Patents by Inventor Mitsuharu Tai

Mitsuharu Tai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11423299
    Abstract: A device includes an input unit, a nonlinear converter, and an output unit. The nonlinear converter and the output unit are connected via a connection path having a delay mechanism that realizes a feedback loop giving a delay to a signal. The delay mechanism includes a conversion mechanism that generates a plurality of signals with different delay times using the signal output from the nonlinear converter, generates a new signal by superimposing the plurality of signals, and outputs the generated signal to the output unit.
    Type: Grant
    Filed: November 29, 2018
    Date of Patent: August 23, 2022
    Assignee: Hitachi, Ltd.
    Inventors: Tadashi Okumura, Mitsuharu Tai, Masahiko Ando, Sanato Nagata, Norifumi Kameshiro
  • Publication number: 20200334516
    Abstract: A computer generates a model for outputting an output value on the basis of a plurality of pieces of time-series data having different data types. The model includes a network that is for hied of connections of nodes having a recursive structure and updates states of the nodes according to a predetermined time step, and an adder that calculates the output value. The computer comprises: a learning unit configured to execute, for each of a plurality of output values, a learning process of calculating weight data including the plurality of weights by using learning data and a first storing unit configured to store a plurality of learning results each of which correlates a type of the output value and the weight data with each other.
    Type: Application
    Filed: March 13, 2020
    Publication date: October 22, 2020
    Applicant: HITACHI, LTD.
    Inventors: Mitsuharu TAI, Jun FURUYA, Nobuhiro FUKUDA, Tadashi OKUMURA, Masahiko ANDO
  • Patent number: 10338046
    Abstract: An object of the present invention is to provide an artificial olfactory sensing system capable of sniffing out various odors highly sensitively. The artificial olfactory sensing system includes: plural sensor cells on a lipid membrane of each of which olfactory receptors have developed; and plural ion-sensitive field-effect transistors (ISFETs) that correspondingly exist to the sensor cells on a one-on-one basis. A response signal showing that each of the olfactory receptors of each of the sensor cells has recognized an odor molecule is converted into an electric signal by an ISFET corresponding to each of the sensor cells.
    Type: Grant
    Filed: January 15, 2016
    Date of Patent: July 2, 2019
    Assignee: HITACHI, LTD.
    Inventors: Masahiko Ando, Sanato Nagata, Shirun Ho, Yuji Suwa, Mitsuharu Tai, Kenzo Kurotsuchi, Hiromasa Takahashi, Norifumi Kameshiro, Seiichi Suzuki
  • Publication number: 20190164053
    Abstract: A device includes an input unit, a nonlinear converter, and an output unit. The nonlinear converter and the output unit are connected via a connection path having a delay mechanism that realizes a feedback loop giving a delay to a signal. The delay mechanism includes a conversion mechanism that generates a plurality of signals with different delay times using the signal output from the nonlinear converter, generates a new signal by superimposing the plurality of signals, and outputs the generated signal to the output unit.
    Type: Application
    Filed: November 29, 2018
    Publication date: May 30, 2019
    Inventors: Tadashi OKUMURA, Mitsuharu TAI, Masahiko ANDO, Sanato NAGATA, Norifumi KAMESHIRO
  • Publication number: 20180267005
    Abstract: An object of the present invention is to provide an artificial olfactory sensing system capable of sniffing out various odors highly sensitively. The artificial olfactory sensing system includes: plural sensor cells on a lipid membrane of each of which olfactory receptors have developed; and plural ion-sensitive field-effect transistors (ISFETs) that correspondingly exist to the sensor cells on a one-on-one basis. A response signal showing that each of the olfactory receptors of each of the sensor cells has recognized an odor molecule is converted into an electric signal by an ISFET corresponding to each of the sensor cells.
    Type: Application
    Filed: January 5, 2015
    Publication date: September 20, 2018
    Applicant: Hitachi, Ltd.
