Patents by Inventor Nobuhiro Ishikawa

Nobuhiro Ishikawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210301129
    Abstract: The present invention provides a poly(phenylene ether) which retains low-dielectric characteristics and is soluble in various solvents. The poly(phenylene ether) is characterized by being obtained from one or more raw-material phenols including a phenol satisfying at least Requirement 1 (to have hydrogen atoms in the ortho and para positions) and by having a slope calculated from a conformational plot of less than 0.6.
    Type: Application
    Filed: July 17, 2019
    Publication date: September 30, 2021
    Applicant: TAIYO HOLDINGS CO., LTD.
    Inventors: Mami NOSAKA, Satoko MATSUMURA, Nobuhiro ISHIKAWA, Toshiaki MASUDA
  • Patent number: 10429166
    Abstract: A processing device includes: a coordinate acquisition unit that acquires a moving amount of a measuring probe and a probe output; a matrix generation unit that generates a correction matrix including linear correction elements and non-linear correction elements; and a probe output correction unit that corrects the probe output with the correction matrix. The coordinate acquisition unit acquires the moving amount and the probe output of the measuring probe in each of measurement points in a quantity larger than or equal to the sum of the number of the linear correction elements and the number of the non-linear correction elements. Consequently, a non-linear error of the probe output supplied from the measuring probe can be corrected, and thus shape coordinates of an object to be measured can be obtained with high accuracy.
    Type: Grant
    Filed: August 18, 2017
    Date of Patent: October 1, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Hideyuki Nakagawa, Nobuhiro Ishikawa
  • Patent number: 10429167
    Abstract: As a former correction step, a coordinate correction method includes: a step of setting a measuring probe in a drive mechanism; a step of restraining a measurement tip; a step of acquiring a moving amount and a probe output; and a step of generating a former correction matrix including linear correction elements and non-linear correction elements. As a latter correction step, the coordinate correction method includes: a step of setting a measuring probe in a drive mechanism; a step of restraining a measurement tip; a step of acquiring a moving amount and a probe output; a step of generating an intermediate correction matrix including linear correction elements for correcting the probe output; and a step of correcting the probe output with a latter correction matrix. Consequently, correction can be simplified while allowing for correction of a non-linear error of the probe output supplied from the measuring probe.
    Type: Grant
    Filed: August 22, 2017
    Date of Patent: October 1, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Hideyuki Nakagawa, Nobuhiro Ishikawa
  • Patent number: 10422636
    Abstract: A processing device includes: a pushing drive mechanism control unit that brings a measurement tip into contact with a surface of a calibration artifact at a single point in each of five directions are all normal directions to the surface of the calibration artifact; a scanning drive mechanism control unit that reciprocates the measurement tip on the surface of the calibration artifact on each of three planes perpendicular to one another; a coordinate acquisition unit that acquires a moving amount and a probe output of a measuring probe; a matrix generation unit that generates a correction matrix; and a probe output correction unit that corrects the probe output with the correction matrix. This enables an improvement in asymmetric probe characteristics of the probe output, which is outputted from the measuring probe, in a particular plane. Thus, shape coordinates of an object to be measured can be obtained with high accuracy.
    Type: Grant
    Filed: August 21, 2017
    Date of Patent: September 24, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Hideyuki Nakagawa, Nobuhiro Ishikawa
  • Patent number: 10415949
    Abstract: A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. A signal processing circuit includes a first processing part that processes outputs of the detection elements to output three displacement signals representing displacement components of a contact part in mutually perpendicular three directions, respectively. The measuring probe capable of reducing measurement directional dependency of sensitivity with a simple configuration while maintaining high sensitivity is thus provided.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: September 17, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Satoshi Koga, Akinori Saito, Hiroyuki Kanamori, Yutaka Kuriyama, Nobuhiro Ishikawa
  • Patent number: 10393495
    Abstract: A measuring probe includes: a stylus having a contact part to be brought into contact with an object to be measured; a probe housing capable of supporting the stylus on an axial center; and a detection element capable of detecting a movement of the contact part. The measuring probe further includes: two supporting members disposed in an axial direction of the probe housing, the supporting member allowing for an attitude change of the stylus; and a coupling shaft for coupling the two supporting members together. The detection element is disposed in one of the two supporting members that is farthest away from a rotational center position of rotation generated in the stylus when a measuring force is applied to the contact part from a direction perpendicular to the axial direction, to detect a strain amount of the one of the two supporting members.
