Abstract: In general, techniques are described that enable crowdsourcing of product-related information. Product-related information may include availability and intra-store locations of various products at particular stores. An example system includes an interface, a memory, and one or more programmable processors configured to receive, at the interface an intra-store product location from a first client device, the intra-store product location indicating a location of a product within a store. The programmable processor(s) are further configured to store, to at least one storage device coupled to the system and in association with the product, the received intra-store product location, receive, at the interface, a request associated with the product from a second client device, and send, from the interface, the intra-store product location to the second client device in response to receiving the request associated with the product.

Abstract: Apparatuses and methods of storing materials, such as liquids, are provided. Mobile storage container systems are disclosed that include or can be erected using multiple transportable storage tanks arranged to form a perimeter and lined with a liner. The transportable storage tanks can include lateral extension panels and/or height extension panels to increase a perimeter and/or a depth of the storage container formed by the multiple transportable storage tanks.

Abstract: In one preferred form of the present invention, there is provided a computer system (10) for providing virtual computers. The computer system (10) includes a pool facility (38) for storing a pool (40) of suspended virtual computers (42) based on at least one virtual computer template (44). A provision manager (32) provides a series (46) of virtual computers (18) as a result of a series (50) of system logon requests by a user (54). The provision manager (32) includes an update facility (100), a resume facility (102) and a customization facility (104). The update facility (104) is provided for updating the or each at least one virtual computer template (44). The resume facility (102) is provided for resuming virtual computers from the pool (40) of suspended virtual computers (42) provided by the pool facility (38). The customization facility (104) is provided for customizing virtual computers after being resumed from the pool (40) to provide active virtual computers.

Abstract: In general, techniques are described that enable crowdsourcing of product-related information. Product-related information may include availability and intra-store locations of various products at particular stores. An example system includes an interface, a memory, and one or more programmable processors configured to receive, at the interface an intra-store product location from a first client device, the intra-store product location indicating a location of a product within a store. The programmable processor(s) are further configured to store, to at least one storage device coupled to the system and in association with the product, the received intra-store product location, receive, at the interface, a request associated with the product from a second client device, and send, from the interface, the intra-store product location to the second client device in response to receiving the request associated with the product.

Abstract: A bar code reading terminal includes a cordless optical reader. The optical reader includes a microprocessor, a scan engine coupled to the microprocessor, a hand held housing supporting the scan engine, program memory coupled to the microprocessor, a decode processor circuit coupled to the microprocessor, and a short-cycle energy storage device coupled to the microprocessor. The energy storage device has high power density and low energy density. In one embodiment, the short-cycle energy storage device comprises a power density greater than 1 kW/kg. The bar code reading terminal further includes a base unit having a housing that includes a socket for receiving the hand held housing. The socket has a connector to facilitate transfer of bar code data messages from the hand held optical reader to the base unit. The connector also transfer powers from the base unit to the short-cycle energy storage device.

Abstract: A mobile device comprising: a data collection device; a trigger to activate the data collection device; a communication system for wireless communications; a display for displaying information; a processor for controlling software and firmware operation; a keypad for entering data for the processor; a power supply for providing power to the mobile device, the power supply comprising a fuel cell or an ultracapacitor; and a housing for supporting the data collection device, trigger, communication system, display, processor, keypad and power supply.

Abstract: Systems and methods for determining one or more characteristics of a specimen using radiation in the terahertz range are provided. One system includes an illumination subsystem configured to illuminate the specimen with radiation. The system also includes a detection subsystem configured to detect radiation propagating from the specimen in response to illumination of the specimen and to generate output responsive to the detected radiation. The detected radiation includes radiation in the terahertz range. In addition, the system includes a processor configured to determine the one or more characteristics of the specimen using the output.

Abstract: A system and method for monitoring and managing wellhead production and costs associated therewith. Electronic equipment is placed at the well head to monitor the volume of product lifted from at a wellhead. The equipment monitors both the volume and the percentage of products lifted and stored at the well head. The status of the separation and the volume can be monitored in real time or on a delayed time basis. The data is displayed on a map and used to identify efficient routes for gathering the lifted product at an appropriate time. The data may be displayed in a user interface which displays desired data in connection with each well head in a represented geographic region.

Abstract: A bar code reading terminal includes a cordless optical reader. The optical reader includes a microprocessor, a scan engine coupled to the microprocessor, a hand held housing supporting the scan engine, program memory coupled to the microprocessor, a decode processor circuit coupled to the microprocessor, and a short-cycle energy storage device coupled to the microprocessor. The energy storage device has high power density and low energy density. In one embodiment, the short-cycle energy storage device comprises a power density greater than 1 kW/kg. The bar code reading terminal further includes a base unit having a housing that includes a socket for receiving the hand held housing. The socket has a connector to facilitate transfer of bar code data messages from the hand held optical reader to the base unit. The connector also transfer powers from the base unit to the short-cycle energy storage device.

Abstract: A mobile device comprising: a data collection device; a trigger to activate the data collection device; a communication system for wireless communications; a display for displaying information; a processor for controlling software and firmware operation; a keypad for entering data for the processor; a power supply for providing power to the mobile device, the power supply comprising a fuel cell or an ultracapacitor; and a housing for supporting the data collection device, trigger, communication system, display, processor, keypad and power supply.

