Patents by Inventor Mitsuharu Tai
Mitsuharu Tai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11423299Abstract: A device includes an input unit, a nonlinear converter, and an output unit. The nonlinear converter and the output unit are connected via a connection path having a delay mechanism that realizes a feedback loop giving a delay to a signal. The delay mechanism includes a conversion mechanism that generates a plurality of signals with different delay times using the signal output from the nonlinear converter, generates a new signal by superimposing the plurality of signals, and outputs the generated signal to the output unit.Type: GrantFiled: November 29, 2018Date of Patent: August 23, 2022Assignee: Hitachi, Ltd.Inventors: Tadashi Okumura, Mitsuharu Tai, Masahiko Ando, Sanato Nagata, Norifumi Kameshiro
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Publication number: 20200334516Abstract: A computer generates a model for outputting an output value on the basis of a plurality of pieces of time-series data having different data types. The model includes a network that is for hied of connections of nodes having a recursive structure and updates states of the nodes according to a predetermined time step, and an adder that calculates the output value. The computer comprises: a learning unit configured to execute, for each of a plurality of output values, a learning process of calculating weight data including the plurality of weights by using learning data and a first storing unit configured to store a plurality of learning results each of which correlates a type of the output value and the weight data with each other.Type: ApplicationFiled: March 13, 2020Publication date: October 22, 2020Applicant: HITACHI, LTD.Inventors: Mitsuharu TAI, Jun FURUYA, Nobuhiro FUKUDA, Tadashi OKUMURA, Masahiko ANDO
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Patent number: 10338046Abstract: An object of the present invention is to provide an artificial olfactory sensing system capable of sniffing out various odors highly sensitively. The artificial olfactory sensing system includes: plural sensor cells on a lipid membrane of each of which olfactory receptors have developed; and plural ion-sensitive field-effect transistors (ISFETs) that correspondingly exist to the sensor cells on a one-on-one basis. A response signal showing that each of the olfactory receptors of each of the sensor cells has recognized an odor molecule is converted into an electric signal by an ISFET corresponding to each of the sensor cells.Type: GrantFiled: January 15, 2016Date of Patent: July 2, 2019Assignee: HITACHI, LTD.Inventors: Masahiko Ando, Sanato Nagata, Shirun Ho, Yuji Suwa, Mitsuharu Tai, Kenzo Kurotsuchi, Hiromasa Takahashi, Norifumi Kameshiro, Seiichi Suzuki
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Publication number: 20190164053Abstract: A device includes an input unit, a nonlinear converter, and an output unit. The nonlinear converter and the output unit are connected via a connection path having a delay mechanism that realizes a feedback loop giving a delay to a signal. The delay mechanism includes a conversion mechanism that generates a plurality of signals with different delay times using the signal output from the nonlinear converter, generates a new signal by superimposing the plurality of signals, and outputs the generated signal to the output unit.Type: ApplicationFiled: November 29, 2018Publication date: May 30, 2019Inventors: Tadashi OKUMURA, Mitsuharu TAI, Masahiko ANDO, Sanato NAGATA, Norifumi KAMESHIRO
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Publication number: 20180267005Abstract: An object of the present invention is to provide an artificial olfactory sensing system capable of sniffing out various odors highly sensitively. The artificial olfactory sensing system includes: plural sensor cells on a lipid membrane of each of which olfactory receptors have developed; and plural ion-sensitive field-effect transistors (ISFETs) that correspondingly exist to the sensor cells on a one-on-one basis. A response signal showing that each of the olfactory receptors of each of the sensor cells has recognized an odor molecule is converted into an electric signal by an ISFET corresponding to each of the sensor cells.Type: ApplicationFiled: January 5, 2015Publication date: September 20, 2018Applicant: Hitachi, Ltd.Inventors: Masahiko ANDO, Sanato NAGATA, Shirun HO, Yuji SUWA, Mitsuharu TAI, Kenzo KUROTSUCHI, Hiromasa TAKAHASHI, Norifumi KAMESHIRO, Seiichi SUZUKI
