Patents by Inventor Oscar Hemberg

Oscar Hemberg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7838854
    Abstract: An EUV plasma formation target delivery system and method is disclosed which may comprise: a target droplet formation mechanism comprising a magneto-restrictive or electro-restrictive material, a liquid plasma source material passageway terminating in an output orifice; a charging mechanism applying charge to a droplet forming jet stream or to individual droplets exiting the passageway along a selected path; a droplet deflector intermediate the output orifice and a plasma initiation site periodically deflecting droplets from the selected path, a liquid target material delivery mechanism comprising a liquid target material delivery passage having an input opening and an output orifice; an electromotive disturbing force generating mechanism generating a disturbing force within the liquid target material, a liquid target delivery droplet formation mechanism having an output orifice; and/or a wetting barrier around the periphery of the output orifice.
    Type: Grant
    Filed: July 25, 2008
    Date of Patent: November 23, 2010
    Assignee: Cymer, Inc.
    Inventors: J. Martin Algots, Igor V. Fomenkov, Alexander I. Ershov, William N. Partlo, Richard L. Sandstrom, Oscar Hemberg, Alexander N. Bykanov, Dennis W. Cobb
  • Publication number: 20100027007
    Abstract: A particle detection system uses a reflective optic comprising a curved surface to detect high angle scattered light generated by a particle in a liquid medium, when a laser beam is incident on the particle. When the particles transit the laser beam, light is scattered in all directions and is described by MIE scattering theory for particles about the size of the wavelength of light and larger or Rayleigh Scattering when the particles are smaller than the wavelength of light. By using the reflective optic, the scattered light can be detected over angles that are greater than normally obtainable.
    Type: Application
    Filed: August 3, 2009
    Publication date: February 4, 2010
    Applicant: JMAR LLC
    Inventors: John A. Adams, Scott H. Bloom, Victor J. Chan, Kristina M. Crousore, Joseph S. Gottlieb, Oscar Hemberg, John J. Lyon, Brett A. Spivey
  • Patent number: 7616311
    Abstract: A particle detection system uses a reflective optic comprising a curved surface to detect high angle scattered light generated by a particle in a liquid medium, when a laser beam is incident on the particle. When the particles transit the laser beam, light is scattered in all directions and is described by MIE scattering theory for particles about the size of the wavelength of light and larger or Rayleigh Scattering when the particles are smaller than the wavelength of light. By using the reflective optic, the scattered light can be detected over angles that are greater than normally obtainable.
    Type: Grant
    Filed: June 13, 2006
    Date of Patent: November 10, 2009
    Assignee: JMAR LLC
    Inventors: John A. Adams, Scott H. Bloom, Victor J. Chan, Kristina M. Crousore, Joseph S. Gottlieb, Oscar Hemberg, John J. Lyon, Brett A. Spivey
  • Patent number: 7589337
    Abstract: An EUV light generation system and method is disclosed that may comprise a droplet generator producing plasma source material target droplets traveling toward the vicinity of a plasma source material target irradiation site; a drive laser; a drive laser focusing optical element having a first range of operating center wavelengths; a droplet detection radiation source having a second range of operating center wavelengths; a drive laser steering element comprising a material that is highly reflective within at least some part of the first range of wavelengths and highly transmissive within at least some part of the second range of center wavelengths; a droplet detection radiation aiming mechanism directing the droplet detection radiation through the drive laser steering element and the lens to focus at a selected droplet detection position intermediate the droplet generator and the irradiation site.
    Type: Grant
    Filed: March 12, 2008
    Date of Patent: September 15, 2009
    Assignee: Cymer, Inc.
    Inventors: Alexander N. Bykanov, J. Martin Algots, Oleh V. Khodykin, Oscar Hemberg, Norbert R. Bowering
  • Patent number: 7554661
    Abstract: A particle detection system to identify and classify particles is programmed to capture digitized images of the particle generated by directing a light source through a fluid that includes the particle. The particle scatters the light and the scattered light is detected using a detector. The detector creates a digital signal corresponding to the particle, which is used by the system to generate biological optical signal. This biological optical signal can then be used to classify the event, or particle.
    Type: Grant
    Filed: October 5, 2006
    Date of Patent: June 30, 2009
    Assignee: JMAR Technologies, Inc.
