Abstract: In a first mode, a control circuit can implement a circuit design with storage circuits in an integrated circuit by programming configuration memory bits via configuration resources. The storage circuits can be accessed for read and write operations during execution of the implemented circuit design with the integrated circuit. In a second mode, the control circuit can perform read and write access operations at the storage circuits via configuration resources or via an interface circuit and interconnect resources that are allocated to the circuit design implementation. Typical applications for performing access operations at the storage circuits include fault injection and observation, statistical monitoring of the circuit design, initialization and the distribution of certain signals such as reset signals, event sampling, just to name a few.

Abstract: An integrated circuit includes user storage circuits, a local control circuit, and scan storage circuits arranged in a scan chain. At least a portion of a design-under-test is implemented in a subset of the integrated circuit that comprises the user storage circuits. The local control circuit retrieves data stored in the user storage circuits through the scan storage circuits without erasing the data stored in the user storage circuits after halting oscillations in a user clock signal that clocks the user storage circuits. The local control circuit restarts oscillations in the user clock signal after the data is provided from the user storage circuits to the scan storage circuits.

Abstract: An integrated circuit includes user storage circuits, a local control circuit, and scan storage circuits arranged in a scan chain. At least a portion of a design-under-test is implemented in a subset of the integrated circuit that comprises the user storage circuits. The local control circuit retrieves data stored in the user storage circuits through the scan storage circuits without erasing the data stored in the user storage circuits after halting oscillations in a user clock signal that clocks the user storage circuits. The local control circuit restarts oscillations in the user clock signal after the data is provided from the user storage circuits to the scan storage circuits.

Abstract: An integrated circuit may include observable storage circuits and unobservable or non-observable storage circuits. Among values stored in the observable and the non-observable storage circuits, only the values stored in the observable storage circuits are accessible for read-back and/or write-back operations during hardware emulation. A computer system may receive a circuit design that includes a design-under-test and implement at least a portion of the circuit design in the integrated circuit. The computer system may insert observable storage circuits into the circuit design and couple the observable storage circuits to the non-observable storage circuits such that the data stored in the non-observable storage circuits may be accessed during read-back operations using the inserted observable storage circuits.

Abstract: In a first mode, a control circuit may implement a circuit design with storage circuits in an integrated circuit by programming configuration memory bits via configuration resources. The storage circuits may be accessed for read and write operations during the execution of the circuit design implementation with the integrated circuit. In a second mode, the control circuit may perform read and write access operations at the storage circuits via configuration resources or via an interface circuit and interconnect resources that are allocated to the circuit design implementation. Typical applications for performing access operations at the storage circuits include fault injection and observation, statistical monitoring of the circuit design, initialization and the distribution of certain signals such as reset signals, event sampling, just to name a few.

Abstract: In a first mode, a control circuit generates a circuit design implementation with storage circuits in an integrated circuit by programming configuration memory bits via configuration resources. The storage circuits can be accessed for read and write operations during the execution of the circuit design implementation with the integrated circuit. In a second mode, the control circuit can perform read and write access operations at the storage circuits via configuration resources or via an interface circuit and interconnect resources that are allocated to the circuit design implementation. Typical applications for performing access operations at the storage circuits include fault injection and observation, statistical monitoring of the circuit design, initialization and distribution of certain signals including reset signals, event sampling, just to name a few.

Abstract: In a first mode, a control circuit generates a circuit design implementation with storage circuits in an integrated circuit by programming configuration memory bits via configuration resources. The storage circuits can be accessed for read and write operations during the execution of the circuit design implementation with the integrated circuit. In a second mode, the control circuit can perform read and write access operations at the storage circuits via configuration resources or via an interface circuit and interconnect resources that are allocated to the circuit design implementation. Typical applications for performing access operations at the storage circuits include fault injection and observation, statistical monitoring of the circuit design, initialization and the distribution of certain signals including reset signals, event sampling, just to name a few.

Abstract: An integrated circuit may include user storage circuits and scan storage circuits. The scan storage circuits may store data from the user storage circuits and provide the data to a user interface during a read-back operation. The user storage circuits may store data from the scan storage circuits, which the scan storage circuits may have received from the user interface during a write-back operation. The scan storage circuits may be arranged in a scan chain and controlled by a local control circuit. The integrated circuit may include multiple local control circuits that each control a sector of the integrated circuit. The local control circuits may communicate with a global control circuit over a communication network, and the global control circuit may communicate with the user interface.

Abstract: A cross-point switch having stacked switching dies on a component die is disclosed. The cross point switch allows scalability by adding switching dies. The switching dies include ingress switches that are coupled to multiplexers to a middle stage switches. The inputs and outputs of the ingress switches are connected to the switching interface region via through silicon vias (TSVs). The outputs of the ingress switches are also coupled by TSVs to multiplexers for routing to middle stage switches on a switching die above. If the switching die is stacked on another switching die, the outputs of the ingress switches are coupled by TSVs to the multiplexers for routing to the middle stage switches of the switching die below. By adding switching dies, the switch is configurable to increase the number of ports as well as the width of the ports.

