Probe pin
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The broken lines shown in the figures represent portions of the probe pin that form no part of the claimed design. The line-dot broken lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.
Claims
The ornamental design for a probe pin, as shown and described.
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Type: Grant
Filed: Jul 28, 2017
Date of Patent: Nov 19, 2019
Assignee: Kabushiki Kaisha Nihon Micronics (Tokyo)
Inventor: Mika Nasu (Tokyo)
Primary Examiner: Antoine Duval Davis
Application Number: 29/612,176