Front panel for a measurement instrument

- Tektronix, Inc.
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Description

FIG. 1 is a front left perspective view of a test and measurement instrument incorporating the ornamental design of the front panel.

FIG. 2 is a front right perspective view of the front panel for a measurement instrument of FIG. 1.

FIG. 3 is a front elevation view of the front panel for a measurement instrument of FIG. 1. FIG. 3A is an enlarged view of the arrangement of the controls of the of the front panel for a measurement instrument of FIG. 1.

FIG. 4 is a right-side elevation of the front panel for a measurement instrument of FIG. 1.

FIG. 5 is a left-side elevation of the front panel for a measurement instrument of FIG. 1.

FIG. 6 is a top plan view of the front panel for a measurement instrument of FIG. 1; and,

FIG. 7 is a bottom plan view of the front panel for a measurement instrument of FIG. 1.

The portions of the front panel for a measurement instrument shown in broken lines form no part of the claimed design.

Claims

The ornamental design for a front panel for a measurement instrument, as shown and described.

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Patent History
Patent number: D820129
Type: Grant
Filed: May 11, 2017
Date of Patent: Jun 12, 2018
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventors: Robert R. Kreitzer (Tigard, OR), Gary J. Waldo (Hillsboro, OR), Kenneth P. Dobyns (Beaverton, OR), Mark A. Briscoe (Portland, OR), Michael J. Wadzita (Vancouver, WA), Pechluck S. Laskey (Portland, OR), Jared Randall (Seattle, WA), Jordan P. Evans (Seattle, WA), Joshua M. Kornfeld (Seattle, WA), Jonah S. Griffith (Seattle, WA), Phelan W. Miller (Seattle, WA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/603,725