Abstract: A ramp generator providing ramp signal with high resolution fine gain includes a current mirror having a first and second paths to conduct a capacitor current and an integrator current responsive to the capacitor current. First and second switched capacitor circuits are coupled to the first path. A fractional divider circuit is coupled to receive a clock signal to generate in response to an adjustable fractional divider ratio K a switched capacitor control signal that oscillates between first and second states to control the first and second switched capacitor circuits. The first and second switched capacitor circuits are coupled to be alternatingly charged by the capacitor current and discharged in response to each the switched capacitor control signal. An integrator coupled is to the second path to generate the ramp signal in response to the integrator current.

Abstract: An electronic endoscope and an electronic endoscope system, wherein the electronic endoscope comprises a tube body (100), at least two lenses (200) having a non-zero-degree viewing angle, an image sensing component (300), and a transmission module. The tube body (100) comprises a light receiving channel penetrating therein for sequentially accommodating the lenses (200), the image sensing component (300), and the transmission module. Optical axes of the lenses (200) are parallel to an extension axis of the light receiving channel. The image sensing component (300) receives images transmitted by the lenses (200) and converts the same into electrical signals. The transmission module drives the lenses (200) having a non-zero-degree viewing angle to rotate about the optical axes in the same direction. When the field-of-view region of the electronic endoscope changes, the field-of-view direction does not change.

Abstract: A readout circuit for use in an image sensor includes a plurality of comparators. Each one of the plurality of comparators is coupled to receive a ramp signal and a respective analog image data signal from a respective one of a plurality of column bit lines to generate a respective comparator output. Each one of a plurality of arithmetic logic units (ALUs) is coupled to receive phase-aligned Gray code (GC) outputs generated by a GC generator. Each one of the plurality of ALUs is further coupled to a respective one of the plurality of comparators to receive the respective comparator output. Each one of the plurality of ALUs is coupled to latch the phase-aligned GC outputs in response to the respective comparator output to generate a respective digital image data signal.

Abstract: An analog to digital conversion (ADC) circuit includes a ramp circuit coupled to output a ramp signal, and the ramp signal is offset from a starting voltage by an offset voltage. The ramp signal ramps towards the starting voltage. A counter circuit is coupled to the ramp circuit to start counting after the ramp signal returns to the starting voltage, and a comparator is coupled to the counter circuit and a bitline to compare the ramp signal to a pixel signal voltage on the bitline. In response to the ramp signal equaling the pixel signal voltage, the comparator stops the counter.

Abstract: An image sensor includes a pixel array with rows and columns of pixels. Each row of the pixel array has a first end that is opposite a second end of each row of the pixel array. Control circuitry is coupled to the first end of each row of the pixel array to provide control signals to each row of the pixel array from the first end of each row of the pixel array. Far end driver circuitry coupled to the second end of each row of the pixel array to selectively further drive from the second end of each row of the pixel array the control signals provided by the control circuitry from the first end of each row of the pixel array. The control circuitry is further coupled to provide far end control signals to the far end driver circuitry.

Abstract: An image sensor includes a pixel array with rows and columns of pixels. Each row of the pixel array has a first end that is opposite a second end of each row of the pixel array. Control circuitry is coupled to the first end of each row of the pixel array to provide control signals to each row of the pixel array from the first end of each row of the pixel array. Far end driver circuitry coupled to the second end of each row of the pixel array to selectively further drive from the second end of each row of the pixel array the control signals provided by the control circuitry from the first end of each row of the pixel array. The control circuitry is further coupled to provide far end control signals to the far end driver circuitry.

Abstract: An analog to digital conversion (ADC) circuit includes a ramp circuit coupled to output a ramp signal, and the ramp signal is offset from a starting voltage by an offset voltage. The ramp signal ramps towards the starting voltage. A counter circuit is coupled to the ramp circuit to start counting after the ramp signal returns to the starting voltage, and a comparator is coupled to the counter circuit and a bitline to compare the ramp signal to a pixel signal voltage on the bitline. In response to the ramp signal equaling the pixel signal voltage, the comparator stops the counter.

