Patents by Inventor Pei-Ming Chang

Pei-Ming Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200266274
    Abstract: A semiconductor device includes an epitaxial straining region formed within a semiconductor substrate, the straining region being positioned adjacent to a gate stack, the gate stack being positioned above a channel. The straining region comprises a defect comprising two crossing dislocations such that a cross-point of the dislocations is closer to a bottom of the straining region than to a top of the straining region. The straining region comprises an element with a smaller lattice constant than a material forming the substrate.
    Type: Application
    Filed: May 4, 2020
    Publication date: August 20, 2020
    Inventors: Hsiu-Ting Chen, Yi-Ming Huang, Shih-Chieh Chang, Hsing-Chi Chen, Pei-Ren Jeng
  • Patent number: 10750068
    Abstract: A camera module testing method is applied to a camera module including a camera lens and a photosensitive element. In a step (A), an original image is captured through the camera lens and the photosensitive element. In a step (B), the original image is converted into a gray scale image. In a step (C), the gray scale image is converted into a binary image according to a critical gray scale value. In a step (D), a boundary contour is obtained according to plural pixels of the binary image higher than or equal to the critical gray scale value. In a step (E), a contour center of the boundary contour is obtained. Then, a step (F) is performed to judge whether an optical axis of the camera lens is aligned with an imaging center of the photosensitive element according to the imaging center and the contour center.
    Type: Grant
    Filed: February 26, 2019
    Date of Patent: August 18, 2020
    Assignee: PRIMAX ELECTRONICS LTD.
    Inventors: Pei-Ming Chang, Pao-Chung Chao, Shih-Chieh Hsu, Wei-Lung Huang
  • Publication number: 20200243714
    Abstract: A light-emitting device, includes: a substrate, including a base with a main surface; and a plurality of protrusions on the main surface, wherein the protrusion and the base include different materials; and a semiconductor stack on the main surface, including a side wall, and wherein an included angle between the side wall and the main surface is an obtuse angle; wherein the main surface includes a peripheral area surrounding the semiconductor stack, and the peripheral area is devoid of the protrusion formed thereon.
    Type: Application
    Filed: January 22, 2020
    Publication date: July 30, 2020
    Inventors: Li-Ming CHANG, Tzung-Shiun YEH, Chien-Fu SHEN, Wen-Hsiang LIN, Pei-Chi CHIANG, Yi-Wen KU
  • Patent number: 10725898
    Abstract: An information management method for a testing network framework is provided. The testing network framework includes a first server and at least one computer. The method includes the following steps. Firstly, the at least one computer downloads and executes a test application program. Then, the at least one computer is connected to the first server, and provides a device identification code and a network address value of the at least one computer to the first server. If the first server judges that the corresponding device identification code complies with a first default condition and the corresponding network address value complies with a second default condition, the corresponding computer is authenticated, and a test setting information is provided from the first server to the corresponding computer. After the test setting information is downloaded to the corresponding computer, a test process is performed.
    Type: Grant
    Filed: May 29, 2018
    Date of Patent: July 28, 2020
    Assignee: PRIMAX ELECTRONICS LTD
    Inventors: Pei-Ming Chang, Pao-Chung Chao, Shih-Chieh Hsu
  • Publication number: 20200217710
    Abstract: An electronic scale calibrating method for an electronic scale is provided. The electronic scale includes a weighing pan, a memory unit, a first weight sensor and a second weight sensor. The weighing pan has a placement region. The first weight sensor and the second weight sensor are symmetric with respect to the placement region. Firstly, two standard samples are placed in the placement region simultaneously. Then, the first weight sensor and the second weight sensor sense the two standard samples to obtain a first read value and a second read value, respectively. Then, a first parameter, a second parameter, a first calibration coefficient and a second calibration coefficient are defined according to the first read value and the second read value. Then, a calibration formula is generated and stored in the memory unit.
    Type: Application
    Filed: April 25, 2019
    Publication date: July 9, 2020
    Inventors: Pei-Ming Chang, Wen-Chih Shen
  • Publication number: 20200186789
    Abstract: A camera module testing method is applied to a camera module including a camera lens and a photosensitive element. In a step (A), an original image is captured through the camera lens and the photosensitive element. In a step (B), the original image is converted into a gray scale image. In a step (C), the gray scale image is converted into a binary image according to a critical gray scale value. In a step (D), a boundary contour is obtained according to plural pixels of the binary image higher than or equal to the critical gray scale value. In a step (E), a contour center of the boundary contour is obtained. Then, a step (F) is performed to judge whether an optical axis of the camera lens is aligned with an imaging center of the photosensitive element according to the imaging center and the contour center.
    Type: Application
    Filed: February 26, 2019
    Publication date: June 11, 2020
    Inventors: Pei-Ming Chang, Pao-Chung Chao, Shih-Chieh Hsu, Wei-Lung Huang
  • Publication number: 20200156078
    Abstract: Provided is a heating mechanism for a biochemical reaction device, including: a heat-conducting body including: at least one accommodating groove each including a chamber and an opening communicating with the chamber; a clamping hole, in communication with the opening and for inserting a reaction tube; and at least one heat-conducting block, movably disposed in the chamber and having one end connected with an elastic element and another opposite end provided with an abutting portion, the elastic element enabling the abutting portion of the heat-conducting block to protrude from the opening and locate in the clamping hole; and a temperature control element connected to the heat-conducting body for heating and regulating a temperature of the heat-conducting block.
