Abstract: A pixel array within an integrated-circuit image sensor is exposed to light representative of a scene during a first frame interval and then oversampled a first number of times within the first frame interval to generate a corresponding first number of frames of image data from which a first output image may be constructed. One or more of the first number of frames of image data are evaluated to determine whether a range of luminances in the scene warrants adjustment of an oversampling factor from the first number to a second number, if so, the oversampling factor is adjusted such that the pixel array is oversampled the second number of times within a second frame interval to generate a corresponding second number of frames of image data from which a second output image may be constructed.

Abstract: In an integrated-circuit image sensor having a pixel array, first and second control pulses that enable photocharge transfer from respective first and second photosensitive elements to a shared floating diffusion node are staggered in time such that capacitive feedthrough to the shared floating diffusion node from a trailing edge of the first control pulse is counteracted by capacitive feedthrough to the shared floating diffusion node from a leading edge of the second control pulse.

Abstract: An integrated-circuit image sensor generates, as constituent reference voltages of a first voltage ramp, a first sequence of linearly related reference voltages followed by a second sequence of exponentially related reference voltages. The integrated-circuit image sensor compares the constituent reference voltages of the first voltage ramp with a first signal level representative of photocharge integrated within a pixel of the image sensor to identify a first reference voltage of the constituent reference voltages that is exceeded by the first signal level.

Abstract: A pixel in an integrated-circuit image sensor is enabled to output, throughout a sampling interval, an analog signal having an amplitude dependent, at least in part, on photocharge integrated within a photosensitive element of the pixel. A plurality of samples of the analog signal are generated during an initial portion of the sampling interval that is shorter than a settling time for a maximum possible level of the analog signal.

Abstract: A pixel within a pixel array of an integrated-circuit image sensor outputs an analog signal representative of accumulated photocharge. First and second analog-to-digital conversions of the analog signal are initiated while the pixel is outputting the analog signal, the first analog-to-digital conversion corresponding to a low-light range of photocharge accumulation within the pixel and the second analog-to-digital conversion corresponding to a brighter-light range of photocharge accumulation within the pixel.

Abstract: In an image sensor containing an array of pixels, a pixel signal corresponding to the state of a photosensitive element is read-out of each pixel and compared with a threshold. If the pixel signal exceeds the first threshold, the state of the photosensitive element is reset and an analog-count voltage that corresponds to the pixel is incremented.

Abstract: Some embodiments provide an image sensor having a low capacitance floating diffusion node based on by reducing the width of the overlap between the floating diffusion region and the reset gate of the reset transistor that is configured to selectively reset the potential of the floating diffusion, so as to reduce the overlap capacitance therebetween. The reset gate may be tapered along its length so as to have a minimum width proximal to the FD and a maximum width distal to the floating diffusion, such as near or at a drain region of the reset transistor. The floating diffusion may be defined to have a width less than the minimum floating diffusion width that could be achieved by the minimum definable width of a photoresist window opening used for doping the FD region for the given fabrication process. Shallow trench isolation and/or compensation doping may be used for such definition of the floating diffusion.

Abstract: In a pixel array within an integrated-circuit image sensor, a pixel (870) includes a photodetector (260) and floating diffusion (262) formed within a substrate. First (881) and second (883) gate elements are disposed adjacent one another over a region (885) of the substrate between the photodetector and the floating diffusion and coupled respectively to a row line (TGr) that extends in a row direction within the pixel array and a column line (TGc) that extends in a column direction within the pixel array.

Abstract: A control pulse is generated a first control signal line coupled to a transfer gate of a pixel to enable photocharge accumulated within a photosensitive element of the pixel to be transferred to a floating diffusion node, the first control signal line having a capacitive coupling to the floating diffusion node. A feedthrough compensation pulse is generated on a second signal line of the pixel array that also has a capacitive coupling to the floating diffusion node. The feedthrough compensation pulse is generated with a pulse polarity opposite the pulse polarity of the control pulse and is timed to coincide with the control pulse such that capacitive feedthrough of the control pulse to the floating diffusion node is reduced.

Abstract: An image sensor architecture with multi-bit sampling is implemented within an image sensor system. A pixel signal produced in response to light incident upon a photosensitive element is converted to a multiple-bit digital value representative of the pixel signal. If the pixel signal exceeds a sampling threshold, the photosensitive element is reset. During an image capture period, digital values associated with pixel signals that exceed a sampling threshold are accumulated into image data.

