Patents by Inventor Nancy H. Pratt

Nancy H. Pratt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070294519
    Abstract: An integrated circuit (IC) including a decoder decoding instructions, shadow latches storing instructions as a localized loop, and a state machine controlling the decoder and the plurality of shadow latches. When the state machine identifies instructions that are the same as those stored in the localized loop, it deactivates the decoder and activates the plurality of shadow latches to retrieve and execute the localized loop in place of the instructions provided by the decoder. Additionally, a method of providing localized control caching operations in an IC to reduce power dissipation is provided. The method includes initializing a state machine to control the IC, providing a plurality of shadow latches, decoding a set of instructions, detecting a loop of decoded instructions, caching the loop of decoded instructions in the shadow latches as a localized loop, detecting a loop end signal for the loop and stopping the caching of the localized loop.
    Type: Application
    Filed: June 19, 2006
    Publication date: December 20, 2007
    Inventors: Laura F. Miller, Pascal A. Nsame, Nancy H. Pratt, Sebastian T. Ventrone
  • Patent number: 6934656
    Abstract: A method and system for identifying logic function areas, which make up a virtual machine, that are affected by specific testcases. A Hardware Descriptor Language (HDL) is used to create a software model of the virtual machine. A simulator compiles and analyzes the HDL model, and creates a matrix scoreboard identifying logic function areas in the virtual machine. A complete list of testcases is run on the virtual machine while a monitor correlates each testcase with affected logic function areas to fill in the matrix scoreboard. When a subsequent test failure occurs, either because of a modification to a logic function area, or the execution of a new test, all logic function areas that are affected, either directly or indirectly, are identified.
    Type: Grant
    Filed: November 4, 2003
    Date of Patent: August 23, 2005
    Assignee: International Business Machines Corporation
    Inventors: Jason Michael Norman, Nancy H. Pratt, Sebastian Theodore Ventrone