Abstract: An output circuit (OUT) can be activated via an activation input (AKT), in the activated state starts an output process for data (D) to be read out, in synchronism with the first internal clock (CLKI1), and outputs the data (D) with a specific phase shift (?TOUT) with respect to the first internal clock (CLKI1), in synchronism with the external clock (CLKE), at a data connection (P). A counting unit (CT) starts a counting process for recording the number of successively following first levels of the first internal clock (CLKI1) as soon as a second internal clock (CLKI2), which is synchronized to the external clock (CLKE), for the first time assumes a first level while an output control signal (PAR) is at first level. It activates the output circuit (OUT) as soon as the number of successively following first levels of the first internal clock (CLKI1) has reached a predetermined value.

Abstract: A method and logic/memory module set the desired corrected duty cycle between the time periods of the first and second level states of at least one control/reference signal. In that, the rising time period of the rising edge and/or the fall time period of the falling edge of the control/reference signal are increased and/or decreased (i.e. changed) by a predefinable correction time period.

Abstract: A switching network with trimmable resistors lies in a control loop of a voltage generator that can be switched off from the supply voltage by a logic device. The logic device and also the switching network are driven by the same signals. The circuit configuration can be used for trimming or switching off the output voltage generated by the voltage generator during the functional test. As many settings as possible for the output voltage can be tested by a small number of control signals.

Abstract: The optimized-delay multiplexer includes at least two pass elements that are respectively driven via a first path by a control signal directly, and via a second path by the control signal inverted by an inverter. A further pass element is connected in the first path to simulate the delay caused by the inverter. As a result, the at least two pass elements are switched simultaneously.

Abstract: A delay device has multiplexers connected in series in a differential configuration. First connections of the multiplexers are connected to the output of an upstream multiplexer. Second inputs of the multiplexers are connected to the input connection to which the signal that is to be delayed can be supplied. A control signal controls the switch position of one of the multiplexers such that its output is connected to the input of the delay device. All the other multiplexers are in the other switch position. This results in the delay device producing a specific delay time. When used in a delay control loop, this results in a jitter-free output signal, even if the operating conditions are fluctuating.

Abstract: An integrated synchronous memory has a register which can store a frequency-range information item regarding whether the memory is operated in a first or in a lower, second frequency range in an application. The mode of operation of a subcircuit in the memory can be controlled on the basis of the stored frequency-range information item in the register. A memory configuration having a memory module on which at least one such synchronous memory is disposed contains a controller which can be connected to the memory module and sets the register in the at least one memory. Therefore, optimum functionality of the memory can be ensured both in a high and in a low frequency range of the operating frequency.

Abstract: Integrated circuits, in particular memory chips of the DDR SDRAM type, are tested in a parallel manner. In order to prevent the circuits from being driven relative to one another during a test operation, an input terminal that is already connected to a channel of an automatic test machine anyway is connected to a switching device, by which the output drivers can be turned off in a manner dependent on the control signal that can be fed in at the input terminal. The switching device preferably contains a demultiplexer and also a multiplexer. The demultiplexer can be driven by a test control signal that is additionally generated besides the test control signal. The input terminal is connected to a tester channel anyway during test operation, with the result that no additional external outlay arises.

Abstract: A delay locked loop has a delay unit with a delay time that can be controlled in a manner dependent on a control signal. In order to generate complementary delayed clock signals, provision is made of switching elements, which tap off the clock signal to be delayed along the series circuit of delay elements. Each of the delay elements has a series circuit of two inverters. One of the delayed clock signals is tapped off in each case at the output of the second of the inverters of the delay elements, and the complementary output signal from the delayed output signals is tapped off at the first of the inverters. What is thus made possible is that, disregarding the frequency of the clock signal to be delayed and the length of the delay time, the complementary delayed clock signals always have the same phase angle with respect to one another.

Abstract: A current mirror circuit has an input path, which has a current source and, connected in series therewith, a first transistor circuit with at least two transistors, wherein one of the transistors can be connected in parallel with the other of the transistors. In an output path, which has a second transistor circuit with at least two transistors, one of the transistors can be connected in parallel with the other of the transistors. The control terminals of the transistors of the first and second transistor circuits can be connected to the input path. As a result, the current mirror circuit can be changed over between two operating modes with a different current requirement with comparatively short changeover times.

Abstract: A switching network with trimmable resistors lies in a control loop of a voltage generator that can be switched off from the supply voltage by a logic device. The logic device and also the switching network are driven by the same signals. The circuit configuration can be used for trimming or switching off the output voltage generated by the voltage generator during the functional test. As many settings as possible for the output voltage can be tested by a small number of control signals.

