Patents by Inventor Michael Trainer

Michael Trainer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240080594
    Abstract: A speaker can have a main body with a generally spheroidal shape, which can be supported standing on its end. The speaker can include a subwoofer that faces forward. A plurality of mid-range drivers can be distributed around the sub-woofer, facing generally forward and radially outward. A plurality of tweeters can be distributed around the sub-woofer, facing generally forward and generally outward. The outer housing portion of the speaker can be covered with a fabric material. A user interface ring 162 can be touch sensitive to receive input, and can have a plurality of lights that can be illuminated separately to convey information to the user.
    Type: Application
    Filed: July 5, 2023
    Publication date: March 7, 2024
    Inventors: Timothy David Williamson, Peter Joseph Hamblin, Maximilian Vincent Wozniak, Robert James Wilson, Wilson E. Taylor, JR., Larry E. Hand, Mark Robert Westcott, Mark Edward Trainer, Ellie Rei Fukuda, Joel Robert Sietsema, Paul Michael Belanger, Matthew Patrick Lyons, Timothy Steven DeYoung, Werner Kirchmann, Ralph Wilhelm Hermann
  • Patent number: 11513047
    Abstract: The present invention comprises methods and apparatus utilizing multiple detectors to measure properties related to light scattered by particles. Characteristics of particles are determined from the measured properties.
    Type: Grant
    Filed: March 17, 2020
    Date of Patent: November 29, 2022
    Inventor: Michael Trainer
  • Publication number: 20210333189
    Abstract: These methods and apparatus improve the determination of particle characteristics from information derived from light scattered by particles.
    Type: Application
    Filed: March 10, 2021
    Publication date: October 28, 2021
    Inventor: Michael Trainer
  • Patent number: 10955327
    Abstract: Apparatus and methods for determining information about at least one particle by measuring light scattered from the particles. Scattered light is combined with light from a light source to produce an optical interference signal utilizing a plurality of beam splitting functions. Scattered light signals are corrected for signal components which are not derived from particle scatter.
    Type: Grant
    Filed: July 10, 2019
    Date of Patent: March 23, 2021
    Inventor: Michael Trainer
  • Publication number: 20200309663
    Abstract: The present invention comprises methods and apparatus utilizing multiple detectors to measure properties related to light scattered by particles. Characteristics of particles are determined from the measured properties.
    Type: Application
    Filed: March 17, 2020
    Publication date: October 1, 2020
    Inventor: Michael Trainer
  • Patent number: 10620105
    Abstract: The present invention comprises methods and apparatus utilizing multiple detectors to measure properties related to light scattered by particles. Characteristics of particles are determined from the measured properties.
    Type: Grant
    Filed: March 24, 2016
    Date of Patent: April 14, 2020
    Inventor: Michael Trainer
  • Publication number: 20200025665
    Abstract: Apparatus and methods for determining information about at least one particle by measuring light scattered from the particles. Scattered light is combined with light from a light source to produce an optical interference signal utilizing a plurality of beam splitting functions. Scattered light signals are corrected for signal components which are not derived from particle scatter.
    Type: Application
    Filed: July 10, 2019
    Publication date: January 23, 2020
    Inventor: Michael Trainer
  • Patent number: 10386283
    Abstract: An instrument for measuring characteristics of particles. A particle sample is introduced into a sample cell. The sample particles are subjected to gravitational or centrifugal forces wherein particle motion is dependent upon particle characteristics. The particles are illuminated by an illumination device to produce light scattered by the particles. The light is detected by at least one detector. Characteristics of the particles are determined from the detector signals.
    Type: Grant
    Filed: July 26, 2017
    Date of Patent: August 20, 2019
    Inventor: Michael Trainer
  • Patent number: 10113945
    Abstract: The present invention comprises methods and apparatus for measuring light scattering from particles and images of particles, and for combining size distributions from the measurements to produce a single size distribution over a larger size range.
    Type: Grant
    Filed: February 19, 2018
    Date of Patent: October 30, 2018
    Assignee: MICROTRAC INC.
    Inventor: Michael Trainer
  • Publication number: 20180188148
    Abstract: The present invention comprises methods and apparatus for measuring light scattering from particles and images of particles, and for combining size distributions from the measurements to produce a single size distribution over a larger size range.
    Type: Application
    Filed: February 19, 2018
    Publication date: July 5, 2018
    Applicant: Microtrac Inc.
    Inventor: Michael Trainer
  • Patent number: 9897524
    Abstract: The present invention comprises methods and apparatus for measuring light scattering from particles and images of particles in the same sample cell utilizing two light sources.
    Type: Grant
    Filed: May 9, 2017
    Date of Patent: February 20, 2018
    Assignee: MICROTRAC INC.
    Inventors: Jason LaForest, Michael Trainer
  • Publication number: 20170322133
    Abstract: An instrument for measuring characteristics of particles. A particle sample is introduced into a sample cell. The sample particles are subjected to gravitational or centrifugal forces wherein particle motion is dependent upon particle characteristics. The particles are illuminated by an illumination device to produce light scattered by the particles. The light is detected by at least one detector. Characteristics of the particles are determined from the detector signals.