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Patent number: 9490429Abstract: When a thin channel semiconductor layer formed on a side wall of a stacked film in which insulating films and gate electrodes are alternately stacked together is removed on the stacked film, a contact resistance between a vertical transistor including the channel semiconductor layer and the gate electrode, and a bit line formed on the stacked film is prevented from rising. As its means, a conductive layer electrically connected to the channel semiconductor layer is disposed immediately above the stacked film.Type: GrantFiled: September 21, 2015Date of Patent: November 8, 2016Assignee: Hitachi, Ltd.Inventors: Yoshitaka Sasago, Masaharu Kinoshita, Mitsuharu Tai, Akio Shima, Kenzo Kurotsuchi, Takashi Kobayashi
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Publication number: 20160079529Abstract: When a thin channel semiconductor layer formed on a side wall of a stacked film in which insulating films and gate electrodes are alternately stacked together is removed on the stacked film, a contact resistance between a vertical transistor including the channel semiconductor layer and the gate electrode, and a bit line formed on the stacked film is prevented from rising. As its means, a conductive layer electrically connected to the channel semiconductor layer is disposed immediately above the stacked film.Type: ApplicationFiled: September 21, 2015Publication date: March 17, 2016Inventors: Yoshitaka SASAGO, Masaharu KINOSHITA, Mitsuharu TAI, Akio SHIMA, Kenzo KUROTSUCHI, Takashi KOBAYASHI
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Patent number: 9153774Abstract: When a thin channel semiconductor layer formed on a side wall of a stacked film in which insulating films and gate electrodes are alternately stacked together is removed on the stacked film, a contact resistance between a vertical transistor including the channel semiconductor layer and the gate electrode, and a bit line formed on the stacked film is prevented from rising. As its means, a conductive layer electrically connected to the channel semiconductor layer is disposed immediately above the stacked film.Type: GrantFiled: December 6, 2010Date of Patent: October 6, 2015Assignee: Hitachi, Ltd.Inventors: Yoshitaka Sasago, Masaharu Kinoshita, Mitsuharu Tai, Akio Shima, Kenzo Kurotsuchi, Takashi Kobayashi
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Patent number: 9070621Abstract: In a nonvolatile semiconductor memory device, there is provided a technique which promotes microfabrication by reducing a thickness of the device as suppressing an OFF current of a polysilicon diode which is a selective element. A polysilicon layer to which an impurity is doped at low concentration and which becomes an electric-field relaxation layer of the polysilicon diode which is a selective element of a resistance variable memory is formed so as to be divided into two or more layers such as polysilicon layers. In this manner, it is suppressed to form the crystal grain boundaries thoroughly penetrating between an n-type polysilicon layer and a p-type polysilicon layer in the electric-field relaxation layer, and therefore, it is prevented to generate a leakage current flowing through the crystal grain boundaries in application of a reverse-bias voltage without increasing a height of the polysilicon diode.Type: GrantFiled: November 10, 2013Date of Patent: June 30, 2015Assignee: Hitachi, Ltd.Inventors: Yoshitaka Sasago, Masaharu Kinoshita, Mitsuharu Tai, Takashi Kobayashi
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Patent number: 9024284Abstract: A superlattice phase change memory capable of increasing a resistance in a low resistance state is provided. The phase change memory includes a first electrode, a second electrode provided on the first electrode, and a phase change memory layer having a superlattice structure between the first electrode and the second electrode, the superlattice structure including to repeatedly formed layers of Sb2Te3 and GeTe. The phase change memory layer having the superlattice structure includes a Sb2Te3 layer containing Zr in contact with the first electrode.Type: GrantFiled: November 27, 2013Date of Patent: May 5, 2015Assignee: Hitachi, Ltd.Inventors: Takasumi Oyanagi, Norikatsu Takaura, Mitsuharu Tai, Masaharu Kinoshita, Takahiro Morikawa, Kenichi Akita, Masahito Kitamura
