Patents by Inventor Mika NASU

Mika NASU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11249109
    Abstract: An electric connection device includes a probe (10) and a probe head (20). The probe (10) includes: a tubular barrel (11), a rod-like top-side plunger (121), and a rod-like bottom-side plunger (122). The top- and bottom-side plungers are connected to the barrel (11) with tips thereof exposed from respective open ends of the barrel (11). The probe head (2) includes guide plates (211 and 212) which are spaced apart from each other in the axial direction of the probe (10) and each include a through-hole through which a body of the barrel (11) penetrates. A protrusion (13) having an outer diameter greater than the body of the barrel (11) is provided on the circumference of the probe (10). The guide plates (211 and 212) include a support guide plate in which the through-hole has a diameter smaller than the outer diameter of the protrusion (13).
    Type: Grant
    Filed: August 3, 2018
    Date of Patent: February 15, 2022
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Mika Nasu
  • Patent number: 11204370
    Abstract: A probe includes: a rod-shaped plunger (11) including a tip section (111) and an insertion section (112) connected to the tip section (111); a tube-shaped barrel (12) in which the insertion section (112) of the plunger (11) is located inside; and a conductive first fixing member (131) which is located in an area where the plunger (11) and the barrel (12) face each other and is configured to fix the plunger (11) to the barrel (12), the first fixing member (131) having a lower melting point than that of the material of both of the plunger (11) and the barrel (12). The gap between the plunger (11) and the barrel (12) is filled with the first fixing member (131) without any voids in a cross section of the probe in an area where the plunger (11) and the barrel (12) overlap each other, including the area where the first fixing member (131) is located.
    Type: Grant
    Filed: May 17, 2018
    Date of Patent: December 21, 2021
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Mika Nasu, Osamu Takeuti
  • Patent number: 11022627
    Abstract: A probe 20 electrically connecting a first contact target to a second contact target includes a tubular barrel portion 50, a first plunger portion 60 partially inserted into a first end of the barrel portion 50 and electrically contacting the first contact target, and a second plunger portion 70 partially inserted into a second end of the barrel portion 50 and electrically contacting the second contact target. The barrel portion 50 includes a first barrel portion 51 having an inside diameter ?1i, and a second barrel portion 52 arranged inside the first barrel portion 51 and having an outside diameter ?2o. The first barrel portion 51 includes a first spring portion 151. The second barrel portion 52 includes a second spring portion 152. The first plunger portion 60 includes a main body portion 61 having a longer dimension than an inside diameter of the first barrel portion 51.
    Type: Grant
    Filed: January 17, 2018
    Date of Patent: June 1, 2021
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Mika Nasu
  • Publication number: 20200300892
    Abstract: An electric connection device includes a probe (10) and a probe head (20). The probe (10) includes: a tubular barrel (11), a rod-like top-side plunger (121), and a rod-like bottom-side plunger (122). The top- and bottom-side plungers are connected to the barrel (11) with tips thereof exposed from respective open ends of the barrel (11). The probe head (2) includes guide plates (211 and 212) which are spaced apart from each other in the axial direction of the probe (10) and each include a through-hole through which a body of the barrel (11) penetrates. A protrusion (13) having an outer diameter greater than the body of the barrel (11) is provided on the circumference of the probe (10). The guide plates (211 and 212) include a support guide plate in which the through-hole has a diameter smaller than the outer diameter of the protrusion (13).
    Type: Application
    Filed: August 3, 2018
    Publication date: September 24, 2020
    Inventor: Mika NASU
  • Patent number: 10775411
    Abstract: A probe card includes a probe having a spring property and a probe head that holds the probe. The probe head includes a guide portion that holds the probe such that the probe can move in an axis direction Z. The guide portion includes a heat radiation structure that absorbs heat of the probe generated by energization and emits the heat to the outside of the probe.
