Abstract: A test simulation circuit includes a simulated read/write head with a magnet shield and a magnetoresistive sensor exposed at a lapped surface. The test simulation circuit also includes first and second electrical test path connected respectively to the magnet shield and the magnetoresistive sensor. The second electrical test path is electrically isolated from the first electrical test path.

Abstract: Systems and methods for managing automated material handling systems, such as semiconductor fabrication facilities, using material item (e.g., wafer lot) attributes and cassette attributes are provided. A semiconductor fabrication facility typically includes multiple wafer lots and multiple cassettes for storing the wafer lots. A system and method, in one embodiment of the invention, includes setting one or more lot attributes for each wafer lot, setting one or more cassette attributes for each cassette, and selecting a particular cassette for holding a particular wafer lot based on the one or more wafer lot attributes of the particular wafer lot and the one or more cassette attributes of the particular cassette. The wafer lot and cassette attributes may, for example, include an attribute identifying a position in a fabrication sequence and one or more attributes indicative of one or more contaminants.

Abstract: A magnetic recording head has a top pole, a write gap layer, a shared pole, and conductive coils. The shared pole has an air bearing surface, a top surface substantially normal to the air bearing surface, and a recess in the top surface extending across the top surface parallel to the air bearing surface. The shared pole is separated from the top pole at the air bearing surface by the write gap layer, and directly contacts the top pole at a region of the writer distal from the air bearing surface. Wrapped around the top pole are the conductive coils, a portion of which is positioned in the recess of the shared pole between the top pole and the shared pole.

Abstract: Techniques for controlling the flow of wafer lots in a semiconductor fabrication facility having multiple storage locations and a fabrication facility employing such techniques are provided. A process and system for controlling the flow of wafer lots within a semiconductor fabrication facility, in accordance with one embodiment of the invention, includes determining a first storage location for a wafer lot, determining, prior to moving the wafer lot, an availability condition of the first storage location based on a condition level of the first storage location and a priority of the wafer lot, and storing the wafer lot in the storage location if the location is available and storing the wafer lot in an alternate location if the storage location is unavailable. The storage location may, for example, be a stocker.

Abstract: A computer controlled manufacturing arrangement and method for selecting between multiple paths for transporting cassettes between processing locations. The manufacturing arrangement includes a plurality of stockers interconnected with tracks on which cassettes are carried on vehicles. A first and second stocker are interconnected by at least a first path and a second path formed by the tracks, and a cassette can be transported from the first to the second stocker via either of the two paths. A plurality of robotic arrangements are configured to transfer cassettes between the stockers and the vehicles. A data processing system is coupled to the robotic arrangements and configured and arranged to maintain an historical record of codes indicative of periods of time expended in transporting cassettes from the first stocker to the second stocker via the first path and second path, respectively.

Abstract: A magneto-resistive sensor has a magneto-resistive element with an active area with an electrical resistance sensitive to changes in magnetic flux. Two hard magnets on opposing sides of the magneto-resistive element magnetically bias the magneto-resistive element. Each hard magnet includes a seed layer of a soft magnetic, electrically conductive material between two magnet layers of a hard magnetic, electrically conductive material laminated longitudinally together such that the seed layer and the magnet layers exhibit unified magnetic properties. The seed layer is preferably an amorphous material such as nitrided sendust. The laminated structure allows for a thicker magnet structure with low electrical resistance but without degradation of magnetic properties due to the increased thickness.

Abstract: A magnetic head comprising a substrate, a non-magnetic seed layer deposited on the substrate, a bottom magnetic core piece positioned over and contacting the non-magnetic seed layer, a magnetic seed layer, and a top magnetic core piece positioned over and contacting the magnetic seed layer.

Abstract: A read/write head includes a bottom shield and a shared shield. The shared shield includes a first domain and a plurality of closure domains. The read/write head also includes a magnetoresistive sensor deposited adjacent an air bearing surface between the bottom shield and the shared shield. The magnetoresistive sensor includes a magnetoresistor aligned with the first domain. Non-magnetic material separates the magnetoresistive sensor from the bottom shield and the shared shield. The shared shield includes a shaped feature that defines an unambiguous direction of magnetization for the first domain.

Abstract: Methods and systems for managing test wafers an automated material handling system are provided. Test material is classified into a plurality of classes. A time profile for each class of test material for a time period is determined and the test material is placed into cassettes based on the determined time profile for each class. When a request to pick up a particular group of a test material class is received, a cassette is identifying for picking up the particular group based on the contents of the cassette.

Abstract: A test simulation circuit includes a simulated read/write head with a magnet shield and a magnetoresistive sensor exposed at a lapped surface. The test simulation circuit also includes first and second electrical test path connected respectively to the magnet shield and the magnetoresistive sensor. The second electrical test path is electrically isolated from the first electrical test path.

Abstract: A method for pre-positioning routed material in a computer controlled manufacturing arrangement having alternate locations for predetermined ones of a plurality of manufacturing process steps and predetermined types of materials to be routed into alternate locations. The method includes establishing a distribution of events indicative of the alternate locations at which material is processed for a manufacturing process step with respect to the materials to be routed and documenting the distribution of events in a database with respect to the type of materials to be routed and the alternate locations in terms of routing times, therein establishing a historical routing time for the type of material to be routed. In addition, there is established the actual mix of materials to be routed to the alternate locations and their historical routing time and actual routing time for the type of routed material are compared.

