Abstract: Devices for X-ray topography determine structures and compositions of objects. In accordance with an embodiment of the invention, a scanning system forms images using small angle scattering. A spatial filter selects radiation an object scatters at small angles and blocks other radiation. A coordinate-sensitive detector behind the filter records the scattered radiation. An object image is constructed based on the small-angle scattering information and the compositions of regions of the object are determined from scattering curves for the regions. One embodiment of the invention includes a source of penetrating radiation, a detector system for radiation transmitted through an analyzed object, a detector system for radiation the object scatters at small angles, and a unit for moving the object during scanning. A three-dimensional absorption factor distribution is determined for the object by X-raying the object at different angles.

Abstract: The present invention provides dyes of formula I-XXXIV, described in detail below, and dichroic light polarizers based on the dyes. In the dichroic light polarizers of this invention the dye molecules are aggregated into particles oriented in a predetermined direction on a surface of a substrate to enable the dye to polarize light transmitted through the dye. In another embodiment, a dichroic light polarizer includes a molecularly oriented layer of an organic dye on a surface of a substrate. The layer has a non-periodic arrangement of different polarizing elements. Each of the polarizing elements have differing orientations of the polarization vector in the substrate plane and/or differing colors. The dichroic light polarizer may contain one or more additional dye layers and may have a transparent layer intermediate to the dye layer.

Abstract: A method of nondestructive investigation of the internal structure of an object uses deflected penetrating radiation. In one embodiment, an incident penetrating radiation flow 4 with angular divergence restricted by a collimator 3 passes through an object 5 to create the a radiation flow 6 registered by a direction-selective detector 10. Typically, the directivity pattern of detector 10 selects a desired angle and has a width no larger than twice the local angular divergence of the incident penetrating radiation flow 4. The desired angle can be the maxima of a scattering pattern for a substance suspected of being in object 5. To improve the quality and range of measurements, the local restrictions of radiation flow 4 is fulfilled in the two intersecting planes; and detector 10 and/or incident radiation flow 4 can be swept through a range of orientations to detect radiation deflected at a range of angles larger than the directivity pattern detector 10 has when fixed.

Abstract: A method and device for examining the internal structure of an object uses diffracted X-rays or other penetrating radiation. In one embodiment, spatial filters proximate to a source of radiation transmit an array of divergent pixel-beams which irradiate an object being examined. The object absorbs, refracts, diffracts, and incoherently scatters radiation from the pixel-beams. Spatial filters proximate to a detector block undeflected and refracted radiation which exits the object. The detector separately measures diffracted radiation for each pixel-beam. For example, an integral of the diffracted intensity around a pixel-beam provides a pixel intensity in an image of the object. Alternatively, analyzing the intensity in a diffraction pattern around a pixel-beam can identify structures and materials within the object. A non-invasive procedure identifies abnormal tissue by measuring radiation diffracted at an angle characteristic of the diffraction pattern for abnormal tissue.