    Inventors: Masahiko ANDO, Sanato NAGATA, Shirun HO, Yuji SUWA, Mitsuharu TAI, Kenzo KUROTSUCHI, Hiromasa TAKAHASHI, Norifumi KAMESHIRO, Seiichi SUZUKI
  • Patent number: 9490429
    Abstract: When a thin channel semiconductor layer formed on a side wall of a stacked film in which insulating films and gate electrodes are alternately stacked together is removed on the stacked film, a contact resistance between a vertical transistor including the channel semiconductor layer and the gate electrode, and a bit line formed on the stacked film is prevented from rising. As its means, a conductive layer electrically connected to the channel semiconductor layer is disposed immediately above the stacked film.
    Type: Grant
    Filed: September 21, 2015
    Date of Patent: November 8, 2016
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitaka Sasago, Masaharu Kinoshita, Mitsuharu Tai, Akio Shima, Kenzo Kurotsuchi, Takashi Kobayashi
  • Publication number: 20160079529
    Abstract: When a thin channel semiconductor layer formed on a side wall of a stacked film in which insulating films and gate electrodes are alternately stacked together is removed on the stacked film, a contact resistance between a vertical transistor including the channel semiconductor layer and the gate electrode, and a bit line formed on the stacked film is prevented from rising. As its means, a conductive layer electrically connected to the channel semiconductor layer is disposed immediately above the stacked film.
    Type: Application
    Filed: September 21, 2015
    Publication date: March 17, 2016
    Inventors: Yoshitaka SASAGO, Masaharu KINOSHITA, Mitsuharu TAI, Akio SHIMA, Kenzo KUROTSUCHI, Takashi KOBAYASHI
  • Patent number: 9153774
    Abstract: When a thin channel semiconductor layer formed on a side wall of a stacked film in which insulating films and gate electrodes are alternately stacked together is removed on the stacked film, a contact resistance between a vertical transistor including the channel semiconductor layer and the gate electrode, and a bit line formed on the stacked film is prevented from rising. As its means, a conductive layer electrically connected to the channel semiconductor layer is disposed immediately above the stacked film.
    Type: Grant
    Filed: December 6, 2010
    Date of Patent: October 6, 2015
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitaka Sasago, Masaharu Kinoshita, Mitsuharu Tai, Akio Shima, Kenzo Kurotsuchi, Takashi Kobayashi
  • Patent number: 9070621
    Abstract: In a nonvolatile semiconductor memory device, there is provided a technique which promotes microfabrication by reducing a thickness of the device as suppressing an OFF current of a polysilicon diode which is a selective element. A polysilicon layer to which an impurity is doped at low concentration and which becomes an electric-field relaxation layer of the polysilicon diode which is a selective element of a resistance variable memory is formed so as to be divided into two or more layers such as polysilicon layers. In this manner, it is suppressed to form the crystal grain boundaries thoroughly penetrating between an n-type polysilicon layer and a p-type polysilicon layer in the electric-field relaxation layer, and therefore, it is prevented to generate a leakage current flowing through the crystal grain boundaries in application of a reverse-bias voltage without increasing a height of the polysilicon diode.
    Type: Grant
    Filed: November 10, 2013
    Date of Patent: June 30, 2015
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitaka Sasago, Masaharu Kinoshita, Mitsuharu Tai, Takashi Kobayashi
  • Patent number: 9024284
    Abstract: A superlattice phase change memory capable of increasing a resistance in a low resistance state is provided. The phase change memory includes a first electrode, a second electrode provided on the first electrode, and a phase change memory layer having a superlattice structure between the first electrode and the second electrode, the superlattice structure including to repeatedly formed layers of Sb2Te3 and GeTe. The phase change memory layer having the superlattice structure includes a Sb2Te3 layer containing Zr in contact with the first electrode.
    Type: Grant
    Filed: November 27, 2013
    Date of Patent: May 5, 2015
    Assignee: Hitachi, Ltd.
    Inventors: Takasumi Oyanagi, Norikatsu Takaura, Mitsuharu Tai, Masaharu Kinoshita, Takahiro Morikawa, Kenichi Akita, Masahito Kitamura
  • Publication number: 20140151622
    Abstract: A superlattice phase change memory capable of increasing a resistance in a low resistance state is provided. The phase change memory includes a first electrode, a second electrode provided on the first electrode, and a phase change memory layer having a superlattice structure between the first electrode and the second electrode, the superlattice structure including to repeatedly formed layers of Sb2Te3 and GeTe. The phase change memory layer having the superlattice structure includes a Sb2Te3 layer containing Zr in contact with the first electrode.