Abstract: An improved magnetoresistive read sensor (100) and a method of fabricating magnetoresistive read sensor (100) that eliminates film removal is disclosed. The magnetoresistive sensor (100) is formed by positioning a first mask (128) on a gap layer (104) split into three regions due to subsequent layers. A first mask (128) is positioned on the central region of the gap layer (104) and a first hard-biasing material (106) is deposited onto the outside regions of the gap layer (104). The first mask (128) is removed and a magnetoresistive element (116) is deposited onto the outside regions of the first hard-biasing material (106) and the central region of gap layer (104), thereby forming an active region (122), a first passive region (124) and a second passive region (126) of the magnetoresistive sensor (100). A spacer layer (118) is deposited onto the magnetoresistive element (116) in all three regions and a soft adjacent layer (120) is deposited onto the spacer layer (118) in all three regions.

Abstract: An improved magnetoresistive read sensor (100) and a method of fabricating magnetoresistive read sensor (100) that eliminates film removal is disclosed. The magnetoresistive sensor (100) is formed by positioning a first mask (128) on a gap layer (104) split into three regions due to subsequent layers. A first mask (128) is positioned on the central region of the gap layer (104) and a first hard-biasing material (106) is deposited onto the outside regions of the gap layer (104). The first mask (128) is removed and a magnetoresistive element (116) is deposited onto the outside regions of the first hard-biasing material (106) and the central region of gap layer (104), thereby forming an active region (122), a first passive region (124) and a second passive region (126) of the magnetoresistive sensor (100). A spacer layer (118) is deposited onto the magnetoresistive element (116) in all three regions and a soft adjacent layer (120) is deposited onto the spacer layer (118) in all three regions.

Abstract: A magneto-resistive sensor has a magneto-resistive element with an active area with an electrical resistance sensitive to changes in magnetic flux. Two hard magnets on opposing sides of the magneto-resistive element magnetically bias the magneto-resistive element. Each hard magnet includes a seed layer of a soft magnetic, electrically conductive material between two magnet layers of a hard magnetic, electrically conductive material laminated longitudinally together such that the seed layer and the magnet layers exhibit unified magnetic properties. The seed layer is preferably an amorphous material such as nitrided sendust. The laminated structure allows for a thicker magnet structure with low electrical resistance but without degradation of magnetic properties due to the increased thickness.

Abstract: A microactuator for radially positioning a transducing head over a selected radial track of a rotatable disc in a disc drive system having a flexure to support a slider carrying the transducing head includes a stator operatively attached to the flexure. First and second pole pieces are substantially parallel to and spaced from each other, each having first and second ends. A via magnetically connects the first and second pole pieces. The first and second pole pieces are shaped so that a first gap between the first end of the first pole piece and the first end of the second pole piece is smaller than a second gap between the second end of the first pole piece and the second end of the second pole piece. A plurality of coils are wrapped around the stator. A rotor confronts the second end of the first pole piece and the second end of the second pole piece.

Abstract: A probabilistic dispatching method and arrangement for directing the movement of wafers in a manufacturing process. In a manufacturing process, some process steps may be performed by tools at alternate locations. Delivery of the material from one manufacturing process step to the next occurs via a rail for transporting the material and stockers for holding the material until the processing can commence. While awaiting processing, material may be moved from one stocker to a stocker at an alternate location and then removed for processing. A distribution of removal events is maintained for process steps having alternate locations, wherein a removal event refers to removal of material from a stocker for processing. When material is returned to a stocker for delivery to another stocker to await a subsequent processing step, the other stocker is identified as a function of the distribution of removal events for the subsequent processing step.

Abstract: A computer controlled manufacturing arrangement and method for selecting between multiple paths for transporting cassettes between processing locations. The manufacturing arrangement includes a plurality of stockers interconnected with tracks on which cassettes are carried on vehicles. A first and second stocker are interconnected by at least a first path and a second path formed by the tracks, and a cassette can be transported from the first to the second stocker via either of the two paths. A plurality of robotic arrangements are configured to transfer cassettes between the stockers and the vehicles. A data processing system is coupled to the robotic arrangements and configured and arranged to maintain an historical record of codes indicative of periods of time expended in transporting cassettes from the first stocker to the second stocker via the first path and second path, respectively.

Abstract: A reticle sorter and a semiconductor fabrication facility employing one or more reticle sorters is provided. The reticle sorter(s) generally lies between a reticle storage system and a group of one or more photolithography exposure tools (e.g., steppers) and is configured for sorting reticles in one or more cassettes. The use of the reticle sorter provides sorting functionality apart from the reticle storage system and typically closer to the group of photolithography steppers with which it is associated. This can, for example, significantly increase the throughput of semiconductor wafers through the associated photolithography exposure tools as well as in the semiconductor fabrication plant as a whole.

Abstract: An apparatus comprising a magnetic head suspension assembly (10) comprised of a rectangular portion (12), load beam (14) and flexure (16) fabricated from a silicon structure using the etching techniques of the integrated circuit fabrication industry. The magnetic head suspension assembly (10) has electrical leads (23) to a slider, a pre-amp circuit (25) and a microactuator (27) fabricated directly thereon. A system of providing a loading force passing to slider (50) comprises either a tapered base plate (40) adapted to be held by a horizontally oriented actuator arm or an actuator arm (60) having at least one angled receiving surface (62,64) for attachment to said suspension assembly.

Abstract: An MR sensor includes an MR layer and permanent magnets defining an active area on the MR layer. A bi-layer test structure is fabricated with a permanent magnet layer deposited on a substrate and an MR layer deposited on the permanent magnet layer. If desired, a SAL may be deposited prior to deposition of the permanent magnet layer. A DC magnetic field is applied to the bi-layer test structure, and the strength of the DC magnetic field is varied. During application of the DC magnetic field, the magnetic response of the bi-layer test structure is measured to determine a hysteresis loop of the bi-layer structure. The exchange coupling between the permanent magnet layer and the MR layer is characterized by a point of inflection identified on the measured hysteresis loop.