Patents by Inventor Mika NASU
Mika NASU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11249109Abstract: An electric connection device includes a probe (10) and a probe head (20). The probe (10) includes: a tubular barrel (11), a rod-like top-side plunger (121), and a rod-like bottom-side plunger (122). The top- and bottom-side plungers are connected to the barrel (11) with tips thereof exposed from respective open ends of the barrel (11). The probe head (2) includes guide plates (211 and 212) which are spaced apart from each other in the axial direction of the probe (10) and each include a through-hole through which a body of the barrel (11) penetrates. A protrusion (13) having an outer diameter greater than the body of the barrel (11) is provided on the circumference of the probe (10). The guide plates (211 and 212) include a support guide plate in which the through-hole has a diameter smaller than the outer diameter of the protrusion (13).Type: GrantFiled: August 3, 2018Date of Patent: February 15, 2022Assignee: Kabushiki Kaisha Nihon MicronicsInventor: Mika Nasu
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Patent number: 11204370Abstract: A probe includes: a rod-shaped plunger (11) including a tip section (111) and an insertion section (112) connected to the tip section (111); a tube-shaped barrel (12) in which the insertion section (112) of the plunger (11) is located inside; and a conductive first fixing member (131) which is located in an area where the plunger (11) and the barrel (12) face each other and is configured to fix the plunger (11) to the barrel (12), the first fixing member (131) having a lower melting point than that of the material of both of the plunger (11) and the barrel (12). The gap between the plunger (11) and the barrel (12) is filled with the first fixing member (131) without any voids in a cross section of the probe in an area where the plunger (11) and the barrel (12) overlap each other, including the area where the first fixing member (131) is located.Type: GrantFiled: May 17, 2018Date of Patent: December 21, 2021Assignee: Kabushiki Kaisha Nihon MicronicsInventors: Mika Nasu, Osamu Takeuti
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Patent number: 11022627Abstract: A probe 20 electrically connecting a first contact target to a second contact target includes a tubular barrel portion 50, a first plunger portion 60 partially inserted into a first end of the barrel portion 50 and electrically contacting the first contact target, and a second plunger portion 70 partially inserted into a second end of the barrel portion 50 and electrically contacting the second contact target. The barrel portion 50 includes a first barrel portion 51 having an inside diameter ?1i, and a second barrel portion 52 arranged inside the first barrel portion 51 and having an outside diameter ?2o. The first barrel portion 51 includes a first spring portion 151. The second barrel portion 52 includes a second spring portion 152. The first plunger portion 60 includes a main body portion 61 having a longer dimension than an inside diameter of the first barrel portion 51.Type: GrantFiled: January 17, 2018Date of Patent: June 1, 2021Assignee: Kabushiki Kaisha Nihon MicronicsInventor: Mika Nasu
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Publication number: 20200300892Abstract: An electric connection device includes a probe (10) and a probe head (20). The probe (10) includes: a tubular barrel (11), a rod-like top-side plunger (121), and a rod-like bottom-side plunger (122). The top- and bottom-side plungers are connected to the barrel (11) with tips thereof exposed from respective open ends of the barrel (11). The probe head (2) includes guide plates (211 and 212) which are spaced apart from each other in the axial direction of the probe (10) and each include a through-hole through which a body of the barrel (11) penetrates. A protrusion (13) having an outer diameter greater than the body of the barrel (11) is provided on the circumference of the probe (10). The guide plates (211 and 212) include a support guide plate in which the through-hole has a diameter smaller than the outer diameter of the protrusion (13).Type: ApplicationFiled: August 3, 2018Publication date: September 24, 2020Inventor: Mika NASU
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Patent number: 10775411Abstract: A probe card includes a probe having a spring property and a probe head that holds the probe. The probe head includes a guide portion that holds the probe such that the probe can move in an axis direction Z. The guide portion includes a heat radiation structure that absorbs heat of the probe generated by energization and emits the heat to the outside of the probe.Type: GrantFiled: October 13, 2016Date of Patent: September 15, 2020Assignee: Kabushiki Kaisha Nihon MicronicsInventors: Tetsuya Yoshioka, Takashi Kawano, Shigeki Makise, Mika Nasu
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Publication number: 20200174038Abstract: A probe includes: a rod-shaped plunger (11) including a tip section (111) and an insertion section (112) connected to the tip section (111); a tube-shaped barrel (12) in which the insertion section (112) of the plunger (11) is located inside; and a conductive first fixing member (131) which is located in an area where the plunger (11) and the barrel (12) face each other and is configured to fix the plunger (11) to the barrel (12), the first fixing member (131) having a lower melting point than that of the material of both of the plunger (11) and the barrel (12). The gap between the plunger (11) and the barrel (12) is filled with the first fixing member (131) without any voids in a cross section of the probe in an area where the plunger (11) and the barrel (12) overlap each other, including the area where the first fixing member (131) is located.Type: ApplicationFiled: May 17, 2018Publication date: June 4, 2020Inventors: Mika NASU, Osamu TAKEUTI
