Patents by Inventor Michael W. Senko

Michael W. Senko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10895578
    Abstract: A method includes applying distinct isobaric tags to each of a plurality of samples; combining the samples; performing a separation of species within the combined samples; isolating and fragmenting labeled parent ions within a m/z range to produce a plurality of reporter ions, each reporter ion corresponding to one of the isobaric tags; determining intensities of the plurality of reporter ions and ions representative of a parent species at a plurality of points along a peak; and fitting the intensity of the ions representative of a parent species and the plurality of reporter ions at the plurality of points to obtain a relative abundance of the parent species in each of the plurality of samples.
    Type: Grant
    Filed: December 15, 2017
    Date of Patent: January 19, 2021
    Assignee: THERMO FINNIGAN LLC
    Inventor: Michael W. Senko
  • Patent number: 10804088
    Abstract: A mass spectrometry method comprises: generating ions; directing the ions through an ion optical component within a first chamber having a first vacuum pressure, the ion optical component maintained at a first electrical potential; transferring the ions through an ion guide within a second chamber having a second vacuum pressure less than the first vacuum pressure, the ion guide maintained at a second electrical potential, wherein a difference between the first and second potentials imparts kinetic energy that causes collision-induced ion fragmentation within the second chamber that removes adduct species; and transferring the ions into another ion guide within a third chamber having a third vacuum pressure less than the second vacuum pressure, the other ion guide maintained at a third electrical potential, wherein a difference between the third and second potentials reduces a portion of the imparted kinetic energy of the ions passing into the third chamber.
    Type: Grant
    Filed: May 30, 2019
    Date of Patent: October 13, 2020
    Assignee: Thermo Finnigan LLC
    Inventors: Michael P. Goodwin, Michael W. Senko, Graeme C. McAlister
  • Patent number: 10424475
    Abstract: A method of operating an electrostatic trapping mass analyzer, comprising: introducing a sample of ions into a trapping region of the mass analyzer, wherein a trapping field within the trapping region is such that the ions exhibit radial motion with respect to a central longitudinal axis of the trapping region while undergoing harmonic motion in a dimension defined by the central longitudinal axis, the frequency of harmonic motion of a particular ion being a function of its mass-to-charge ratio; superimposing a modulation field onto the trapping field within the trapping region, the modulation field acting to either increase or reduce the harmonic motion energies of the ions by an amount varying according to the frequency of harmonic motion; and acquiring a mass spectrum of the ions in the trapping region by measuring a signal representative of an image current induced by the harmonic motion of the ions.
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: September 24, 2019
    Assignee: THERMO FINNIGAN LLC
    Inventors: Chad R. Weisbrod, Michael W. Senko, Jesse D. Canterbury, John E. P. Syka
  • Publication number: 20190187150
    Abstract: A method includes applying distinct isobaric tags to each of a plurality of samples; combining the samples; performing a separation of species within the combined samples; isolating and fragmenting labeled parent ions within a m/z range to produce a plurality of reporter ions, each reporter ion corresponding to one of the isobaric tags; determining intensities of the plurality of reporter ions and ions representative of a parent species at a plurality of points along a peak; and fitting the intensity of the ions representative of a parent species and the plurality of reporter ions at the plurality of points to obtain a relative abundance of the parent species in each of the plurality of samples.
    Type: Application
    Filed: December 15, 2017
    Publication date: June 20, 2019
    Inventor: Michael W. SENKO
  • Publication number: 20190122879
    Abstract: A method of operating an electrostatic trapping mass analyzer, comprising: introducing a sample of ions into a trapping region of the mass analyzer, wherein a trapping field within the trapping region is such that the ions exhibit radial motion with respect to a central longitudinal axis of the trapping region while undergoing harmonic motion in a dimension defined by the central longitudinal axis, the frequency of harmonic motion of a particular ion being a function of its mass-to-charge ratio; superimposing a modulation field onto the trapping field within the trapping region, the modulation field acting to either increase or reduce the harmonic motion energies of the ions by an amount varying according to the frequency of harmonic motion; and acquiring a mass spectrum of the ions in the trapping region by measuring a signal representative of an image current induced by the harmonic motion of the ions.
