Patents by Inventor Michael J. Wadzita
Michael J. Wadzita has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11650225Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.Type: GrantFiled: November 30, 2021Date of Patent: May 16, 2023Assignee: Tektronix, Inc.Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
-
Publication number: 20220196701Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.Type: ApplicationFiled: November 30, 2021Publication date: June 23, 2022Applicant: Tektronix, Inc.Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
-
Patent number: 11187720Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.Type: GrantFiled: June 18, 2018Date of Patent: November 30, 2021Assignee: Tektronix, Inc.Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
-
Publication number: 20200200794Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.Type: ApplicationFiled: June 18, 2018Publication date: June 25, 2020Applicant: Tektronix, Inc.Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
-
Patent number: 9329967Abstract: Method and related systems are described for navigating through information related to the status of one or more layers of a signal, such as a serial or parallel bus. Information may be displayed by selecting fields within a visual depicted on an oscilloscope or similar measuring instrument. By selecting particular fields, and indicators, different aspects of a layer may be analyzed without the need to have extensive knowledge of the operation of the measuring instrument.Type: GrantFiled: November 13, 2012Date of Patent: May 3, 2016Assignee: TEKTRONIX, INC.Inventors: Keith D. Rule, Walter R. Strand, Keith A. Olson, Michael J. Wadzita, Steve M. Mishler
-
Patent number: 9178792Abstract: Embodiments of this invention include a protocol sensitive visual navigation apparatus, and associated methods, for navigating and relating different protocol levels of a protocol. A test and measurement instrument can include the protocol sensitive visual navigation apparatus, which can facilitate analyzing, searching, and measuring various aspects of the different protocol layers and cross-correlating items from one protocol layer to another protocol layer. The type and characteristics of the analysis is informed by a selected protocol layer. Physical layer signals or events can be correlated to protocol level information, thereby increasing an understanding of the overall protocol and associated protocol layers and events.Type: GrantFiled: November 16, 2011Date of Patent: November 3, 2015Assignee: Tektronix, Inc.Inventors: Keith D. Rule, Michael J. Wadzita, Walter R. Strand
-
Publication number: 20140136899Abstract: Method and related systems are described for navigating through information related to the status of one or more layers of a signal, such as a serial or parallel bus. Information may be displayed by selecting fields within a visual depicted on an oscilloscope or similar measuring instrument. By selecting particular fields, and indicators, different aspects of a layer may be analyzed without the need to have extensive knowledge of the operation of the measuring instrument.Type: ApplicationFiled: November 13, 2012Publication date: May 15, 2014Applicant: TEKTRONIX, INC.Inventors: Keith D. Rule, Walter R. Strand, Keith A. Olson, Michael J. Wadzita, Steve M. Mishler
-
Publication number: 20130125006Abstract: Embodiments of this invention include a protocol sensitive visual navigation apparatus, and associated methods, for navigating and relating different protocol levels of a protocol. A test and measurement instrument can include the protocol sensitive visual navigation apparatus, which can facilitate analyzing, searching, and measuring various aspects of the different protocol layers and cross-correlating items from one protocol layer to another protocol layer. The type and characteristics of the analysis is informed by a selected protocol layer. Physical layer signals or events can be correlated to protocol level information, thereby increasing an understanding of the overall protocol and associated protocol layers and events.Type: ApplicationFiled: November 16, 2011Publication date: May 16, 2013Applicant: TEKTRONIX, INC.Inventors: Keith D. RULE, Michael J. WADZITA, Walter R. STRAND
-
Patent number: 7801206Abstract: An encoded serial data bit error analyzer captures the actual waveform of an encoded serial data stream associated with a bit error so that a user may readily validate the cause of the bit error. An encoded serial data stream decoder in the analyzer is modified to provide a signal for a trigger system when a characteristic of a bit error failure is detected. A power splitter produces a pair of incident encoded serial data streams from a programmable test signal, one of which is input to a device under test and the other is input to the analyzer. A re-transmitted encoded serial data stream from the device under test is input to another channel of the analyzer. The encoded serial data stream decoder provides an “error detected” output when a condition occurs in the re-transmitted encoded serial data stream indicative of a bit error. The “error detected” output is used as a trigger signal to capture the incident and re-transmitted encoded serial data waveforms surrounding the detected bit error.Type: GrantFiled: May 1, 2006Date of Patent: September 21, 2010Assignee: Tektronix, Inc.Inventors: John C. Calvin, Michael J. Wadzita
-
Patent number: 7227549Abstract: A method of indicating and manipulating a zoom region of a waveform being displayed includes a zoom region indicator. The zoom region indicator has an associated marker that spans the zoom region but is never less than a minimum span to allow ease of identifying or locating the zoom region on the displayed waveform. Manipulating the associated marker with a pointer device causes the zoom region to move accordingly along the displayed waveform. The portion of the displayed waveform that is within the zoom region is displayed as a zoomed waveform on the display.Type: GrantFiled: January 29, 2004Date of Patent: June 5, 2007Assignee: Tektronix, Inc.Inventors: Robert L. Beasley, Robert D. Twete, Michael J. Wadzita
-
Publication number: 20040183818Abstract: A method of indicating and manipulating a zoom region of a waveform being displayed includes a zoom region indicator. The zoom region indicator has an associated marker that spans the zoom region but is never less than a minimum span to allow ease of identifying or locating the zoom region on the displayed waveform. Manipulating the associated marker with a pointer device causes the zoom region to move accordingly along the displayed waveform. The portion of the displayed waveform that is within the zoom region is displayed as a zoomed waveform on the display.Type: ApplicationFiled: January 29, 2004Publication date: September 23, 2004Inventors: Robert L. Beasley, Robert D. Twete, Michael J. Wadzita
-
Patent number: D776106Type: GrantFiled: September 11, 2015Date of Patent: January 10, 2017Assignee: TEKTRONIX, INC.Inventors: Marc A. Gessford, Samuel A. Cassel, Lawrence M. Le Mon, Neil Clayton, Stanley G. Miller, Jessica Anna Dunn, Karl A. Rinder, Michael J. Wadzita, Thuy T. Nguyen, Michael C. Moore
-
Patent number: D808969Type: GrantFiled: November 28, 2016Date of Patent: January 30, 2018Assignee: Tektronix, Inc.Inventors: Marc A. Gessford, Samuel A. Cassel, Lawrence M. Le Mon, Neil Clayton, Stanley G. Miller, Jessica Anna Dunn, Karl A. Rinder, Michael J. Wadzita, Thuy T. Nguyen, Michael C. Moore
-
Patent number: D808970Type: GrantFiled: November 28, 2016Date of Patent: January 30, 2018Assignee: Tektronix, Inc.Inventors: Marc A. Gessford, Samuel A. Cassel, Lawrence M. Le Mon, Neil Clayton, Stanley G. Miller, Jessica Anna Dunn, Karl A. Rinder, Michael J. Wadzita, Thuy T. Nguyen, Michael C. Moore
-
Patent number: D820129Type: GrantFiled: May 11, 2017Date of Patent: June 12, 2018Assignee: Tektronix, Inc.Inventors: Robert R. Kreitzer, Gary J. Waldo, Kenneth P. Dobyns, Mark A. Briscoe, Michael J. Wadzita, Pechluck S. Laskey, Jared Randall, Jordan P. Evans, Joshua M. Kornfeld, Jonah S. Griffith, Phelan W. Miller