    Type: Application
    Filed: September 19, 2017
    Publication date: May 21, 2020
    Applicant: GENEREACH BIOTECHNOLOGY CORP.
    Inventors: Chun-Ming LEE, Ching-Ko LIN, Yun-Lung TSAI, Pei-Yu LEE, Chen SU, Hsiao-Fen CHANG, Fu-Chun LI
  • Patent number: 10644116
    Abstract: A method includes forming a recess in a semiconductor substrate, the recess being adjacent to a gate stack, performing an epitaxial growth process within the recess to form a straining region, and forming a defect within the straining region in-situ with the epitaxial growth process.
    Type: Grant
    Filed: February 6, 2014
    Date of Patent: May 5, 2020
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Hsiu-Ting Chen, Yi-Ming Huang, Shih-Chieh Chang, Hsing-Chi Chen, Pei-Ren Jeng
  • Publication number: 20200019853
    Abstract: A product testing system and an auxiliary testing method are provided. The product testing system includes a computer and a test fixture. The computer has a machine learning model. The auxiliary testing method includes the following steps. Firstly, the test fixture tests the plural under-test products sequentially, and generates corresponding test data to the computer. Then, the computer generates plural trend line graphs corresponding to the test data. Then, the operator determines corresponding human judging results according to the trend line graphs. The test data, the trend line graphs and the human judging results are inputted into the machine learning model, and a learning process is performed. If the number of samples reaches a predetermined threshold value, the machine learning model generates auxiliary judging results according to the corresponding test data and the corresponding trend line graphs.
    Type: Application
    Filed: November 15, 2018
    Publication date: January 16, 2020
    Inventors: Shih-Chieh Hsu, Pei-Ming Chang, Pao-Chung Chao, Wei-Lung Huang
  • Patent number: 10502776
    Abstract: A circuit board testing system includes a testing fixture. The testing fixture is used for testing plural wires of a cable of a circuit board. The testing fixture includes a first contact element, a switch circuit, a second contact element, a voltage acquisition element and a control unit. The first contact element is connected with input terminals of the plural wires. The second contact element is connected with output terminals of the plural wires. When the control unit drives a switching action of the switch circuit, a testing voltage is provided to the odd-numbered wires or the even-numbered wires. The control unit reads the voltage values of the odd-numbered wires and the voltage values of the even-numbered wires from the voltage acquisition element so as to judge whether the plural wires of the cable are normal.
    Type: Grant
    Filed: April 12, 2018
    Date of Patent: December 10, 2019
    Assignee: PRIMAX ELECTRONICS LTD.
    Inventors: Pei-Ming Chang, Yang-Te Chung
  • Publication number: 20190331709
    Abstract: A sensor testing system includes a standard unit and a test fixture. The standard unit and plural under-test sensors are placed on a test platform of the test fixture. A sensor testing method includes following steps. Firstly, the standard unit and the plural under-test sensors are arranged to generate a main process. Then, the standard unit and the plural under-test sensors are assigned to generate plural sub-threads according to the main process. When the main process is executed, the plural sub-threads are synchronously executed. Then, the test platform is enabled to create a motion in a first direction, and the main process waits for a predetermined time period. Then, the standard unit and the under-test sensors sense the motion in the first direction. When the sensing results are generated, the standard unit and the under-test sensors respond to the main process.
    Type: Application
    Filed: July 25, 2018
    Publication date: October 31, 2019
    Inventors: Pei-Ming Chang, Pao-Chung Chao, Shih-Chieh Hsu
  • Publication number: 20190318471
    Abstract: A hot spot defect detecting method and a hot spot defect detecting system are provided. In the method, hot spots are extracted from a design of a semiconductor product to define a hot spot map comprising hot spot groups, wherein local patterns in a same context of the design yielding a same image content are defined as a same hot spot group. During runtime, defect images obtained by an inspection tool performing hot scans on a wafer manufactured with the design are acquired and the hot spot map is aligned to each defect image to locate the hot spot groups. The hot spot defects in each defect image are detected by dynamically mapping the hot spot groups located in each defect image to a plurality of threshold regions and respectively performing automatic thresholding on pixel values of the hot spots of each hot spot group in the corresponding threshold region.
    Type: Application
    Filed: August 29, 2018
    Publication date: October 17, 2019
    Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Chien-Huei Chen, Pei-Chao Su, Xiaomeng Chen, Chan-Ming Chang, Shih-Yung Chen, Hung-Yi Chung, Kuang-Shing Chen, Li-Jou Lee, Yung-Cheng Lin, Wei-Chen Wu, Shih-Chang Wang, Chien-An Lin
  • Patent number: 10383906
    Abstract: A method for treating skin diseases, wherein a composition having an effective amount of mangosteen rind extract is administered.
