Abstract: Optimizing an integrated circuit design to improve manufacturing yield using manufacturing data and algorithms to identify areas with high probability of failures, i.e. critical areas. The process further changes the layout of the circuit design to reduce critical area thereby reducing the probability of a fault occurring during manufacturing. Methods of identifying critical area include common run, geometry mapping, and Voronoi diagrams. Optimization includes but is not limited to incremental movement and adjustment of shape dimensions until optimization objectives are achieved and critical area is reduced.

Abstract: An approach that obtains a feasible integer solution in a hierarchical circuit layout optimization is described. In one embodiment, a hierarchical circuit layout and ground rule files are received as input. Constraints in the hierarchical circuit layout are represented as an original integer linear programming problem. A relaxed linear programming problem is derived from the original integer linear programming problem by relaxing integer constraints and using relaxation variables on infeasible constraints. The relaxed linear programming problem is solved to obtain a linear programming solution. A subset of variables from the relaxed linear programming problem is rounded to integer values according to the linear programming solution. Next, it is determined whether all the variables are rounded to integer values. Unrounded variables are iterated back through the deriving of the integer linear programming problem, solving of the relaxed linear programming problem, and rounding of a subset of variables.

Abstract: An approach that obtains a feasible integer solution in a hierarchical circuit layout optimization is described. In one embodiment, a hierarchical circuit layout and ground rule files are received as input. Constraints in the hierarchical circuit layout are represented as an original integer linear programming problem. A relaxed linear programming problem is derived from the original integer linear programming problem by relaxing integer constraints and using relaxation variables on infeasible constraints. The relaxed linear programming problem is solved to obtain a linear programming solution. Variables are then clustered, and at least one variable from each cluster is rounded to an integer value according to the linear programming solution. Next, it is determined whether all the variables are rounded to integer values. Unrounded variables are iterated back through the deriving of the integer linear programming problem, solving of the relaxed linear programming problem, and rounding of a subset of variables.

Abstract: A method, system and program product for context aware sub-circuit layout modification are disclosed. The method may include defining at least one context for the sub-circuit for each circuit that uses the sub-circuit; in the case that a plurality of contexts are defined, minimizing a number of contexts for the sub-circuit by combining contexts into at least one stage; placing each stage into a staged layout; and modifying the sub-circuit by modifying the staged layout.

Abstract: Meshed touchscreen pattern. A conductive pattern implemented within a touchscreen (e.g., using indium tin oxide (ITO) such as may be deposited on a substrate composed of polyester or some other material) provides paths for signals traveling through the touchscreen. By monitoring these signal in accordance with some means (e.g., cross point detection, zone detection, etc.) an estimate may be made as to a location of user's interaction with the touchscreen (e.g., finger or stylus touching of the touchscreen). The conductive pattern includes a number of conductors aligned in various directions (e.g., row and column conductors) across the touchscreen, and they are separated by a dielectric layer (e.g., air, SiO2, or any other desirable dielectric layer). The conductors include a great deal of interlacing and meshing as achieved by spurs, extensions, and/or protrusions (e.g., of any desired shape) extending from one conductor into an adjacent conductor within the conductive pattern.

Abstract: An adaptive weighting method for layout optimization differentiates different priorities by assigning the weight of a higher priority (pi) to be multiple of the weight of a lower priority (pi?1) where W(pi)=mi % W(pi?1. To avoid numerical imprecision, this method keeps the total cost in the objective function within a trustable range by scaling the initial weights in the objectives, while maintaining relativity, to produce the scaled weights.

Abstract: Optimizing an integrated circuit design to improve manufacturing yield using manufacturing data and algorithms to identify areas with high probability of failures, i.e. critical areas. The process further changes the layout of the circuit design to reduce critical area thereby reducing the probability of a fault occurring during manufacturing. Methods of identifying critical area include common run, geometry mapping, and Voronoi diagrams. Optimization includes but is not limited to incremental movement and adjustment of shape dimensions until optimization objectives are achieved and critical area is reduced.

Abstract: A method of and service for optimizing an integrated circuit design to improve manufacturing yield. The invention uses manufacturing data and algorithms to identify areas with high probability of failures, i.e. critical areas. The invention further changes the layout of the circuit design to reduce critical area thereby reducing the probability of a fault occurring during manufacturing. Methods of identifying critical area include common run, geometry mapping, and Voronoi diagrams. Optimization includes but is not limited to incremental movement and adjustment of shape dimensions until optimization objectives are achieved and critical area is reduced.

Abstract: A method of layout optimization containing parameterized cells includes reading a physical design containing parameterized cells, creating a new version for each of usage of a given parameterized cell. The method optimizes physical design shapes of each new version of the parameterized cell by assigning variables to parameters of the parameterized cell according to a desired objective. Then, the method updates the parameters of each new version of the parameterized cell and replaces each new version of the parameterized cell with an instance of the parameterized cell having updated parameters. The method can optionally adjust physical design shapes based on constraints related to the parameters.

Abstract: A method of modifying a VLSI layout for performance optimization includes defining a revised set of ground rules for a plurality of original device shapes to be modified and flattening the plurality of original device shapes to a prime cell. A layout optimization operation is performed on the flattened device shapes, based on the revised set of ground rules, so as to create a plurality of revised device shapes. An overlay cell is then created from a difference between the revised device shapes and the original device shapes.