    Type: Application
    Filed: December 17, 2018
    Publication date: April 25, 2019
    Inventors: Chad R. WEISBROD, Michael W. SENKO, Jesse D. CANTERBURY, John E. P. SYKA
  • Patent number: 10192730
    Abstract: A method of operating an electrostatic trapping mass analyzer, comprising: introducing a sample of ions into a trapping region of the mass analyzer, wherein a trapping field within the trapping region is such that the ions exhibit radial motion with respect to a central longitudinal axis of the trapping region while undergoing harmonic motion in a dimension defined by the central longitudinal axis, the frequency of harmonic motion of a particular ion being a function of its mass-to-charge ratio; superimposing a modulation field onto the trapping field within the trapping region, the modulation field acting to either increase or reduce the harmonic motion energies of the ions by an amount varying according to the frequency of harmonic motion; and acquiring a mass spectrum of the ions in the trapping region by measuring a signal representative of an image current induced by the harmonic motion of the ions.
    Type: Grant
    Filed: August 30, 2016
    Date of Patent: January 29, 2019
    Assignee: Thermo Finnigan LLC
    Inventors: Chad R. Weisbrod, Michael W. Senko, Jesse D. Canterbury, John E. P. Syka
  • Publication number: 20190013188
    Abstract: Isobaric mass spectrometry tags (e.g., TMT) are susceptible to ratio compression, which arises from the co-isolation and co-fragmentation of interfering species that also contribute to the final reporter ion ratios. Additional stages of ion activation/transformation (e.g., MSn and PTR) have been shown to decrease ratio compression. Embodiments of the present invention include a mass spectrometry cleavable moiety on the isobaric mass tags. The cleavable moiety allows for a predictable mass loss, and results in an improved tag reporter ion purity.
    Type: Application
    Filed: July 6, 2018
    Publication date: January 10, 2019
    Inventors: Michael W. SENKO, Graeme McALISTER, Christopher L. Etienne
  • Publication number: 20180068838
    Abstract: A hybrid mass spectrometer design and architecture, and methods of operating mass spectrometers are disclosed. According to one operating method, an analysis time is determined for each one of a plurality of ion species to be analyzed in an ordered sequence, and an injection time is calculated for at least some of the ion species based on an analysis time of a preceding ion species in the ordered list. The method enables more efficient utilization of analyzer time.
    Type: Application
    Filed: November 13, 2017
    Publication date: March 8, 2018
    Inventors: Michael W. SENKO, Justin BLETHROW, Shannon Eliuk DIXON, Tonya SECOND, Vladimir ZABROUSKOV, Eric HEMENWAY
  • Publication number: 20180061625
    Abstract: A method of operating an electrostatic trapping mass analyzer, comprising: introducing a sample of ions into a trapping region of the mass analyzer, wherein a trapping field within the trapping region is such that the ions exhibit radial motion with respect to a central longitudinal axis of the trapping region while undergoing harmonic motion in a dimension defined by the central longitudinal axis, the frequency of harmonic motion of a particular ion being a function of its mass-to-charge ratio; superimposing a modulation field onto the trapping field within the trapping region, the modulation field acting to either increase or reduce the harmonic motion energies of the ions by an amount varying according to the frequency of harmonic motion; and acquiring a mass spectrum of the ions in the trapping region by measuring a signal representative of an image current induced by the harmonic motion of the ions.
    Type: Application
    Filed: August 30, 2016
    Publication date: March 1, 2018
    Inventors: Chad R. WEISBROD, Michael W. SENKO, Jesse D. CANTERBURY, John E. P. SYKA
  • Patent number: 9824871
    Abstract: A hybrid mass spectrometer design and architecture, and methods of operating mass spectrometers are disclosed. According to one operating method, an analysis time is determined for each one of a plurality of ion species to be analyzed in an ordered sequence, and an injection time is calculated for at least some of the ion species based on an analysis time of a preceding ion species in the ordered list. The method enables more efficient utilization of analyzer time.
