Patents by Inventor Michael W. Senko

Michael W. Senko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9824871
    Abstract: A hybrid mass spectrometer design and architecture, and methods of operating mass spectrometers are disclosed. According to one operating method, an analysis time is determined for each one of a plurality of ion species to be analyzed in an ordered sequence, and an injection time is calculated for at least some of the ion species based on an analysis time of a preceding ion species in the ordered list. The method enables more efficient utilization of analyzer time.
    Type: Grant
    Filed: March 7, 2014
    Date of Patent: November 21, 2017
    Assignee: Thermo Finnigan LLC
    Inventors: Michael W. Senko, Justin Blethrow, Shannon Eliuk Dixon, Tonya Second, Vladimir Zabrouskov, Eric Hemenway
  • Patent number: 9818595
    Abstract: A mass spectrometer includes a radio frequency ion trap; and a controller. The controller is configured to cause an ion population to be injected into the radio frequency ion trap; supply a first isolation waveform to the radio frequency ion trap for a first duration, and supply a second isolation waveform to the radio frequency ion trap for a second duration. The first isolation waveform has at least a first wide notch at a first mass-to-charge ratio, and the second isolation waveform has at least a first narrow notch at the first mass-to-charge ratio. The first and second isolation waveforms are effective to isolate one or more precursor ions from the ion population.
    Type: Grant
    Filed: May 11, 2015
    Date of Patent: November 14, 2017
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Michael W. Senko, Jae C. Schwartz
  • Publication number: 20160336163
    Abstract: A mass spectrometer includes a radio frequency ion trap; and a controller. The controller is configured to cause an ion population to be injected into the radio frequency ion trap; supply a first isolation waveform to the radio frequency ion trap for a first duration, and supply a second isolation waveform to the radio frequency ion trap for a second duration. The first isolation waveform has at least a first wide notch at a first mass-to-charge ratio, and the second isolation waveform has at least a first narrow notch at the first mass-to-charge ratio. The first and second isolation waveforms are effective to isolate one or more precursor ions from the ion population.
    Type: Application
    Filed: May 11, 2015
    Publication date: November 17, 2016
    Inventors: Philip M. REMES, Michael W. SENKO, Jae C. SCHWARTZ
  • Patent number: 9455128
    Abstract: A method is disclosed for operating a mass spectrometer having a Fourier Transform (FT) analyzer, such as an orbital electrostatic trap mass analyzer, to avoid peak coalescence and/or other phenomena arising from frequency-shifting caused by ion-ion interactions. Ions of a first group are mass analyzed, for example in a quadrupole ion trap analyzer, to generate a mass spectrum. The estimated frequency shift of the characteristic periodic motion in the FT analyzer is calculated for one or more ion species of interest based on the intensities of adjacent (closely m/z-spaced) ion species. If the estimated frequency shift(s) for the one or more ion species exceeds a threshold, then a target ion population for an FT analyzer scan is adjusted downwardly to a value that produces a shift of acceptable value. An analytical scan of a second ion group is performed at the adjusted target ion population.
    Type: Grant
    Filed: June 16, 2015
    Date of Patent: September 27, 2016
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Michael W. Senko
  • Patent number: 9293312
    Abstract: A method is described for identifying the occurrence and location of charging of ion optic devices arranged along the ion path of a mass spectrometer. The method includes repeatedly performing a sequence of introducing a beam of discharge ions to a location on the ion path, and subsequently measuring the intensities of opposite-polarity sample ions delivered to a mass analyzer, with the discharge ions being delivered to a location further downstream in the ion path at each successive sequence.
    Type: Grant
    Filed: March 17, 2014
    Date of Patent: March 22, 2016
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Michael W. Senko, Michael W. Belford, Jae C. Schwartz, Jean-Jacques Dunyach, Berg Tehlirian
  • Publication number: 20160042937
    Abstract: A method for mass analyzing ions comprising a restricted range mass-to-charge (m/z) ratios comprising (i) performing a survey mass analysis, using a first mass analyzer employing indirect detection of ions by image current detection, to measure a flux of ions having m/z ratios within said range and (ii) performing a dependent mass analysis, using a second mass analyzer, of an optimal quantity of ions having m/z ratios within said range, said optimal quantity collected for a time period determined by the measured ion flux, the method characterized in that: the time period is determined using a corrected ion flux that includes a correction that comprises an estimate of the quantity of ions that are undetected by the first mass analyzer.
