Patents by Inventor Naoto Kuratani

Naoto Kuratani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6383896
    Abstract: In a thin film forming method and an apparatus A for implementing the method, a deposition chamber 1 provided with a substrate holder 12 and a radical emitting device 2 continuing to the chamber 1 for emitting neutral radicals uniformly to a whole deposition target region of a deposition target substrate S held by the holder 12 are used. Deposition gas plasma PL1 is formed at the vicinity of the substrate S on the holder 12 by supplying a predetermined deposition gas into the chamber 1. Neutral radicals RA are produced by exciting and dissociating a predetermined radical material gas in the radical emitting device 2, and the radicals are uniformly emitted to the deposition target region of the substrate S for forming a predetermined thin film on the substrate S.
    Type: Grant
    Filed: September 14, 2000
    Date of Patent: May 7, 2002
    Assignee: Nissan Electric Co., Ltd.
    Inventors: Hiroya Kirimura, Naoto Kuratani, Kiyoshi Ogata
  • Patent number: 5501911
    Abstract: A copper film coated substrate includes a substrate and a copper film formed on a surface of the substrate. The copper film has an X-ray diffraction intensity of 2.0 cps/nm or more per unit film thickness at a crystal orientation (111) face of the copper film. A crystal orientation of a copper thin film is controlled by irradiating a surface of a substrate with inert gas ions before forming a copper thin film on the substrate by a physical vapor deposition process. A copper thin film is formed by irradiating a surface of a substrate with ions, and depositing a copper thin film on the irradiated substrate. In the ion irradiating step, an ion irradiation energy for a dosage of the irradiated ions is controlled, so that crystal is greatly grown to be orientated in a direction of copper (111) face with a less dosage of the irradiated ions.
    Type: Grant
    Filed: May 25, 1993
    Date of Patent: March 26, 1996
    Assignee: Nissin Electric Co., Ltd.
    Inventors: Akinori Ebe, Kiyoshi Ogata, Satoshi Nishiyama, Naoto Kuratani, Taizo Okazaki
  • Patent number: 5316802
    Abstract: A copper film coated substrate includes a substrate and a copper film formed on a surface of the substrate. The copper film has an X-ray diffraction intensity of 2.0 cps per unit film thickness at a crystal orientation (111) face of the copper film. A crystal orientation of a copper thin film is controlled by irradiating a surface of a substrate with inert gas ions before forming a copper thin film on the substrate by a physical vapor deposition process. A copper thin film is formed by irradiating a surface of a substrate with ions, and depositing a copper thin film on the irradiated substrate. In the ion irradiating step, an ion irradiation energy for a dosage of the irradiated ions is controlled, so that crystal is greatly grown to be orientated in a direction of copper (111) face with a less dosage of the irradiated ions.
    Type: Grant
    Filed: June 4, 1992
    Date of Patent: May 31, 1994
    Assignee: Nissin Electric Co., Ltd.
    Inventors: Akinori Ebe, Kiyoshi Ogata, Satoshi Nishiyama, Naoto Kuratani, Taizo Okazaki