    Type: Grant
    Filed: March 7, 2014
    Date of Patent: November 21, 2017
    Assignee: Thermo Finnigan LLC
    Inventors: Michael W. Senko, Justin Blethrow, Shannon Eliuk Dixon, Tonya Second, Vladimir Zabrouskov, Eric Hemenway
  • Patent number: 9818595
    Abstract: A mass spectrometer includes a radio frequency ion trap; and a controller. The controller is configured to cause an ion population to be injected into the radio frequency ion trap; supply a first isolation waveform to the radio frequency ion trap for a first duration, and supply a second isolation waveform to the radio frequency ion trap for a second duration. The first isolation waveform has at least a first wide notch at a first mass-to-charge ratio, and the second isolation waveform has at least a first narrow notch at the first mass-to-charge ratio. The first and second isolation waveforms are effective to isolate one or more precursor ions from the ion population.
    Type: Grant
    Filed: May 11, 2015
    Date of Patent: November 14, 2017
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Michael W. Senko, Jae C. Schwartz
  • Publication number: 20160336163
    Abstract: A mass spectrometer includes a radio frequency ion trap; and a controller. The controller is configured to cause an ion population to be injected into the radio frequency ion trap; supply a first isolation waveform to the radio frequency ion trap for a first duration, and supply a second isolation waveform to the radio frequency ion trap for a second duration. The first isolation waveform has at least a first wide notch at a first mass-to-charge ratio, and the second isolation waveform has at least a first narrow notch at the first mass-to-charge ratio. The first and second isolation waveforms are effective to isolate one or more precursor ions from the ion population.
    Type: Application
    Filed: May 11, 2015
    Publication date: November 17, 2016
    Inventors: Philip M. REMES, Michael W. SENKO, Jae C. SCHWARTZ
  • Patent number: 9455128
    Abstract: A method is disclosed for operating a mass spectrometer having a Fourier Transform (FT) analyzer, such as an orbital electrostatic trap mass analyzer, to avoid peak coalescence and/or other phenomena arising from frequency-shifting caused by ion-ion interactions. Ions of a first group are mass analyzed, for example in a quadrupole ion trap analyzer, to generate a mass spectrum. The estimated frequency shift of the characteristic periodic motion in the FT analyzer is calculated for one or more ion species of interest based on the intensities of adjacent (closely m/z-spaced) ion species. If the estimated frequency shift(s) for the one or more ion species exceeds a threshold, then a target ion population for an FT analyzer scan is adjusted downwardly to a value that produces a shift of acceptable value. An analytical scan of a second ion group is performed at the adjusted target ion population.
    Type: Grant
    Filed: June 16, 2015
    Date of Patent: September 27, 2016
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Michael W. Senko
  • Patent number: 9293312
    Abstract: A method is described for identifying the occurrence and location of charging of ion optic devices arranged along the ion path of a mass spectrometer. The method includes repeatedly performing a sequence of introducing a beam of discharge ions to a location on the ion path, and subsequently measuring the intensities of opposite-polarity sample ions delivered to a mass analyzer, with the discharge ions being delivered to a location further downstream in the ion path at each successive sequence.
    Type: Grant
    Filed: March 17, 2014
    Date of Patent: March 22, 2016
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Michael W. Senko, Michael W. Belford, Jae C. Schwartz, Jean-Jacques Dunyach, Berg Tehlirian
  • Publication number: 20160042937
    Abstract: A method for mass analyzing ions comprising a restricted range mass-to-charge (m/z) ratios comprising (i) performing a survey mass analysis, using a first mass analyzer employing indirect detection of ions by image current detection, to measure a flux of ions having m/z ratios within said range and (ii) performing a dependent mass analysis, using a second mass analyzer, of an optimal quantity of ions having m/z ratios within said range, said optimal quantity collected for a time period determined by the measured ion flux, the method characterized in that: the time period is determined using a corrected ion flux that includes a correction that comprises an estimate of the quantity of ions that are undetected by the first mass analyzer.
