Abstract: An apparatus for recognizing a failure in a cryptographic unit, wherein the cryptographic unit includes a determinator for determining an input control signal and an output control signal, with the determinator being formed to determine the input control signal on the basis of an encryption of an input control signal parity of a group of input signals or an input signal of the group of input signals with an encryption number and to determine the output control signal on the basis of an encryption of an output control signal parity of a group of the output signals or an output signal of the group of output signals with the encryption number. Furthermore, the apparatus for recognizing includes an evaluator for evaluating the input control signal and the output control signal to recognize a failure of the cryptographic unit on the basis of a comparison between the input control signal and the output control signal.

Abstract: A circuitry is proposed for the correction of errors in a possibly erroneous binary word v?=v?1, . . . , v?n relative to a codeword v=v1, . . . , vn, in particular 3-bit errors containing an adjacent 2-bit error (burst error). The circuitry comprises a syndrome generator and a decoder. A modified BCH is used wherein n? column vectors of a first BCH code submatrix are paired as column vector pairs so that a componentwise XOR combination of the two column vectors of each column vector pair produces an identical column vector K that is different from all column vectors of the first BCH submatrix. A second BCH submatrix comprises corresponding column vectors as the third power, according to Galois field arithmetic, of the column vector in the first BCH submatrix. The syndrome generated by the syndrome generator can be checked against the columns of the first and second submatrices.

Abstract: A circuitry is provided that includes a memory including a plurality of memory cells, wherein at least one of the plurality of memory cells of the memory is configured to take on one of at least three different states. The circuitry also includes a first subcircuit BT configured to generate a plurality of ternary output values based on a sequence of binary values, a second subcircuit LH configured to transform one or more ternary state values into binary auxiliary read values based on the one or more state values, and an encoder configured to generate one or more binary check bits, wherein the encoder is configured to store each of the generated one or more check bits in a different memory cell.

Abstract: A device for testing a circuit includes a syndrome determiner, a test sequence provider and an evaluation circuit. The syndrome determiner determines an error syndrome bit sequence (s(v?)) based on a coded binary word (v?). The error syndrome bit sequence (s(v?)) indicates whether the coded binary word (v?) is a code word of an error correction code (C) used for coding the coded binary word (v?). The test sequence provider provides a test bit sequence (Ti) of the circuit that is different than the error syndrome bit sequence (s(v?)), if the error syndrome bit sequence (s(v?)) indicates that the coded binary word (v?) is a code word of the error correction code (C). The evaluation circuit detects an erroneous processing of the test bit sequence (Ti) by the circuit based on a test output signal (R(Ti)?)—caused by the test bit sequence (Ti)—of the circuit.

Abstract: An apparatus for determination of a position of a 1-bit error includes an error position determiner of the inner code, an error syndrome determiner of the outer code, a derivative determiner and an overall error position determiner. The error position determiner of the inner code determines at least one possible error position of a bit error in the coded bit sequence on the basis of the inner code. The error syndrome determiner of the outer code determines a value of a non-linear syndrome bit of the outer code on the basis of a non-linear function of bits in the coded bit sequence. Furthermore, the derivative determiner determines a value of a derivative bit for at least one determined, possible error position of the bit error on the basis of derivation of the non-linear function based on the bit at the determined, possible error position in the coded bit sequence.

Abstract: An apparatus for correcting at least one bit error within a coded bit sequence includes an error syndrome generator and a bit error corrector. The error syndrome generator determines the error syndrome of a coded bit sequence derived by a multiplication of a check matrix with a coded bit sequence.

Abstract: Methods and apparatuses relating to error-tolerant memories are provided. In one example embodiment, output signals from at least three memory devices are supplied to an error correction device. The error correction device outputs a corrected data value in such a manner that, when the read data values match, this data value is output and, in at least one state in which the data values do not match, a previously output data value is retained.

Abstract: One embodiment of the present invention relates to an error tolerant memory circuit having a low hardware overhead that can tolerate both single volatile soft errors and permanent errors. In one embodiment, the method and apparatus comprise a memory circuit having a plurality of memory element pairs, respectively having two memory storage elements configured to store a data unit. One or more parity generation circuits are configured to calculate a first parity bit from data written to the plurality of memory element pairs (e.g., the two memory storage elements) and a second parity bit from data read from one of the two memory storage elements in the plurality of memory element pairs. Based upon the calculated first and second parity bits, the memory circuit chooses to selectively output data from memory storage elements not known to contain an error.

Abstract: An apparatus for correcting at least one bit error within a coded bit sequence includes an error syndrome generator and a bit error corrector. The error syndrome generator determines the error syndrome of a coded bit sequence derived by a multiplication of a check matrix with a coded bit sequence.

Abstract: When coding user data, it may be desirable to mark user data as invalid. This may arise, by way of example, in applications in which a stored data item needs to be updated by virtue of an updated data item additionally being stored and the old stored data item being marked as invalid. In order to mark the invalidity of a stored data item by means of the value of the data item and to be able to apply an error-recognizing or error-correcting coding dependably, the user data are extended by supplementary data and the coding is applied to the extended user data.