Abstract: A method and logic/memory module set the desired corrected duty cycle between the time periods of the first and second level states of at least one control/reference signal. In that, the rising time period of the rising edge and/or the fall time period of the falling edge of the control/reference signal are increased and/or decreased (i.e. changed) by a predefinable correction time period.

Abstract: A synchronous semiconductor memory containing dynamic memory cells has a delay locked loop in order to synchronize a clock signal which actuates data output drivers with an externally supplied clock signal. An updating of the delay locked loop is suppressed during a Read state of the semiconductor memory. An appropriate control signal is produced by a state machine and is supplied to the delay locked loop. The synchronization of the data output with the supplied clock signal can be achieved in a precise manner and requires only simple circuitry.

Abstract: A circuit configuration for enabling a clock signal in a manner dependent on an enable signal has first and second signal paths that are fed to a NAND gate. The second signal path contains an RS flip-flop, upstream of which NAND gates are connected, which, for their part, are connected via different inverters to the input terminals for the clock signal and the enable signal, respectively.

Abstract: A delay locked loop includes a first delay device for obtaining a fine setting and a downstream-connected second delay device for obtaining a coarse setting of the delay time. The control signals for controlling the respective delay devices are provided by synchronization latches, which receive a clock obtained by the output signal of the first delay device for obtaining the fine setting. The delay locked loop enables a linear operating behavior at a high operating frequency and is particularly suitable when a differential embodiment of the two delay devices is used.

Abstract: A delay device has multiplexers connected in series in a differential configuration. First connections of the multiplexers are connected to the output of an upstream multiplexer. Second inputs of the multiplexers are connected to the input connection to which the signal that is to be delayed can be supplied. A control signal controls the switch position of one of the multiplexers such that its output is connected to the input of the delay device. All the other multiplexers are in the other switch position. This results in the delay device producing a specific delay time. When used in a delay control loop, this results in a jitter-free output signal, even if the operating conditions are fluctuating.

Abstract: The voltage pump for generating a boosted output voltage has a switch-on control circuit. The switch-on control includes a transistor that is connected between a terminal for feeding in a supply voltage and the terminal for tapping off the boosted output voltage. After the voltage pump has started to operate, the boosted output voltage is decoupled from the supply voltage by the transistor. A changeover switch forwards the respective higher of the output voltage or supply voltage to the substrate terminal and gate terminal of the transistor. The switch-on control enables early provision of a boosted output voltage in conjunction with reliable start-up operation of the voltage pump, while the additional outlay on circuitry is minimized.

Abstract: An integrated memory is described which has a memory cell array with column lines and row lines. A row access controller serves for activating one of the row lines and for controlling a deactivation operation. An input of a control unit is connected to a signal terminal for a signal that, in the event of a read access to one of the memory cells, defines the beginning of data outputting to a point outside the memory cell array. The data output is synchronized with a clock signal. In this case, the signal is adjustable depending on an operating frequency of the memory. An output signal of the control unit serves for triggering the deactivation operation of one of the row lines after a write access. Therefore, in the event of a write access, a comparatively high data throughput is possible even at different operating frequencies of the integrated memory.

Abstract: A configuration for testing a plurality of memory chips on a wafer, in which needles are used to supply the memory chips with supply voltages, an initialization signal, a read signal, a clock signal as well as address, data and control signals. The address, data and control signals are in this case produced by a logic device disposed in an edge area of the memory chip and are supplied directly to the memory chips.

Abstract: A delay locked loop includes a delay unit with a controllable delay time. Switching elements are provided in order to tap off output signals from the delay elements of the delay unit. Two nodes connected to the switching elements are connected to a multiplexer configuration in order to activate in each case two of the switching elements that are connected to delay elements connected directly in succession. A phase interpolator generates an intermediate phase from the signals provided.

Abstract: A delay locked loop has a delay unit with a delay time that can be controlled in a manner dependent on a control signal. In order to generate complementary delayed clock signals, provision is made of switching elements, which tap off the clock signal to be delayed along the series circuit of delay elements. Each of the delay elements has a series circuit of two inverters. One of the delayed clock signals is tapped off in each case at the output of the second of the inverters of the delay elements, and the complementary output signal from the delayed output signals is tapped off at the first of the inverters. What is thus made possible is that, disregarding the frequency of the clock signal to be delayed and the length of the delay time, the complementary delayed clock signals always have the same phase angle with respect to one another.