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Publication number: 20140151622Abstract: A superlattice phase change memory capable of increasing a resistance in a low resistance state is provided. The phase change memory includes a first electrode, a second electrode provided on the first electrode, and a phase change memory layer having a superlattice structure between the first electrode and the second electrode, the superlattice structure including to repeatedly formed layers of Sb2Te3 and GeTe. The phase change memory layer having the superlattice structure includes a Sb2Te3 layer containing Zr in contact with the first electrode.Type: ApplicationFiled: November 27, 2013Publication date: June 5, 2014Inventors: Takasumi Oyanagi, Norikatsu Takaura, Mitsuharu Tai, Masaharu Kinoshita, Takahiro Morikawa, Kenichi Akita, Masahito Kitamura
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Publication number: 20140065789Abstract: In a nonvolatile semiconductor memory device, there is provided a technique which promotes microfabrication by reducing a thickness of the device as suppressing an OFF current of a polysilicon diode which is a selective element. A polysilicon layer to which an impurity is doped at low concentration and which becomes an electric-field relaxation layer of the polysilicon diode which is a selective element of a resistance variable memory is formed so as to be divided into two or more layers such as polysilicon layers. In this manner, it is suppressed to form the crystal grain boundaries thoroughly penetrating between an n-type polysilicon layer and a p-type polysilicon layer in the electric-field relaxation layer, and therefore, it is prevented to generate a leakage current flowing through the crystal grain boundaries in application of a reverse-bias voltage without increasing a height of the polysilicon diode.Type: ApplicationFiled: November 10, 2013Publication date: March 6, 2014Applicant: Hitachi, Ltd.Inventors: Yoshitaka SASAGO, Masaharu KINOSHITA, Mitsuharu TAI, Takashi KOBAYASHI
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Patent number: 8592789Abstract: In a nonvolatile semiconductor memory device, there is provided a technique which promotes microfabrication by reducing a thickness of the device as suppressing an OFF current of a polysilicon diode which is a selective element. A polysilicon layer to which an impurity is doped at low concentration and which becomes an electric-field relaxation layer of the polysilicon diode which is a selective element of a resistance variable memory is formed so as to be divided into two or more layers such as polysilicon layers. In this manner, it is suppressed to form the crystal grain boundaries thoroughly penetrating between an n-type polysilicon layer and a p-type polysilicon layer in the electric-field relaxation layer, and therefore, it is prevented to generate a leakage current flowing through the crystal grain boundaries in application of a reverse-bias voltage without increasing a height of the polysilicon diode.Type: GrantFiled: May 17, 2011Date of Patent: November 26, 2013Assignee: Hitachi, Ltd.Inventors: Yoshitaka Sasago, Masaharu Kinoshita, Mitsuharu Tai, Takashi Kobayashi
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Publication number: 20130228739Abstract: When a thin channel semiconductor layer formed on a side wall of a stacked film in which insulating films and gate electrodes are alternately stacked together is removed on the stacked film, a contact resistance between a vertical transistor including the channel semiconductor layer and the gate electrode, and a bit line formed on the stacked film is prevented from rising. As its means, a conductive layer electrically connected to the channel semiconductor layer is disposed immediately above the stacked film.Type: ApplicationFiled: December 6, 2010Publication date: September 5, 2013Inventors: Yoshitaka Sasago, Masaharu Kinoshita, Mitsuharu Tai, Akio Shima, Kenzo Kurotsuchi, Takashi Kobayashi
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Patent number: 8338867Abstract: According to the present invention, a highly sensitive photo-sensing element and a sensor driver circuit are prepared by planer process on an insulating substrate by using only polycrystalline material. Both the photo-sensing element and the sensor driver circuit are made of polycrystalline silicon film. As the photo-sensing element, a photo transistor is formed by using TFT, which comprises a first electrode 11 prepared on an insulating substrate 10, a photoelectric conversion region 14 and a second electrode 12, and a third electrode 13 disposed above the photoelectric conversion region 14. An impurity layer positioned closer to an intrinsic layer (density of active impurities is 1017 cm?3 or lower) is provided on the regions 15 and 16 on both sides under the third electrode 13 or on one of the regions 15 or 16 on one side.Type: GrantFiled: September 19, 2011Date of Patent: December 25, 2012Assignees: Hitachi Displays, Ltd., Panasonic Liquid Crystal Display Co., Ltd.Inventors: Mitsuharu Tai, Hideo Sato, Mutsuko Hatano, Masayoshi Kinoshita