    Type: Application
    Filed: October 16, 2015
    Publication date: February 11, 2016
    Inventors: Philip M. REMES, Michael W. SENKO, Justin BLETHROW
  • Publication number: 20160035549
    Abstract: A hybrid mass spectrometer design and architecture, and methods of operating mass spectrometers are disclosed. According to one operating method, an analysis time is determined for each one of a plurality of ion species to be analyzed in an ordered sequence, and an injection time is calculated for at least some of the ion species based on an analysis time of a preceding ion species in the ordered list. The method enables more efficient utilization of analyzer time.
    Type: Application
    Filed: March 7, 2014
    Publication date: February 4, 2016
    Inventors: Michael W. SENKO, Justin BLETHROW, Shannon Eliuk DIXON, Tonya SECOND, Vladimir ZABROUSKOV, Eric HEMENWAY
  • Publication number: 20150364303
    Abstract: A method is disclosed for operating a mass spectrometer having a Fourier Transform (FT) analyzer, such as an orbital electrostatic trap mass analyzer, to avoid peak coalescence and/or other phenomena arising from frequency-shifting caused by ion-ion interactions. Ions of a first group are mass analyzed, for example in a quadrupole ion trap analyzer, to generate a mass spectrum. The estimated frequency shift of the characteristic periodic motion in the FT analyzer is calculated for one or more ion species of interest based on the intensities of adjacent (closely m/z-spaced) ion species. If the estimated frequency shift(s) for the one or more ion species exceeds a threshold, then a target ion population for an FT analyzer scan is adjusted downwardly to a value that produces a shift of acceptable value. An analytical scan of a second ion group is performed at the adjusted target ion population.
    Type: Application
    Filed: June 16, 2015
    Publication date: December 17, 2015
    Inventors: Philip M. REMES, Michael W. SENKO
  • Patent number: 9202681
    Abstract: A method for mass analyzing ions comprising a restricted range mass-to-charge (m/z) ratios comprising performing a survey mass analysis using a mass analyzer to measure a flux of ions having m/z ratios within said restricted range and performing a dependent mass analysis of an optimal quantity of ions having m/z ratios within said restricted range, said optimal quantity collected for a time period determined by the measured ion flux, CHARACTERIZED IN THAT: the time period is determined using a corrected ion flux that accounts for one or more of: (a) imperfect restriction of collected ions to the range of m/z ratios, (b) inclusion of ions within the range of m/z ratios that are undetected by the survey mass analysis, (c) different mass analyzers used for the dependent and survey mass analyses, and (d) different ion pathways used during dependent and the survey mass analyses.
    Type: Grant
    Filed: April 11, 2014
    Date of Patent: December 1, 2015
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Michael W. Senko
  • Patent number: 9165755
    Abstract: A method for mass analyzing ions comprising a restricted range mass-to-charge (m/z) ratios comprising (i) performing a survey mass analysis, using a first mass analyzer employing indirect detection of ions by image current detection, to measure a flux of ions having m/z ratios within said range and (ii) performing a dependent mass analysis, using a second mass analyzer, of an optimal quantity of ions having m/z ratios within said range, said optimal quantity collected for a time period determined by the measured ion flux, the method characterized in that: the time period is determined using a corrected ion flux that includes a correction that comprises an estimate of the quantity of ions that are undetected by the first mass analyzer.
    Type: Grant
    Filed: June 5, 2014
    Date of Patent: October 20, 2015
    Assignee: Thermo Finnigan LLC
    Inventors: Philip M. Remes, Michael W. Senko, Justin Blethrow
  • Publication number: 20150179420
    Abstract: A sample ionization system includes at least an ionization source disposed at an ion source end of a charged particle analyzer, for selectably generating first ions in an analyzing mode of operation and second ions in a cleaning mode of operation. The first ions are one of positively and negatively charged and the second ions are the other one of positively and negatively charged. The second ions are directed through the charged particle analyzer toward a surface of an ion optic component, for at least partially neutralizing a buildup of charge caused by the first ions impinging on the surface of the at least one ion optic component.
