Patents by Inventor Naoki Kawahara
Naoki Kawahara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11807324Abstract: There is provided a target installation apparatus. A rod-shaped member is capable of being arranged to extend in a vehicle width direction of the vehicle ahead of or behind the vehicle, and is provided with a target point indicating an installation position of the target. A reference member is formed such that reference points are positioned on left and right outer sides in the vehicle width direction of the vehicle when the reference member is arranged with respect to the vehicle. A connection unit connects the rod-shaped member and the reference member such that a distance from the reference point to the target point in the front-and-rear direction satisfies a predetermined condition.Type: GrantFiled: September 7, 2022Date of Patent: November 7, 2023Assignee: HONDA MOTOR CO., LTD.Inventors: Kazuki Matsumoto, Kenta Miyazawa, Akiko Tsuruya, Mako Seki, Naoki Kawahara, Masaharu Miyoshi, Eiji Omori
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Publication number: 20230230428Abstract: An inspection apparatus, which inspects a CAN communication function of an ECU to be inspected, comprises: a connection unit configured to connect a communication circuit of the ECU and the inspection apparatus on a one-to-one basis; an inspection message creation unit configured to create an inspection message in which a predetermined signal level indicating a higher priority of communication arbitration than the message received from the ECU to be inspected is set in an identifier field of a data format corresponding to the message; a transmission unit configured to transmit the inspection message to the ECU; a reception unit configured to receive a message transmitted from the ECU; and a reception function determination unit configured to determine whether a reception function of the ECU is normal based on whether the reception unit has received the message from the ECU after transmission of the inspection message.Type: ApplicationFiled: January 9, 2023Publication date: July 20, 2023Applicant: HONDA MOTOR CO., LTD.Inventors: Tsuyoshi Imoto, Naoki Kawahara, Daiki Yagihara, Taketoshi Uno
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Publication number: 20230231739Abstract: An inspection apparatus, which inspects a CAN communication function of an ECU, comprises: a connection unit which connects a communication circuit of the ECU and the inspection apparatus on a one-to-one basis; a creation unit which creates an inspection message in which a predetermined signal level is set in a confirmation field of a data format corresponding to a message received from the ECU; a transmission unit which transmits the inspection message to the ECU; a reception unit which receives a response message to the inspection message from the ECU; a confirmation unit which confirms whether a signal level of the confirmation field in the response message is changed with respect to setting of the inspection message; and a determination unit which determines whether a reception function of the ECU is normal based on the confirmation.Type: ApplicationFiled: December 28, 2022Publication date: July 20, 2023Applicant: HONDA MOTOR CO., LTD.Inventors: Tsuyoshi IMOTO, Naoki KAWAHARA, Daiki YAGIHARA, Taketoshi UNO
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Publication number: 20230001996Abstract: There is provided a target installation apparatus. A rod-shaped member is capable of being arranged to extend in a vehicle width direction of the vehicle ahead of or behind the vehicle, and is provided with a target point indicating an installation position of the target. A reference member is formed such that reference points are positioned on left and right outer sides in the vehicle width direction of the vehicle when the reference member is arranged with respect to the vehicle. A connection unit connects the rod-shaped member and the reference member such that a distance from the reference point to the target point in the front-and-rear direction satisfies a predetermined condition.Type: ApplicationFiled: September 7, 2022Publication date: January 5, 2023Applicant: HONDA MOTOR CO., LTD.Inventors: Kazuki Matsumoto, Kenta Miyazawa, Akiko Tsuruya, Mako Seki, Naoki Kawahara, Masaharu Miyoshi, Eiji Omori
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Publication number: 20210375077Abstract: Provided is a fault diagnosis device capable of identifying the true location of a fault in a short length of time, regardless of mechanic experience. The present invention is a fault diagnosis device that diagnoses faults on the basis of fault codes recorded in an electronic controller of a vehicle, the device comprising: a storage unit for storing system information representing a system of a plurality of fault codes that are related to each other; an identifying unit for identifying a true fault code on the basis of the system information when a plurality of fault codes are recorded; and an output unit for outputting the identification results of the identification unit.Type: ApplicationFiled: July 3, 2019Publication date: December 2, 2021Inventors: Naoki Kawahara, Koji Watanabe