Abstract: A system and method for signature-based redundancy comparison provides for receiving, by a master part, an input signal and generating, by the master part, a binary output signal, generating a delayed input signal based on the input signal, generating a first output signature based on the binary output signal, and generating a delayed first output signature based on the first output signature. The system and method further comprise generating a delayed binary output signal based on the delayed input signal, generating, by a checker part, a delayed second output signature based on the delayed binary output signal, comparing the delayed first output signature with the delayed second output signature, and generating an error signal, where the state of the error signal is based upon the comparison.

Abstract: An apparatus for comparing pairs of binary words includes an intermediate value determiner and an error detector. The intermediate value determiner determines an intermediate binary word so that the intermediate binary word is equal to a reference binary word for a first pair of equal or inverted binary words, so that the intermediate binary word is equal to the inverted reference binary word for a second pair of equal or inverted binary words and so that the intermediate binary word is unequal to the reference binary word and the inverted reference binary word for a pair of unequal and uninverted binary words, if the intermediate value determiner works faultlessly. Further, the error detector provides an error signal based on the intermediate binary word so that the error signal indicates whether or not the binary words of a pair of binary words are equal or inverted.

Abstract: An apparatus for determination of a position of a 1-bit error includes an error position determiner of the inner code, an error syndrome determiner of the outer code, a derivative determiner and an overall error position determiner. The error position determiner of the inner code determines at least one possible error position of a bit error in the coded bit sequence on the basis of the inner code. The error syndrome determiner of the outer code determines a value of a non-linear syndrome bit of the outer code on the basis of a non-linear function of bits in the coded bit sequence. Furthermore, the derivative determiner determines a value of a derivative bit for at least one determined, possible error position of the bit error on the basis of derivation of the non-linear function based on the bit at the determined, possible error position in the coded bit sequence.

Abstract: A circuit arrangement for controlling the masking of test and diagnosis data with X values of an electronic circuit with N scan paths, wherein the test data are provided on insertion into the N scan paths by a decompressor with m inputs and N outputs (m<N) and wherein the masked test data are compacted by a compactor with N data inputs and n data outputs and m<N applies is provided.

Abstract: Electronic circuit arrangement for processing binary input values x?X of a word width n (n>1), with a first, second and third combinatory circuit components configured to process the binary input values x to form first, second and third binary output values. The arrangement further includes a majority voter element configured to receive the binary output values and provide a majority signal based on the received binary output values. The second and third combinatory circuit components are designed, as regards faults during processing of the binary input values x in the first combinatory circuit component, to process binary input values of a true non-empty partial quantity X1 of the quantity of binary input values X in a fault-tolerant manner and process binary input values of a further non-empty partial quantity X2 of the quantity of binary input values X different from the true non-empty partial quantity X1 in a fault-intolerant manner.

Abstract: A test apparatus includes a test input signal generator that generates a test input signal of word width N, and terminals that connect to inputs and outputs of an electrical circuit to be tested. The electrical circuit includes N digital test inputs and M digital test outputs. The terminals for the test inputs are connected to the test input signal and an electrical circuit is driven such that it outputs at its test outputs data with a macro clock cycle T of length L as test response. A compactor includes M inputs that are connected to the terminals for the test outputs of the circuit to be tested. The compactor compacts the test response with a micro clock cycle t of length l and outputs a data word of width m, where the length L is at least twice as large as the length l.

Abstract: One embodiment of the present invention relates to an error tolerant memory circuit having a low hardware overhead that can tolerate both single volatile soft errors and permanent errors. In one embodiment, the method and apparatus comprise a memory circuit having a plurality of memory element pairs, respectively having two memory storage elements configured to store a data unit. One or more parity generation circuits are configured to calculate a first parity bit from data written to the plurality of memory element pairs (e.g., the two memory storage elements) and a second parity bit from data read from one of the two memory storage elements in the plurality of memory element pairs. Based upon the calculated first and second parity bits, the memory circuit chooses to selectively output data from memory storage elements not known to contain an error.

Abstract: The invention relates to a circuit arrangement, comprising: a functional circuit with m (m=1, 2, . . . ) data inputs and n (n=1, 2, . . . ) data outputs for processing at least one m-dimensional binary data input (x1, . . . , xm) to form an n-dimensional data output (y1, . . . , yn), wherein the functional circuit comprises at least one combinatorial circuit part, at least two registers with a word length k (k=1, 2, . . . ; k?n) which are coupled to at least some of the n data outputs of the functional circuit in order to store output values (y=y1, . . . , yk; y?=y?1, . . . , y?k) which are duplicated with respect to one another or are duplicated with bit-by-bit inversion with respect to one another, said output values being derived from the n-dimensional data output (y1, . . .

Abstract: An apparatus for detecting an error within a coded binary word includes an error corrector and an error detector. The error corrector corrects a correctable bit error within a faulty subset of bits of a faulty coded binary word coded by an error correction code, so that the corrected subset of bits is equal to a corresponding subset of bits of a code word of the error correction code, if the error corrector works faultlessly. Further, the error detector determines an error detection bit sequence indicating whether or not an error detector input binary word is a code word of the error correction code. The error detector input binary word is based on a corrected coded binary word containing the corrected subset of bits and maximally a proper subset of bits of the faulty coded binary word.

Abstract: An apparatus for correcting at least one bit error within a coded bit sequence includes an error syndrome generator and a bit error corrector. The error syndrome generator determines the error syndrome of a coded bit sequence derived by a multiplication of a check matrix with a coded bit sequence.