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Publication number: 20200025797Abstract: A probe 20 electrically connecting a first contact target to a second contact target includes a tubular barrel portion 50, a first plunger portion 60 partially inserted into a first end of the barrel portion 50 and electrically contacting the first contact target, and a second plunger portion 70 partially inserted into a second end of the barrel portion 50 and electrically contacting the second contact target. The barrel portion 50 includes a first barrel portion 51 having an inside diameter ?1i, and a second barrel portion 52 arranged inside the first barrel portion 51 and having an outside diameter ?2o. The first barrel portion 51 includes a first spring portion 151. The second barrel portion 52 includes a second spring portion 152. The first plunger portion 60 includes a main body portion 61 having a longer dimension than an inside diameter of the first barrel portion 51.Type: ApplicationFiled: January 17, 2018Publication date: January 23, 2020Inventor: Mika NASU
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Patent number: 10215801Abstract: A contact inspection device includes: plural probes each having a first end to be brought into contact with a test object; a probe substrate including contact portions in contact with respective second ends of the probes; a probe head through which the probes extend and which is detachably attached to the probe substrate; and plural positioning members which are provided on a surface of the probe head facing the probe substrate and through which the probes extend. Each probe has a rotation restricted portion provided on the side of the second end. Each positioning member has rotation restricting portions adapted to engage the rotation restricted portions. When the positioning members are moved relative to each other, the rotation restricting portions align the probes and switch the probes from a rotation unrestricted state to a rotation restricted state.Type: GrantFiled: November 6, 2015Date of Patent: February 26, 2019Assignee: KABUSHIKI KAISHA NIHON MICRONICSInventor: Mika Nasu
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Publication number: 20180299489Abstract: A probe card includes a probe having a spring property and a probe head that holds the probe. The probe head includes a guide portion that holds the probe such that the probe can move in an axis direction Z. The guide portion includes a heat radiation structure that absorbs heat of the probe generated by energization and emits the heat to the outside of the probe.Type: ApplicationFiled: October 13, 2016Publication date: October 18, 2018Applicant: Kabushiki Kaisha Nihon MicronicsInventors: Tetsuya YOSHIOKA, Takashi KAWANO, Shigeki MAKISE, Mika NASU
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Patent number: D847757Type: GrantFiled: August 30, 2017Date of Patent: May 7, 2019Assignee: Kabushiki Kaisha Nihon MicronicsInventor: Mika Nasu
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Patent number: D867183Type: GrantFiled: July 28, 2017Date of Patent: November 19, 2019Assignee: Kabushiki Kaisha Nihon MicronicsInventor: Mika Nasu
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Patent number: D869305Type: GrantFiled: July 28, 2017Date of Patent: December 10, 2019Assignee: Kabushiki Kaisha Nihon MicronicsInventor: Mika Nasu
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Patent number: D873159Type: GrantFiled: August 1, 2018Date of Patent: January 21, 2020Assignee: Kabushiki Kaisha Nihon MicronicsInventors: Mika Nasu, Tsuyoshi Muramoto
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Patent number: D873160Type: GrantFiled: August 1, 2018Date of Patent: January 21, 2020Assignee: Kabushiki Kaisha Nihon MicronicsInventors: Mika Nasu, Tsuyoshi Muramoto
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Patent number: D873161Type: GrantFiled: August 1, 2018Date of Patent: January 21, 2020Assignee: Kabushiki Kaisha Nihon MicronicsInventors: Mika Nasu, Tsuyoshi Muramoto
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Patent number: D873683Type: GrantFiled: August 1, 2018Date of Patent: January 28, 2020Assignee: Kabushiki Kaisha Nihon MicronicsInventors: Mika Nasu, Tsuyoshi Muramoto
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Patent number: D873684Type: GrantFiled: August 1, 2018Date of Patent: January 28, 2020Assignee: Kabushiki Kaisha Nihon MicronicsInventors: Mika Nasu, Yoshihiko Otsuka, Namiko Fukatsu
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Patent number: D873685Type: GrantFiled: August 1, 2018Date of Patent: January 28, 2020Assignee: Kabushiki Kaisha Nihon MicronicsInventors: Mika Nasu, Yoshihiko Otsuka, Namiko Fukatsu
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Patent number: D873686Type: GrantFiled: August 1, 2018Date of Patent: January 28, 2020Assignee: Kabushiki Kaisha Nihon MicronicsInventors: Mika Nasu, Yoshihiko Otsuka, Namiko Fukatsu
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Patent number: D874958Type: GrantFiled: August 1, 2018Date of Patent: February 11, 2020Assignee: Kabushiki Kaisha Nihon MicronicsInventors: Mika Nasu, Yoshihiko Otsuka, Namiko Fukatsu