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Patent number: 10473598Abstract: An X-ray thin film inspection device of the present invention includes an X-ray irradiation unit 40 installed on a first rotation arm 32, an X-ray detector 50 installed on a second rotation arm 33, and a fluorescence X-ray detector 60 for detecting fluorescence X-rays generated from an inspection target upon irradiation of X-rays. The X-ray irradiation unit 40 includes an X-ray optical element 43 comprising a confocal mirror for receiving X-rays radiated from an X-ray tube 42, reflects plural focused X-ray beams monochromatized at a specific wavelength and focuses the plural focused X-ray beams to a preset focal point, and a slit mechanism 46 for passing therethrough any number of focused X-ray beams out of the plural focused X-ray beams reflected from the X-ray optical element 43.Type: GrantFiled: October 14, 2014Date of Patent: November 12, 2019Assignee: RIGAKU CORPORATIONInventors: Kiyoshi Ogata, Sei Yoshihara, Takao Kinefuchi, Shiro Umegaki, Shigematsu Asano, Katsutaka Horada, Muneo Yoshida, Hiroshi Motono, Hideaki Takahashi, Akifusa Higuchi, Kazuhiko Omote, Yoshiyasu Ito, Naoki Kawahara, Asao Nakano
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Publication number: 20190130670Abstract: The objective of the present invention is to provide an electronic manual display method and an electronic manual control device with which it is possible, for example, to improve the work efficiency of failure diagnosis. An electronic manual control device displays an inspection work selecting screen which displays collectively, for each diagnostic trouble code (DTC): a failure summary display region displaying a summary of a failure corresponding to the DTC; a detection range display region displaying graphically the detection range of the DTC; and an inspection location display region which selectably displays, as options, inspection work items within the detection range associated with the DTC, categorized into minimum work items. When one option is selected, an inspection work explanation screen corresponding to said option is displayed by a display device.Type: ApplicationFiled: April 7, 2017Publication date: May 2, 2019Inventors: Masataka Takao, Ouki Itou, Naoki Kawahara
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Patent number: 10175185Abstract: A doubly bent X-ray spectroscopic device (1) according to the present invention includes: a glass plate (3) which is deformed into a shape having a doubly bent surface by being sandwiched between a doubly curved convex surface (21a) of a convex forming die (21) and a doubly curved concave surface (22a), of a concave forming die (22), that matches the doubly curved convex surface (21a), and being heated to a temperature of 400° C. to 600° C.; and a reflection coating (5) configured to reflect X-rays, which is formed on a concave surface (3a) of the deformed glass plate (3).Type: GrantFiled: September 22, 2017Date of Patent: January 8, 2019Assignee: Rigaku CorporationInventor: Naoki Kawahara
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Publication number: 20180011035Abstract: A doubly bent X-ray spectroscopic device (1) according to the present invention includes: a glass plate (3) which is deformed into a shape having a doubly bent surface by being sandwiched between a doubly curved convex surface (21a) of a convex forming die (21) and a doubly curved concave surface (22a), of a concave forming die (22), that matches the doubly curved convex surface (21a), and being heated to a temperature of 400° C. to 600° C.; and a reflection coating (5) configured to reflect X-rays, which is formed on a concave surface (3a) of the deformed glass plate (3 ).Type: ApplicationFiled: September 22, 2017Publication date: January 11, 2018Applicant: RIGAKU CORPORATIONInventor: Naoki KAWAHARA
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Publication number: 20170234814Abstract: An X-ray thin film inspection device of the present invention includes an X-ray irradiation unit 40 installed on a first rotation arm 32, an X-ray detector 50 installed on a second rotation arm 33, and a fluorescence X-ray detector 60 for detecting fluorescence X-rays generated from an inspection target upon irradiation of X-rays. The X-ray irradiation unit 40 includes an X-ray optical element 43 comprising a confocal mirror for receiving X-rays radiated from an X-ray tube 42, reflects plural focused X-ray beams monochromatized at a specific wavelength and focuses the plural focused X-ray beams to a preset focal point, and a slit mechanism 46 for passing therethrough any number of focused X-ray beams out of the plural focused X-ray beams reflected from the X-ray optical element 43.Type: ApplicationFiled: October 14, 2014Publication date: August 17, 2017Applicant: RIGAKU CORPORATIONInventors: Kiyoshi Ogata, Sei Yoshihara, Takao Kinefuchi, Shiro Umegaki, Shigematsu Asano, Katsutaka Horada, Muneo Yoshida, Hiroshi Motono, Hideaki Takahashi, Akifusa Higuchi, Kazuhiko Omote, Yoshiyasu Ito, Naoki Kawahara, Asao Nakano