    Inventors: John A. Adams, Kristina M. Crousore, Cherish K. Teters, Oscar Hemberg
  • Publication number: 20080283776
    Abstract: An EUV plasma formation target delivery system and method is disclosed which may comprise: a target droplet formation mechanism comprising a magneto-restrictive or electro-restrictive material, a liquid plasma source material passageway terminating in an output orifice; a charging mechanism applying charge to a droplet forming jet stream or to individual droplets exiting the passageway along a selected path; a droplet deflector intermediate the output orifice and a plasma initiation site periodically deflecting droplets from the selected path, a liquid target material delivery mechanism comprising a liquid target material delivery passage having an input opening and an output orifice; an electromotive disturbing force generating mechanism generating a disturbing force within the liquid target material, a liquid target delivery droplet formation mechanism having an output orifice; and/or a wetting barrier around the periphery of the output orifice.
    Type: Application
    Filed: July 25, 2008
    Publication date: November 20, 2008
    Applicant: CYMER, INC.
    Inventors: J. Martin Algots, Igor V. Fomenkov, Alexander I. Ershov, William N. Partlo, Richard L. Sandstrom, Oscar Hemberg, Alexander N. Bykanov, Dennis W. Cobb
  • Publication number: 20080179549
    Abstract: An EUV light generation system and method is disclosed that may comprise a droplet generator producing plasma source material target droplets traveling toward the vicinity of a plasma source material target irradiation site; a drive laser; a drive laser focusing optical element having a first range of operating center wavelengths; a droplet detection radiation source having a second range of operating center wavelengths; a drive laser steering element comprising a material that is highly reflective within at least some part of the first range of wavelengths and highly transmissive within at least some part of the second range of center wavelengths; a droplet detection radiation aiming mechanism directing the droplet detection radiation through the drive laser steering element and the lens to focus at a selected droplet detection position intermediate the droplet generator and the irradiation site.
    Type: Application
    Filed: March 12, 2008
    Publication date: July 31, 2008
    Applicant: Cymer, Inc.
    Inventors: Alexander N. Bykanov, J. Martin Algots, Oleh Khodykin, Oscar Hemberg
  • Patent number: 7405416
    Abstract: An EUV plasma formation target delivery system and method is disclosed which may comprise: a target droplet formation mechanism comprising a magneto-restrictive or electro-restrictive material, a liquid plasma source material passageway terminating in an output orifice; a charging mechanism applying charge to a droplet forming jet stream or to individual droplets exiting the passageway along a selected path; a droplet deflector intermediate the output orifice and a plasma initiation site periodically deflecting droplets from the selected path, a liquid target material delivery mechanism comprising a liquid target material delivery passage having an input opening and an output orifice; an electromotive disturbing force generating mechanism generating a disturbing force within the liquid target material, a liquid target delivery droplet formation mechanism having an output orifice; and/or a wetting barrier around the periphery of the output orifice.
    Type: Grant
    Filed: February 25, 2005
    Date of Patent: July 29, 2008
    Assignee: Cymer, Inc.
    Inventors: J. Martin Algots, Igor V. Fomenkov, Alexander I. Ershov, William N. Partlo, Richard L. Sandstrom, Oscar Hemberg, Alexander N. Bykanov, Dennis W. Cobb
  • Patent number: 7372056
    Abstract: An EUV light generation system and method is disclosed that may comprise a droplet generator producing plasma source material target droplets traveling toward the vicinity of a plasma source material target irradiation site; a drive laser; a drive laser focusing optical element having a first range of operating center wavelengths; a droplet detection radiation source having a second range of operating center wavelengths; a drive laser steering element comprising a material that is highly reflective within at least some part of the first range of wavelengths and highly transmissive within at least some part of the second range of center wavelengths; a droplet detection radiation aiming mechanism directing the droplet detection radiation through the drive laser steering element and the lens to focus at a selected droplet detection position intermediate the droplet generator and the irradiation site.
    Type: Grant
    Filed: June 29, 2005
    Date of Patent: May 13, 2008
    Assignee: Cymer, Inc.
    Inventors: Alexander N. Bykanov, J. Martin Algots, Oleh Khodykin, Oscar Hemberg
  • Publication number: 20080093775
    Abstract: Ablation of holes having diameters as small as 82 nm and having clean walls was obtained in a poly(methyl methacrylate) on a silicon substrate by focusing pulses from a Ne-like Ar, 46.9 nm wavelength, capillary-discharge laser using a freestanding Fresnel zone plate diffracting into third order is described. Spectroscopic analysis of light from the ablation has also been performed. These results demonstrate the use of focused coherent EUV/SXR light for the direct nanoscale patterning of materials.