    Type: Application
    Filed: October 16, 2015
    Publication date: February 11, 2016
    Inventors: Philip M. REMES, Michael W. SENKO, Justin BLETHROW
  • Publication number: 20160035549
    Abstract: A hybrid mass spectrometer design and architecture, and methods of operating mass spectrometers are disclosed. According to one operating method, an analysis time is determined for each one of a plurality of ion species to be analyzed in an ordered sequence, and an injection time is calculated for at least some of the ion species based on an analysis time of a preceding ion species in the ordered list. The method enables more efficient utilization of analyzer time.
    Type: Application
    Filed: March 7, 2014
    Publication date: February 4, 2016
    Inventors: Michael W. SENKO, Justin BLETHROW, Shannon Eliuk DIXON, Tonya SECOND, Vladimir ZABROUSKOV, Eric HEMENWAY
  • Publication number: 20150364303
    Abstract: A method is disclosed for operating a mass spectrometer having a Fourier Transform (FT) analyzer, such as an orbital electrostatic trap mass analyzer, to avoid peak coalescence and/or other phenomena arising from frequency-shifting caused by ion-ion interactions. Ions of a first group are mass analyzed, for example in a quadrupole ion trap analyzer, to generate a mass spectrum. The estimated frequency shift of the characteristic periodic motion in the FT analyzer is calculated for one or more ion species of interest based on the intensities of adjacent (closely m/z-spaced) ion species. If the estimated frequency shift(s) for the one or more ion species exceeds a threshold, then a target ion population for an FT analyzer scan is adjusted downwardly to a value that produces a shift of acceptable value. An analytical scan of a second ion group is performed at the adjusted target ion population.
    Type: Application
    Filed: June 16, 2015
    Publication date: December 17, 2015
    Inventors: Philip M. REMES, Michael W. SENKO
  • Patent number: 9202681
    Abstract: A method for mass analyzing ions comprising a restricted range mass-to-charge (m/z) ratios comprising performing a survey mass analysis using a mass analyzer to measure a flux of ions having m/z ratios within said restricted range and performing a dependent mass analysis of an optimal quantity of ions having m/z ratios within said restricted range, said optimal quantity collected for a time period determined by the measured ion flux, CHARACTERIZED IN THAT: the time period is determined using a corrected ion flux that accounts for one or more of: (a) imperfect restriction of collected ions to the range of m/z ratios, (b) inclusion of ions within the range of m/z ratios that are undetected by the survey mass analysis, (c) different mass analyzers used for the dependent and survey mass analyses, and (d) different ion pathways used during dependent and the survey mass analyses.
    Type: Grant
    Filed: April 11, 2014
    Date of Patent: December 1, 2015
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Michael W. Senko
  • Patent number: 9165755
    Abstract: A method for mass analyzing ions comprising a restricted range mass-to-charge (m/z) ratios comprising (i) performing a survey mass analysis, using a first mass analyzer employing indirect detection of ions by image current detection, to measure a flux of ions having m/z ratios within said range and (ii) performing a dependent mass analysis, using a second mass analyzer, of an optimal quantity of ions having m/z ratios within said range, said optimal quantity collected for a time period determined by the measured ion flux, the method characterized in that: the time period is determined using a corrected ion flux that includes a correction that comprises an estimate of the quantity of ions that are undetected by the first mass analyzer.
    Type: Grant
    Filed: June 5, 2014
    Date of Patent: October 20, 2015
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Michael W. Senko, Justin Blethrow
  • Publication number: 20150179420
    Abstract: A sample ionization system includes at least an ionization source disposed at an ion source end of a charged particle analyzer, for selectably generating first ions in an analyzing mode of operation and second ions in a cleaning mode of operation. The first ions are one of positively and negatively charged and the second ions are the other one of positively and negatively charged. The second ions are directed through the charged particle analyzer toward a surface of an ion optic component, for at least partially neutralizing a buildup of charge caused by the first ions impinging on the surface of the at least one ion optic component.
    Type: Application
    Filed: December 20, 2013
    Publication date: June 25, 2015
    Applicant: Thermo Finnigan LLC
    Inventor: Michael W. SENKO