Abstract: A living cell observing cell capable of measuring a surface of a membrane of a living cell or a rear surface side thereof and accurately performing structural analysis is provided. The living cell observing cell is used to culture at least one cell in a culture solution and observe the cells. The living cell observing cell includes a container body which stores the culturing solution and a flat location plate which is detachably fixed in the container body and has a plurality of protrusions formed in a predetermined interval on a surface thereof, wherein the cells are located on a plurality of the protrusions.

Abstract: A facsimile machine in which multiple items of account information can be registered in an internal memory with the machine being capable of sending and receiving E-mail is disclosed. If the facsimile machine has been instructed to perform an E-mail operation and multiple items of account information has been registered, one of these items of account information is selected and authentication processing is executed. If only one item of account information has been registered, then this account information is used but the authentication processing is omitted. Thus, depending upon the account registration circumstances, an E-mail operation can be performed without performing an account selection operation and/or personal authentication. The result is improved operability.

Abstract: A semiconductor device includes a first power supply terminal, a second power supply terminal, a comparison circuit coupled to the first power supply terminal and the second power supply terminal to produce at an output node thereof a signal responsive to a difference between a potential of the first power supply terminal and a potential of the second power supply terminal, and a core circuit coupled to the output node of the comparison circuit to perform a test operation in response to the signal.

Abstract: There is provided a device in which a probe can be used for both of observation and correction, and which can, even if a next generation photomask of ultra minute structure is made an object, perform a desired processing without injuring a normal portion in a process of obtaining information of a position and a shape of a defect part, and without impairing the probe also at a processing time. It has been adapted such that, at an observation time, a contact pressure between a probe and a mask is reduced to 0.1 nN by applying a vibration of 1 kHz to 1 MHz to the probe. It has been adapted such that a cantilever used in the present invention is formed by a silicon material of 100-600 ?m in length and 5-50 ?m in thickness and, at the observation time, the probe contacts with the mask at the contact pressure of 0.1 nN and, at the processing time, a defect correction can be performed by causing the probe to contact with the mask at the contact pressure of 10 nN to 1 mN.

Abstract: There is provided a device in which a probe can be used for both of observation and correction, and which can, even if a next generation photomask of ultra minute structure is made an object, perform a desired processing without injuring a normal portion in a process of obtaining information of a position and a shape of a defect part, and without impairing the probe also at a processing time. It has been adapted such that, at an observation time, a contact pressure between a probe and a mask is reduced to 0.1 nN by applying a vibration of 1 kHz to 1 MHz to the probe. It has been adapted such that a cantilever used in the present invention is formed by a silicon material of 100-600 ?m in length and 5-50 ?m in thickness and, at the observation time, the probe contacts with the mask at the contact pressure of 0.1 nN and, at the processing time, a defect correction can be performed by causing the probe to contact with the mask at the contact pressure of 10 nN to 1 mN.

Abstract: An image processing system includes an input unit, a selecting unit, a determining unit and a control unit. The input unit inputs one of a color image and a monochrome image, and the selecting unit selects either a normal recording mode for recording an image on a recording material at a predetermined recording density, and a decimation recording mode for recording the image on the recording material at a recording density lower than that of the normal recording mode. The determining unit determines if the input image is a color image or a monochrome image, and the control unit changes to the normal recording mode, when the decimation recording mode is selected and the input image is determined to be a color image.

Abstract: The present invention provides a working method using a scanning probe which can enhance a working speed and prolong a lifetime of the probe. The present invention provides the working method using a scanning probe which works a sample by performing the relative scanning of a probe supported on a cantilever on the sample at a predetermined scanning speed. The working method can work the object to be worked while forcibly and relatively vibrating the probe in the direction orthogonal to or parallel to a working surface of the sample at low frequency of 100 to 1000 Hz.

Abstract: Disclosed are a communication apparatus capable of registering telephone directory data at once from e-mail containing the telephone directory data into a telephone directory of a communication apparatus. A communication apparatus according to this invention is a communication apparatus having a function of transmitting/receiving e-mail, and characterized by including a communication partner information storage unit for storing communication partner information having predetermined registration items, an identifier detecting unit for detecting a predetermined identifier from received e-mail, and a registering unit for registering information described in the e-mail in accordance with the detected identifier into that registration item of the communication partner information which corresponds to the identifier.

Abstract: There is provided a device in which a probe can be used for both of observation and correction, and which can, even if a next generation photomask of ultra minute structure is made an object, perform a desired processing without injuring a normal portion in a process of obtaining information of a position and a shape of a defect part, and without impairing the probe also at a processing time. It has been adapted such that, at an observation time, a contact pressure between a probe and a mask is reduced to 0.1 nN by applying a vibration of 1 kHz to 1 MHz to the probe. It has been adapted such that a cantilever used in the present invention is formed by a silicon material of 100–600 ?m in length and 5–50 ?m in thickness and, at the observation time, the probe contacts with the mask at the contact pressure of 0.1 nN and, at the processing time, a defect correction can be performed by causing the probe to contact with the mask at the contact pressure of 10 nN to 1 mN.

