Abstract: System for testing memory associated with a set of check bits in an EDC system. The circuitry of the invention includes an EDC circuit; multiplexers; and a memory with first storage bits, second storage bits, and third storage bits. In writing data to the memory, a multi-bit data word having a first group of data bits and a second group of data bits is first received from a CPU bus. The first group of bits is written to the first storage bits. In a "normal" mode, the second group of bits is written to the second storage bits. A set of check bits are calculated by the EDC circuit and written to the third storage bits. In the "swap" mode, the second group of data bits is stored in the third storage bits. "Alternate" bits are calculated by the EDC circuit, and written to the second storage bits. In memory reads, contents of all of the storage bits are received from the memory and directed to the error detecting circuit. The contents of the first storage bits are directed to error correction circuit.

Abstract: A method and apparatus for a read-modify-write operation in a digital computer memory system that reduces memory data path buffer storage requirements. The method latches new write data and associated mask fields into a data output buffer and then uses the latched mask fields to merge read data with the new data in the output buffer. The mask fields determine which portion of the read data is to be replaced with new data. Appropriate check bits for an error correction code (ECC) are generated and added to the modified data in the output buffer to produce a new data output which is released from the output buffer into the memory at the selected address.

Abstract: A memory testing system for an electronic computing system includes multiple memory modules, each equipped with error detecting and correcting (EDC) circuitry, and is operable in a diagnostic test mode wherein read and write tests of the modules are performed in parallel. Each module includes a command/status register (CSR), used in identifying errors occurring in that module by capturing various signals at the time of the error. These signals include the type of error, the memory address involved in the error, the check bits of the data associated with the error, and the syndromes of the data. After pre-setting each CSR's diagnostic register, one module operates in a "target" mode, and the remaining modules operate in a "shadow" mode. The target module operates normally during read and write operations. When the target module is directed to write data to a particular address, the shadow modules write the same data to corresponding addresses in their memory banks.

Abstract: An algorithm, and methodology for its application, useful in digital computer systems incorporating read-modify-write data storage systems to accurately identify rewritten data which has been determined bad before being rewritten.

Abstract: A method and apparatus for a read-modify-write operation in a digital computer memory system which reduces memory data path buffer storage requirements with a procedure which includes latching new write data and associated mask fields into a data output buffer and then merging read data with the new data in the output buffer according to the latched mask fields.