    Type: Grant
    Filed: February 23, 2017
    Date of Patent: August 27, 2019
    Assignee: MITUTOYO CORPORATION
    Inventors: Satoshi Koga, Akinori Saito, Hiroyuki Kanamori, Yutaka Kuriyama, Nobuhiro Ishikawa
  • Patent number: 10006803
    Abstract: A contact detector circuit that detects a change in a DC sensor signal based on a change in a physical amount to be detected includes: a reference signal generation circuit that generates a reference signal based on the DC sensor signal; a trigger signal output circuit that compares the DC sensor signal with the reference signal and outputs a trigger signal based on a result of the comparison; and a sampling-and-holding circuit that holds the reference signal when the trigger signal is started to be outputted and outputs the held reference signal to the trigger signal output circuit while the trigger signal is outputted. The trigger signal output circuit uses the reference signal outputted by the sampling-and-holding circuit for the comparison with the DC sensor signal while the trigger signal is outputted.
    Type: Grant
    Filed: June 16, 2015
    Date of Patent: June 26, 2018
    Assignee: Mituoyo Corporation
    Inventor: Nobuhiro Ishikawa
  • Publication number: 20180058832
    Abstract: A processing device includes: a coordinate acquisition unit that acquires a moving amount of a measuring probe and a probe output; a matrix generation unit that generates a correction matrix including linear correction elements and non-linear correction elements; and a probe output correction unit that corrects the probe output with the correction matrix. The coordinate acquisition unit acquires the moving amount and the probe output of the measuring probe in each of measurement points in a quantity larger than or equal to the sum of the number of the linear correction elements and the number of the non-linear correction elements. Consequently, a non-linear error of the probe output supplied from the measuring probe can be corrected, and thus shape coordinates of an object to be measured can be obtained with high accuracy.
    Type: Application
    Filed: August 18, 2017
    Publication date: March 1, 2018
    Applicant: MITUTOYO CORPORATION
    Inventors: Hideyuki NAKAGAWA, Nobuhiro ISHIKAWA
  • Publication number: 20180058847
    Abstract: A processing device includes: a pushing drive mechanism control unit that brings a measurement tip into contact with a surface of a calibration artifact at a single point in each of five directions are all normal directions to the surface of the calibration artifact; a scanning drive mechanism control unit that reciprocates the measurement tip on the surface of the calibration artifact on each of three planes perpendicular to one another; a coordinate acquisition unit that acquires a moving amount and a probe output of a measuring probe; a matrix generation unit that generates a correction matrix; and a probe output correction unit that corrects the probe output with the correction matrix. This enables an improvement in asymmetric probe characteristics of the probe output, which is outputted from the measuring probe, in a particular plane. Thus, shape coordinates of an object to be measured can be obtained with high accuracy.
    Type: Application
    Filed: August 21, 2017
    Publication date: March 1, 2018
    Applicant: MITUTOYO CORPORATION
    Inventors: Hideyuki NAKAGAWA, Nobuhiro ISHIKAWA
  • Publication number: 20180058834
    Abstract: As a former correction step, a coordinate correction method includes: a step of setting a measuring probe in a drive mechanism; a step of restraining a measurement tip; a step of acquiring a moving amount and a probe output; and a step of generating a former correction matrix including linear correction elements and non-linear correction elements. As a latter correction step, the coordinate correction method includes: a step of setting a measuring probe in a drive mechanism; a step of restraining a measurement tip; a step of acquiring a moving amount and a probe output; a step of generating an intermediate correction matrix including linear correction elements for correcting the probe output; and a step of correcting the probe output with a latter correction matrix. Consequently, correction can be simplified while allowing for correction of a non-linear error of the probe output supplied from the measuring probe.
