Abstract: An electro-optical sensor comprises an optical input configured to receive an optical carrier via an upstream fiber. The electro-optical sensor also includes an optical modulator configured to modulate an electrical signal onto the optical carrier to create an optical signal. The electro-optical sensor further includes an optical output configured to transmit the optical signal via a downstream fiber. The electro-optical sensor employs a variation output configured to transmit variation data indicating variation in the received optical carrier to support compensation for corresponding variation in the optical signal.

Abstract: An electro-optic modulator of a test and measurement system. The electro-optic modulator includes a first electrode, a second electrode with identical electrical characteristics as the first electrode and an optical waveguide between the first electrode and the second electrode. The first electrode and the second electrode present a balanced load to a device under test.

Abstract: A differential pin to RF adaptor includes a center conductor contact with an RF connector on one end and a signal contact on the other end. An insulating sleeve surrounds the central contact. A reference contact surrounds the insulating sleeve. The signal pin of the differential pair interfaces with the center conductor contact of the RF connector. The adaptor is structured to slide down over a pair of pins/leads so that the reference contact abuts a circuit board attached to the pins. The pins/leads are shielded all the way to the circuit board, which shields/isolates the pins from common mode and other types of interference. The adaptor maintains the shape of the signal pin and the reference pin during testing. The adaptor maintains a fixed impedance of the pins, which reduces or eliminates uncontrolled impedance and hence preserves system frequency response and reduces/eliminates erroneous ripple currents.

Abstract: A flexible resistive tip cable assembly includes a probe Radio Frequency (RF) connector structured to receive a RF differential signal and a testing connection assembly. A coaxial cable is structured to conduct the RF differential signal between the probe RF connector and the testing connection assembly. The coaxial cable includes a cable for conducting the differential signal, and a plurality of magnetic elements positioned along a length of the cable and structured to isolate the differential signal from common mode interference. The magnetic elements are separated from adjacent magnetic elements by a gap with elastomeric elements is positioned in each gap to provide cable flexibility. The assembly may also include an Electrically Erasable Programmable Read Only Memory (EEPROM) loaded with an attenuation associated with the flexible resistive tip cable assembly for use in signal testing by a device coupled to the testing connection assembly.

Abstract: A differential pin to RF adaptor includes a center conductor contact with an RF connector on one end and a signal contact on the other end. An insulating sleeve surrounds the central contact. A reference contact surrounds the insulating sleeve. The signal pin of the differential pair interfaces with the center conductor contact of the RF connector. The adaptor is structured to slide down over a pair of pins/leads so that the reference contact abuts a circuit board attached to the pins. The pins/leads are shielded all the way to the circuit board, which shields/isolates the pins from common mode and other types of interference. The adaptor maintains the shape of the signal pin and the reference pin during testing. The adaptor maintains a fixed impedance of the pins, which reduces or eliminates uncontrolled impedance and hence preserves system frequency response and reduces/eliminates erroneous ripple currents.

Abstract: A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a control unit output port to provide the clamped/limited output signal to an oscilloscope.

Abstract: A sensor head of a test and measurement instrument can include an input configured to receive an input signal from a device under test (DUT), an optical voltage sensor having signal input electrodes and control electrodes or one set of electrodes, wherein the input is connected to the signal input electrodes, and a bias control unit connected to the control electrodes and configured to reduce an error signal or the input signal bias control signal are electrically combined and applied to a single set of electrodes.

Abstract: The disclosed technology relates to a probe for use with a test and measurement instrument. The probe includes a digital multimeter or voltmeter with an analog-to-digital converter configured to measure a signal from a device under test and determine a digital measurement from the signal, a controller connected to the multimeter or voltmeter configured to receive the digital measurement from the multimeter or voltmeter, a digital communication interface connected to the controller configured to communicate with the controller, and a communication link connected to the digital communication interface and the analog signal interface to communicate with the test and measurement instrument.

Abstract: A test and measurement system including a device under test, an accessory, a controller and a test and measurement instrument. The accessory is connected to the device under test and includes a signal input to receive an input signal from the device under test, a compensation unit configured to apply a compensation signal internal to the accessory, and a signal output to output an output signal read from the device under test. The controller is connected to the accessory and includes one or more receivers to receive the input signal and the output signal from the accessory, and a microcontroller or correction circuit configured to compare the input signal and the output signal and in response to the comparison provide a compensation signal to the compensation unit.

