Abstract: A hot spot defect detecting method and a hot spot defect detecting system are provided. In the method, hot spots are extracted from a design of a semiconductor product to define a hot spot map comprising hot spot groups, wherein local patterns in a same context of the design yielding a same image content are defined as a same hot spot group. During runtime, defect images obtained by an inspection tool performing hot scans on a wafer manufactured with the design are acquired and the hot spot map is aligned to each defect image to locate the hot spot groups. The hot spot defects in each defect image are detected by dynamically mapping the hot spot groups located in each defect image to a plurality of threshold regions and respectively performing automatic thresholding on pixel values of the hot spots of each hot spot group in the corresponding threshold region.

Abstract: An upper for an article of footwear is configured to be connected to a sole structure and is configured to receive a foot. The upper includes a knitted component having a strobel portion that is configured to be disposed underneath the foot. The strobel portion defines an interior surface and an exterior surface of the knitted component. The strobel portion defines a strobel passage between the interior surface and the exterior surface. Also, the upper includes a tensile strand that extends through the strobel passage.

Abstract: The embodiments described herein are directed to a method for reducing fin oxidation during the formation of fin isolation regions. The method includes providing a semiconductor substrate with an n-doped region and a p-doped region formed on a top portion of the semiconductor substrate; epitaxially growing a first layer on the p-doped region; epitaxially growing a second layer different from the first layer on the n-doped region; epitaxially growing a third layer on top surfaces of the first and second layers, where the third layer is thinner than the first and second layers. The method further includes etching the first, second, and third layers to form fin structures on the semiconductor substrate and forming an isolation region between the fin structures.

Abstract: The embodiments described herein are directed to a method for reducing fin oxidation during the formation of fin isolation regions. The method includes providing a semiconductor substrate with an n-doped region and a p-doped region formed on a top portion of the semiconductor substrate; epitaxially growing a first layer on the p-doped region; epitaxially growing a second layer different from the first layer on the n-doped region; epitaxially growing a third layer on top surfaces of the first and second layers, where the third layer is thinner than the first and second layers. The method further includes etching the first, second, and third layers to form fin structures on the semiconductor substrate and forming an isolation region between the fin structures.

Abstract: A physiological signal measurement device is disclosed. In some implementations, the physiological signal measurement device includes a fixing element, a rack, a first sensor, and a second sensor. The fixing element is configured to be fixed on a limb of a user. The rack is configured to engage the fixing element and includes a first end and a second end distal to the first end. The first sensor is disposed on the first end of the rack. The sensor is disposed on the second end of the rack. The first end of the rack has a first stiffness, the second end of the rack has a second stiffness, and the first stiffness is higher than the second stiffness.

Abstract: A memory device is provided, including a memory array, a driver circuit, and recover circuit. The memory array includes multiple memory cells. Each memory cell is coupled to a control line, a data line, and a source line and, during a normal operation, is configured to receive first and second voltage signals. The driver circuit is configured to output at least one of the first voltage signal or the second voltage signal to the memory cells. The recover circuit is configured to output, during a recover operation, a third voltage signal, through the driver circuit to at least one of the memory cells. The third voltage signal is configured to have a first voltage level that is higher than a highest level of the first voltage signal or the second voltage signal, or lower than a lowest level of the first voltage signal or the second voltage signal.

Abstract: A wireless sound output device includes a wireless earbud and a charging base. The wireless earbud is placed in the charging base. If a true wireless stereo Bluetooth controller of the wireless earbud detects that a mode switching circuit of the charging base is switched to a wireless Bluetooth receiver mode, an analog signal is transmitted to an audio source output hole of the charging base through an audio source analog signal output switching unit of the wireless earbud.

Abstract: A wireless sound output device includes a wireless earbud and a charging base. The wireless earbud is placed in the charging base. If a true wireless stereo Bluetooth controller of the wireless earbud detects that a mode switching circuit of the charging base is switched to a wireless Bluetooth receiver mode, an analog signal is transmitted to an audio source output hole of the charging base through an audio source analog signal output switching unit of the wireless earbud.

Abstract: An externally-connected shop floor control (SFC) system comprising M shop floor control (SFC) devices is disclosed. By letting each of the M SFC devices be electrically connected between one test machine and one information read-out device, the SFC system is successfully implemented into a production line. Therefore, each of the M SFC devices is adopted to achieve a re-verification of pass record for a test object that is transferred from a previous-stage test machine, and is also adopted for collecting related test data of the test object transferred from a current-stage test machine. As such, the SFC system can be easily implemented into any one type of production line, so as to assist the manager of the production line in data collection, station passing control, manufacturing reports, and control of production efficiency and yield, without spending much cost of human resources and software/firmware developing.

Abstract: An electronic scale calibrating method for an electronic scale is provided. The electronic scale includes a weighing pan, a memory unit, a first weight sensor and a second weight sensor. The weighing pan has a placement region. The first weight sensor and the second weight sensor are symmetric with respect to the placement region. Firstly, two standard samples are placed in the placement region simultaneously. Then, the first weight sensor and the second weight sensor sense the two standard samples to obtain a first read value and a second read value, respectively. Then, a first parameter, a second parameter, a first calibration coefficient and a second calibration coefficient are defined according to the first read value and the second read value. Then, a calibration formula is generated and stored in the memory unit.