    Type: Application
    Filed: August 22, 2017
    Publication date: March 1, 2018
    Applicant: MITUTOYO CORPORATION
    Inventors: Hideyuki NAKAGAWA, Nobuhiro ISHIKAWA
  • Publication number: 20170248400
    Abstract: A measuring probe includes: a stylus having a contact part to be brought into contact with an object to be measured; a probe housing capable of supporting the stylus on an axial center; and a detection element capable of detecting a movement of the contact part. The measuring probe further includes: two supporting members disposed in an axial direction of the probe housing, the supporting member allowing for an attitude change of the stylus; and a coupling shaft for coupling the two supporting members together. The detection element is disposed in one of the two supporting members that is farthest away from a rotational center position of rotation generated in the stylus when a measuring force is applied to the contact part from a direction perpendicular to the axial direction, to detect a strain amount of the one of the two supporting members.
    Type: Application
    Filed: February 23, 2017
    Publication date: August 31, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Satoshi KOGA, Akinori SAITO, Hiroyuki KANAMORI, Yutaka KURIYAMA, Nobuhiro ISHIKAWA
  • Publication number: 20170248402
    Abstract: A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. A signal processing circuit includes a first processing part that processes outputs of the detection elements to output three displacement signals representing displacement components of a contact part in mutually perpendicular three directions, respectively. The measuring probe capable of reducing measurement directional dependency of sensitivity with a simple configuration while maintaining high sensitivity is thus provided.
    Type: Application
    Filed: February 23, 2017
    Publication date: August 31, 2017
    Applicant: MITUTOYO CORPORATION
    Inventors: Satoshi KOGA, Akinori SAITO, Hiroyuki KANAMORI, Yutaka KURIYAMA, Nobuhiro ISHIKAWA
  • Patent number: 9746303
    Abstract: A first correction component calculation processing unit calculates diagonal components of a correction matrix based on first and second detection values. The first and second detection values are obtained by measurement in which a calibration reference body and the probe are moved relatively to each other in a normal direction on a surface of the calibration reference body so as to bring a measurement tip into contact with the surface of the calibration reference body at one point. A second correction component calculation processing unit calculates non-diagonal components of the correction matrix based on third and fourth detection values. The third and fourth detection values are obtained by scanning measurement using the measurement tip on the surface of the calibration reference body while maintaining a constant relative distance between the center of the measurement tip and a reference point or a reference line of the calibration reference body.
    Type: Grant
    Filed: February 13, 2015
    Date of Patent: August 29, 2017
    Assignee: MITUTOYO CORPORATION
    Inventors: Hideyuki Nakagawa, Nobuhiro Ishikawa
  • Patent number: 9719779
    Abstract: A form measuring machine includes: a scanning probe including a stylus with a tip ball and a probe body attached with the stylus; a movable slider supporting the scanning probe; a scale detecting a slider displacement of the slider; a tip ball displacement detector detecting a tip ball displacement of the tip ball; and an arithmetic unit calculating a measurement value based on the slider displacement, the tip ball displacement and a correction filter and comprising a correction filter setting section that: calculates a correction matrix diagonal component from the slider displacement and the tip ball displacement detected by calibration of the scanning probe; and calculates a correction factor of the correction filter from the correction matrix diagonal component to set the correction filter.
    Type: Grant
    Filed: November 2, 2015
    Date of Patent: August 1, 2017
    Assignee: MITUTOYO CORPORATION
    Inventors: Nobuhiro Ishikawa, Hideyuki Nakagawa
  • Patent number: 9683839
    Abstract: In a shape measuring apparatus having a scanning probe to perform scanning measurement using a tip ball provided at an end of a stylus with the tip ball being in contact with an object to be measured, a tip ball displacement detector detects a displacement of the tip ball of the scanning probe, a displacement of a moving mechanism that relatively moves the object to be measured and the scanning probe is detected, and an angle formed by a contact direction of the tip ball with the object to be measured and an axial direction of the stylus is calculated. The displacement of the tip ball that is detected by the tip ball displacement detector is corrected on the basis of the angle, and a corrected value of the displacement is outputted. The corrected value is added to the displacement of the moving mechanism to calculate a measurement value.
