Patents by Inventor Mitsuru Onodera

Mitsuru Onodera has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220051981
    Abstract: A power supply conductive trace structure of a semiconductor device includes a first power supply conductive trace in a mesh form provided in a first power supply conductive trace layer, and a second power supply conductive trace provided in a redistribution layer located on or above the first power supply conductive trace to correspond in position to a conductive trace area that is a portion of the first power supply conductive trace and to be connected to the first power supply conductive trace.
    Type: Application
    Filed: August 11, 2021
    Publication date: February 17, 2022
    Inventor: Mitsuru ONODERA
  • Patent number: 9436795
    Abstract: A method of verifying a layout of a semiconductor integrated circuit is disclosed. The method includes executing a timing analysis of the semiconductor integrated circuit based on first layout information acquired after execution of a layout process of the semiconductor integrated circuit, executing layout correction with respect to the first layout information, comparing the first layout information acquired before the execution of the layout correction and second layout information acquired after the execution of the layout correction to acquire information indicating an RC difference in wires of the semiconductor integrated circuit before and after the execution of the layout correction, and adding, by a computer, an effect due to an increase in delay in the wires resulting from the RC difference to timing information obtained by the timing analysis.
    Type: Grant
    Filed: February 11, 2015
    Date of Patent: September 6, 2016
    Assignee: SOCIONEXT INC.
    Inventor: Mitsuru Onodera
  • Patent number: 9255966
    Abstract: A receiver circuit includes a CDR circuit, a jitter generator unit, a test pattern generator unit, and a comparator unit. The jitter generator unit generates jitter having first characteristics (frequency and amplitude). The test pattern generator unit generates a test pattern to which the jitter is added, and supplies the test pattern to the CDR circuit. The comparator unit compares a value outputted from the CDR circuit with an expected value and outputs a comparison result.
    Type: Grant
    Filed: February 10, 2014
    Date of Patent: February 9, 2016
    Assignee: SOCIONEXT INC.
    Inventor: Mitsuru Onodera
  • Publication number: 20150254392
    Abstract: A method of verifying a layout of a semiconductor integrated circuit is disclosed. The method includes executing a timing analysis of the semiconductor integrated circuit based on first layout information acquired after execution of a layout process, executing layout correction with respect to the first layout information, comparing the first layout information acquired before the execution of the layout correction and second layout information acquired after the execution of the layout correction to acquire information indicating an RC difference in wires, and adding, by a computer, an effect due to an increase in delay in the wires resulting from the RC difference to timing information obtained by the timing analysis.
    Type: Application
    Filed: February 11, 2015
    Publication date: September 10, 2015
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Mitsuru ONODERA
  • Patent number: 9020421
    Abstract: According to an embodiment, a wireless communication device includes a first wireless communication section, a wireless power receiving section and a wireless control section. The first wireless communication section is configured to transmit and receive a first wireless signal. The wireless power receiving section is configured to receive power by a second wireless signal. The wireless control section is configured to control the first wireless communication section according to a wireless power reception state of the wireless power receiving section. The wireless control section activates the first wireless communication section after wireless power reception by the wireless power receiving section is started.
    Type: Grant
    Filed: February 28, 2013
    Date of Patent: April 28, 2015
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Kiyoshi Toshimitsu, Akira Irube, Mitsuru Onodera, Toshiki Miyasaka, Yoshinari Kumaki, Tomoya Horiguchi, Hirotsugu Kajihara, Ichiro Seto
  • Publication number: 20140269872
    Abstract: A receiver circuit includes a CDR circuit, a jitter generator unit, a test pattern generator unit, and a comparator unit. The jitter generator unit generates jitter having first characteristics (frequency and amplitude). The test pattern generator unit generates a test pattern to which the jitter is added, and supplies the test pattern to the CDR circuit. The comparator unit compares a value outputted from the CDR circuit with an expected value and outputs a comparison result.
    Type: Application
    Filed: February 10, 2014
    Publication date: September 18, 2014
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Mitsuru ONODERA
  • Patent number: 8713500
    Abstract: A computer executes a signal delay evaluation program to determine whether reference levels used to define slew rates of a first circuit block are different from those used for a second circuit block that receives an output signal from the first circuit block. The computer corrects an output slew rate of the output signal supplied from the first circuit block to the second circuit block, based on a difference in the reference levels that is found between the first and second circuit blocks.
    Type: Grant
    Filed: September 1, 2009
    Date of Patent: April 29, 2014
    Assignee: Fujitsu Semiconductor Limited
    Inventor: Mitsuru Onodera
  • Patent number: 8683401
    Abstract: An information processing device comprises, a physical property value generation unit to generate a plurality of physical property values for changing signal propagation time of a target path including a plurality of circuit elements within a predetermined fluctuation range, an element delay calculation unit to calculate delay time of each of signals passing through the circuit element in accordance with each of the generated physical property values and a propagation time calculation unit to calculate the signal propagation time of the target path on the basis of the delay time of the signals.