    Type: Application
    Filed: November 27, 2013
    Publication date: June 5, 2014
    Inventors: Takasumi Oyanagi, Norikatsu Takaura, Mitsuharu Tai, Masaharu Kinoshita, Takahiro Morikawa, Kenichi Akita, Masahito Kitamura
  • Publication number: 20140065789
    Abstract: In a nonvolatile semiconductor memory device, there is provided a technique which promotes microfabrication by reducing a thickness of the device as suppressing an OFF current of a polysilicon diode which is a selective element. A polysilicon layer to which an impurity is doped at low concentration and which becomes an electric-field relaxation layer of the polysilicon diode which is a selective element of a resistance variable memory is formed so as to be divided into two or more layers such as polysilicon layers. In this manner, it is suppressed to form the crystal grain boundaries thoroughly penetrating between an n-type polysilicon layer and a p-type polysilicon layer in the electric-field relaxation layer, and therefore, it is prevented to generate a leakage current flowing through the crystal grain boundaries in application of a reverse-bias voltage without increasing a height of the polysilicon diode.
    Type: Application
    Filed: November 10, 2013
    Publication date: March 6, 2014
    Applicant: Hitachi, Ltd.
    Inventors: Yoshitaka SASAGO, Masaharu KINOSHITA, Mitsuharu TAI, Takashi KOBAYASHI
  • Patent number: 8592789
    Abstract: In a nonvolatile semiconductor memory device, there is provided a technique which promotes microfabrication by reducing a thickness of the device as suppressing an OFF current of a polysilicon diode which is a selective element. A polysilicon layer to which an impurity is doped at low concentration and which becomes an electric-field relaxation layer of the polysilicon diode which is a selective element of a resistance variable memory is formed so as to be divided into two or more layers such as polysilicon layers. In this manner, it is suppressed to form the crystal grain boundaries thoroughly penetrating between an n-type polysilicon layer and a p-type polysilicon layer in the electric-field relaxation layer, and therefore, it is prevented to generate a leakage current flowing through the crystal grain boundaries in application of a reverse-bias voltage without increasing a height of the polysilicon diode.
    Type: Grant
    Filed: May 17, 2011
    Date of Patent: November 26, 2013
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitaka Sasago, Masaharu Kinoshita, Mitsuharu Tai, Takashi Kobayashi
  • Publication number: 20130228739
    Abstract: When a thin channel semiconductor layer formed on a side wall of a stacked film in which insulating films and gate electrodes are alternately stacked together is removed on the stacked film, a contact resistance between a vertical transistor including the channel semiconductor layer and the gate electrode, and a bit line formed on the stacked film is prevented from rising. As its means, a conductive layer electrically connected to the channel semiconductor layer is disposed immediately above the stacked film.
    Type: Application
    Filed: December 6, 2010
    Publication date: September 5, 2013
    Inventors: Yoshitaka Sasago, Masaharu Kinoshita, Mitsuharu Tai, Akio Shima, Kenzo Kurotsuchi, Takashi Kobayashi
  • Patent number: 8338867
    Abstract: According to the present invention, a highly sensitive photo-sensing element and a sensor driver circuit are prepared by planer process on an insulating substrate by using only polycrystalline material. Both the photo-sensing element and the sensor driver circuit are made of polycrystalline silicon film. As the photo-sensing element, a photo transistor is formed by using TFT, which comprises a first electrode 11 prepared on an insulating substrate 10, a photoelectric conversion region 14 and a second electrode 12, and a third electrode 13 disposed above the photoelectric conversion region 14. An impurity layer positioned closer to an intrinsic layer (density of active impurities is 1017 cm?3 or lower) is provided on the regions 15 and 16 on both sides under the third electrode 13 or on one of the regions 15 or 16 on one side.
    Type: Grant
    Filed: September 19, 2011
    Date of Patent: December 25, 2012
    Assignees: Hitachi Displays, Ltd., Panasonic Liquid Crystal Display Co., Ltd.