Abstract: A method of polygonal area design rule correction for use in an electronic design automation tool for governing integrated circuit (IC) design layouts using one-dimensional (1-D) optimization, with steps of analyzing IC design layout data to identify violating polygons, partitioning violating polygons into rectangles in a direction of optimization, formulating an area constraint for each violating polygon to formulate a global linear programming (LP) problem that includes each constraint for each violating polygon and solving the global LP problem to obtain a real-valued solution. A next LP problem is created for each area constraint, and solved. The creating a next and solving the next LP problem and solving are repeated until the last “next LP problem” is solved using constraints and objectives representing sums or differences of no more than two optimization variables.

Abstract: A method, system and program product for context aware sub-circuit layout modification are disclosed. The method may include defining at least one context for the sub-circuit for each circuit that uses the sub-circuit; in the case that a plurality of contexts are defined, minimizing a number of contexts for the sub-circuit by combining contexts into at least one stage; placing each stage into a staged layout; and modifying the sub-circuit by modifying the staged layout.

Abstract: An approach that obtains a feasible integer solution in a hierarchical circuit layout optimization is described. In one embodiment, a hierarchical circuit layout and ground rule files are received as input. Constraints in the hierarchical circuit layout are represented as an original integer linear programming problem. A relaxed linear programming problem is derived from the original integer linear programming problem by relaxing integer constraints and using relaxation variables on infeasible constraints. The relaxed linear programming problem is solved to obtain a linear programming solution. A subset of variables from the relaxed linear programming problem is rounded to integer values according to the linear programming solution. Next, it is determined whether all the variables are rounded to integer values. Unrounded variables are iterated back through the deriving of the integer linear programming problem, solving of the relaxed linear programming problem, and rounding of a subset of variables.

Abstract: A method comprises extracting a hierarchical grid constraint set and modeling one or more critical objects of at least one cell as a variable set. The method further comprises solving a linear programming problem based on the hierarchical grid constraint set with the variable set to provide initial locations of the critical objects of the at least one cell and determining target on-grid locations of the one or more critical objects in the at least one cell using the results of the linear programming solution.

Abstract: A method of optimizing hierarchical very large scale integration (VLSI) design by use of cluster-based cell cloning. The method of the present invention provides improved yield or migration by reusing cells in order to reduce the number of unique instances of at least one of the reused cells. The method performs hierarchal optimization on the reduced set of clones (i.e., clusters). The method of the present disclosure includes, but is not limited to, the steps of setting the initial clustering parameters; assembling the physical design from existing reused cells; for each cell type, performing a full cloning operation in order to create a full set of duplicate cells; for each cell type, performing a full optimization of the design; for each cell type, performing an analyses of all cell environments and performing a clustering operation; and analyzing the overall results in order to determine whether the optimization objectives are achieved.

Abstract: An alignment tool for a laser beam delivery system includes a base having one or more registration elements and an alignment optic operably coupled to the base. The alignment optic has a fluorescent element and a front surface. The fluorescent element is configured to fluoresce when illuminated by electromagnetic radiation produced by a laser. The front surface includes a reflective surface and an alignment mark. The reflective surface is configured to specularly reflect the electromagnetic radiation, while the alignment mark, which is centrally disposed within the reflective surface, is configured to diffusely scatter the electromagnetic radiation.

Abstract: A method of and service for optimizing an integrated circuit design to improve manufacturing yield. The invention uses manufacturing data and algorithms to identify areas with high probability of failures, i.e. critical areas. The invention further changes the layout of the circuit design to reduce critical area thereby reducing the probability of a fault occurring during manufacturing. Methods of identifying critical area include common run, geometry mapping, and Voronoi diagrams. Optimization includes but is not limited to incremental movement and adjustment of shape dimensions until optimization objectives are achieved and critical area is reduced.

Abstract: A method of calculating critical area in an integrated circuit design, said method comprising: inputting an integrated circuit design; associating variables with the positions of edges in said integrated circuit design; and associating cost functions of said variables with spacing between said edges in said integrated circuit design; wherein said cost functions calculate critical area contributions as the positions and length of said edges in said integrated circuit design change, and wherein said critical area contributions comprise a measure of electrical fault characteristics of said spacing between said edges in said integrated circuit design.

Abstract: A method, system and program product for merging cloned and original circuit shapes such that a union thereof does not include a notch. The invention determines, for a cell including an original circuit shape and at least one overlapping clone of the original circuit shape, whether each clone corner point of each overlapping clone is within a threshold distance of a corresponding original corner point of the original circuit shape; and generates, in the case that each clone corner point of each overlapping clone circuit shape is within a threshold distance, a union of each overlapping clone and the original circuit shape such that the union does not contain a notch. The union is generated using a point code that sets a new position for a union corner point to remove a notch based on the original shape's direction and the edge orientations previous to and next to the corner point.

Abstract: A method, system and program product that implements area minimization of a circuit design while respecting the explicit and implicit design constraints, in the form of ground rules and user intent. A longest path algorithm is used to generate a scaling factor. The scaling factor is used to reduce the size of the circuit design to the minimum legal size. The scaling may be followed by application of minpert analysis to correct any errors introduced by the scaling. The resulting design is shrunk (or expanded) with all elements shrinking (or growing) together by the same factor, and with the relative relationships of elements maintained. In addition, the invention is operational in the presence of a positive cycle, can be run with scaling that freezes the sizes of any structure or ground rule, and can be applied to technology migration.