Abstract: A plant state displaying apparatus displaying information representing a state of a plant includes a generator that: acquires plant information from at least one of devices, apparatuses, and facilities installed in the plant; calculates a state value representing the state of the plant using the plant information; and generates a plant state diagram in which at least one of a color and a density of at least one of devices, apparatuses, and facilities from which the plant information is acquired is changed according to magnitude of the state value; and a display that displays the plant state diagram generated by the generator as the information representing the state of the plant.

Abstract: A plant performance evaluation apparatus includes a first storage storing a first static model indicating a model of a first steady state in a plant, a second storage storing a first dynamic model indicating a model of a dynamic state of the plant, a model converter configured to convert the first dynamic model to a second static model indicating a model of a second steady state of the plant, and to store the second static model into the first storage, the first steady state indicating a steady state of the plant temporally before the second steady state, a comparator configured to compare parameters included in the first static model with parameters included in the second static model and to output a comparison result, and a display configured to display the comparison result output from the comparator.

Abstract: A plant simulation device includes a first storage that stores a model that models a state of a facility in a plant, a first parameter that is fixed at a start operation of the plant, and a second parameter that is varied during an operation of the plant, the first parameter and the second parameter being set in the model, and a simulator that compares a process value of the facility with a simulated value calculated using the model and that adjusts the first parameter and the second parameter.

Abstract: A plant simulation device includes a first storage that stores a model that models a state of a facility in a plant, a first parameter that is fixed at a start operation of the plant, and a second parameter that is varied during an operation of the plant, the first parameter and the second parameter being set in the model, and a simulator that compares a process value of the facility with a simulated value calculated using the model and that adjusts the first parameter and the second parameter.

Abstract: A plant state displaying apparatus displaying information representing a state of a plant includes a generator that: acquires plant information from at least one of devices, apparatuses, and facilities installed in the plant; calculates a state value representing the state of the plant using the plant information; and generates a plant state diagram in which at least one of a color and a density of at least one of devices, apparatuses, and facilities from which the plant information is acquired is changed according to magnitude of the state value; and a display that displays the plant state diagram generated by the generator as the information representing the state of the plant.

Abstract: A process control device according to one aspect of the present invention is configured to control an industrial process implemented in a plant. The process control device includes: a virtualizer configured to run over a hardware in lieu of the hardware; and first and second controllers configured to run over the virtualizer and control operations of a plurality of field apparatuses configured to perform at least one of measurement and operation which are required to control the industrial process; an input distributor included in the virtualizer, the input distributor being configured to distribute a signal output from the field apparatus to the first and second controllers; and an output acquirer included in the virtualizer, and the output acquirer being configured to acquire outputs of the first and second controllers, and output any one of the outputs to at least one of the field apparatuses.

Abstract: A maintenance support system include includes: a first storage unit which stores first specification information indicating a specification of a process control system which performs control of an industrial process implemented in a plant; an actual condition information extraction unit configured to extract actual condition information indicating an actual condition for the process control system; and a first comparison unit configured to output first information indicating a result of comparing the first specification information stored in the first storage unit with the actual condition information extracted by the extraction unit.

Abstract: A plant performance evaluation apparatus includes a first storage storing a first static model indicating a model of a first steady state in a plant, a second storage storing a first dynamic model indicating a model of a dynamic state of the plant, a model converter configured to convert the first dynamic model to a second static model indicating a model of a second steady state of the plant, and to store the second static model into the first storage, the first steady state indicating a steady state of the plant temporally before the second steady state, a comparator configured to compare parameters included in the first static model with parameters included in the second static model and to output a comparison result, and a display configured to display the comparison result output from the comparator.

Abstract: A process control system for controlling an industrial process implemented at a plant, may include: a network provided in the plant; a network device comprising at least one of a first detector, which is configured to detect a connection state of the network device with the network, and a second detector, which is configured to detect a state of the network device, the network device being configured to output at least one of connection information, which indicates a first detection result detected by the first detector, and device state information, which indicates a second detection result detected by the second detector, to the network.

Abstract: A process control system that controls an industrial process implemented in a plant, may include: a network provided in the plant; a first field device that is connected to the network, the first field device being configured to output one of measurement data, which is obtained by measuring a state quantity in the industrial process, and first simulation data, which simulates the state quantity; a controller that is connected to the network, the controller being configured to perform control in response to one of the measurement data and the first simulation data output from the first field device; and a simulator configured to generate the first simulation data to be output from the first field device.

Abstract: A process control system for controlling an industrial process implemented at a plant, may include: a network provided in the plant; a network device comprising at least one of a first detector, which is configured to detect a connection state of the network device with the network, and a second detector, which is configured to detect a state of the network device, the network device being configured to output at least one of connection information, which indicates a first detection result detected by the first detector, and device state information, which indicates a second detection result detected by the second detector, to the network.