    Type: Application
    Filed: July 26, 2017
    Publication date: November 9, 2017
    Inventor: Michael Trainer
  • Publication number: 20160202164
    Abstract: The present invention comprises methods and apparatus utilizing multiple detectors to measure properties related to light scattered by particles. Characteristics of particles are determined from the measured properties.
    Type: Application
    Filed: March 24, 2016
    Publication date: July 14, 2016
    Inventor: Michael Trainer
  • Patent number: 9297737
    Abstract: Method and apparatus are described for improving measurements of scattered light from particles by controlling multiple scattering and coincidence count levels. The scatter path in the particle dispersion and particle concentration are adjusted to reduce multiple scattering in ensemble particle scattering measurement. And the particle dispersion volume and particle concentration are adjusted to reduce coincidence counts in single particle scattering measurements. Alignment of the optical system, for measuring scattered light, is maintained by a reflection apparatus.
    Type: Grant
    Filed: January 17, 2014
    Date of Patent: March 29, 2016
    Inventor: Michael Trainer
  • Publication number: 20140226158
    Abstract: Apparatus and methods are described for determining information about at least one particle by measuring light scattered from the particles. Scattered light is detected from a region of a particle dispersion or from a larger region in a generally collimated illumination beam. Scattered light is also detected from a plurality of regions for improvement of repeatability.
    Type: Application
    Filed: April 17, 2014
    Publication date: August 14, 2014
    Inventor: Michael Trainer
  • Publication number: 20140152986
    Abstract: Method and apparatus are described for improving measurements of scattered light from particles by controlling multiple scattering and coincidence count levels. The scatter path in the particle dispersion and particle concentration are adjusted to reduce multiple scattering in ensemble particle scattering measurement. And the particle dispersion volume and particle concentration are adjusted to reduce coincidence counts in single particle scattering measurements. Alignment of the optical system, for measuring scattered light, is maintained by a reflection apparatus.
    Type: Application
    Filed: January 17, 2014
    Publication date: June 5, 2014
    Inventor: Michael Trainer
  • Patent number: 8705040
    Abstract: An apparatus and method for determining characteristics of particles, by measuring characteristics which are related to the velocity of the particles. Particle size distribution is determined from motion of the particles in an acceleration field, or from Brownian motion of the particles. Zeta potential and particle mobility are determined by measuring velocity related characteristics of charged particles in an electric field. Particle velocity characteristics are determined by measuring dynamic properties of light, which is scattered by the particles. A light source illuminates the particles. Scattered light, from the particles, is mixed with light, from the light source, onto at least one light detector. The detector produces a signal, which is indicative of velocity related characteristics of the particles. The velocity characteristics are also determined by measuring light scattered from particles moving through an illumination pattern, with a periodic intensity structure.
    Type: Grant
    Filed: March 30, 2010
    Date of Patent: April 22, 2014
    Inventor: Michael Trainer
  • Patent number: 8634072
    Abstract: An instrument for measuring characteristics of a particle sample by counting and classifying particles into selected ranges of particle characteristics. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles of interest at one time is reduced to an acceptable level. A light beam is projected through a sample space, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle characteristics. So both the decrease in the beam intensity, due to light removal by the particle, and light scattered by the particle, may be used to determine the particle characteristics, to classify the particle and count it in a certain range of particle characteristics.
    Type: Grant
    Filed: May 21, 2010
    Date of Patent: January 21, 2014
    Inventor: Michael Trainer
  • Publication number: 20100231909
    Abstract: An apparatus and method for determining characteristics of particles, by measuring characteristics which are related to the velocity of the particles. Particle size distribution is determined from motion of the particles in an acceleration field, or from Brownian motion of the particles. Zeta potential and particle mobility are determined by measuring velocity related characteristics of charged particles in an electric field. Particle velocity characteristics are determined by measuring dynamic properties of light, which is scattered by the particles. A light source illuminates the particles. Scattered light, from the particles, is mixed with light, from the light source, onto at least one light detector. The detector produces a signal, which is indicative of velocity related characteristics of the particles. The velocity characteristics are also determined by measuring light scattered from particles moving through an illumination pattern, with a periodic intensity structure.
    Type: Application
    Filed: March 30, 2010
    Publication date: September 16, 2010
    Inventor: Michael Trainer
  • Publication number: 20100225913
    Abstract: An instrument for measuring characteristics of a particle sample by counting and classifying particles into selected ranges of particle characteristics. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles of interest at one time is reduced to an acceptable level. A light beam is projected through a sample space, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle characteristics. So both the decrease in the beam intensity, due to light removal by the particle, and light scattered by the particle, may be used to determine the particle characteristics, to classify the particle and count it in a certain range of particle characteristics.
    Type: Application
    Filed: May 21, 2010
    Publication date: September 9, 2010
    Inventor: Michael Trainer