Abstract: A method for controlling the flow of wafers through a process flow includes monitoring operating states of a plurality of processing tools adapted to process wafers; measuring a characteristic of a particular incoming wafer; identifying a particular processing tool having an operating state complimentary to the measured characteristic; and routing the particular incoming wafer to the particular processing tool for processing. A manufacturing system includes a plurality of processing tools adapted to process wafers and a process control server. The process control server is adapted to access metrology data related to a characteristic of a particular incoming wafer, identify a particular processing tool having an operating state complimentary to the characteristic, and route the particular incoming wafer to the particular processing tool for processing.

Abstract: The present invention provides for a method and an apparatus for using scatterometry to perform feedback and feed-forward control. A processing run of semiconductor devices is performed. Metrology data from the processed semiconductor devices is acquired. Error data is acquired by analyzing the acquired metrology data. A determination is made whether the error data merits modification to the processing of semiconductor devices. A feedback modification of the processing of semiconductor devices is performed in response to the determination that the error data merits modification to the processing of semiconductor devices. A feed-forward modification of the processing of the semiconductor devices is performed in response to the determination that the error data merits modification to the processing of semiconductor devices.

Abstract: A method and apparatus for scheduled controller execution based upon impending lot arrival at a processing tool in an APC framework. It is determined which lot of processing pieces that is to be processed by a processing tool and the lot of processing pieces is retrieved from a remote location. A predefined set of calculations is initiated relating to the operation of the processing tool in anticipation of delivering the lot of processing pieces to the processing tool. The lot of processing pieces is delivered to the processing tool, and the processing pieces are processed by the processing tool using the predefined set of calculations.

Abstract: A metbod for perforning a wafer-less qualification of a processing tool includes creating a wafer-less qualification model for the processing tool. Qualification data is generated from the processing tool iiiring a wafer-less qualification process. The qualification data is compared with the wafer-less qualification model. The processig tool is determined to be operating in a predefined state based on the comparison of the qualification data with the wafer-less qualification model.

Abstract: A method is provided for manufacturing, the method comprising processing a workpiece, measuring a parameter characteristic of the processing, and forming an output signal corresponding to the characteristic parameter measured by using the characteristic parameter measured as an input to a transistor model. The method also comprises predicting a wafer electrical test (WET) resulting value based on the output signal, detecting faulty processing based on the predicted WET resulting value, and correcting the faulty processing.

Abstract: A method for controlling a manufacturing system includes processing workpieces in a plurality of tools; initiating a baseline control script for a selected tool of the plurality of tools; providing context information for the baseline control script; determining a tool type based on the context information; selecting a control routine for the selected tool based on the tool type; and executing the control routine to generate a control action for the selected tool. A manufacturing system includes a plurality of tools adapted to process workpieces, a control execution manager, and a control executor. The control execution manager is adapted to initiate a baseline control script for a selected tool of the plurality of tools and provide context information for the baseline control script.

Abstract: There is provided a multiple-component tampon applicator formed from at least three separate components. A fingergrip having a reduced cross-section as compared to that of the barrel may be formed such that it is a separate component or is integrally formed with a barrel component. The reduced cross-section fingergrip provides exceptional grippability to the user. The multiple components may be formed from materials including, for example, biopolymer including starches and proteins, cardboard, heat shrink plastic, paper slurry, plastic, plastic tubing, pulp slurry, pulp-molded paper, or any combinations thereof. Prior to assembly of the applicator and prior to loading the barrel component with an absorbent pledget, petals may be formed on the insertion end of the barrel using existing processes and equipment. Alternatively, a separate insertion tip component having petals may be formed.

Abstract: A roll sensor system for a land vehicle is provided to determine when a vehicle roll condition has occurred and to trigger a safety system in response to that determination. In certain embodiments, an angular rate sensor is used to obtain an angular rate and, from the angular rate, an angle relative to the roll axis of the land vehicle. If the angular rate and the angle correspond to a safety system activation event, the roll sensor system will provide a trigger signal to the safety system. In some embodiments, the system includes an incline sensor(s) to aid in detecting and compensating for drift in the output of the angular rate sensor. In other embodiments the output of an angular rate sensor is used to validate the output of the incline sensor to aid in determining whether a vehicle safety system trigger event has occurred.

Abstract: The present invention provides a method and apparatus for performing automated development and updating of a manufacturing model for a manufacturing process. An initial manufacturing model is developed. Tolerances of the manufacturing model are expanded using additional production data. The manufacturing model is then re-developed using the expanded tolerances.

Abstract: The present invention provides for a method and an apparatus for interfacing a statistical process control system with a manufacturing control system. A manufacturing model is defined. A processing run of semiconductor devices is processed in a manufacturing facility as defined by the manufacturing model. An advanced process control analysis is performed on the processed semiconductor devices. A statistical process control analysis is performed on the processed semiconductor devices. The manufacturing facility is modified in response to the advanced process control analysis and the statistical process control analysis.