Abstract: A maintenance support system include includes: a first storage unit which stores first specification information indicating a specification of a process control system which performs control of an industrial process implemented in a plant; an actual condition information extraction unit configured to extract actual condition information indicating an actual condition for the process control system; and a first comparison unit configured to output first information indicating a result of comparing the first specification information stored in the first storage unit with the actual condition information extracted by the extraction unit.

Abstract: A process control device according to one aspect of the present invention is configured to control an industrial process implemented in a plant. The process control device includes: a virtualizer configured to run over a hardware in lieu of the hardware; and first and second controllers configured to run over the virtualizer and control operations of a plurality of field apparatuses configured to perform at least one of measurement and operation which are required to control the industrial process; an input distributor included in the virtualizer, the input distributor being configured to distribute a signal output from the filed apparatus to the first and second controllers; and an output acquirer included in the virtualizer, and the output acquirer being configured to acquire outputs of the first and second controllers, and output any one of the outputs to at least one of the field apparatuses.

Abstract: A process control system that controls an industrial process implemented in a plant, may include: a network provided in the plant; a first field device that is connected to the network, the first field device being configured to output one of measurement data, which is obtained by measuring a state quantity in the industrial process, and first simulation data, which simulates the state quantity; a controller that is connected to the network, the controller being configured to perform control in response to one of the measurement data and the first simulation data output from the first field device; and a simulator configured to generate the first simulation data to be output from the first field device.

Abstract: A method and apparatus for displaying batch execution data of an industrial plant configured for performing a plurality of batch executions. The method comprises selecting a first level element in a first level window; and displaying in a second level window all second level elements comprised by the selected first level element, the second level window being displayed within the first level window directly beneath the selected first level element without obscuring any other first level element in the first level window.

Abstract: In this grease composition, a grease produced by mixing at least one base oil selected from a mineral oil-type lubricant base oil, a synthetic lubricant base oil, and a biodegradable lubricant base oil with a thickener is compounded with a wax and water, and an additive such as a surfactant and a defoamer is optionally compounded therewith. A soap containing a calcium sulfonate complex is used as the thickener. A carnauba wax is preferably used as the wax. Since this grease composition is mainly composed of a grease and a wax, the grease composition extremely facilities its removal operation after application, is environmentally friendly, and has extremely excellent anti-corrosion performance. When the grease composition is used by being applied to a base material of an object to be welded, an effect of preventing the adhesion of welding spatters can be obtained.

Abstract: An exemplary aspect of the invention is to conduct delay tests under actual operating conditions for a semiconductor integrated circuit including multiple logic circuits operating based on clocks of different frequencies, without causing any inconveniences when a test clock is set to a high-frequency side or a low-frequency side. The semiconductor integrated circuit includes: a first logic block that operates based on a first clock; a second logic block that operates based on a second clock having a frequency different from that of the first clock; and a test circuit connected between the first logic block and the second logic block. The test circuit outputs an output of the first logic block set as a test target, without passing through the second logic block, and transmits an input value received without being passed through the first logic circuit, to the second logic circuit set as a test target.

Abstract: An exemplary aspect of the invention is to conduct delay tests under actual operating conditions for a semiconductor integrated circuit including multiple logic circuits operating based on clocks of different frequencies, without causing any inconveniences when a test clock is set to a high-frequency side or a low-frequency side. The semiconductor integrated circuit includes: a first logic block that operates based on a first clock; a second logic block that operates based on a second clock having a frequency different from that of the first clock; and a test circuit connected between the first logic block and the second logic block. The test circuit outputs an output of the first logic block set as a test target, without passing through the second logic block, and transmits an input value received without being passed through the first logic circuit, to the second logic circuit set as a test target.

Abstract: The invention provides a system that associates data files with one another effectively to visually represent a relation among the data files and allows a user to easily understand relationship of contents of the data files. The system determines whether there is a parent data file for a selected retrieval object data file with reference to a contract association table and, if the parent data file is present, changes the retrieval object to the parent data file and repeats the processing. If the parent data file is not present, the system stores a present retrieval object data file as display data, that is, store a top data file as display data. Then, the system retrieves all data files associated with the top data file, stores the data files as display data, generates a relation diagram of the data files, and transmits the relation diagram to a user terminal.

Abstract: An object of this array substrate for a flat display device is to eliminate display unevenness caused by the inequality of parasitic capacitances of switches of signal line switch circuits. Electrode patterns (P) which connects the gate electrodes of the switches (ASW) to any one of a plurality of switch control signal lines (ASWL1 and ASWL2) are formed so as to each two-dimensionally overlap all of the switch control signal lines ASWL and to have substantially identical shapes, thus equalizing the areas of the electrode patterns (P).