    Type: Grant
    Filed: July 6, 2011
    Date of Patent: March 25, 2014
    Assignee: Fujitsu Semiconductor Limited
    Inventor: Mitsuru Onodera
  • Publication number: 20130324052
    Abstract: According to an embodiment, a wireless communication device includes a first wireless communication section, a wireless power receiving section and a wireless control section. The first wireless communication section is configured to transmit and receive a first wireless signal. The wireless power receiving section is configured to receive power by a second wireless signal. The wireless control section is configured to control the first wireless communication section according to a wireless power reception state of the wireless power receiving section. The wireless control section activates the first wireless communication section after wireless power reception by the wireless power receiving section is started.
    Type: Application
    Filed: February 28, 2013
    Publication date: December 5, 2013
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Kiyoshi TOSHIMITSU, Akira IRUBE, Mitsuru ONODERA, Toshiki MIYASAKA, Yoshinari KUMAKI, Tomoya HORIGUCHI, Hirotsugu KAJIHARA, Ichiro SETO
  • Patent number: 8504332
    Abstract: A non-transitory computer-readable recording medium stores therein a program that causes a processor to execute inputting a driving capability value, a lumped-constant capacitance value, and an input capacitance value included in the lumped-constant capacitance value, respectively defined in a circuit model, and further inputting a first delay time of the circuit model, based on the driving capability value and the lumped-constant capacitance value; setting in the circuit model, the driving capability value, the lumped-constant capacitance value, and the input capacitance value; acquiring a second delay time of the circuit model, by providing to a simulator, the circuit model having values set therein; calculating a relative evaluation value for the first delay time and the second delay time; and storing to a storage apparatus and as a delay time correcting coefficient, the relative evaluation value correlated with the driving capability value, the lumped-constant capacitance value, and the input capacitance
    Type: Grant
    Filed: June 3, 2010
    Date of Patent: August 6, 2013
    Assignee: Fujitsu Semiconductor Limited
    Inventor: Mitsuru Onodera
  • Patent number: 8433022
    Abstract: A clock data recovery circuit includes a receiving circuit that takes in input data based on a sampling clock, a demultiplexer that converts serial data output from the receiving circuit into parallel data, a clock/data recovery part that detects phase information from the parallel data output from the demultiplexer and generates the sampling clock by adjusting the phase of a reference clock based on the phase information, a data pattern analyzer that carries out frequency analysis of the parallel data output from the demultiplexer, and an aliasing detector that detects a clock recovery state based on the analysis result of the frequency of the parallel data.
    Type: Grant
    Filed: May 23, 2011
    Date of Patent: April 30, 2013
    Assignee: Fujitsu Semiconductor Limited
    Inventor: Mitsuru Onodera
  • Patent number: 8423944
    Abstract: A design supporting method includes partitioning a partition path of circuit information into partitioned paths based on a given condition, calculating a variation value of each of the partitioned paths based on variation values on a delay of a cell included in the corresponding partitioned path, calculating a partition propagation delay time of each of the partitioned paths based on the variation value of the corresponding partitioned path, and calculating a source propagation delay time of the source path by merging the propagation delay time of each of the partitioned paths.
    Type: Grant
    Filed: December 17, 2009
    Date of Patent: April 16, 2013
    Assignee: Fujitsu Semiconductor Limited
    Inventor: Mitsuru Onodera
  • Patent number: 8381146
    Abstract: A computer-readable, non-transitory medium stores therein a design support program that causes a computer capable of accessing a storage device storing therein for each cell, an output voltage value of the cell, for each elapsed time period from a start of variation of an input voltage applied to the cell, to execute a process. The process includes extracting from the storage device, the output voltage value for each elapsed time period related to an cell under design selected from circuit information of a circuit under design; determining based on a specific voltage value, an extracted elapsed time period to be corrected; adding a time constant of an output from the cell under design to the elapsed time period determined to correction; and outputting the output voltage value for each corrected elapsed time period and the output voltage value for each elapsed time period that is not determined for correction.
    Type: Grant
    Filed: March 16, 2011
    Date of Patent: February 19, 2013
    Assignee: Fujitsu Semiconductor Limited
    Inventor: Mitsuru Onodera
  • Publication number: 20120039426
    Abstract: A clock data recovery circuit includes a receiving circuit that takes in input data based on a sampling clock, a demultiplexer that converts serial data output from the receiving circuit into parallel data, a clock/data recovery part that detects phase information from the parallel data output from the demultiplexer and generates the sampling clock by adjusting the phase of a reference clock based on the phase information, a data pattern analyzer that carries out frequency analysis of the parallel data output from the demultiplexer, and an aliasing detector that detects a clock recovery state based on the analysis result of the frequency of the parallel data.
