Abstract: A guard ring grid is disclosed. The guard ring grid includes a substrate and an injector array coupled to the substrate. The injector array includes a plurality of injectors. The guard ring grid also includes a plurality of guard rings that surround the plurality of injectors.

Abstract: A method of protecting devices within an integrated circuit during electro-static discharge (ESD) testing using an ESD test system is provided. The method includes applying a direct current (DC) bias voltage to an input of at least one device of the integrated circuit and applying an ESD simulated signal to at least one other input of the integrated circuit. The applied ESD simulated signal is conducted along a first current path to a first ground, while a low-current signal associated with the at least one device is conducted along a second current path to the second ground. The DC bias voltage is maintained between the input of the at least one device and the second ground at a substantially constant value in response to a signal variation on the second ground that results from the applied ESD simulated signal.

Abstract: A method of protecting devices within an integrated circuit during electro-static discharge (ESD) testing using an ESD test system is provided. The method includes applying a direct current (DC) bias voltage to an input of at least one device of the integrated circuit and applying an ESD simulated signal to at least one other input of the integrated circuit. The applied ESD simulated signal is conducted along a first current path to a first ground, while a low-current signal associated with the at least one device is conducted along a second current path to the second ground. The DC bias voltage is maintained between the input of the at least one device and the second ground at a substantially constant value in response to a signal variation on the second ground that results from the applied ESD simulated signal.

Abstract: A method of protecting devices within an integrated circuit during electro-static discharge (ESD) testing using an ESD test system is provided. The method includes applying a direct current (DC) bias voltage to an input of at least one device of the integrated circuit and applying an ESD simulated signal to at least one other input of the integrated circuit. The applied ESD simulated signal is conducted along a first current path to a first ground, while a low-current signal associated with the at least one device is conducted along a second current path to the second ground. The DC bias voltage is maintained between the input of the at least one device and the second ground at a substantially constant value in response to a signal variation on the second ground that results from the applied ESD simulated signal.

Abstract: A method of protecting devices within an integrated circuit during electro-static discharge (ESD) testing using an ESD test system is provided. The method includes applying a direct current (DC) bias voltage to an input of at least one device of the integrated circuit and applying an ESD simulated signal to at least one other input of the integrated circuit. The applied ESD simulated signal is conducted along a first current path to a first ground, while a low-current signal associated with the at least one device is conducted along a second current path to the second ground. The DC bias voltage is maintained between the input of the at least one device and the second ground at a substantially constant value in response to a signal variation on the second ground that results from the applied ESD simulated signal.

Abstract: A method of protecting devices within an integrated circuit during electro-static discharge (ESD) testing using an ESD test system is provided. The method includes applying a direct current (DC) bias voltage to an input of at least one device of the integrated circuit and applying an ESD simulated signal to at least one other input of the integrated circuit. The applied ESD simulated signal is conducted along a first current path to a first ground, while a low-current signal associated with the at least one device is conducted along a second current path to the second ground. The DC bias voltage is maintained between the input of the at least one device and the second ground at a substantially constant value in response to a signal variation on the second ground that results from the applied ESD simulated signal.

Abstract: A method of protecting devices within an integrated circuit during electro-static discharge (ESD) testing using an ESD test system is provided. The method includes applying a direct current (DC) bias voltage to an input of at least one device of the integrated circuit and applying an ESD simulated signal to at least one other input of the integrated circuit. The applied ESD simulated signal is conducted along a first current path to a first ground, while a low-current signal associated with the at least one device is conducted along a second current path to the second ground. The DC bias voltage is maintained between the input of the at least one device and the second ground at a substantially constant value in response to a signal variation on the second ground that results from the applied ESD simulated signal.

Abstract: A method of protecting devices within an integrated circuit during electro-static discharge (ESD) testing using an ESD test system is provided. The method includes applying a direct current (DC) bias voltage to an input of at least one device of the integrated circuit and applying an ESD simulated signal to at least one other input of the integrated circuit. The applied ESD simulated signal is conducted along a first current path to a first ground, while a low-current signal associated with the at least one device is conducted along a second current path to the second ground. The DC bias voltage is maintained between the input of the at least one device and the second ground at a substantially constant value in response to a signal variation on the second ground that results from the applied ESD simulated signal.

Abstract: Disclosed are embodiments of methods and systems for wireless data transmission by magnetic induction. In one embodiment, a network of magnetic induction units is provided. The units may be configured to transmit a data signal by modulation of a time-varying magnetic field. One or more units may also be configured to receive a data signal received from another magnetic induction unit. In one specific implementation, a network of underground magnetic induction units is provided, each having a sensor connected thereto. Each of the units, or a subset of the units, may be configured to transmit its sensed data to an adjacent or nearby unit, which, in turn, may retransmit the original data, along with additional appended data, to another adjacent unit. The network data may thereby be relayed in a multi-hop fashion until it reaches a desired destination.

Abstract: A system and method are disclosed for utilizing resources of a network. A constructive proof that a subset of resources is sufficient to satisfy the objective of a system can be generated. The constructive proof can comprise instructions for using the subset of resources. A set of computer-executable instructions can be created from the constructive proof and executed on a host device. The computer-executable instructions can control a data output device according to the instructions of the constructive proof.

Abstract: Disclosed are embodiments of methods and systems for wireless data transmission by magnetic induction. In one embodiment, a network of magnetic induction units is provided. The units may be configured to transmit a data signal by modulation of a time-varying magnetic field. One or more units may also be configured to receive a data signal received from another magnetic induction unit. In one specific implementation, a network of underground magnetic induction units is provided, each having a sensor connected thereto. Each of the units, or a subset of the units, may be configured to transmit its sensed data to an adjacent or nearby unit, which, in turn, may retransmit the original data, along with additional appended data, to another adjacent unit. The network data may thereby be relayed in a multi-hop fashion until it reaches a desired destination.