    Type: Application
    Filed: August 17, 2007
    Publication date: April 24, 2008
    Applicant: COLORADO STATE UNIVERSITY RESEARCH FOUNDATION
    Inventors: Carmen Menoni, Jorge Rocca, Georgiy Vaschenko, Scott Bloom, Erik Anderson, Weilun Chao, Oscar Hemberg
  • Publication number: 20080014653
    Abstract: A system and method for analysis of minute quantities of contaminants in water. Liquid water is converted to water vapor and then excited into a plasma state with microwave radiation. Optical emissions from the plasma are spectrally analyzed to provide qualitative and/or quantitative analyses of the contaminants in the water. Preferred embodiments provide special techniques for generating the water vapor from a water stream; exciting the water vapor to a plasma state; varying and controlling the plasma energy; introducing samples into an existing plasma; collecting emissions from the plasma from a variety of angles; selecting the optical collection angles; protecting the analysis optics from the plasma; exhausting the spent plasma gases back into the water stream; and analyzing the results to yield concentrations of elements and molecules in the sample.
    Type: Application
    Filed: July 13, 2007
    Publication date: January 17, 2008
    Inventors: Scott Harris Bloom, Eric Oscar Hemberg, Robert Bible
  • Patent number: 7239686
    Abstract: A method of producing a radiating plasma with an increased flux stability and uniformity is disclosed. The method comprises the steps of generating a primary target by urging a liquid under pressure through a nozzle; directing an energy pre-pulse onto the primary target to generate a secondary target in the form of a gas or plasma cloud; allowing the thus formed secondary target to expand for a predetermined period of time; and directing a main energy pulse onto the secondary target when the predetermined period of time has elapsed in order to produce a plasma radiating X-ray or EUV radiation. The pre-pulse has a beam waist size that is larger, in at least one dimension, than the corresponding dimension of the primary target.
    Type: Grant
    Filed: May 13, 2003
    Date of Patent: July 3, 2007
    Assignee: Jettec AB
    Inventors: Magnus Berglund, Björn Hansson, Oscar Hemberg, Hans Hertz, Lars Rymell
  • Publication number: 20070146703
    Abstract: A particle detection system to identify and classify particles is programmed to capture digitized images of the particle generated by directing a light source through a fluid that includes the particle. The particle scatters the light and the scattered light is detected using a detector. The detector creates a digital signal corresponding to the particle, which is used by the system to generate biological optical signal. This biological optical signal can then be used to classify the event, or particle.
    Type: Application
    Filed: October 5, 2006
    Publication date: June 28, 2007
    Applicant: JMAR Technologies, Inc.
    Inventors: John Adams, Kristina Crousore, Cherish Teters, Oscar Hemberg
  • Publication number: 20070046938
    Abstract: A particle detection system uses a reflective optic comprising a curved surface to detect high angle scattered light generated by a particle in a liquid medium, when a laser beam is incident on the particle. When the particles transit the laser beam, light is scattered in all directions and is described by MIE scattering theory for particles about the size of the wavelength of light and larger or Rayleigh Scattering when the particles are smaller than the wavelength of light. By using the reflective optic, the scattered light can be detected over angles that are greater than normally obtainable.
    Type: Application
    Filed: June 13, 2006
    Publication date: March 1, 2007
    Applicant: JMAR Research, Inc.
    Inventors: John Adams, Scott Bloom, Victor Chan, Kristina Crousore, Joseph Gottlieb, Oscar Hemberg, John Lyon, Brett Spivey
  • Publication number: 20070001130
    Abstract: An EUV light generation system and method is disclosed that may comprise a droplet generator producing plasma source material target droplets traveling toward the vicinity of a plasma source material target irradiation site; a drive laser; a drive laser focusing optical element having a first range of operating center wavelengths; a droplet detection radiation source having a second range of operating center wavelengths; a drive laser steering element comprising a material that is highly reflective within at least some part of the first range of wavelengths and highly transmissive within at least some part of the second range of center wavelengths; a droplet detection radiation aiming mechanism directing the droplet detection radiation through the drive laser steering element and the lens to focus at a selected droplet detection position intermediate the droplet generator and the irradiation site.
    Type: Application
    Filed: June 29, 2005
    Publication date: January 4, 2007
    Applicant: Cymer, Inc.
