Abstract: A skew control loop circuit for controlling a skew between a plurality of digital signals, and a semiconductor device, and a method of operation, for the same, may be provided. The skew control loop circuit comprises a skew detector for detecting a phase difference between the digital signals, a skew control circuit adapted for controlling an operation of the skew control loop circuit. The skew control circuit is operable in a first operating mode and in a second operating mode. The skew control loop circuit comprises also an enable input of the skew detector, wherein the enable input is adapted for receiving an enable input signal, generated by the skew control circuit, wherein the enable input is adapted for selectively enable or disable a phase detection operation of the skew detector, and wherein the enable input signal is only active during the first operating mode.

Abstract: A duty cycle correction device may be provided for correcting a duty cycle of an input signal. The device includes a first duty cycle correction circuit. The first duty cycle correction circuit receives the input signal. The first duty cycle correction circuit generates a first intermediate signal. The device includes a first programmable delay circuit. The first programmable delay circuit is controlled by a first delay control signal. The first programmable delay circuit receives the first intermediate signal. The first programmable delay circuit generates an output signal. The device includes a second duty cycle correction circuit. The second duty cycle correction circuit receives the input signal. The second duty cycle correction circuit generates a second intermediate signal. The device includes a second programmable delay circuit. The second programmable delay circuit generates a reference signal. The device includes a skew control arrangement operable for generating the first delay control signal.

Abstract: A circuit for measuring a transition time of a digital signal may be provided. The circuit comprises a window detector comprising a comparator circuitry arranged for generating a first signal based on comparing said digital signal with a first reference voltage and for generating a second signal based on comparing said digital signal with a second reference voltage. Additionally, the circuit comprises a time-difference-to-digital converter operable for converting a delay between an edge of said first signal and an edge of said second signal into a digital value, said digital value characterizing said transition time of said digital signal.

Abstract: A circuit for measuring a transition time of a digital signal may be provided. The circuit comprises a window detector comprising a comparator circuitry arranged for generating a first signal based on comparing said digital signal with a first reference voltage and for generating a second signal based on comparing said digital signal with a second reference voltage. Additionally, the circuit comprises a time-difference-to-digital converter operable for converting a delay between an edge of said first signal and an edge of said second signal into a digital value, said digital value characterizing said transition time of said digital signal.

Abstract: A computer identifies a metal layer, in a design, which contains routing track segregated by blockages. The sections of segregated routing track are removed and new routing track are added along the periphery of the blockage. It is determined if contact can be created between the component and the new routing track with the addition of a vertical interconnect access (VIA) structure. If contact can be created, then the VIA structures are added to create contact. If no contact can be created then another new routing track is added with (VIA) structures such that contact is created. Further routing track and VIA structures are added to higher metal layers to form a connection between a routing terminus located on a top metal layer and the new routing track and component.