Abstract: An intracardiac pacemaker device, comprising a housing that is configured to be implanted entirely within a ventricle (V) of a heart (H), an electronic module for generating pacing pulses, a battery for supplying energy to the electronic module, an elongated lead extension protruding from the housing, at least a first electrode arranged on the elongated lead extension, and a pacing electrode and a return electrode for applying said pacing pulses to cardiac tissue, wherein the pacing electrode is arranged on the housing. The electronic module is electrically coupled to the pacing electrode via the housing, and wherein the electronic module is configured to carry out measurements of electrical activity via the at least one first electrode of the elongated lead extension.

Abstract: A photodiode is adapted to accumulate image charges in response to incident light. A transfer transistor is coupled between the photodiode and a floating diffusion to transfer the image charges from the photodiode to the floating diffusion. A transfer gate voltage controls the transmission of the image charges from a transfer receiving terminal of the transfer transistor to the floating diffusion. A reset transistor is coupled to supply a supply voltage to the floating diffusion. A source follower transistor is coupled to receive voltage of the floating diffusion from a gate terminal of the source follower and provide an amplified signal to a source terminal of the source follower. A row select transistor is coupled to enable the amplified signal from the SF source terminal and output the amplified signal to a bitline. A bitline enable transistor is coupled to link between the bitline and a bitline source node. The bitline source node is coupled to a blacksun voltage generator.

Abstract: A readout circuit for use in an image sensor includes a system ramp generator coupled to generate a system ramp signal. A plurality of analog-to-digital converters is coupled to a plurality of column bitlines from a pixel array to receive corresponding analog column image signals. An isolation ramp buffer is coupled between the system ramp generator and the analog-to-digital converters. The isolation ramp buffer includes a single input to receive the system ramp signal, and a plurality of isolated outputs. Each of the isolated outputs is coupled to provide an isolated column ramp signal to a corresponding analog-to-digital converter. Each of the of analog-to-digital converters is coupled to generate a corresponding digital column image signal in response to the corresponding analog column image signal and corresponding isolated column ramp signal.

Abstract: A readout circuit for use in an image sensor includes a system ramp generator coupled to generate a system ramp signal. A plurality of analog-to-digital converters is coupled to a plurality of column bitlines from a pixel array to receive corresponding analog column image signals. An isolation ramp buffer is coupled between the system ramp generator and the analog-to-digital converters. The isolation ramp buffer includes a single input to receive the system ramp signal, and a plurality of isolated outputs. Each of the isolated outputs is coupled to provide an isolated column ramp signal to a corresponding analog-to-digital converter. Each of the of analog-to-digital converters is coupled to generate a corresponding digital column image signal in response to the corresponding analog column image signal and corresponding isolated column ramp signal.

Abstract: Readout circuitry to readout an array of image sensor pixels includes readout units that include a plurality of analog-to-digital converters (“ADCs”), a plurality of blocks of Static Random-Access Memory (“SRAM”), and a plurality of blocks of Dynamic Random-Access Memory (“DRAM”). The plurality ADCs is coupled to readout analog image signals two-dimensional blocks of the array of image sensor pixels. The plurality of blocks of SRAM is coupled to receive digital image signals from the ADCs. The digital image signals are representative of the analog image signal readout from the two-dimensional block of pixels. The plurality of blocks of DRAM is coupled to the blocks of SRAM. Each block of SRAM is coupled to sequentially output the digital image signals to each of the blocks of DRAM. Each of the readout units are coupled to output the digital image signals as a plurality of Input/Output (“IO”) signals.

Abstract: Readout circuitry to readout an array of image sensor pixels includes readout units that include a plurality of analog-to-digital converters (“ADCs”), a plurality of blocks of Static Random-Access Memory (“SRAM”), and a plurality of blocks of Dynamic Random-Access Memory (“DRAM”). The plurality ADCs is coupled to readout analog image signals two-dimensional blocks of the array of image sensor pixels. The plurality of blocks of SRAM is coupled to receive digital image signals from the ADCs. The digital image signals are representative of the analog image signal readout from the two-dimensional block of pixels. The plurality of blocks of DRAM is coupled to the blocks of SRAM. Each block of SRAM is coupled to sequentially output the digital image signals to each of the blocks of DRAM. Each of the readout units are coupled to output the digital image signals as a plurality of Input/Output (“IO”) signals.