    Inventors: Alexander Bykanov, J. Algots, Oleh Khodykin, Oscar Hemberg
  • Patent number: 7122816
    Abstract: An EUV light source plasma source material handling system and method is disclosed which may comprise a droplet generator having a droplet generator plasma source material reservoir in fluid communication with a droplet formation capillary and maintained within a selected range of temperatures sufficient to keep the plasma source material in a liquid form; a plasma source material supply system having a supply reservoir in fluid communication with the droplet generator plasma source material reservoir and holding at least a replenishing amount of plasma source material in liquid form for transfer to the droplet generator plasma source material reservoir, while the droplet generator is on line; a transfer mechanism transferring liquid plasma source material from the supply reservoir to the droplet generator plasma source material reservoir, while the droplet generator is on line.
    Type: Grant
    Filed: March 23, 2005
    Date of Patent: October 17, 2006
    Assignee: Cymer, Inc.
    Inventors: J. Martin Algots, Oscar Hemberg, Tae H. Chung
  • Publication number: 20060192155
    Abstract: An EUV light source plasma source material handling system and method is disclosed which may comprise a droplet generator having a droplet generator plasma source material reservoir in fluid communication with a droplet formation capillary and maintained within a selected range of temperatures sufficient to keep the plasma source material in a liquid form; a plasma source material supply system having a supply reservoir in fluid communication with the droplet generator plasma source material reservoir and holding at least a replenishing amount of plasma source material in liquid form for transfer to the droplet generator plasma source material reservoir, while the droplet generator is on line; a transfer mechanism transferring liquid plasma source material from the supply reservoir to the droplet generator plasma source material reservoir, while the droplet generator is on line.
    Type: Application
    Filed: March 23, 2005
    Publication date: August 31, 2006
    Inventors: J. Algots, Oscar Hemberg, Tae Chung
  • Publication number: 20060192154
    Abstract: An EUV plasma formation target delivery system and method is disclosed which may comprise: a target droplet formation mechanism comprising a magneto-restrictive or electro-restrictive material, a liquid plasma source material passageway terminating in an output orifice; a charging mechanism applying charge to a droplet forming jet stream or to individual droplets exiting the passageway along a selected path; a droplet deflector intermediate the output orifice and a plasma initiation site periodically deflecting droplets from the selected path, a liquid target material delivery mechanism comprising a liquid target material delivery passage having an input opening and an output orifice; an electromotive disturbing force generating mechanism generating a disturbing force within the liquid target material, a liquid target delivery droplet formation mechanism having an output orifice; and/or a wetting barrier around the periphery of the output orifice.
    Type: Application
    Filed: February 25, 2005
    Publication date: August 31, 2006
    Applicant: Cymer, Inc.
    Inventors: J. Algots, Igor Fomenkov, Alexander Ershov, William Partlo, Richard Sandstrom, Oscar Hemberg, Alexander Bykanov, Dennis Cobb
  • Publication number: 20060098781
    Abstract: A nano-scale surface analysis system comprises an electrically powered apparatus for the generation of soft x-ray laser radiation. The apparatus comprises an excitation circuit having at least two or more electrically conducting structures separated by a liquid dielectric for providing a high current excitation pulse, and a capillary structure having a capillary with a length to diameter ration of about 20 to 1000 for enclosing a selected lasing material, wherein the excitation circuit is capable of generating a plasma volume within the capillary structure to produce a population inversion. The generator further comprises a focusing optic for receiving the soft x-ray radiation from the emissions source and focus the soft x-ray radiation onto a target for forming a nanoplasma, the soft x-ray radiation being focused onto an area of the target having a diameter of less than 100 nm.
    Type: Application
    Filed: December 14, 2005
    Publication date: May 11, 2006
    Inventors: Scott Bloom, Oscar Hemberg
  • Publication number: 20060091109
    Abstract: A method and apparatus that may comprise an EUV light producing mechanism utilizing an EUV plasma source material comprising a material that will form an etching compound, which plasma source material produces EUV light in a band around a selected center wavelength comprising: an EUV plasma generation chamber; an EUV light collector contained within the chamber having a reflective surface containing at least one layer comprising a material that does not form an etching compound and/or forms a compound layer that does not significantly reduce the reflectivity of the reflective surface in the band; an etchant source gas contained within the chamber comprising an etchant source material with which the plasma source material forms an etching compound, which etching compound has a vapor pressure that will allow etching of the etching compound from the reflective surface. The etchant source material may comprises a halogen or halogen compound.
    Type: Application
    Filed: November 1, 2004
    Publication date: May 4, 2006
    Inventors: William Partlo, Richard Sandstrom, Igor Fomenkov, Alexander Ershov, William Oldham, William Marx, Oscar Hemberg