    Type: Application
    Filed: May 23, 2011
    Publication date: February 16, 2012
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Mitsuru ONODERA
  • Publication number: 20120036490
    Abstract: An information processing device comprises, a physical property value generation unit to generate a plurality of physical property values for changing signal propagation time of a target path including a plurality of circuit elements within a predetermined fluctuation range, an element delay calculation unit to calculate delay time of each of signals passing through the circuit element in accordance with each of the generated physical property values and a propagation time calculation unit to calculate the signal propagation time of the target path on the basis of the delay time of the signals.
    Type: Application
    Filed: July 6, 2011
    Publication date: February 9, 2012
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Mitsuru ONODERA
  • Publication number: 20110314433
    Abstract: A computer-readable, non-transitory medium stores therein a design support program that causes a computer capable of accessing a storage device storing therein for each cell, an output voltage value of the cell, for each elapsed time period from a start of variation of an input voltage applied to the cell, to execute a process. The process includes extracting from the storage device, the output voltage value for each elapsed time period related to an cell under design selected from circuit information of a circuit under design; determining based on a specific voltage value, an extracted elapsed time period to be corrected; adding a time constant of an output from the cell under design to the elapsed time period determined to correction; and outputting the output voltage value for each corrected elapsed time period and the output voltage value for each elapsed time period that is not determined for correction.
    Type: Application
    Filed: March 16, 2011
    Publication date: December 22, 2011
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Mitsuru ONODERA
  • Publication number: 20110314434
    Abstract: A computer-readable, non-transitory medium stores therein a design support program that causes a computer capable of accessing a storage device storing therein for each cell, an output voltage value of the cell, for each elapsed time period from a start of variation of an input voltage applied to the cell, to execute a process. The process includes extracting from the storage device, the output voltage value for each elapsed time period related to an cell under design selected from circuit information of a circuit under design; determining based on a specific voltage value, an extracted elapsed time period to be corrected; adding a time constant of an output from the cell under design to the elapsed time period determined to correction; and outputting the output voltage value for each corrected elapsed time period and the output voltage value for each elapsed time period that is not determined for correction.
    Type: Application
    Filed: March 16, 2011
    Publication date: December 22, 2011
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Mitsuru ONODERA
  • Publication number: 20100318341
    Abstract: A non-transitory computer-readable recording medium stores therein a program that causes a processor to execute inputting a driving capability value, a lumped-constant capacitance value, and an input capacitance value included in the lumped-constant capacitance value, respectively defined in a circuit model, and further inputting a first delay time of the circuit model, based on the driving capability value and the lumped-constant capacitance value; setting in the circuit model, the driving capability value, the lumped-constant capacitance value, and the input capacitance value; acquiring a second delay time of the circuit model, by providing to a simulator, the circuit model having values set therein; calculating a relative evaluation value for the first delay time and the second delay time; and storing to a storage apparatus and as a delay time correcting coefficient, the relative evaluation value correlated with the driving capability value, the lumped-constant capacitance value, and the input capacitance
    Type: Application
    Filed: June 3, 2010
    Publication date: December 16, 2010
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventor: Mitsuru ONODERA
  • Publication number: 20100218153
    Abstract: A design supporting method includes partitioning a partition path of circuit information into partitioned paths based on a given condition, calculating a variation value of each of the partitioned paths based on variation values on a delay of a cell included in the corresponding partitioned path, calculating a partition propagation delay time of each of the partitioned paths based on the variation value of the corresponding partitioned path, and calculating a source propagation delay time of the source path by merging the propagation delay time of each of the partitioned paths.
    Type: Application
    Filed: December 17, 2009
    Publication date: August 26, 2010
    Applicant: FUJITSU MICROELECTRONIC LIMITED
    Inventor: Mitsuru ONODERA
  • Publication number: 20090319972
    Abstract: A computer executes a signal delay evaluation program to determine whether reference levels used to define slew rates of a first circuit block are different from those used for a second circuit block that receives an output signal from the first circuit block. The computer corrects an output slew rate of the output signal supplied from the first circuit block to the second circuit block, based on a difference in the reference levels that is found between the first and second circuit blocks.
    Type: Application
    Filed: September 1, 2009
    Publication date: December 24, 2009
    Applicant: FUJITSU MICROELECTRONICS LIMITED
    Inventor: Mitsuru ONODERA