    Type: Grant
    Filed: June 5, 2015
    Date of Patent: June 20, 2017
    Assignee: MITUTOYO CORPORATION
    Inventors: Hideyuki Nakagawa, Nobuhiro Ishikawa
  • Patent number: 9464877
    Abstract: A calculator includes a first filter, a second filter, and an adding device. The first filter outputs, as a first corrected value, a value in which displacement of a displacement table detected by a scale has been corrected based on first frequency transfer characteristics from a scale to a measured object station. The second filter outputs, as a second corrected value, a value in which the first corrected value is corrected based on second frequency transfer characteristics from a ball tip to a ball tip displacement detector. The adding device adds the second corrected value and displacement of the ball tip detected by the ball tip displacement detector to calculate a measured value.
    Type: Grant
    Filed: February 9, 2015
    Date of Patent: October 11, 2016
    Assignee: MITUTOYO CORPORATION
    Inventors: Hideyuki Nakagawa, Nobuhiro Ishikawa
  • Publication number: 20160131470
    Abstract: A form measuring machine includes: a scanning probe including a stylus with a tip ball and a probe body attached with the stylus; a movable slider supporting the scanning probe; a scale detecting a slider displacement of the slider; a tip ball displacement detector detecting a tip ball displacement of the tip ball; and an arithmetic unit calculating a measurement value based on the slider displacement, the tip ball displacement and a correction filter and comprising a correction filter setting section that: calculates a correction matrix diagonal component from the slider displacement and the tip ball displacement detected by calibration of the scanning probe; and calculates a correction factor of the correction filter from the correction matrix diagonal component to set the correction filter.
    Type: Application
    Filed: November 2, 2015
    Publication date: May 12, 2016
    Inventors: Nobuhiro Ishikawa, Hideyuki Nakagawa
  • Publication number: 20160018218
    Abstract: In a shape measuring apparatus having a scanning probe to perform scanning measurement using a tip ball provided at an end of a stylus with the tip ball being in contact with an object to be measured, a tip ball displacement detector detects a displacement of the tip ball of the scanning probe, a displacement of a moving mechanism that relatively moves the object to be measured and the scanning probe is detected, and an angle formed by a contact direction of the tip ball with the object to be measured and an axial direction of the stylus is calculated. The displacement of the tip ball that is detected by the tip ball displacement detector is corrected on the basis of the angle, and a corrected value of the displacement is outputted. The corrected value is added to the displacement of the moving mechanism to calculate a measurement value.
    Type: Application
    Filed: June 5, 2015
    Publication date: January 21, 2016
    Applicant: MITUTOYO CORPORATION
    Inventors: Hideyuki NAKAGAWA, Nobuhiro ISHIKAWA
  • Publication number: 20150369655
    Abstract: A contact detector circuit that detects a change in a DC sensor signal based on a change in a physical amount to be detected includes: a reference signal generation circuit that generates a reference signal based on the DC sensor signal; a trigger signal output circuit that compares the DC sensor signal with the reference signal and outputs a trigger signal based on a result of the comparison; and a sampling-and-holding circuit that holds the reference signal when the trigger signal is started to be outputted and outputs the held reference signal to the trigger signal output circuit while the trigger signal is outputted. The trigger signal output circuit uses the reference signal outputted by the sampling-and-holding circuit for the comparison with the DC sensor signal while the trigger signal is outputted.
    Type: Application
    Filed: June 16, 2015
    Publication date: December 24, 2015
    Inventor: Nobuhiro Ishikawa
  • Publication number: 20150241194
    Abstract: A first correction component calculation processing unit calculates diagonal components of a correction matrix based on first and second detection values. The first and second detection values are obtained by measurement in which a calibration reference body and the probe are moved relatively to each other in a normal direction on a surface of the calibration reference body so as to bring a measurement tip into contact with the surface of the calibration reference body at one point. A second correction component calculation processing unit calculates non-diagonal components of the correction matrix based on third and fourth detection values. The third and fourth detection values are obtained by scanning measurement using the measurement tip on the surface of the calibration reference body while maintaining a constant relative distance between the center of the measurement tip and a reference point or a reference line of the calibration reference body.
    Type: Application
    Filed: February 13, 2015
    Publication date: August 27, 2015
    Applicant: MITUTOYO CORPORATION
    Inventors: Hideyuki NAKAGAWA, Nobuhiro ISHIKAWA