Abstract: An object of the present invention is to provide a light diffusion sheet having a favorable cost reduction capability due to excellent scratching preventive property of the front face, and having in addition thereto, a favorable directional light diffusion function, transmittivity of rays of light, and a thin film character; and a backlight unit capable of promoting performances such as luminance as well as price reduction, and thin and light modeling capability. The light diffusion sheet of the present invention has a light diffusion sheet including a transparent substrate layer, and a light diffusion layer overlaid on the front face side of the substrate layer, wherein the light diffusion layer has resin beads and a resin binder, characterized in that the light diffusion layer has protruding parts having a shape of a partial spherical body on the front face in a scattering manner.

Abstract: In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit.

Abstract: Arrangements for inspecting a specimen on which plural patterns are formed; capturing a first image of a first area; capturing a second image of a second area in which patterns which are essentially the same with the patterns formed in the first area; creating data relating to corresponding pixels of the first and second images, for each pixel; determining a threshold for each pixel for detecting defects directly in accordance with the first and second images; and detecting defects on the specimen by processing the first and second images by using the threshold for each pixel and information of a scattered diagram of brightness of the first and second images, wherein the threshold is determined by using information of brightness of a local region of at least one of the first and second images, with the local region including an aimed pixel and peripheral pixels of the aimed pixel.

Abstract: Measurement cannot be made when trying to measure a wavefront aberration of a wide-angle lens, being wide in a field of view, comparing to a focus distance, by a Shack-Hartmann sensor, since an inclination of the wavefront exceeds an allowable value of inclination of the Shack-Hartmann sensor. The Shack-Hartmann sensor is inclined at a position of a pupil of a lens, and is controlled so that it lies within the allowable value mentioned above. Photographing is made through step & repeat while overlapping at the same position, to compose in such a manner that overlapping spots are piled up, and thereby measuring the wavefront aberration of the lens having a large pupil diameter.

Abstract: There is provided a pattern inspection device for a substrate surface which can inspect a substrate including a pattern whose size is equal to or smaller than light resolution limit at high speed. The pattern inspection device for the substrate surface includes: a near-field optical head 101 having a fine repetitive pattern; a ? driving unit 311 of scanning an inspected substrate 900 relatively to the near-field optical head 101; a space holding mechanism of holding a space between the near-field optical head 101 and the inspected substrate 900 constant; alight source 110 of irradiating light to the near-field optical head 101; a detection system 201 of detecting an intensity of scattered light generated by interaction between the fine repetitive pattern on the near-field optical head 101 and a fine pattern on a surface of the inspected substrate 900; and a signal processing unit 321 of inspecting the fine pattern on the inspected substrate 900 based on an output of the detection system 201.

Abstract: According to an embodiment of the invention, degradation of carrier in a case is detected from the number of rotations of a developing roller. A predetermined quantity of carrier is replenished every time the developing roller reaches a predetermined number of rotations. An excess developer caused by an increase in bulk through carrier replenishment is discharged from a developer discharge port. The degraded old carrier in the case is replaced by new carrier little by little.

Abstract: An apparatus is disclosed for detecting defects on a sample inspected by different inspection apparatuses. A data processing unit receives position information of a first defects group in a first coordinate system, based on inspection of the sample under a first condition using a first defect inspection apparatus. The data processing unit receives position information of a second defects group in a second coordinate system, after least one processing step has been performed on the sample. Position information of the second defects group is obtained by inspecting the sample under a second condition using a second defect inspection apparatus which is different from the first defect inspection apparatus. A position correction unit corrects error of relative position information on the first defects group and the second defects group, and the first and second defects groups are checked.

Abstract: A developing device includes a developer tank configured to contain a developer including a toner and a carrier, the developer tank having a discharge port which is provided in a lateral side surface of the developer tank and configured to discharge the developer, a developing agent supplier configured to develop a latent image by using the toner contained in the developer tank, and a plate-shaped member configured to be formed in a direction of height from a lower end of the discharge port and partially cover the discharge port to regulate the discharge of the developer.

Abstract: A separation membrane support substrate characterized by being composed of a laminated nonwoven fabric comprising a front layer as the resin coating layer, a middle layer and a back layer which are integrally formed by heat bonding, and by satisfying the following conditions (1) to (5): (1) The front layer has at least one layer comprising thermoplastic resin filaments with a single filament diameter of 7-30 ?m; (2) the middle layer has at least one layer comprising melt blown fibers with a single fiber diameter of no greater than 5 ?m, and a fiber basis weight of at least 1 g/m2 and comprising no more than 30 wt % of the total fiber basis weight; (3) the back layer has at least one layer comprising thermoplastic resin filaments with a single filament diameter of 7-20 ?m, and has a fiber basis weight of 3-40 g/m2; (4) the laminated nonwoven fabric has an apparent density of 0.67-0.91 g/cm3; and (5) the laminated nonwoven fabric has a thickness of 45-110 ?m.

Abstract: There is provided a defect inspecting apparatus, which includes an irradiating optical system of irradiating a light beam on a surface of a face plate of a disk mounted on a stage to scan the surface of the face plate, a light-receiving optical system of receiving specular reflection light that has transmitted a shading filter with a shading difference that changes an amount of the specular reflection light from the face plate resulting from the light beam irradiated on the disk, and a processing unit of identifying defects on the surface of the face plate from the change in amount of the specular reflection light that has transmitted a filter, so that a size and a height of the defect can be measured with high accuracy when irregular defects are determined, which is not easily achieved by a conventional lens effect.