    Inventors: Mitsuharu Tai, Hideo Sato, Mutsuko Hatano, Masayoshi Kinoshita
  • Publication number: 20120074368
    Abstract: A semiconductor memory device having a diode and a transistor connected in series, which prevents carriers from going from the diode into the transistor, thereby reducing the possibility of transistor deterioration. A structure to annihilate carriers from the diode is provided between a channel layer of the transistor and a diode semiconductor layer of the diode where the carriers are generated.
    Type: Application
    Filed: July 13, 2011
    Publication date: March 29, 2012
    Inventors: Yoshitaka SASAGO, Masaharu KINOSHITA, Mitsuharu TAI, Akio SHIMA, Takashi KOBAYASHI
  • Publication number: 20120068287
    Abstract: According to the present invention, a highly sensitive photo-sensing element and a sensor driver circuit are prepared by planer process on an insulating substrate by using only polycrystalline material. Both the photo-sensing element and the sensor driver circuit are made of polycrystalline silicon film. As the photo-sensing element, a photo transistor is formed by using TFT, which comprises a first electrode 11 prepared on an insulating substrate 10, a photoelectric conversion region 14 and a second electrode 12, and a third electrode 13 disposed above the photoelectric conversion region 14. An impurity layer positioned closer to an intrinsic layer (density of active impurities is 1017 cm?3 or lower) is provided on the regions 15 and 16 on both sides under the third electrode 13 or on one of the regions 15 or 16 on one side.
    Type: Application
    Filed: September 19, 2011
    Publication date: March 22, 2012
    Inventors: Mitsuharu Tai, Hideo Sato, Mutsuko Hatano, Masayoshi Kinoshita
  • Patent number: 8097927
    Abstract: The present invention provides an image display unit integrated with a photo-sensor, comprising a photo-sensing element with high sensitivity and low noise and a polycrystalline silicon TFT prepared at the same time on an insulating substrate using planer process. After a first electrode 11 and a second electrode 12 of the photo-sensing element are made of polycrystalline silicon film, a light receiving layer (photoelectric conversion layer) 13 of the photo-sensing element is prepared by amorphous silicon film on upper layer. In this case, a polycrystalline silicon TFT is prepared at the same time.
    Type: Grant
    Filed: December 12, 2007
    Date of Patent: January 17, 2012
    Assignee: Hitachi Displays, Ltd.
    Inventors: Mitsuharu Tai, Toshio Miyazawa
  • Publication number: 20110284817
    Abstract: In a nonvolatile semiconductor memory device, there is provided a technique which promotes microfabrication by reducing a thickness of the device as suppressing an OFF current of a polysilicon diode which is a selective element. A polysilicon layer to which an impurity is doped at low concentration and which becomes an electric-field relaxation layer of the polysilicon diode which is a selective element of a resistance variable memory is formed so as to be divided into two or more layers such as polysilicon layers. In this manner, it is suppressed to form the crystal grain boundaries thoroughly penetrating between an n-type polysilicon layer and a p-type polysilicon layer in the electric-field relaxation layer, and therefore, it is prevented to generate a leakage current flowing through the crystal grain boundaries in application of a reverse-bias voltage without increasing a height of the polysilicon diode.
    Type: Application
    Filed: May 17, 2011
    Publication date: November 24, 2011
    Inventors: Yoshitaka SASAGO, Masaharu Kinoshita, Mitsuharu Tai, Takashi Kobayashi
  • Patent number: 7939826
    Abstract: A thin film semiconductor device is provided which includes an insulating substrate, a Si thin film formed over the insulating substrate, and a transistor with the Si thin film as a channel thereof. The Si thin film includes a polycrystal where a plurality of narrow, rectangular crystal grains are arranged. A surface of the polycrystal is flat at grain boundaries thereof. Also, an average film thickness of the boundaries of crystals of the Si thin film ranges from 90 to 110% of an intra-grain average film thickness.
    Type: Grant
    Filed: October 27, 2008
    Date of Patent: May 10, 2011
    Assignee: Hitachi Displays, Ltd.
    Inventors: Shinya Yamaguchi, Mutsuko Hatano, Mitsuharu Tai, Sedng-Kee Park, Takeo Shiba