box in which at least one control and power supply unit (34) is installed. The box is arranged physically separately from the microscope stand (32) and is connected to the microscope stand (32) with a cable (38). In one exemplary embodiment, a computer unit (36) is connected to the box that contains at least one control and power supply unit (34).
    Type: Grant
    Filed: July 25, 2001
    Date of Patent: April 6, 2004
    Assignee: Leica Microsystems Wetzlar GmbH
    Inventor: Michael Ganser
  • Patent number: 6653065
    Abstract: A method and an apparatus for laser microdissection of specimen regions (23) of interest of a specimen (4) are described. In a first step, a perforation with webs (26, 27, 28) is generated by means of a focused laser beam (7) along a cut line (25) enclosing the specimen region (23) of interest. The perforation has at least two webs (26, 27, 28) which interrupt the cut line (25) and join the specimen region (23) of interest to the surrounding specimen (4). In a second step, the webs (26, 27, 28) are broken with a single laser pulse of the defocused laser beam (7) directed onto the specimen region (23) of interest, thereby detaching the specimen region (23) of interest from the specimen (4).
    Type: Grant
    Filed: August 31, 2001
    Date of Patent: November 25, 2003
    Assignee: Leica Microsystems Wetzlar GmbH
    Inventor: Michael Ganser
  • Publication number: 20030075530
    Abstract: The invention relates to a device for laser cutting preparations which comprises an XY table (2) that defines a table surface (4). A holding device (14) for accommodating an object support (6) with a preparation (8) is arranged above the table surface (4) and is joined to the XY table (2) in a manner that permits it to be displaced in the Y direction (20a) in the X direction (22a). An open working space (16) is defined between the holding device (14) and the table surface (4). A catching device (10), which has at least one receptacle (12) for catching a preparation part that has been cut out, can be introduced into said working space. The invention also relates to a microscope that is equipped with the aforementioned laser cutting device.
    Type: Application
    Filed: October 9, 2002
    Publication date: April 24, 2003
    Inventors: Michael Ganser, Albrecht Weiss, Ruediger Stenzel
  • Patent number: 6545765
    Abstract: A method and an apparatus for measuring thickness of transparent films is described in which an illumination beam is directed through an objective onto an object comprising a transparent film. A structured focusing aid is disposed in the illumination beam, a camera is disposed in an imaging beam. The focusing aid and the camera each are disposed in locations conjugated with the focal plane of the objective. The focal plane of the objective is displaced stepwise through the object. At each position, a camera image is recorded and its focus score is determined, the image of the focusing aid being used as the contrast indicator. The positions with maximal focus scores are assigned to the locations of the interfaces. The thickness of the transparent film is calculated from the difference between the positions of its interfaces.
    Type: Grant
    Filed: November 8, 2000
    Date of Patent: April 8, 2003
    Assignee: Leica Microsystems Heidelberg GmbH
    Inventors: Michael Ganser, Albrecht Weiss
  • Patent number: 6525876
    Abstract: The invention describes an apparatus for changing objective lenses in a microscope, the microscope being used primarily with a microscope stage that has a so-called fixed stage arrangement. The disposition of the objective lens turret in the microscope makes it possible to avoid damaging manipulators or samples during an objective lens change. The damage is avoided due to a lateral tilt of the rotational axis of the objective lens turret relative to the first and the second side walls of the microscope. The lateral tilt of the turret also ensures that a particular part of the sample remains located in the field of view of the microscope after the lens change. The entire process of objective lens change, as well as the magnification setting and focusing necessary for the purpose, is performed in a completely automatic and motorized fashion.
    Type: Grant
    Filed: October 4, 2000
    Date of Patent: February 25, 2003
    Assignee: Leica Lasertechnik GmbH
    Inventors: Manfred Gilbert, Michael Ganser
  • Publication number: 20020164678
    Abstract: The invention relates to a method and a device for laser cutting microscopic samples. The device for laser cutting microscopic samples comprises a microscope (1) having at least one lens (6) for observing a sample (12) that is to be cut The lens (6) defines an optical axis (14) and a lens aperture (34). A laser (4) is also connected to the microscope (1). The laser (4) generates a laser beam (41) that is injected into the lens (6) by means of at least one optical system (16). A diaphragm (18) is provided, which generates a dimmed laser beam (4b), whereby the laser aperture (36) generated by the lens (6) is smaller than the lens aperture (34) of the lens (6) itself.
    Type: Application
    Filed: May 2, 2002
    Publication date: November 7, 2002
    Inventors: Michael Ganser, Albrecht Weiss, Ruediger Stenzel
  • Publication number: 20020056345
    Abstract: A method and an apparatus for laser microdissection of specimen regions (23) of interest of a specimen (4) are described. In a first step, an incomplete cut line (25) enclosing the specimen region (23) of interest is generated by means of a laser beam (7). At the incomplete point of the cut line (25), there remains a web (26) which joins the specimen region (23) of interest to the surrounding specimen (4). In a second step, the web (26) is severed with a single laser pulse directed onto it, thereby completing the cut line. The specimen region (23) of interest is in that context detached from the specimen (4) and falls by the action of gravity into a collection vessel (19).
    Type: Application
    Filed: August 31, 2001
    Publication date: May 16, 2002
    Inventors: Michael Ganser, Albrecht Weiss, Joachim Wesner, Gerhard Johannsen
  • Publication number: 20020048747
    Abstract: A method and an apparatus for laser microdissection of specimen regions (23) of interest of a specimen (4) are described. In a first step, a perforation with webs (26, 27, 28) is generated by means of a focused laser beam (7) along a cut line (25) enclosing the specimen region (23) of interest. The perforation has at least two webs (26, 27, 28) which interrupt the cut line (25) and join the specimen region (23) of interest to the surrounding specimen (4). In a second step, the webs (26, 27, 28) are broken with a single laser pulse of the defocused laser beam (7) directed onto the specimen region (23) of interest, thereby detaching the specimen region (23) of interest from the specimen (4).
    Type: Application
    Filed: August 31, 2001
    Publication date: April 25, 2002
    Inventor: Michael Ganser
  • Patent number: 6369939
    Abstract: An illumination system (1) for a microscope, in which a first light source (2), a collector lens (3), an aperture diaphragm (4), and a condenser lens ((5) are arranged in the illumination beam path (6), is described. The illumination light is directed through the aperture diaphragm (4) via the condenser lens (5) into the object plane (9). Arranged in the illumination beam path (6) on the optical axis (20) is a second light source (8) that is imaged at infinity by the condenser lens (5).
    Type: Grant
    Filed: June 5, 2000
    Date of Patent: April 9, 2002
    Assignee: Leica Microsystems Wetzlar GmbH
    Inventors: Albrecht Weiss, Michael Ganser, Helmut Rühl, Manfred Gilbert