    Type: Grant
    Filed: October 13, 2016
    Date of Patent: September 15, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Tetsuya Yoshioka, Takashi Kawano, Shigeki Makise, Mika Nasu
  • Publication number: 20200174038
    Abstract: A probe includes: a rod-shaped plunger (11) including a tip section (111) and an insertion section (112) connected to the tip section (111); a tube-shaped barrel (12) in which the insertion section (112) of the plunger (11) is located inside; and a conductive first fixing member (131) which is located in an area where the plunger (11) and the barrel (12) face each other and is configured to fix the plunger (11) to the barrel (12), the first fixing member (131) having a lower melting point than that of the material of both of the plunger (11) and the barrel (12). The gap between the plunger (11) and the barrel (12) is filled with the first fixing member (131) without any voids in a cross section of the probe in an area where the plunger (11) and the barrel (12) overlap each other, including the area where the first fixing member (131) is located.
    Type: Application
    Filed: May 17, 2018
    Publication date: June 4, 2020
    Inventors: Mika NASU, Osamu TAKEUTI
  • Publication number: 20200025797
    Abstract: A probe 20 electrically connecting a first contact target to a second contact target includes a tubular barrel portion 50, a first plunger portion 60 partially inserted into a first end of the barrel portion 50 and electrically contacting the first contact target, and a second plunger portion 70 partially inserted into a second end of the barrel portion 50 and electrically contacting the second contact target. The barrel portion 50 includes a first barrel portion 51 having an inside diameter ?1i, and a second barrel portion 52 arranged inside the first barrel portion 51 and having an outside diameter ?2o. The first barrel portion 51 includes a first spring portion 151. The second barrel portion 52 includes a second spring portion 152. The first plunger portion 60 includes a main body portion 61 having a longer dimension than an inside diameter of the first barrel portion 51.
    Type: Application
    Filed: January 17, 2018
    Publication date: January 23, 2020
    Inventor: Mika NASU
  • Patent number: 10215801
    Abstract: A contact inspection device includes: plural probes each having a first end to be brought into contact with a test object; a probe substrate including contact portions in contact with respective second ends of the probes; a probe head through which the probes extend and which is detachably attached to the probe substrate; and plural positioning members which are provided on a surface of the probe head facing the probe substrate and through which the probes extend. Each probe has a rotation restricted portion provided on the side of the second end. Each positioning member has rotation restricting portions adapted to engage the rotation restricted portions. When the positioning members are moved relative to each other, the rotation restricting portions align the probes and switch the probes from a rotation unrestricted state to a rotation restricted state.
    Type: Grant
    Filed: November 6, 2015
    Date of Patent: February 26, 2019
    Assignee: KABUSHIKI KAISHA NIHON MICRONICS
    Inventor: Mika Nasu
  • Publication number: 20180299489
    Abstract: A probe card includes a probe having a spring property and a probe head that holds the probe. The probe head includes a guide portion that holds the probe such that the probe can move in an axis direction Z. The guide portion includes a heat radiation structure that absorbs heat of the probe generated by energization and emits the heat to the outside of the probe.
    Type: Application
    Filed: October 13, 2016
    Publication date: October 18, 2018
    Applicant: Kabushiki Kaisha Nihon Micronics
    Inventors: Tetsuya YOSHIOKA, Takashi KAWANO, Shigeki MAKISE, Mika NASU
  • Patent number: D847757
    Type: Grant
    Filed: August 30, 2017
    Date of Patent: May 7, 2019
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Mika Nasu
  • Patent number: D867183
    Type: Grant
    Filed: July 28, 2017
    Date of Patent: November 19, 2019
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Mika Nasu
  • Patent number: D869305
    Type: Grant
    Filed: July 28, 2017
    Date of Patent: December 10, 2019
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Mika Nasu
  • Patent number: D873159
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: January 21, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Mika Nasu, Tsuyoshi Muramoto
  • Patent number: D873160
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: January 21, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Mika Nasu, Tsuyoshi Muramoto
  • Patent number: D873161
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: January 21, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Mika Nasu, Tsuyoshi Muramoto
  • Patent number: D873683
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: January 28, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Mika Nasu, Tsuyoshi Muramoto
  • Patent number: D873684
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: January 28, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Mika Nasu, Yoshihiko Otsuka, Namiko Fukatsu
  • Patent number: D873685
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: January 28, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Mika Nasu, Yoshihiko Otsuka, Namiko Fukatsu
  • Patent number: D873686
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: January 28, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Mika Nasu, Yoshihiko Otsuka, Namiko Fukatsu
  • Patent number: D874958
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: February 11, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Mika Nasu, Yoshihiko Otsuka, Namiko Fukatsu