Abstract: An integrated-circuit image sensor generates, as constituent reference voltages of a first voltage ramp, a first sequence of linearly related reference voltages followed by a second sequence of exponentially related reference voltages.

Abstract: An image sensor architecture is implemented within an image sensor system. Image sensor pixels include pixel regions, and each pixel region includes a photosensor, a reset circuit, and a readout circuit. The readout circuit receives enable signals from an enable signal line, and outputs a pixel signal representative of light captured by the photosensor on a combination input/output line. The reset circuit resets the photosensor in response to receiving a first reset signal on a reset line and a second reset signal on the combination input/output line.

Abstract: Pixels within an image sensor pixel array are sampled by corresponding conditional read circuitry. A zero pixel value is outputted for each pixel associated with a sample less than a conversion threshold, and a saturated pixel value is outputted for each pixel associated with a sample greater than or equal to a saturation threshold. Samples greater than or equal to the conversion threshold and less than the saturation threshold are converted by an ADC, and a converted pixel value is output for each associated above threshold pixel. The ADC (along with any corresponding amplifiers) are powered on for a variable period depending on the number of pixels needing conversion during the conversion of such samples during a read period, and are powered off for the remainder of the read period.

Abstract: An image sensor architecture with multi-bit sampling is implemented within an image sensor system. A pixel signal produced in response to light incident upon a photosensitive element is converted to a multiple-bit digital value representative of the pixel signal. If the pixel signal exceeds a sampling threshold, the photosensitive element is reset. During an image capture period, digital values associated with pixel signals that exceed a sampling threshold are accumulated into image data.

Abstract: A control pulse is generated a first control signal line coupled to a transfer gate of a pixel to enable photocharge accumulated within a photosensitive element of the pixel to be transferred to a floating diffusion node, the first control signal line having a capacitive coupling to the floating diffusion node. A feedthrough compensation pulse is generated on a second signal line of the pixel array that also has a capacitive coupling to the floating diffusion node. The feedthrough compensation pulse is generated with a pulse polarity opposite the pulse polarity of the control pulse and is timed to coincide with the control pulse such that capacitive feedthrough of the control pulse to the floating diffusion node is reduced.

Abstract: In a pixel array within an integrated-circuit image sensor, each of a plurality of pixels is evaluated to determine whether charge integrated within the pixel in response to incident light exceeds a first threshold. N-bit digital samples corresponding to the charge integrated within at least a subset of the plurality of pixels are generated, and then applied to a lookup table to retrieve respective M-bit digital values (M being less than N), wherein a stepwise range of charge integration levels represented by possible states of the M-bit digital values extends upward from a starting charge integration level that is determined based on the first threshold.

Abstract: An image sensor includes front-side and backside photodetectors of a first conductivity type disposed in a substrate layer of the first conductivity type. A front-side pinning layer of a second conductivity type is connected to a first contact. The first contact receives a predetermined potential. A backside pinning layer of the second conductivity type is connected to a second contact. The second contact receives an adjustable and programmable potential.

Abstract: In a pixel array within an integrated-circuit image sensor, each of a plurality of pixels is evaluated to determine whether charge integrated within the pixel in response to incident light exceeds a first threshold. N-bit digital samples corresponding to the charge integrated within at least a subset of the plurality of pixels are generated, and then applied to a lookup table to retrieve respective M-bit digital values (M being less than N), wherein a stepwise range of charge integration levels represented by possible states of the M-bit digital values extends upward from a starting charge integration level that is determined based on the first threshold.

Abstract: In a pixel array within an integrated-circuit image sensor, each of a plurality of pixels is evaluated to determine whether charge integrated within the pixel in response to incident light exceeds a first threshold. N-bit digital samples corresponding to the charge integrated within at least a subset of the plurality of pixels are generated, and then applied to a lookup table to retrieve respective M-bit digital values (M being less than N), wherein a stepwise range of charge integration levels represented by possible states of the M-bit digital values extends upward from a starting charge integration level that is determined based on the first threshold.

Abstract: An image sensor includes front-side and backside photodetectors of a first conductivity type disposed in a substrate layer of the first conductivity type. A front-side pinning layer of a second conductivity type is connected to a first contact. The first contact receives a predetermined potential. A backside pinning layer of the second conductivity type is connected to a second contact. The second contact receives an adjustable and programmable potential.