Patents by Inventor Naoya Tada

Naoya Tada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8374803
    Abstract: A damage detection apparatus and method which detect a damage occurring in a specimen include energizing an inspection area on a specimen into a predetermined energized condition, measuring a potential difference at predetermined intervals in the inspection area, and analyzing an existence or otherwise of a damage, and a shape thereof, based on a plurality of items of potential difference data. Parameters specifying a hypothetical damage are hypothesized in advance and, based on the potential difference data, calculation is executed using a maximum likelihood estimation method on a double body in which hypothetical specimens are doubled by bringing together their front surfaces, and furthermore on a quadruple body quadrupled by bringing rear surfaces of hypothetical specimens together, a maximum likelihood estimation value of the parameters is calculated.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: February 12, 2013
    Assignee: National University Corporation Okayama University
    Inventor: Naoya Tada
  • Publication number: 20090192730
    Abstract: To provide a damage detection apparatus and damage detection method enabling an identification of a crack at a higher speed with a nondestructive inspection method which enables a quantification of a damage such as a crack buried inside a specimen, a crack exposed on a surface, or a wall thinning of the specimen, in three dimensions with an optional aspect ratio and inclination.
    Type: Application
    Filed: January 31, 2007
    Publication date: July 30, 2009
    Applicant: NATIONAL UNIVERSITY CORPORATION OKAYAMA UNIVERSITY
    Inventor: Naoya Tada
  • Patent number: 6532805
    Abstract: An atomic force microscope including a cantilever, a transferring device and a displacement detecting device is used for conducting a material test of a test member based on a load amount and a displacement amount. The test member may be fixed to the cantilever or may be entirely replaced with the cantilever. The transferring device, which is normally used for transferring the cantilever or the sample in accordance with a shape of the sample, constitutes a load applying device for applying a load to the test member, and a displacement of the test member is detected by the displacement detecting device. The load applying device can apply slight displacement and load to the test member, so that the material test for the small material can be conducted.
    Type: Grant
    Filed: February 26, 1999
    Date of Patent: March 18, 2003
    Assignees: Shimadzu Corporation
    Inventors: Ryohei Kokawa, Naoya Tada