Abstract: A structure for fixing a planting base 100 supporting a planted raising member 106 by a bottom plate 101 to a laying face 300, the structure being provided with a cylinder portion 105 which projects from the bottom plate 101 of the planting base 100 to a top side and top and bottom of which are opened in which an inner diameter is gradually contracted from a top end to a bottom side, a bolt 110 constituting a fixing member is inserted to the cylinder portion 105, the bolt 110 is screwed to and fixed by an anchor holder 120 of the laying face 300 until a position at which a bolt head portion 110a is brought into contact with and caught by an inner face of the cylinder portion 105, and a top face of the bolt head portion 110a is arranged at a height the same as that of a top end of the cylinder portion 105, or arranged at inside of the cylinder portion 105.

Abstract: An image forming apparatus includes: a first image forming unit which forms a first image on a first recording medium with a first material which is not thermally decolorized; a second image forming unit which forms a second image on a second recording medium with a second material which is thermally decolorized; a fixing unit which is on a common carrying path shared by the first recording medium and the second recording medium and fixes the first image to the first recording medium; and a control unit which controls the fixing unit so that the temperature of the second recording medium passing through the fixing unit becomes lower than a decolorizing temperature of the second material.

Abstract: A weatherstrip composition includes the following polymer A group and polymer B group, Polymer A group. A polymer group is made up of a domain 1 consisting of crosslinked product of a polymer selected from a group consisting of ethylene polymer, ethylene/?-olefin copolymer (where the ?-olefin has from 3 to 20 carbons), ethylene/?-olefin/diene copolymer (where the .alpha.-olefin has from 3 to 20 carbons), homopolymer rubber of a conjugated diene monomer, copolymer polymerized with a conjugated diene monomer and an aromatic vinyl monomer, and hydrogenated copolymer polymerized with a conjugated diene monomer and an aromatic vinyl monomer (where the hydrogenation of all double bonds except for the aromatic groups is at least 50%), and a domain 2 is made up of crosslinked product of ethylene polymer or ethylene/?-olefin copolymer (where the ?-olefin has from 3 to 20 carbons).

Abstract: A method and apparatus for inspecting defects includes emitting an ultraviolet light from an ultraviolet light source, illuminating a specimen with the ultraviolet light in which a polarization condition of the ultraviolet light is controlled, controlling a polarization condition of light reflected from the specimen which is illuminated by the polarization condition controlled ultraviolet light, detecting the light reflected from the specimen, processing the detected light so as to detect defects, and outputting information about the defects. The ultraviolet light source is disposed in a clean environment supplied with clean gas and separated from outside.

Abstract: Arrangements for inspecting a specimen on which plural patterns are formed; capturing a first image of a first area; capturing a second image of a second area in which patterns which are essentially the same with the patterns formed in the first area; creating data relating to corresponding pixels of the first and second images, for each pixel; determining a threshold for each pixel for detecting defects directly in accordance with the first and second images; and detecting defects on the specimen by processing the first and second images by using the threshold for each pixel and information of a scattered diagram of brightness of the first and second images, wherein the threshold is determined by using information of brightness of a local region of at least one of the first and second images, with the local region including an aimed pixel and peripheral pixels of the aimed pixel.

Abstract: It is possible to further improve an accuracy of detecting a sound producing position in a musical composition and enhancing a rate of detecting a type of a musical instrument than ever before. There is provided a sound producing position detecting part 3 which, when a sound producing position of a musical instrument playing a musical composition is detected by using a difference value of a residual power value obtained by LPC-analyzing a musical composition data Sin corresponding to the musical composition, uses a variable threshold value for detection based on a speed (tempo) of the musical composition.

Abstract: Screen data is generated by a screen generating processor (74) of a control host computer (7) and transmitted to a programmable display apparatus (5). In accordance with the screen data, the programmable display apparatus (5) inquires a PLC (3) or the like about a state of a device (21), so as to update the display or transmit a control instruction depending on an input result. On the other hand, a control host computer (7) has a public server section (77) to transmit to a client apparatus (9) via the Internet an applet, which is generated by a compiler (76) compiling the screen data. The client apparatus (9) executes the applet to transmit to the public server section (77) an or the control instruction inquiry similar to those the programmable display apparatus (5) makes. In this way, the display is updated in accordance with a response.

Abstract: A surface inspection apparatus is provided based on an optical interference scheme using a wide-band laser light source, such as diode laser, for an interferometer. In the apparatus, a diode laser with a large spectrum width having a short coherence length is used as an emitted light source; modulation optical elements for performing modulation with slightly different frequencies, and optical path length varying optical elements for adjusting the optical path length are located in each of two optical paths between a branching optical element and a combining optical element; and the above-mentioned optical path length varying optical elements are adjusted, while measuring an interference intensity, so as to maximize the interference intensity.

Abstract: A defect generated during a nano-imprint process is inspected by a scatterometry method. The scatterometry method is to illuminate the surface of a medium with light having a plurality of wave lengths by means of a first illuminator through a half mirror and an objective lens and cause light reflected on the medium to be incident on a spectrometer through the objective lens and the half mirror. A second illuminator illuminates a foreign material or scratch on the surface of the medium from an oblique direction with respect to the surface of the medium. Light is scattered from the foreign material or scratch and detected by first and second detectors. The first detector is placed in a direction defining a first elevation angle with the surface of the medium. The second detector is placed in a direction defining a second elevation angle with the surface of the medium.

Abstract: An image forming apparatus includes: a first image forming unit which forms a first image on a first recording medium with a first material which is not thermally decolorized; a second image forming unit which forms a second image on a second recording medium with a second material which is thermally decolorized; a fixing unit which is on a common carrying path shared by the first recording medium and the second recording medium and fixes the first image to the first recording medium; and a control unit which controls the fixing unit so that the temperature of the second recording medium passing through the fixing unit becomes lower than a decolorizing temperature of the second material.