Patents by Inventor Michael J. Wadzita

Michael J. Wadzita has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11650225
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Grant
    Filed: November 30, 2021
    Date of Patent: May 16, 2023
    Assignee: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Publication number: 20220196701
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Application
    Filed: November 30, 2021
    Publication date: June 23, 2022
    Applicant: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Patent number: 11187720
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Grant
    Filed: June 18, 2018
    Date of Patent: November 30, 2021
    Assignee: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Publication number: 20200200794
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Application
    Filed: June 18, 2018
    Publication date: June 25, 2020
    Applicant: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Patent number: 9329967
    Abstract: Method and related systems are described for navigating through information related to the status of one or more layers of a signal, such as a serial or parallel bus. Information may be displayed by selecting fields within a visual depicted on an oscilloscope or similar measuring instrument. By selecting particular fields, and indicators, different aspects of a layer may be analyzed without the need to have extensive knowledge of the operation of the measuring instrument.
    Type: Grant
    Filed: November 13, 2012
    Date of Patent: May 3, 2016
    Assignee: TEKTRONIX, INC.
    Inventors: Keith D. Rule, Walter R. Strand, Keith A. Olson, Michael J. Wadzita, Steve M. Mishler
  • Patent number: 9178792
    Abstract: Embodiments of this invention include a protocol sensitive visual navigation apparatus, and associated methods, for navigating and relating different protocol levels of a protocol. A test and measurement instrument can include the protocol sensitive visual navigation apparatus, which can facilitate analyzing, searching, and measuring various aspects of the different protocol layers and cross-correlating items from one protocol layer to another protocol layer. The type and characteristics of the analysis is informed by a selected protocol layer. Physical layer signals or events can be correlated to protocol level information, thereby increasing an understanding of the overall protocol and associated protocol layers and events.
    Type: Grant
    Filed: November 16, 2011
    Date of Patent: November 3, 2015
    Assignee: Tektronix, Inc.
    Inventors: Keith D. Rule, Michael J. Wadzita, Walter R. Strand
  • Publication number: 20140136899
    Abstract: Method and related systems are described for navigating through information related to the status of one or more layers of a signal, such as a serial or parallel bus. Information may be displayed by selecting fields within a visual depicted on an oscilloscope or similar measuring instrument. By selecting particular fields, and indicators, different aspects of a layer may be analyzed without the need to have extensive knowledge of the operation of the measuring instrument.
    Type: Application
    Filed: November 13, 2012
    Publication date: May 15, 2014
    Applicant: TEKTRONIX, INC.
    Inventors: Keith D. Rule, Walter R. Strand, Keith A. Olson, Michael J. Wadzita, Steve M. Mishler
  • Publication number: 20130125006
    Abstract: Embodiments of this invention include a protocol sensitive visual navigation apparatus, and associated methods, for navigating and relating different protocol levels of a protocol. A test and measurement instrument can include the protocol sensitive visual navigation apparatus, which can facilitate analyzing, searching, and measuring various aspects of the different protocol layers and cross-correlating items from one protocol layer to another protocol layer. The type and characteristics of the analysis is informed by a selected protocol layer. Physical layer signals or events can be correlated to protocol level information, thereby increasing an understanding of the overall protocol and associated protocol layers and events.
    Type: Application
    Filed: November 16, 2011
    Publication date: May 16, 2013
    Applicant: TEKTRONIX, INC.
    Inventors: Keith D. RULE, Michael J. WADZITA, Walter R. STRAND
  • Patent number: 7801206
    Abstract: An encoded serial data bit error analyzer captures the actual waveform of an encoded serial data stream associated with a bit error so that a user may readily validate the cause of the bit error. An encoded serial data stream decoder in the analyzer is modified to provide a signal for a trigger system when a characteristic of a bit error failure is detected. A power splitter produces a pair of incident encoded serial data streams from a programmable test signal, one of which is input to a device under test and the other is input to the analyzer. A re-transmitted encoded serial data stream from the device under test is input to another channel of the analyzer. The encoded serial data stream decoder provides an “error detected” output when a condition occurs in the re-transmitted encoded serial data stream indicative of a bit error. The “error detected” output is used as a trigger signal to capture the incident and re-transmitted encoded serial data waveforms surrounding the detected bit error.
    Type: Grant
    Filed: May 1, 2006
    Date of Patent: September 21, 2010
    Assignee: Tektronix, Inc.
    Inventors: John C. Calvin, Michael J. Wadzita
  • Patent number: 7227549
    Abstract: A method of indicating and manipulating a zoom region of a waveform being displayed includes a zoom region indicator. The zoom region indicator has an associated marker that spans the zoom region but is never less than a minimum span to allow ease of identifying or locating the zoom region on the displayed waveform. Manipulating the associated marker with a pointer device causes the zoom region to move accordingly along the displayed waveform. The portion of the displayed waveform that is within the zoom region is displayed as a zoomed waveform on the display.
    Type: Grant
    Filed: January 29, 2004
    Date of Patent: June 5, 2007
    Assignee: Tektronix, Inc.
    Inventors: Robert L. Beasley, Robert D. Twete, Michael J. Wadzita
  • Publication number: 20040183818
    Abstract: A method of indicating and manipulating a zoom region of a waveform being displayed includes a zoom region indicator. The zoom region indicator has an associated marker that spans the zoom region but is never less than a minimum span to allow ease of identifying or locating the zoom region on the displayed waveform. Manipulating the associated marker with a pointer device causes the zoom region to move accordingly along the displayed waveform. The portion of the displayed waveform that is within the zoom region is displayed as a zoomed waveform on the display.
    Type: Application
    Filed: January 29, 2004
    Publication date: September 23, 2004
    Inventors: Robert L. Beasley, Robert D. Twete, Michael J. Wadzita
  • Patent number: D776106
    Type: Grant
    Filed: September 11, 2015
    Date of Patent: January 10, 2017
    Assignee: TEKTRONIX, INC.
    Inventors: Marc A. Gessford, Samuel A. Cassel, Lawrence M. Le Mon, Neil Clayton, Stanley G. Miller, Jessica Anna Dunn, Karl A. Rinder, Michael J. Wadzita, Thuy T. Nguyen, Michael C. Moore
  • Patent number: D808969
    Type: Grant
    Filed: November 28, 2016
    Date of Patent: January 30, 2018
    Assignee: Tektronix, Inc.
    Inventors: Marc A. Gessford, Samuel A. Cassel, Lawrence M. Le Mon, Neil Clayton, Stanley G. Miller, Jessica Anna Dunn, Karl A. Rinder, Michael J. Wadzita, Thuy T. Nguyen, Michael C. Moore
  • Patent number: D808970
    Type: Grant
    Filed: November 28, 2016
    Date of Patent: January 30, 2018
    Assignee: Tektronix, Inc.
    Inventors: Marc A. Gessford, Samuel A. Cassel, Lawrence M. Le Mon, Neil Clayton, Stanley G. Miller, Jessica Anna Dunn, Karl A. Rinder, Michael J. Wadzita, Thuy T. Nguyen, Michael C. Moore
  • Patent number: D820129
    Type: Grant
    Filed: May 11, 2017
    Date of Patent: June 12, 2018
    Assignee: Tektronix, Inc.
    Inventors: Robert R. Kreitzer, Gary J. Waldo, Kenneth P. Dobyns, Mark A. Briscoe, Michael J. Wadzita, Pechluck S. Laskey, Jared Randall, Jordan P. Evans, Joshua M. Kornfeld, Jonah S. Griffith, Phelan W. Miller