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Patent number: 9245393Abstract: In a vehicle diagnostic system and a vehicle diagnostic method, malfunction codes recorded in each ECU in a vehicle include idle stop malfunction codes that disallow idle stop, and a non-idle stop malfunction code that does not disallow idle stop. The idle stop malfunction codes include: a first idle stop malfunction code that operates a warning light provided corresponding to a specific ECU; and a second idle stop malfunction code that does not operate the relevant warning light. An external diagnostic device extracts, from the plurality of ECUs, only the second idle stop malfunction codes, among the first idle stop malfunction codes and the second idle stop malfunction codes, when performing malfunction diagnosis for non-execution of idle stop.Type: GrantFiled: October 9, 2012Date of Patent: January 26, 2016Assignee: HONDA MOTOR CO., LTD.Inventors: Kensuke Yagi, Katsuhisa Doi, Naoki Kawahara, Wataru Endo
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Publication number: 20140350775Abstract: In a vehicle diagnostic system and a vehicle diagnostic method, malfunction codes recorded in each ECU in a vehicle include idle stop malfunction codes that disallow idle stop, and a non-idle stop malfunction code that does not disallow idle stop. The idle stop malfunction codes include: a first idle stop malfunction code that operates a warning light provided corresponding to a specific ECU; and a second idle stop malfunction code that does not operate the relevant warning light. An external diagnostic device extracts, from the plurality of ECUs, only the second idle stop malfunction codes, among the first idle stop malfunction codes and the second idle stop malfunction codes, when performing malfunction diagnosis for non-execution of idle stop.Type: ApplicationFiled: October 9, 2012Publication date: November 27, 2014Inventors: Kensuke Yagi, Katsuhisa Doi, Naoki Kawahara, Wataru Endo
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Patent number: 7961842Abstract: An X-ray fluorescence spectrometer which includes a calculating device (10) operable to calculate the theoretical intensity of secondary X-rays (6), emanated from each of elements contained in a sample (13), based on the assumed composition and then to successively approximately modify and calculate the assumed composition so that the theoretical intensity and the converted and measured intensity, which have been detected by a detecting device (9) and then converted in a theoretical intensity scale, can match with each other, to thereby calculate the composition of the sample (13). The calculating device (10), when calculating the theoretical intensity, performs a simulation to determine the theoretical intensity of the secondary X-rays (6) for each of optical paths, using the size of the sample (13), and the intensity and the incident angle (?) of primary X-rays (2) impinged upon various areas of the sample surface (13a) as parameters.Type: GrantFiled: December 8, 2005Date of Patent: June 14, 2011Assignee: Rigaku CorporationInventors: Naoki Kawahara, Shinya Hara
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Publication number: 20090041184Abstract: An X-ray fluorescence spectrometer which includes a calculating device (10) operable to calculate the theoretical intensity of secondary X-rays (6), emanated from each of elements contained in a sample (13), based on the assumed composition and then to successively approximately modify and calculate the assumed composition so that the theoretical intensity and the converted and measured intensity, which have been detected by a detecting device (9) and then converted in a theoretical intensity scale, can match with each other, to thereby calculate the composition of the sample (13). The calculating device (10), when calculating the theoretical intensity, performs a simulation to determine the theoretical intensity of the secondary X-rays (6) for each of optical paths, using the size of the sample (13), and the intensity and the incident angle (?) of primary X-rays (2) impinged upon various areas of the sample surface (13a) as parameters.Type: ApplicationFiled: December 8, 2005Publication date: February 12, 2009Applicant: RIGAKU INDUSTRIAL CORPORATIONInventors: Naoki Kawahara, Shinya Hara
