Abstract: A method of forming an integrated device includes: pre-storing a plurality of via pillars in a storage tool; arranging a first via pillar selected from the plurality of via pillars to electrically connect to a circuit cell in a first circuit; analyzing an electromigration information of the first circuit to determine if the first via pillar induces EM phenomenon; arranging a second via pillar selected from the plurality of via pillars to replace the first via pillar of the circuit cell to generate a second circuit when the first via pillar induces EM phenomenon; and generating the integrated device according to the second circuit.

Abstract: Exemplary embodiments for various via pillar structures include one or more first conductors in a first interconnect layer of a semiconductor stack interconnected with one or more second conductors in a second interconnect layer of the semiconductor stack. The one or more first conductors and/or the one or more second conductors within the first interconnect layer and the second interconnect layer, respectively, can traverse multiple directions. In some situations, this allows multiple interconnections to be utilized to interconnect the one or more first conductors and the one or more second conductors. These multiple interconnections can reduce resistance between the one or more first conductors and the one or more second conductors thereby improving performance of signals flowing between the one or more first conductors and the one or more second conductors.

Abstract: In examples described herein, methods for via pillar placement and an integrated circuit design including a via pillar are described. In some instances, a path within an integrated circuit or proposed integrated circuit design can be identified as having negative slack. In such instances, in particular where the path includes a fanout to input pins of receivers, a via pillar can be inserted at a location prior to fanout of the path. The via pillar can be inserted, for example, proximate to the fanout, but between the fanout and an output pin of a driver that is connected to the path.