Abstract: A system, method and apparatus implementing a multiple-row concurrent readout scheme for high-speed CMOS image sensor with backside illumination are described herein. In one embodiment, the method of operating an image sensor starts acquiring image data within a color pixel array and the image data from a first set of multiple rows in the color pixel array is then concurrently readout. Concurrently reading out the image data from the first set of multiple rows includes concurrently selecting a first portion of the image data from the first set by first readout circuitry and a second portion of the image data from the first set by second readout circuitry. The first and second portions of the image data from the first set are different and the first and second readout circuitries are also different. Other embodiments are also described.

Abstract: An image sensor includes a plurality of pixel cells organized into rows and columns of a pixel array. A bit line is coupled to each of the pixel cells within a line of the pixel array. Readout circuitry is coupled to the bit line to readout the image data from the pixel cells within the line. The readout circuitry includes a line amplifier coupled to the bit line to amplify the image data and first and second sample and convert circuits coupled in parallel to an output of the line amplifier to reciprocally and contemporaneously sample the image data and convert the image data from analog values to digital values.

Abstract: A method for customizing a mail history including generating a mail tree composed of all received mails belonging to a same topic; receiving a user input indicating a mail to be replied to and a mail to be referred to which are selected by the user, the mail to be replied to and the mail to be referred to being located on different branches of the mail tree; acquiring a first plurality of mails on a first path from a root mail of the mail tree to a child mail of the mail to be replied to, and a second plurality of mails on a second path from the root mail to a child mail of the mail to be referred to; and merging the first plurality of mails and the second plurality of mails to generate a merging result as the mail history.

Abstract: A method of implementing high dynamic range bin algorithm in an image sensor including a pixel array with a first super row having a first integration time and a second super row having a second integration time is described. The method starts by reading out image data from the first super row into a counter. Image data from the first super row is multiplied by a factor to obtain multiplied data. The factor is a ratio between the first and the second integration times. The multiplied data is then compared with a predetermined data. The image data from the second super row is readout into the counter. If the multiplied data is larger than the predetermined data, the multiplied data from the first super row is stored in the counter. If not, the image data from the second super row is stored. Other embodiments are also described.

Abstract: An arithmetic counter circuit for high performance CMOS image sensors includes a plurality of flip-flops of a plurality of counter stages and a plurality of multiplexers of the plurality of counter stages being coupled to the plurality of flip-flops. Each of the plurality of multiplexers coupled to receive control signals including at least one of a toggle signal, a keep signal, a shift enable signal, or a mode signal. The control signals select the output of each of the plurality of multiplexers. Each of the plurality of flip-flops is coupled to be in one of a toggle state, a keep state, a reset state or a set state based on inputs received from the plurality of multiplexers. Other embodiments are described.

Abstract: A system, method and apparatus implementing a multiple-row concurrent readout scheme for high-speed CMOS image sensor with backside illumination are described herein. In one embodiment, the method of operating an image sensor starts acquiring image data within a color pixel array and the image data from a first set of multiple rows in the color pixel array is then concurrently readout. Concurrently reading out the image data from the first set of multiple rows includes concurrently selecting a first portion of the image data from the first set by first readout circuitry and a second portion of the image data from the first set by second readout circuitry. The first and second portions of the image data from the first set are different and the first and second readout circuitries are also different. Other embodiments are also described.

Abstract: An arithmetic counter circuit for high performance CMOS image sensors includes a plurality of flip-flops of a plurality of counter stages and a plurality of multiplexers of the plurality of counter stages being coupled to the plurality of flip-flops. Each of the plurality of multiplexers coupled to receive control signals including at least one of a toggle signal, a keep signal, a shift enable signal, or a mode signal. The control signals select the output of each of the plurality of multiplexers. Each of the plurality of flip-flops is coupled to be in one of a toggle state, a keep state, a reset state or a set state based on inputs received from the plurality of multiplexers. Other embodiments are described.