Patents by Inventor Michel Aliman

Michel Aliman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9230789
    Abstract: An apparatus for focusing and for storage of ions and an apparatus for separation of a first pressure area from a second pressure area are disclosed, in particular for an analysis apparatus for ions. A particle beam device may have at least one of the abovementioned apparatuses. A container for holding ions and at least one multipole unit are provided. The multipole unit has a through-opening with a longitudinal axis as well as a multiplicity of electrodes. A first set of the electrodes is at a first radial distance from the longitudinal axis. A second set of the electrodes is in each case at a second radial distance from the longitudinal axis. The first radial distance is less than the second radial distance. Alternatively or additionally, the apparatus may have an elongated opening with a radial extent. The opening has a longitudinal extent which is greater than the radial extent.
    Type: Grant
    Filed: January 27, 2011
    Date of Patent: January 5, 2016
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Alexander Laue, Albrecht Glasmachers, Christian Hendrich, Dirk Preikszas, Michel Aliman, Hubert Mantz, Ulrike Zeile, Holger Dömer
  • Publication number: 20150235829
    Abstract: A method includes parallel or serial ionization of a gas mixture by activating at least two ionization devices operating using different ionization procedures, and/or by ionizing the gas mixture in a detector to which the gas mixture and ions and/or metastable particles of an ionization gas are fed. The method also includes detecting the ionized gas mixture in the detector for the mass spectrometric examination thereof. A mass spectrometer for mass spectrometric examination of gas mixtures includes an ionization unit for ionizing a gas mixture and a detector for detecting the ionized gas mixture.
    Type: Application
    Filed: March 16, 2015
    Publication date: August 20, 2015
    Inventors: Hin Yiu Anthony Chung, Michel Aliman, Gennady Fedosenko, Albrecht Ranck
  • Patent number: 9035245
    Abstract: A device for mass selective determination of at least one ion or of a plurality of ions is used, for example, in a measuring apparatus having an ion trap. The ion trap has a ring electrode having a first opening. A first electrode is arranged at the first opening. Furthermore, an amplifier for providing a radio-frequency storage signal for the ion trap and a first transformer are provided, said first transformer being connected to the amplifier and the first electrode in such a way that the radio-frequency storage signal is coupled into the first electrode via the first transformer.
    Type: Grant
    Filed: May 15, 2014
    Date of Patent: May 19, 2015
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Albrecht Glasmachers, Michel Aliman
  • Publication number: 20140339424
    Abstract: A device for mass selective determination of at least one ion or of a plurality of ions is used, for example, in a measuring apparatus having an ion trap. The ion trap has a ring electrode having a first opening. A first electrode is arranged at the first opening. Furthermore, an amplifier for providing a radio-frequency storage signal for the ion trap and a first transformer are provided, said first transformer being connected to the amplifier and the first electrode in such a way that the radio-frequency storage signal is coupled into the first electrode via the first transformer.
    Type: Application
    Filed: May 15, 2014
    Publication date: November 20, 2014
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Albrecht Glasmachers, Michel Aliman
  • Publication number: 20140326874
    Abstract: An apparatus for transmission of energy of an ion to at least one gas particle and/or for transportation of an ion and a particle beam device having an apparatus such as this are disclosed. In particular, a container is provided, in which a gas is arranged which has gas particles, wherein the container has a transport axis. Furthermore, at least one first multipole unit and at least one second multipole unit are provided, which are arranged along the transport axis. The first multipole unit and the second multipole unit are formed by printed circuit boards. Furthermore, an electronic circuit is provided, which provides each multipole unit with a potential, such that a potential gradient is generated, in particular along the transport axis.