Abstract: An electro-optic modulator of a test and measurement system. The electro-optic modulator includes a first electrode, a second electrode with identical electrical characteristics as the first electrode and an optical waveguide between the first electrode and the second electrode. The first electrode and the second electrode present a balanced load to a device under test.

Abstract: A test and measurement system including an electro-optical accessory with an electro-optical sensor configured to output a modulated output signal, a device under test connected to the electro-optical accessory with a variable input signal, and a processor. The electro-optical accessory includes two sets of electrodes in which a sensitivity of the first set of electrodes is different from a sensitivity of the second set of electrodes. The processor in the test and measurement system is configured to modify the modulated output signal from the electro-optical voltage accessory to reconstruct the variable input signal of the electro-optical voltage accessory that exceeds the linear input range of the optical sensor.

Abstract: An accessory for use with a test and measurement instrument. The accessory includes an input to receive a signal from a device under test, a calibration unit configured to apply a calibration or compensation signal internal to the accessory, and an output to output the signal from the device under test or the calibration or compensation signal to a test and measurement instrument.

Abstract: A test and measurement system including an electro-optical voltage accessory with an electro-optical sensor configured to output a modulated output signal, a device under test connected to the electro-optical voltage accessory with a variable input signal that exceeds a linear input range of the optical sensor, and a processor. The processor is configured to modify the modulated output signal from the electro-optical voltage accessory to reconstruct the variable input signal of the electro-optical voltage accessory that exceeds the linear input range of the optical sensor.

Abstract: A method of controlling the gain or sensitivity of a test and measurement system. The test and measurement system includes a host, a controller with an optical transmitter and an optical receiver, optical-to-electrical converter, an accessory head, and a device under test. The method includes determining whether a gain or sensitivity adjustment of the test and measurement system is required, determining the amount of gain or sensitivity adjustment, and adjusting the output power of a laser of the optical transmitter in response to the determination of the gain or sensitivity adjustment of the test and measurement system.

Abstract: A test and measurement system including a device under test, an accessory, a controller and a test and measurement instrument. The accessory is connected to the device under test and includes a signal input to receive an input signal from the device under test, a compensation unit configured to apply a compensation signal internal to the accessory, and a signal output to output an output signal read from the device under test. The controller is connected to the accessory and includes one or more receivers to receive the input signal and the output signal from the accessory, and a microcontroller or correction circuit configured to compare the input signal and the output signal and in response to the comparison provide a compensation signal to the compensation unit.

Abstract: A test and measurement system including an electro-optical voltage accessory with an electro-optical sensor configured to output a modulated output signal, a device under test connected to the electro-optical voltage accessory with a variable input signal that exceeds a linear input range of the optical sensor, and a processor. The processor is configured to modify the modulated output signal from the electro-optical voltage accessory to reconstruct the variable input signal of the electro-optical voltage accessory that exceeds the linear input range of the optical sensor.

Abstract: A method of controlling the gain or sensitivity of a test and measurement system. The test and measurement system includes a host, a controller with an optical transmitter and an optical receiver, optical-to-electrical converter, an accessory head, and a device under test. The method includes determining whether a gain or sensitivity adjustment of the test and measurement system is required, determining the amount of gain or sensitivity adjustment, and adjusting the output power of a laser of the optical transmitter in response to the determination of the gain or sensitivity adjustment of the test and measurement system.

Abstract: An accessory for use with a test and measurement instrument. The accessory includes an input to receive a signal from a device under test, a calibration unit configured to apply a calibration or compensation signal internal to the accessory, and an output to output the signal from the device under test or the calibration or compensation signal to a test and measurement instrument.

Abstract: The disclosed technology relates to a probe for use with a test and measurement instrument. The probe includes a digital multimeter or voltmeter with an analog-to-digital converter configured to measure a signal from a device under test and determine a digital measurement from the signal, a controller connected to the multimeter or voltmeter configured to receive the digital measurement from the multimeter or voltmeter, a digital communication interface connected to the controller configured to communicate with the controller, and a communication link connected to the digital communication interface and the analog signal interface to communicate with the test and measurement instrument.

Abstract: An accessory device voltage management system includes an accessory device selectively coupled to a host. The host provides a bulk power supply and a low power supply voltage to the accessory device. The host receives accessory device parameters from the device and determines if the accessory device is a valid and supported device and, if so, sends commands to the accessory device to couple the bulk power supply voltage to a power supply circuit in the accessory device. The power supply circuit in the accessory device generates at least a first regulated voltage output.