Abstract: A tampon applicator is provided that comprises a tubular barrel adapted to house a pledget and a telescoping plunger adapted to expel the pledget out of the barrel. A portion of the applicator has a fingergrip area with at least one multi-directional gripping structure to enhance the gripping characteristics of the applicator. The multi-directional gripping structure allows the user to securely hold the applicator during insertion of the applicator into the vagina, expulsion of the pledget from the barrel of the applicator, and removal of the applicator from the vagina.

Abstract: A method for controlling critical dimensions of a feature formed on a semiconductor wafer includes illuminating the wafer; measuring light reflected off the wafer to generate a profile trace; comparing the profile trace to a target profile trace; and modifying an operating recipe of a processing tool used to form the feature based on a deviation between the profile trace and the target profile trace. A processing line includes a processing tool, a scatterometer, and a process controller. The processing tool is adapted to form a feature on a semiconductor wafer in accordance with an operating recipe. The scatterometer is adapted to receive the wafer. The scatterometer includes a light source adapted to illuminate the wafer and a light detector adapted to measure light from the light source reflected off the wafer to generate a profile trace.

Abstract: A method is provided. for manufacturing, the method including processing a workpiece in a processing step, measuring a parameter characteristic of the processing performed on the workpiece in the processing step, and forming an output signal corresponding to the characteristic parameter measured. The method also includes setting a target value for the processing performed in the processing step based on the output signal.

Abstract: The present invention provides for a method and an apparatus for using equipment state data for controlling a manufacturing process. Initial equipment state data is acquired. At least one semiconductor device is processed using the initial equipment state data is performed. Equipment and wafer state data processing is performed using data from the processing of the semiconductor device and the initial equipment state data. A determination is made whether at least one control input parameter used for processing of the semiconductor device is to be modified in response to performing the equipment and wafer state data processing. The control input parameter is modified in response to determining that at least one the control input parameter is to be modified.

Abstract: The invention generally relates to a needle assembly of the kind having a needle, an elongate blunting device, a shifting member, and a flash chamber. The needle is of the kind that has a needle proximal end, a sharp needle distal end and a needle cannula extending therethrough. The elongate blunting device is at least partially located within the needle cannula. The elongate blunting device is of the kind that has a blunting device proximal end, a blunting device distal end, and a blunting device blood flow passage therethrough through which blood can flow from the blunting device distal end to the blunting device proximal end.

Abstract: A method and device for thermal creep-sizing an annular-shaped structure. The creep-sizing device includes a ring member with through-holes present between the inner and outer diametrical boundaries of the ring member, and with through-slots alternatingly extending from each through-hole to either the inner or outer diametrical boundary. In use, the ring member is placed within the annular-shaped structure, and pins are installed in the through-holes in the ring member to cause the outer diametrical boundary of the ring member to diametrically expand. The structure and creep-sizing device are then heated so that the mechanically expanded ring member causes the structure to undergo thermal creep-sizing.

Abstract: There is provided a supporting rim structure of an open-ended tampon applicator for firmly supporting a tampon pledget that has been assembled in the applicator. The applicator supports the pledget around an intermediate section between its insertion end and its rear portion so that the insertion end is exposed outside of the applicator and the rear portion is inside of the applicator. In particular, the rim structure firmly supports the pledget against an axial force subjected to the pledget by a forming tool that forms the insertion end of the pledget into a rounded, hemispherical shape and yet readily allows the pledget to eject from the applicator. The rim structure has a shape that tapers angularly inward from the body of the applicator to form a rigid brace that counters the axial force subjected by the forming tool. Thus, while preventing the insertion end of the pledget from receding back into the applicator, the rim structure allows the pledget to easily eject from the applicator.

Abstract: There is provided a supporting rim structure of an open-ended tampon applicator for firmly supporting a tampon pledget that has been assembled in the applicator. The applicator supports the pledget around an intermediate section between its insertion end and its rear portion so that the insertion end is exposed outside of the applicator and the rear portion is inside of the applicator. In particular, the rim structure firmly supports the pledget against an axial force subjected to the pledget by a forming tool that forms the insertion end of the pledget into a rounded, hemispherical shape and yet readily allows the pledget to eject from the applicator. The rim structure has a shape that tapers angularly inward from the body of the applicator to form a rigid brace that counters the axial force subjected by the forming tool. Thus, while preventing the insertion end of the pledget from receding back into the applicator, the rim structure allows the pledget to easily eject from the applicator.

Abstract: A heat reservoir device for maintaining a comestible at a desired consumption temperature consisting essentially of a shaped reinforced thermoset polyester resin, preferably one made by reacting isophthalic acid, propylene glycol, and fumaric acid to form the unsaturated polyester and then forming a solution thereof in a vinyl monomer. The invention also include the method of maintaining a comestible at a desired temperature using such device.