Abstract: Disclosures of the present invention describe a method for calibrating laser power. During a laser power calibration of a laser optics product, reference intensity data and reference power data are adopted for generating a reference trend line with a R2 value that is equal to 1. As such, real intensity data that have a residual value smaller than a threshold value are adopted for generating a first trend line in combination with real power data. Moreover, the real intensity data that have a residual value greater than the threshold value are utilized for generating a second trend line in combination with corresponding real power data. Consequently, under an assistance of a predict trend line constituted by the first trend line and the second trend line, the laser power calibration is therefore completed after the laser optics product successively emits a laser beam by a few times.

Abstract: Disclosures of the present invention describe an independent inputting device with self-learning function. During a user inputting a vocabulary word and/or a sentence, this independent inputting device can forecast what vocabulary word is that the user desires to input in case of a number of inputted letters of the vocabulary word reaching a threshold integer (?N). Consequently, this independent inputting device automatically completes the inputting of those un-inputted letters of the vocabulary word, such that the user does no longer continue the inputting of those un-inputted letters of the vocabulary word. As such, when the user adopts one input method to edit a program code, write an article or a letter, or make statistical forms, inputting speed of the typed vocabulary words can be apparently increased by this independent inputting device, thereby largely enhancing the user's work efficiency.

Abstract: A method for communicating with an under-test object and a communicating system are provided. The method includes the following steps. A command signal is provided from a processing unit of the communicating system to the under-test object, and the processing unit waits for receiving a response signal from the under-test object. If the response signal from the under-test object 5 has not been received by the processing unit for a predetermined waiting time period, the command signal is provided to the under-test object again and the predetermined waiting time period is adjusted. There is an exponential relation between the predetermined waiting time period and the number of times the command signal is provided to the under-test object.

Abstract: A camera module testing method is applied to a camera module including a camera lens and a photosensitive element. In a step (A), an original image is captured through the camera lens and the photosensitive element. In a step (B), the original image is converted into a gray scale image. In a step (C), the gray scale image is converted into a binary image according to a critical gray scale value. In a step (D), a boundary contour is obtained according to plural pixels of the binary image higher than or equal to the critical gray scale value. In a step (E), a contour center of the boundary contour is obtained. Then, a step (F) is performed to judge whether an optical axis of the camera lens is aligned with an imaging center of the photosensitive element according to the imaging center and the contour center.

Abstract: An information management method for a testing network framework is provided. The testing network framework includes a first server and at least one computer. The method includes the following steps. Firstly, the at least one computer downloads and executes a test application program. Then, the at least one computer is connected to the first server, and provides a device identification code and a network address value of the at least one computer to the first server. If the first server judges that the corresponding device identification code complies with a first default condition and the corresponding network address value complies with a second default condition, the corresponding computer is authenticated, and a test setting information is provided from the first server to the corresponding computer. After the test setting information is downloaded to the corresponding computer, a test process is performed.

Abstract: An electronic scale calibrating method for an electronic scale is provided. The electronic scale includes a weighing pan, a memory unit, a first weight sensor and a second weight sensor. The weighing pan has a placement region. The first weight sensor and the second weight sensor are symmetric with respect to the placement region. Firstly, two standard samples are placed in the placement region simultaneously. Then, the first weight sensor and the second weight sensor sense the two standard samples to obtain a first read value and a second read value, respectively. Then, a first parameter, a second parameter, a first calibration coefficient and a second calibration coefficient are defined according to the first read value and the second read value. Then, a calibration formula is generated and stored in the memory unit.

Abstract: A camera module testing method is applied to a camera module including a camera lens and a photosensitive element. In a step (A), an original image is captured through the camera lens and the photosensitive element. In a step (B), the original image is converted into a gray scale image. In a step (C), the gray scale image is converted into a binary image according to a critical gray scale value. In a step (D), a boundary contour is obtained according to plural pixels of the binary image higher than or equal to the critical gray scale value. In a step (E), a contour center of the boundary contour is obtained. Then, a step (F) is performed to judge whether an optical axis of the camera lens is aligned with an imaging center of the photosensitive element according to the imaging center and the contour center.

Abstract: A product testing system and an auxiliary testing method are provided. The product testing system includes a computer and a test fixture. The computer has a machine learning model. The auxiliary testing method includes the following steps. Firstly, the test fixture tests the plural under-test products sequentially, and generates corresponding test data to the computer. Then, the computer generates plural trend line graphs corresponding to the test data. Then, the operator determines corresponding human judging results according to the trend line graphs. The test data, the trend line graphs and the human judging results are inputted into the machine learning model, and a learning process is performed. If the number of samples reaches a predetermined threshold value, the machine learning model generates auxiliary judging results according to the corresponding test data and the corresponding trend line graphs.

Abstract: A circuit board testing system includes a testing fixture. The testing fixture is used for testing plural wires of a cable of a circuit board. The testing fixture includes a first contact element, a switch circuit, a second contact element, a voltage acquisition element and a control unit. The first contact element is connected with input terminals of the plural wires. The second contact element is connected with output terminals of the plural wires. When the control unit drives a switching action of the switch circuit, a testing voltage is provided to the odd-numbered wires or the even-numbered wires. The control unit reads the voltage values of the odd-numbered wires and the voltage values of the even-numbered wires from the voltage acquisition element so as to judge whether the plural wires of the cable are normal.