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Patent number: 7187751Abstract: A calculating device 10 for calculating the concentration of elements contained in a sample 13 based on the FP method is provided. The calculating device 10 is operable to assume a concentration of unmeasured elements as far as unmeasured elements, of which fluorescent X-rays are not measured, are concerned, and, also, to utilize, in place of the secondary X-rays emanating from the unmeasured elements contained in the sample, scattered X-rays of the primary X-rays at least equal in number to the number of the unmeasured elements, of which concentrations are assumed, and including scattered X-rays of different wavelengths before they are scattered from the sample.Type: GrantFiled: May 11, 2006Date of Patent: March 6, 2007Assignee: Rigaku Industrial CorporationInventors: Naoki Kawahara, Shinya Hara, Makoto Doi
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Publication number: 20060274882Abstract: A calculating device 10 for calculating the concentration of elements contained in a sample 13 based on the FP method is provided. The calculating device 10 is operable to assume a concentration of unmeasured elements as far as unmeasured elements, of which fluorescent X-rays are not measured, are concerned, and, also, to utilize, in place of the secondary X-rays emanating from the unmeasured elements contained in the sample, scattered X-rays of the primary X-rays at least equal in number to the number of the unmeasured elements, of which concentrations are assumed, and including scattered X-rays of different wavelengths before they are scattered from the sample.Type: ApplicationFiled: May 11, 2006Publication date: December 7, 2006Inventors: Naoki Kawahara, Shinya Hara, Makoto Doi
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Patent number: 6647090Abstract: To provide an X-ray fluorescence spectrometer capable of providing a stable fluorescent X-ray intensity regardless of the presence of irregularities or the like on a surface of a sample to be analyzed, the X-ray fluorescence spectrometer includes an X-ray source 1 including a primary X-ray limiting diaphragm 3. An aperture 3a of the primary X-ray limiting diaphragm 3 is of a shape effective to allow change in intensity of fluorescent X-rays 7 measured by a detector 8 to be not higher than 1% in the event that a height of the sample surface 5a relative to the X-ray source 1 and the detector 8 changes 1 mm at maximum.Type: GrantFiled: April 22, 2002Date of Patent: November 11, 2003Assignee: Rigaku Industrial CorporationInventors: Naoki Kawahara, Kouichi Aoyagi, Yasujiro Yamada
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Publication number: 20030142781Abstract: To provide an X-ray fluorescence spectrometer capable of analyzing a semiconductor sample at inexpensive costs non-invasively without incurring damage to the patterned circuits on the semiconductor sample, the X-ray fluorescence spectrometer includes a point source of primary X-rays 3a for emitting primary X-rays B1 used to irradiate a semiconductor sample 1 having circuit patterned areas 1a and scribe line 1b so as to separate the neighboring circuit patterned areas 1a, and a detecting unit 5 for detecting fluorescent X-rays emitted from the semiconductor sample 1.Type: ApplicationFiled: January 30, 2003Publication date: July 31, 2003Inventors: Naoki Kawahara, Hisayuki Kohno, Takashi Yamada, Keisuke Ogura
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Publication number: 20020172322Abstract: To provide an X-ray fluorescence spectrometer capable of providing a stable fluorescent X-ray intensity regardless of the presence of irregularities or the like on a surface of a sample to be analyzed, the X-ray fluorescence spectrometer includes an X-ray source 1 including a primary X-ray limiting diaphragm 3. An aperture 3a of the primary X-ray limiting diaphragm 3 is of a shape effective to allow change in intensity of fluorescent X-rays 7 measured by a detector 8 to be not higher than 1% in the event that a height of the sample surface 5a relative to the X-ray source 1 and the detector 8 changes 1 mm at maximum.Type: ApplicationFiled: April 22, 2002Publication date: November 21, 2002Inventors: Naoki Kawahara, Kouichi Aoyagi, Yasujiro Yamada
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Patent number: 6337897Abstract: A fluorescent X-ray analyzer includes a detector (6) for detecting fluorescent X-rays (5) emitted from a sample piece (1) to be analyzed, and a first collimator (10) disposed between the sample piece (1) and the detector (6) supported for movement between inserted and retracted positions with respect to a path of travel of the fluorescent X-rays (5) towards the detector (6). The first collimator (10) comprises a wall (11) adjacent the sample piece (1) that is stepped to provide stepped wall segments (11a, 11b, 11c) having respective apertures (12a, 12b, 12c) of varying diameters defined therein. The smaller the aperture, the closer it is to the sample piece (1) when one of the apertures (12a, 12b, 12c) is selected according to a size of a target area of the sample piece (1) to be measured and is then brought in register with the path of travel of the fluorescent X-rays (5) towards the detector (6).Type: GrantFiled: October 20, 1999Date of Patent: January 8, 2002Assignee: Rigaku Industrial CorporationInventors: Naoki Kawahara, Kouichi Aoyagi