    Type: Application
    Filed: December 20, 2013
    Publication date: June 25, 2015
    Applicant: Thermo Finnigan LLC
    Inventor: Michael W. SENKO
  • Patent number: 9048074
    Abstract: A mass spectrometry method for analyzing isobarically-labeled analyte compounds comprising (a) ionizing compounds including the isobarically-labeled analyte compounds to generate a plurality of precursor ion species comprising different respective m/z ratios, (b) isolating a precursor ion species, (c) fragmenting the precursor ion species to generate a plurality of first-generation fragment ion species comprising different respective m/z ratios, and (d) selecting and co-isolating two or more of the first-generation product-ion species, the method characterized by: (e) fragmenting all of the selected and isolated first-generation product ion species so as to generate a plurality of second-generation fragment ion species including released label ions; (f) generating a mass spectrum of the second-generation fragment ion species; and (g) generating quantitative information relating to at least one analyte compound based on peaks of the mass spectrum attributable to the released label ions.
    Type: Grant
    Filed: January 24, 2013
    Date of Patent: June 2, 2015
    Assignee: Thermo Finnigan LLC
    Inventor: Michael W. Senko
  • Publication number: 20140361158
    Abstract: A method for mass analyzing ions comprising a restricted range mass-to-charge (m/z) ratios comprising (i) performing a survey mass analysis, using a first mass analyzer employing indirect detection of ions by image current detection, to measure a flux of ions having m/z ratios within said range and (ii) performing a dependent mass analysis, using a second mass analyzer, of an optimal quantity of ions having m/z ratios within said range, said optimal quantity collected for a time period determined by the measured ion flux, the method characterized in that: the time period is determined using a corrected ion flux that includes a correction that comprises an estimate of the quantity of ions that are undetected by the first mass analyzer.
    Type: Application
    Filed: June 5, 2014
    Publication date: December 11, 2014
    Inventors: Philip M. REMES, Michael W. SENKO, Justin BLETHROW
  • Publication number: 20140339421
    Abstract: A mass spectrometry method for analyzing isobarically-labeled analyte compounds comprising (a) ionizing compounds including the isobarically-labeled analyte compounds to generate a plurality of precursor ion species comprising different respective m/z ratios, (b) isolating a precursor ion species, (c) fragmenting the precursor ion species to generate a plurality of first-generation fragment ion species comprising different respective m/z ratios, and (d) selecting and co-isolating two or more of the first-generation product-ion species, the method characterized by: (e) fragmenting all of the selected and isolated first-generation product ion species so as to generate a plurality of second-generation fragment ion species including released label ions; (f) generating a mass spectrum of the second-generation fragment ion species; and (g) generating quantitative information relating to at least one analyte compound based on peaks of the mass spectrum attributable to the released label ions.
    Type: Application
    Filed: January 24, 2013
    Publication date: November 20, 2014
    Inventor: Michael W. Senko
  • Publication number: 20140306107
    Abstract: A method for mass analyzing ions comprising a restricted range mass-to-charge (m/z) ratios comprising performing a survey mass analysis using a mass analyzer to measure a flux of ions having m/z ratios within said restricted range and performing a dependent mass analysis of an optimal quantity of ions having m/z ratios within said restricted range, said optimal quantity collected for a time period determined by the measured ion flux, CHARACTERIZED IN THAT: the time period is determined using a corrected ion flux that accounts for one or more of: (a) imperfect restriction of collected ions to the range of m/z ratios, (b) inclusion of ions within the range of m/z ratios that are undetected by the survey mass analysis, (c) different mass analyzers used for the dependent and survey mass analyses, and (d) different ion pathways used during dependent and the survey mass analyses.
    Type: Application
    Filed: April 11, 2014
    Publication date: October 16, 2014
    Applicant: Thermo Finnigan LLC
    Inventors: Philip M. REMES, Michael W. SENKO
  • Patent number: 8853622
    Abstract: A tandem mass spectrometer includes a two-dimensional ion trap that has an elongated ion-trapping region extending along a continuously curving path between first and second opposite ends thereof. The elongated trapping region has a central axis that is defined substantially parallel to the curved path and that extends between the first and second opposite ends. The two-dimensional ion trap is configured for receiving ions through the first end and for mass selectively ejecting the ions along a direction that is orthogonal to the central axis, such that the ejected ions are directed generally toward a common point. The tandem mass spectrometer also includes a collision cell having an ion inlet that is disposed about the common point for receiving the ions that are ejected therefrom and for causing at least a portion of the ions to undergo collisions and form product ions by fragmentation.