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Publication number: 20120074368Abstract: A semiconductor memory device having a diode and a transistor connected in series, which prevents carriers from going from the diode into the transistor, thereby reducing the possibility of transistor deterioration. A structure to annihilate carriers from the diode is provided between a channel layer of the transistor and a diode semiconductor layer of the diode where the carriers are generated.Type: ApplicationFiled: July 13, 2011Publication date: March 29, 2012Inventors: Yoshitaka SASAGO, Masaharu KINOSHITA, Mitsuharu TAI, Akio SHIMA, Takashi KOBAYASHI
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Publication number: 20120068287Abstract: According to the present invention, a highly sensitive photo-sensing element and a sensor driver circuit are prepared by planer process on an insulating substrate by using only polycrystalline material. Both the photo-sensing element and the sensor driver circuit are made of polycrystalline silicon film. As the photo-sensing element, a photo transistor is formed by using TFT, which comprises a first electrode 11 prepared on an insulating substrate 10, a photoelectric conversion region 14 and a second electrode 12, and a third electrode 13 disposed above the photoelectric conversion region 14. An impurity layer positioned closer to an intrinsic layer (density of active impurities is 1017 cm?3 or lower) is provided on the regions 15 and 16 on both sides under the third electrode 13 or on one of the regions 15 or 16 on one side.Type: ApplicationFiled: September 19, 2011Publication date: March 22, 2012Inventors: Mitsuharu Tai, Hideo Sato, Mutsuko Hatano, Masayoshi Kinoshita
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Patent number: 8097927Abstract: The present invention provides an image display unit integrated with a photo-sensor, comprising a photo-sensing element with high sensitivity and low noise and a polycrystalline silicon TFT prepared at the same time on an insulating substrate using planer process. After a first electrode 11 and a second electrode 12 of the photo-sensing element are made of polycrystalline silicon film, a light receiving layer (photoelectric conversion layer) 13 of the photo-sensing element is prepared by amorphous silicon film on upper layer. In this case, a polycrystalline silicon TFT is prepared at the same time.Type: GrantFiled: December 12, 2007Date of Patent: January 17, 2012Assignee: Hitachi Displays, Ltd.Inventors: Mitsuharu Tai, Toshio Miyazawa
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Publication number: 20110284817Abstract: In a nonvolatile semiconductor memory device, there is provided a technique which promotes microfabrication by reducing a thickness of the device as suppressing an OFF current of a polysilicon diode which is a selective element. A polysilicon layer to which an impurity is doped at low concentration and which becomes an electric-field relaxation layer of the polysilicon diode which is a selective element of a resistance variable memory is formed so as to be divided into two or more layers such as polysilicon layers. In this manner, it is suppressed to form the crystal grain boundaries thoroughly penetrating between an n-type polysilicon layer and a p-type polysilicon layer in the electric-field relaxation layer, and therefore, it is prevented to generate a leakage current flowing through the crystal grain boundaries in application of a reverse-bias voltage without increasing a height of the polysilicon diode.Type: ApplicationFiled: May 17, 2011Publication date: November 24, 2011Inventors: Yoshitaka SASAGO, Masaharu Kinoshita, Mitsuharu Tai, Takashi Kobayashi
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Patent number: 7939826Abstract: A thin film semiconductor device is provided which includes an insulating substrate, a Si thin film formed over the insulating substrate, and a transistor with the Si thin film as a channel thereof. The Si thin film includes a polycrystal where a plurality of narrow, rectangular crystal grains are arranged. A surface of the polycrystal is flat at grain boundaries thereof. Also, an average film thickness of the boundaries of crystals of the Si thin film ranges from 90 to 110% of an intra-grain average film thickness.Type: GrantFiled: October 27, 2008Date of Patent: May 10, 2011Assignee: Hitachi Displays, Ltd.Inventors: Shinya Yamaguchi, Mutsuko Hatano, Mitsuharu Tai, Sedng-Kee Park, Takeo Shiba