Abstract: A main control circuit generates a plurality of main control signals of different phases to local control circuits. The local control circuits produce row-related control signals greater in number than the main control signals in accordance with these main control signals. A semiconductor memory device can be easily adapted to change in bank structure, and can perform a fast and stable operation with a low current consumption.

Abstract: In order to provide a scanning probe microscope and a scanning method which are capable of accurately approaching or contacting a probe needle and a sample surface irrespective of an irregularities shape of the sample surface, it comprises a probe needle 2 for relatively performing, with respect to a sample surface S, scans in two directions parallel to the sample surface S and a movement in a perpendicular direction of the sample surface S, a detection means 4 for detecting a measurement amount changing in compliance with a distance between the probe needle 2 and the sample surface S, an observation means 6 for gathering an observation data in a point of time at which the probe needle 2 has approached to or contacted with the sample surface S, a control means 5 for controlling the sans in the two directions and the movement in the perpendicular direction and an approach/separation drive section 24 for causing the probe needle 2 to relatively approach to and separate from the sample surface S at a predetermin

Abstract: A communication terminal device which is connected to a mail server for acquiring E-mail, and has storage unit for storing the acquired E-mail data, the terminal device detects a mail-status notification signal transmitted from the mail server, determines whether or not there is incoming mail by analyzing the mail-status notification signal, refers to available capacity of the storage unit if it is determined that there is incoming mail, thereby determines whether or not E-mail data relating to the incoming mail can be stored, and exercising control in such a manner that acquisition of E-mail is performed if it has determined that the E-mail data relating to the incoming mail can be stored, and in such a manner that no acquisition of E-mail is performed if it has determined that the E-mail data relating to the incoming mail cannot be stored.

Abstract: Sub-blocks SBA0–SBA3, SBB0–SBB3, SBC0–SBC3, SBD0–SBD3 respectively form four groups. In each group, a refresh end signal REF_END is successively transferred to the next sub-block. Therefore, when a refresh counter of the number of bits corresponding to the number of word lines present in a sub-block is provided in a central control circuit, a memory capacity can easily be redesigned by changing the number of sub-blocks and changing a group configuration of sub-blocks. As a result, there can be provided a memory core for embedded memory in which a memory capacity can easily be changed and a refresh control-related circuitry can easily be changed.

Abstract: The kind of a particle is determined by pressing a hard atomic force microscope stylus having a spring constant equal to or larger than 300 N/m onto a particle to be removed and detecting bending quantity relative to a press force and a kind of a stylus used for removing the particle is changed in accordance with the kind of the particle.

Abstract: An indentation is formed by thrusting a probe of a scanning probe microscope for processing, which has a vertical surface or a vertical ridge and is harder than sample material, into sample for measuring the indentation. A high-fidelity AFM observation is performed on the shape of the formed indentation with a thin probe with high aspect ratio, the direction of the vertical surface or the vertical ridge is inspected, and the angle error ? is stored. By rotating a sample stage by an angle corresponding to the measured mounting angle error ? of the probe, the mounting angle error of the probe is corrected in advance.

Abstract: In a communication system having a first communication apparatus capable of a first communication via a first communication line such as a wire line and a second communication apparatus capable of a second communication via a second communication line such as a wireless line, information input from an information input unit of the first communication apparatus is transmitted over the second communication line via the second communication apparatus.

Abstract: There is provided a device in which a probe can be used for both of observation and correction, and which can, even if a next generation photomask of ultra minute structure is made an object, perform a desired processing without injuring a normal portion in a process of obtaining information of a position and a shape of a defect part, and without impairing the probe also at a processing time. It has been adapted such that, at an observation time, a contact pressure between a probe and a mask is reduced to 0.1 nN by applying a vibration of 1 kHz to 1 MHz to the probe. It has been adapted such that a cantilever used in the present invention is formed by a silicon material of 100-600 ?m in length and 5-50 ?m in thickness and, at the observation time, the probe contacts with the mask at the contact pressure of 0.1 nN and, at the processing time, a defect correction can be performed by causing the probe to contact with the mask at the contact pressure of 10 nN to 1 mN.

Abstract: To provide a technique in which chips generated by a defect portion scraping processing using a scanning probe microscope can be removed completely without being collected at the surface of a sample despite of the surface tension of adsorbed water existing on the sample surface and/or electrostatic charges caused by friction. A subject to be processed is disposed within a cell in which liquid is reserved. The scratch processing using a canning probe microscope is performed within the liquid so that chips or shavings scatter within the liquid, not remaining on the surface of the sample. Further, the processing cell is provided with a supply port and an discharge port for the liquid so that new liquid is supplied within the cell through the supply port after the termination of the scratch processing to clean within the cell.

Abstract: A main control circuit generates a plurality of main control signals of different phases to local control circuits. The local control circuits produce row-related control signals greater in number than the main control signals in accordance with these main control signals. A semiconductor memory device can be easily adapted to change in bank structure, and can perform a fast and stable operation with a low current consumption.

Abstract: A main control circuit generates a plurality of main control signals of different phases to local control circuits. The local control circuits produce row-related control signals greater in number than the main control signals in accordance with these main control signals.