    Type: Grant
    Filed: July 21, 2016
    Date of Patent: August 20, 2019
    Assignee: XANTHO BIOTECHNOLOGY CO., LTD.
    Inventors: Jia-Ming Chang, Pei-Yi Tsai, Ku-Cheng Chen
  • Publication number: 20190251021
    Abstract: An information management method for a testing network framework is provided. The testing network framework includes a first server and at least one computer. The method includes the following steps. Firstly, the at least one computer downloads and executes a test application program. Then, the at least one computer is connected to the first server, and provides a device identification code and a network address value of the at least one computer to the first server. If the first server judges that the corresponding device identification code complies with a first default condition and the corresponding network address value complies with a second default condition, the corresponding computer is authenticated, and a test setting information is provided from the first server to the corresponding computer. After the test setting information is downloaded to the corresponding computer, a test process is performed.
    Type: Application
    Filed: May 29, 2018
    Publication date: August 15, 2019
    Inventors: Pei-Ming Chang, Pao-Chung Chao, Shih-Chieh Hsu
  • Patent number: 10338978
    Abstract: An electronic device test system and method detects a memory serial number of an electronic device. The electronic device test system includes a Macintosh system computer, configured to execute a serial number detection program to detect the memory serial number of the electronic device; and a Windows system computer, configured to execute a serial number comparison program to compare whether the memory serial number of the electronic device satisfies a coding rule. The Macintosh system computer transmits the memory serial number to the Windows system computer by means of an RS232 interface for printing.
    Type: Grant
    Filed: April 21, 2017
    Date of Patent: July 2, 2019
    Assignee: PRIMAX ELECTRONICS LTD.
    Inventors: Pei-Ming Chang, Shih-Chieh Hsu
  • Publication number: 20190187203
    Abstract: A circuit board testing system includes a testing fixture. The testing fixture is used for testing plural wires of a cable of a circuit board. The testing fixture includes a first contact element, a switch circuit, a second contact element, a voltage acquisition element and a control unit. The first contact element is connected with input terminals of the plural wires. The second contact element is connected with output terminals of the plural wires. When the control unit drives a switching action of the switch circuit, a testing voltage is provided to the odd-numbered wires or the even-numbered wires. The control unit reads the voltage values of the odd-numbered wires and the voltage values of the even-numbered wires from the voltage acquisition element so as to judge whether the plural wires of the cable are normal.
    Type: Application
    Filed: April 12, 2018
    Publication date: June 20, 2019
    Inventors: Pei-Ming Chang, Yang-Te Chung
  • Publication number: 20190171776
    Abstract: A parameter optimization method includes: a parameter search is performed on an input parameter, an output response value and a target value through a plurality of optimization schemes to search for a plurality of candidate recommended parameters. Each optimization scheme is assigned to a weight value according to user historical decision information. At least one recommended parameter is selected from the candidate recommended parameters according to the weight values. An user interface is provided for a user to input a decision instruction. A new input parameter is selected from the at least one recommended parameter according to the decision instruction; the new input parameter is inputted into the target system; and a new output response value is evaluated whether meets a specification condition. The user historical decision information is updated based on the decision instruction to adjust the weight values.
    Type: Application
    Filed: December 28, 2017
    Publication date: June 6, 2019
    Inventors: Po-Yu HUANG, Hong-Chi KU, Sen-Chia CHANG, Te-Ming CHEN, Pei-Yi LO
  • Patent number: 10248519
    Abstract: The present invention provides an input device test system, configured to test an input device having a plurality of functional elements. The input device test system includes: a test host, configured to execute a test program and a message interception program, and output a test message by means of the test program; and a test platform, configured to receive the test message and operate the input device according to the test message, where the input device outputs a response message to the test host in response to the operation, where the message interception program is used to intercept the response message and convert the response message into at least one code, and the test program determines whether the at least one code is consistent with the test message.
    Type: Grant
    Filed: February 15, 2017
    Date of Patent: April 2, 2019
    Assignee: PRIMAX ELECTRONICS LTD.
    Inventor: Pei-Ming Chang
  • Patent number: 10234481
    Abstract: A detection data storage device includes a detection probe, an inspection instrument, a processor and a storage controller. The processor includes a software component. The storage controller includes a key and a prompt lamp. When a circuit is detected by the detection probe, a detection signal is generated. After the detection signal is received by the inspection instrument, a detection data is generated and transmitted to the software component of the processor. If the software component judges that the detection data matches a standard value, the software components issues a prompt signal to the prompt lamp of the storage controller. In response to the prompt signal, the prompt lamp emits a light beam. After the light beam from the prompt lamp is received by the user and the key is pressed, the detection data is stored in a storage unit.
    Type: Grant
    Filed: April 21, 2017
    Date of Patent: March 19, 2019
    Assignee: PRIMAX ELECTRONICS LTD.
    Inventor: Pei-Ming Chang
  • Patent number: D876673
    Type: Grant
    Filed: October 9, 2017
    Date of Patent: February 25, 2020
    Inventors: Chia-Ming Chang, Chi-Hui Chang, Pei-Chia Hsu