Abstract: A cross-point switch having stacked switching dies on a component die is disclosed. The cross point switch allows scalability by adding switching dies. The switching dies include ingress switches that are coupled to multiplexers to a middle stage switches. The inputs and outputs of the ingress switches are connected to the switching interface region via through silicon vias (TSVs). The outputs of the ingress switches are also coupled by TSVs to multiplexers for routing to middle stage switches on a switching die above. If the switching die is stacked on another switching die, the outputs of the ingress switches are coupled by TSVs to the multiplexers for routing to the middle stage switches of the switching die below. By adding switching dies, the switch is configurable to increase the number of ports as well as the width of the ports.

Abstract: A cross-point switch having stacked switching dies on a component die is disclosed. The cross point switch allows scalability by adding switching dies. The switching dies include ingress switches that are coupled to multiplexers to a middle stage switches. The inputs and outputs of the ingress switches are connected to the switching interface region via through silicon vias (TSVs). The outputs of the ingress switches are also coupled by TSVs to multiplexers for routing to middle stage switches on a switching die above. If the switching die is stacked on another switching die, the outputs of the ingress switches are coupled by TSVs to the multiplexers for routing to the middle stage switches of the switching die below. By adding switching dies, the switch is configurable to increase the number of ports as well as the width of the ports.

Abstract: A dedicated hardware block is provided for implementing crossbars and/or barrel shifters in programmable logic resources. Crossbar and/or barrel shifter circuitry may replace one or more rows, one or more columns, one or more rectangles, or any combination thereof of programmable logic regions on a programmable logic resource. The functionality of the crossbar and/or barrel shifter circuitry can further be improved by implementing time-multiplexing.

Abstract: A programmable logic integrated circuit device has a plurality of regions of programmable logic disposed on the device in a plurality of intersecting rows and columns of such regions. Interconnection resources (e.g., interconnection conductors, signal buffers/drivers, programmable connectors, etc.) are provided on the device for making programmable interconnections to, from, and/or between the regions. At least some of these interconnection resources are provided in two forms that are architecturally similar (e.g., with similar and substantially parallel routing) but that have significantly different signal propagation speed characteristics. For example, a major or larger portion of such dual-form interconnection resources may have what may be termed normal signal speed, while a smaller minor portion may have significantly faster signal speed. Secondary (e.g.

Abstract: A programmable logic device (“PLD”) architecture includes logic elements (“LEs”) grouped together in clusters called logic array blocks (LABs”). To save area, local feedback resources (for feeding outputs of the LEs in a LAB back to inputs of LEs in the LAB) are reduced or eliminated as compared to in the prior art. Because all (or at least more) of any LE-output-to-LE-input connections of LEs that are working together in a LAB must be routed through the general-purpose input routing resources of the LAB, it is important to conserve those resources. This is accomplished, for example, by giving greater importance to finding logic functions that have common inputs when deciding what logic functions to implement together in a LAB.

Abstract: Disclosed is an LE that can provide a number of advantageous features. For example, the LE can provide efficient and flexible use of LUTs and input sharing. The LE may also provide for flexible use of one or more dedicated adders and include register functionality.

Abstract: A programmable logic integrated circuit device has a plurality of regions of programmable logic disposed on the device in a plurality of intersecting rows and columns of such regions. Interconnection resources (e.g., interconnection conductors, signal buffers/drivers, programmable connectors, etc.) are provided on the device for making programmable interconnections to, from, and/or between the regions. At least some of these interconnection resources are provided in two forms that are architecturally similar (e.g., with similar and substantially parallel routing) but that have significantly different signal propagation speed characteristics. For example, a major or larger portion of such dual-form interconnection resources may have what may be termed normal signal speed, while a smaller minor portion may have significantly faster signal speed. Secondary (e.g.

Abstract: A programmable logic device (“PLD”) architecture includes logic elements (“LEs”) grouped together in clusters called logic array blocks (LABs”). To save area, local feedback resources (for feeding outputs of the LEs in a LAB back to inputs of LEs in the LAB) are reduced or eliminated as compared to in the prior art. Because all (or at least more) of any LE-output-to-LE-input connections of LEs that are working together in a LAB must be routed through the general-purpose input routing resources of the LAB, it is important to conserve those resources. This is accomplished, for example, by giving greater importance to finding logic functions that have common inputs when deciding what logic functions to implement together in a LAB.

Abstract: A method for designing systems on field programmable gate arrays (FPGAs) includes caching design information from a compilation of a system design. The design information is utilized in a compilation of a subsequent system design.

Abstract: A programmable logic integrated circuit device has a plurality of regions of programmable logic disposed on the device in a plurality of intersecting rows and columns of such regions. Interconnection resources (e.g., interconnection conductors, signal buffers/drivers, programmable connectors, etc.) are provided on the device for making programmable interconnections to, from, and/or between the regions. At least some of these interconnection resources are provided in two forms that are architecturally similar (e.g., with similar and substantially parallel routing) but that have significantly different signal propagation speed characteristics. For example, a major or larger portion of such dual-form interconnection resources may have what may be termed normal signal speed, while a smaller minor portion may have significantly faster signal speed. Secondary (e.g.

Abstract: A dedicated hardware block is provided for implementing crossbars and/or barrel shifters in programmable logic resources. Crossbar and/or barrel shifter circuitry may replace one or more rows, one or more columns, one or more rectangles, or any combination thereof of programmable logic regions on a programmable logic resource. The functionality of the crossbar and/or barrel shifter circuitry can further be improved by implementing time-multiplexing.