    Type: Grant
    Filed: February 7, 2007
    Date of Patent: October 7, 2014
    Assignee: Thermo Finnigan LLC
    Inventor: Michael W. Senko
  • Publication number: 20140264007
    Abstract: A method is described for identifying the occurrence and location of charging of ion optic devices arranged along the ion path of a mass spectrometer. The method includes repeatedly performing a sequence of introducing a beam of discharge ions to a location on the ion path, and subsequently measuring the intensities of opposite-polarity sample ions delivered to a mass analyzer, with the discharge ions being delivered to a location further downstream in the ion path at each successive sequence.
    Type: Application
    Filed: March 17, 2014
    Publication date: September 18, 2014
    Applicant: THERMO FINNIGAN LLC
    Inventors: Philip M. REMES, Michael W. SENKO, Michael W. BELFORD, Jae C. SCHWARTZ, Jean-Jacques DUNYACH, Berg TEHLIRIAN
  • Patent number: 8829463
    Abstract: An ion transport apparatus for a mass- or ion-mobility-spectrometer comprises: (a) a plurality of strip electrodes in a series on a flat substrate; (b) an ion outlet aperture in the substrate disposed adjacent to a first one of the plurality of strip electrodes; (c) a cage electrode at least partially enclosing the plurality of strip electrodes and the ion outlet aperture; (d) a radio frequency (RF) voltage generator operable to supply an RF phase difference between each pair of adjacent electrodes; and (e) at least one DC voltage source operable to supply first and second DC voltages to the cage electrode and an extraction electrode and to supply respective DC bias voltages to each of the plurality of electrodes, wherein electrode strip widths of a series of the plurality of electrodes progressively increase away from the first one of the plurality of electrodes.
    Type: Grant
    Filed: August 1, 2013
    Date of Patent: September 9, 2014
    Assignee: Thermo Finnigan LLC
    Inventors: Michael W. Senko, Eloy R. Wouters
  • Patent number: 8748809
    Abstract: A method of obtaining and analyzing a mass spectrum of a sample comprising components is characterized by: setting values of a first energy level and a second energy level; chromatographically separating the components; ionizing a portion of the separated components to create precursor ions; introducing a first portion of the precursor ions into a collision or reaction cell and generating a first sub-population of ions corresponding to the first energy level; introducing a second portion of the precursor ions into the cell and generating a second sub-population of ions corresponding to the second energy level; transferring a mixture of the first and second sub-populations of ions into a mass analyzer; producing an analysis of the ions of the mixture; varying the value of at least one of the first and the second energy levels according to a pre-determined cyclical variation; repeating various above steps; and analyzing the time-variation of the analyses.
    Type: Grant
    Filed: March 30, 2010
    Date of Patent: June 10, 2014
    Assignee: Thermo Finnigan LLC
    Inventors: Vladimir Zabrouskov, Michael W. Senko, Scott T. Quarmby
  • Publication number: 20140034828
    Abstract: An ion transport apparatus for a mass- or ion-mobility-spectrometer comprises: (a) a plurality of strip electrodes in a series on a fiat substrate; (b) an ion outlet aperture in the substrate disposed adjacent to a first one of the plurality of strip electrodes; (c) a cage electrode at least partially enclosing the plurality of strip electrodes and the ion outlet aperture; (d) a radio frequency (RF) voltage generator operable to supply an RF phase difference between each pair of adjacent electrodes; and (e) at least one DC voltage source operable to supply first and second DC voltages to the cage electrode and an extraction electrode and to supply respective DC bias voltages to each of the plurality of electrodes, wherein electrode strip widths of a series of the plurality of electrodes progressively increase away from the first one of the plurality of electrodes.
    Type: Application
    Filed: August 1, 2013
    Publication date: February 6, 2014
    Inventors: Michael W. SENKO, Eloy R. WOUTERS