Abstract: Systems and methods for determining one or more characteristics of a specimen using radiation in the terahertz range are provided. One system includes an illumination subsystem configured to illuminate the specimen with radiation. The system also includes a detection subsystem configured to detect radiation propagating from the specimen in response to illumination of the specimen and to generate output responsive to the detected radiation. The detected radiation includes radiation in the terahertz range. In addition, the system includes a processor configured to determine the one or more characteristics of the specimen using the output.

Abstract: A charged particle optic apparatus for improvement in resolution of an electrostatic, multi-beam column is disclosed. The charged particle optic apparatus includes an electrostatic lens array having a first plurality of apertures and a first magnetic pole piece disposed proximate the electrostatic lens array. The first magnetic pole piece includes a second plurality of apertures. The charged particle optic apparatus also includes a second magnetic pole piece disposed proximate the electrostatic lens array such that the electrostatic lens array is between the first magnetic pole piece and the second magnetic pole piece. The second magnetic pole piece includes a third plurality of apertures. The first, second and third pluralities of apertures are aligned with each other. The charged particle optic apparatus may be implemented in a charged particle beam system.

Abstract: Disclosed is a semiconductor die having a scanning area. The semiconductor die includes a first plurality of test structures wherein each of the test structures in the first plurality of test structures is located entirely within the scanning area. The semiconductor die further includes a second plurality of test structures wherein each of the test structures in the first plurality of test structures is located only partially within the scanning area. The test structures are arranged so that a scan of the scanning area results in detection of defects outside of the scanning area.

Abstract: One embodiment relates to an apparatus which utilizes an electron beam for inspection or metrology of a substrate. The apparatus includes a CRT-type gun and deflectors to generate and scan the electron beam. The CRT-type gun may optionally be in a sealed vacuum. Another embodiment relates to a method of inspecting a substrate or measuring an aspect of the substrate. The method includes focusing an electron beam using electrostatic lenses formed by metal plates supported by and separated by fused glass beads or other insulating material. Other embodiments and features are also disclosed.

Abstract: Disclosed is a semiconductor die having a scanning area. The semiconductor die includes a first plurality of test structures wherein each of the test structures in the first plurality of test structures is located entirely within the scanning area. The semiconductor die further includes a second plurality of test structures wherein each of the test structures in the first plurality of test structures is located only partially within the scanning area. The test structures are arranged so that a scan of the scanning area results in detection of defects outside of the scanning area.

Abstract: Disclosed is a semiconductor die having an upper layer and a lower layer. The die includes a lower test structure formed in the lower metal layer of the semiconductor die. The lower conductive test structure has a first end and a second end, wherein the first end is coupled to a predetermined voltage level. The die also has an insulating layer formed over the lower metal layer and an upper test structure formed in the upper metal layer of the semiconductor die. The upper conductive test structure is coupled with the second end of the lower conductive test structure, and the upper metal layer being formed over the insulating layer. The die further includes at least one probe pad coupled with the upper test structure. Preferably, the first end of the lower test structure is coupled to a nominal ground potential. In another implementation, the upper test structure is a voltage contrast element. In another embodiment, a semiconductor die having a scanning area is disclosed.

Abstract: Disclosed is a method of inspecting a sample. The method includes moving to a first field associated with a first group of test structures. The first group of test structures are partially within the first field. The method further includes scanning the first field to determine whether there are any defects present within the first group of test structures. When it is determined that there are defects within the first group of test structures, the method further includes repeatedly stepping to areas and scanning such areas so as to determine a specific defect location within the first group of test structures. A suitable test structure for performing this method is also disclosed.

Abstract: Disclosed are methods and apparatus for simultaneously flooding a sample (e.g., a semiconductor wafer) to control charge and inspecting the sample. The apparatus includes a charged particle beam generator arranged to generate a charged particle beam substantially towards a first portion of the sample and a flood gun for generating a second beam towards a second portion of the sample. The second beam is generated substantially simultaneously with the inspection beam. The apparatus further includes a detector arranged to detect charged particles originating from the sample portion. In a further implementation, the apparatus further includes an image generator for generating an image of the first portion of the sample from the detected particles. In one embodiment, the sample is a semiconductor wafer. In a method aspect, a first area of a sample is flooded with a flood beam to control charge on a surface of the sample. A second area of the sample is inspected with an inspection beam.

Abstract: Disclosed is a semiconductor die having a lower test structure formed in a lower metal layer of the semiconductor die. The lower conductive test structure has a first end and a second end. The first end is coupled to a predetermined voltage level. The semiconductor die also includes an insulating layer formed over the lower metal layer. The die further includes an upper test structure formed in an upper metal layer of the semiconductor die. The upper conductive test structure is coupled with the second end of the lower conductive test structure. The upper metal layer is formed over the insulating layer. In a specific implementation, the first end of the lower test structure is coupled to ground. In another embodiment, the semiconductor die also includes a substrate and a first via coupled between the first end of the lower test structure and the substrate. In yet another aspect, the lower test structure is an extended metal line, and the upper test structure is a voltage contrast element.

Abstract: Disclosed is a semiconductor die having a scanning area. The semiconductor die includes a first plurality of test structures wherein each of the test structures in the first plurality of test structures is located entirely within the scanning area. The semiconductor die further includes a second plurality of test structures wherein each of the test structures in the first plurality of test structures is located only partially within the scanning area. The test structures are arranged so that a scan of the scanning area results in detection of defects outside of the scanning area.