Probe pin

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Description

FIG. 1 is a perspective view of a portion of a probe pin, showing the claimed design;

FIG. 2 is a front view of the probe pin;

FIG. 3 is a rear view of the probe pin;

FIG. 4 is a left side view of the probe pin;

FIG. 5 is a right side view of the probe pin;

FIG. 6 is a top plan view of the probe pin;

FIG. 7 is a bottom plan view of the probe pin;

FIG. 8 is an enlarged view of the section of the probe pin identified by the reference Nos. 8-8 in FIG. 2; and,

FIG. 9 is an enlarged left side view of the probe pin.

The broken lines shown in the figures represent portions of the probe pin that form no part of the claimed design. The line-dot broken lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.

Claims

The ornamental design for a probe pin, as shown and described.

Referenced Cited
U.S. Patent Documents
D397052 August 18, 1998 Arnoux
D686098 July 16, 2013 Agar
D769748 October 25, 2016 Teranishi
D769749 October 25, 2016 Teranishi
D776551 January 17, 2017 Teranishi
D776552 January 17, 2017 Teranishi
20110050261 March 3, 2011 Li
20130069669 March 21, 2013 Mogaveera
20150070040 March 12, 2015 Treibergs
20150369859 December 24, 2015 Suzuki
20170138985 May 18, 2017 Teranishi
Foreign Patent Documents
S000763322 May 1989 JP
20160063284 June 2016 KR
Patent History
Patent number: D867183
Type: Grant
Filed: Jul 28, 2017
Date of Patent: Nov 19, 2019
Assignee: Kabushiki Kaisha Nihon Micronics (Tokyo)
Inventor: Mika Nasu (Tokyo)
Primary Examiner: Antoine Duval Davis
Application Number: 29/612,176
Classifications