Patents by Inventor Michiyoshi Takano

Michiyoshi Takano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050272243
    Abstract: A method of manufacturing a semiconductor device includes: (a) forming an insulating layer having a contact hole on a semiconductor section in which an element is formed; (b) forming an electrode pad on the insulating layer so that a depression or a protrusion remains at a position at which the electrode pad overlaps the contact section; (c) forming a passivation film to have an opening on a first section of the electrode pad and to be positioned on a second section of the electrode pad; (d) forming a barrier layer on the electrode pad; and (e) forming a bump to be larger than the opening in the passivation film and to be partially positioned on the passivation film. The contact section is connected with the second section at a position within a range in which the contact section overlaps the bump while avoiding the first section of the electrode pad.
    Type: Application
    Filed: June 2, 2005
    Publication date: December 8, 2005
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Takeshi Yuzawa, Hideki Yuzawa, Michiyoshi Takano
  • Publication number: 20050269697
    Abstract: A semiconductor device including: a semiconductor section in which an element is formed; an insulating layer formed on the semiconductor section; an electrode pad formed on the insulating layer; a contact section formed of a conductive material provided in a contact hole in the insulating layer and electrically connected with the electrode pad; a passivation film formed to have an opening on a first section of the electrode pad and to be positioned on a second section of the electrode pad; a bump formed to be larger than the opening in the passivation film and to be partially positioned on the passivation film; and a barrier layer which lies between the electrode pad and the bump. The contact section is connected with the second section at a position within a range in which the contact section overlaps the bump while avoiding the first section of the electrode pad.
    Type: Application
    Filed: June 2, 2005
    Publication date: December 8, 2005
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Takeshi Yuzawa, Hideki Yuzawa, Michiyoshi Takano
  • Patent number: 6872651
    Abstract: The invention includes a semiconductor device, and a method for making the same, wherein bumps of a semiconductor chip and inner leads of a film tape carrier can be securely bonded to each other by thermal welding using a heating unit. A semiconductor wafer 50 is etched using a potassium iodide or ammonium iodide solution. By the etching, a barrier metal layer 48 is removed while the upper face of a bump 10 is simultaneously roughened and many prominences 12 are formed. The formation of the prominences 12 increases the surface area of the upper face of the bump 10 and improves the bonding between the bump 10 of the semiconductor chip and the lead of the film tape carrier.
    Type: Grant
    Filed: May 27, 2003
    Date of Patent: March 29, 2005
    Assignee: Seiko Epson Corporation
    Inventor: Michiyoshi Takano
  • Publication number: 20050062158
    Abstract: The invention includes a semiconductor device, and a method for making the same, wherein bumps of a semiconductor chip and inner leads of a film tape carrier can be securely bonded to each other by thermal welding using a heating unit. A semiconductor wafer 50 is etched using a potassium iodide or ammonium iodide solution. By the etching, a barrier metal layer 48 is removed while the upper face of a bump 10 is simultaneously roughened and many prominences 12 are formed. The formation of the prominences 12 increases the surface area of the upper face of the bump 10 and improves the bonding between the bump 10 of the semiconductor chip and the lead of the film tape carrier.
    Type: Application
    Filed: November 16, 2004
    Publication date: March 24, 2005
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Michiyoshi Takano
  • Publication number: 20040217456
    Abstract: A method is provided to control the height of bump electrodes and increase a clearance between edge sections of a semiconductor chip and lead terminals of a tape substrate. By applying suction to a tape substrate through a suction groove, boundary portions of a semiconductor chip mounting region are drawn into the suction groove, and curved sections are formed in the tape substrate at locations corresponding to edge sections of a semiconductor chip.
    Type: Application
    Filed: February 24, 2004
    Publication date: November 4, 2004
    Inventor: Michiyoshi Takano
  • Publication number: 20040217470
    Abstract: A method is provided to control the height of bump electrodes and increase a clearance between edge sections of a semiconductor chip and lead terminals of a tape substrate. By pushing up on a tape substrate by a bonding stage, and applying suction to the tape substrate through a suction groove, boundary portions of a semiconductor chip mounting region are drawn into the suction groove, and curved sections are formed in the tape substrate at locations corresponding to edge sections of a semiconductor chip and inclined sections disposed in outer circumference sections of the curved sections are formed in the tape substrate.
    Type: Application
    Filed: February 24, 2004
    Publication date: November 4, 2004
    Inventor: Michiyoshi Takano
  • Publication number: 20040004273
    Abstract: The invention includes a semiconductor device, and a method for making the same, wherein bumps of a semiconductor chip and inner leads of a film tape carrier can be securely bonded to each other by thermal welding using a heating unit. A semiconductor wafer 50 is etched using a potassium iodide or ammonium iodide solution. By the etching, a barrier metal layer 48 is removed while the upper face of a bump 10 is simultaneously roughened and many prominences 12 are formed. The formation of the prominences 12 increases the surface area of the upper face of the bump 10 and improves the bonding between the bump 10 of the semiconductor chip and the lead of the film tape carrier.
    Type: Application
    Filed: May 27, 2003
    Publication date: January 8, 2004
    Applicant: Seiko Epson Corporation
    Inventor: Michiyoshi Takano
  • Publication number: 20030173108
    Abstract: A semiconductor device includes a semiconductor chip on which bumps are formed; and a substrate on which the semiconductor chip is mounted, the substrate including an interconnecting line to which each of the bumps is bonded. Surfaces of the bumps and a surface of the interconnecting line are formed of the same metal, and the interconnecting line is formed of a metal softer than nickel.
    Type: Application
    Filed: December 27, 2002
    Publication date: September 18, 2003
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Michiyoshi Takano
  • Patent number: 6605523
    Abstract: A semiconductor device and a manufacturing method thereof are provided, wherein both bumps of a semiconductor chip and leads on a tape substrate can be accurately connected at the time of performing thermocompression bonding of the two using a heating tool. The film tape carrier and semiconductor chip expand due to heat applied from the heating tool of the gang bonding apparatus, so setting the pitch of the bumps and the pitch of the inner leads, taking into consideration beforehand the difference in linear expansion coefficient of the two at the time of gang bonding, solves the problem.
    Type: Grant
    Filed: March 12, 2001
    Date of Patent: August 12, 2003
    Assignee: Seiko Epson Corporation
    Inventor: Michiyoshi Takano
  • Publication number: 20030145947
    Abstract: A method of manufacturing a semiconductor device including: placing a substrate on a bonding stage; and bonding a semiconductor chip to the substrate. At least a section of the bonding stage which is in contact with the substrate is formed of a material having a thermal conductivity of 15 to 30 W·m−1·K−1.
    Type: Application
    Filed: January 10, 2003
    Publication date: August 7, 2003
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Michiyoshi Takano, Hideki Yuzawa
  • Publication number: 20010036685
    Abstract: A semiconductor device and a manufacturing method thereof are provided, wherein both bumps of a semiconductor chip and leads on a tape substrate can be accurately connected at the time of performing thermocompression bonding of the two using a heating tool. The film tape carrier and semiconductor chip expand due to heat applied from the heating tool of the gang bonding apparatus, so setting the pitch of the bumps and the pitch of the inner leads, taking into consideration beforehand the difference in linear expansion coefficient of the two at the time of gang bonding, solves the problem.
    Type: Application
    Filed: March 12, 2001
    Publication date: November 1, 2001
    Applicant: Seiko Epson Corporation
    Inventor: Michiyoshi Takano