    Type: Application
    Filed: May 16, 2014
    Publication date: November 6, 2014
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Albrecht Glasmachers, Alexander Laue, Michel Aliman, Hubert Mantz, Ulrike Zeile, Holger Doemer
  • Publication number: 20140299577
    Abstract: The invention relates to an apparatus for surface processing on a substrate, for example for applying a coating to the substrate or for removing a coating from the substrate, wherein the apparatus comprises: a chamber enclosing an interior and serving for arranging the substrate for the surface processing, a process gas analyser for detecting at least one gaseous constituent of a residual gas atmosphere formed in the interior, wherein the process gas analyser comprises an ion trap for storing the gaseous constituent to be detected, and an ionization device for ionizing the gaseous constituent. The invention also relates to an associated method for monitoring surface processing on a substrate.
    Type: Application
    Filed: June 23, 2014
    Publication date: October 9, 2014
    Inventors: Hin Yiu Anthony Chung, Michel Aliman, Gennady Fedosenko, Albrecht Ranck, Leonid Gorkhover
  • Patent number: 8766219
    Abstract: A method of operating a particle beam microscopy. A particle beam is scanned across a scanning region of a surface of the object. Particles are detected by a detector system for a plurality of impingement locations of the primary beam within the scanning region. A detector system generates detector signals which represent for each of the impingement locations an intensity of the detected particles. Material data of the interaction regions are calculated depending on the detector signals and depending on topography data, which represent a topography of the object surface in the scanning region.
    Type: Grant
    Filed: September 10, 2013
    Date of Patent: July 1, 2014
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Michel Aliman, Jaroslaw Paluszynski, Wolfgang Berger
  • Publication number: 20140070099
    Abstract: A method of operating a particle beam microscopy. A particle beam is scanned across a scanning region of a surface of the object. Particles are detected by a detector system for a plurality of impingement locations of the primary beam within the scanning region. A detector system generates detector signals which represent for each of the impingement locations an intensity of the detected particles. Material data of the interaction regions are calculated depending on the detector signals and depending on topography data, which represent a topography of the object surface in the scanning region.
    Type: Application
    Filed: September 10, 2013
    Publication date: March 13, 2014
    Applicant: Carl Zeiss Microscopy GmbH
    Inventors: Michel Aliman, Jaroslaw Paluszynski, Wolfgang Berger
  • Publication number: 20110220788
    Abstract: An apparatus for focusing and for storage of ions and an apparatus for separation of a first pressure area from a second pressure area are disclosed, in particular for an analysis apparatus for ions. A particle beam device may have at least one of the abovementioned apparatuses. A container for holding ions and at least one multipole unit are provided. The multipole unit has a through-opening with a longitudinal axis as well as a multiplicity of electrodes. A first set of the electrodes is at a first radial distance from the longitudinal axis. A second set of the electrodes is in each case at a second radial distance from the longitudinal axis. The first radial distance is less than the second radial distance. Alternatively or additionally, the apparatus may have an elongated opening with a radial extent. The opening has a longitudinal extent which is greater than the radial extent.
    Type: Application
    Filed: January 27, 2011
    Publication date: September 15, 2011
    Inventors: Alexander Laue, Albrecht Glasmachers, Christian Hendrich, Dirk Preikszas, Michel Aliman, Hubert Mantz, Ulrike Zeile, Holger Dömer
  • Publication number: 20110192973
    Abstract: An apparatus for transmission of energy of an ion to at least one gas particle and/or for transportation of an ion and a particle beam device having an apparatus such as this are disclosed. In particular, a container is provided, in which a gas is arranged which has gas particles, wherein the container has a transport axis. Furthermore, at least one first multipole unit and at least one second multipole unit are provided, which are arranged along the transport axis. The first multipole unit and the second multipole unit are formed by printed circuit boards. Furthermore, an electronic circuit is provided, which provides each multipole unit with a potential, such that a potential gradient is generated, in particular along the transport axis.
    Type: Application
    Filed: January 27, 2011
    Publication date: August 11, 2011
    Inventors: Albrecht Glasmachers, Alexander Laue, Michel Aliman, Hubert Mantz, Ulrike Zeile, Holger Dömer