Abstract: A sensor testing system includes a standard unit and a test fixture. The standard unit and plural under-test sensors are placed on a test platform of the test fixture. A sensor testing method includes following steps. Firstly, the standard unit and the plural under-test sensors are arranged to generate a main process. Then, the standard unit and the plural under-test sensors are assigned to generate plural sub-threads according to the main process. When the main process is executed, the plural sub-threads are synchronously executed. Then, the test platform is enabled to create a motion in a first direction, and the main process waits for a predetermined time period. Then, the standard unit and the under-test sensors sense the motion in the first direction. When the sensing results are generated, the standard unit and the under-test sensors respond to the main process.

Abstract: An information management method for a testing network framework is provided. The testing network framework includes a first server and at least one computer. The method includes the following steps. Firstly, the at least one computer downloads and executes a test application program. Then, the at least one computer is connected to the first server, and provides a device identification code and a network address value of the at least one computer to the first server. If the first server judges that the corresponding device identification code complies with a first default condition and the corresponding network address value complies with a second default condition, the corresponding computer is authenticated, and a test setting information is provided from the first server to the corresponding computer. After the test setting information is downloaded to the corresponding computer, a test process is performed.

Abstract: An electronic device test system and method detects a memory serial number of an electronic device. The electronic device test system includes a Macintosh system computer, configured to execute a serial number detection program to detect the memory serial number of the electronic device; and a Windows system computer, configured to execute a serial number comparison program to compare whether the memory serial number of the electronic device satisfies a coding rule. The Macintosh system computer transmits the memory serial number to the Windows system computer by means of an RS232 interface for printing.

Abstract: A circuit board testing system includes a testing fixture. The testing fixture is used for testing plural wires of a cable of a circuit board. The testing fixture includes a first contact element, a switch circuit, a second contact element, a voltage acquisition element and a control unit. The first contact element is connected with input terminals of the plural wires. The second contact element is connected with output terminals of the plural wires. When the control unit drives a switching action of the switch circuit, a testing voltage is provided to the odd-numbered wires or the even-numbered wires. The control unit reads the voltage values of the odd-numbered wires and the voltage values of the even-numbered wires from the voltage acquisition element so as to judge whether the plural wires of the cable are normal.

Abstract: The present invention provides an input device test system, configured to test an input device having a plurality of functional elements. The input device test system includes: a test host, configured to execute a test program and a message interception program, and output a test message by means of the test program; and a test platform, configured to receive the test message and operate the input device according to the test message, where the input device outputs a response message to the test host in response to the operation, where the message interception program is used to intercept the response message and convert the response message into at least one code, and the test program determines whether the at least one code is consistent with the test message.

Abstract: A detection data storage device includes a detection probe, an inspection instrument, a processor and a storage controller. The processor includes a software component. The storage controller includes a key and a prompt lamp. When a circuit is detected by the detection probe, a detection signal is generated. After the detection signal is received by the inspection instrument, a detection data is generated and transmitted to the software component of the processor. If the software component judges that the detection data matches a standard value, the software components issues a prompt signal to the prompt lamp of the storage controller. In response to the prompt signal, the prompt lamp emits a light beam. After the light beam from the prompt lamp is received by the user and the key is pressed, the detection data is stored in a storage unit.

Abstract: An electronic device test system is configured to test functions of an electronic device. The electronic device test system includes: a test computer, configured to execute an electronic device test program; a scanning device, configured to scan a barcode number of the electronic device; and an optical sensor module, configured to detect a connection status of the electronic device and the test computer. When the optical sensor module confirms the connection status, the electronic device test program starts a test function to test the electronic device, records a test result of the electronic device according to the barcode number, and subsequently generates a retest rate according to the test result.

Abstract: An input module includes an input device and a control program. The input device is in communication with a computer. The control program is installed in the computer. If a control signal from a processing unit of the input device has not been received by the computer for a predetermined time period after the control program is opened, the control program issues a command signal to the processing unit. After the command signal is received by the processing unit, the processing unit issues at least one response signal to the computer so as to prevent the computer from entering a hibernation mode.

Abstract: A testing system uses different operating systems to test electronic products. The testing system includes a master computer, a slave computer and a relay. A first operating system is installed in the master computer. A second operating system is installed in the slave computer. The master computer and the slave computer are connected with each other through RS-232 ports. The relay is connected with the master computer, the slave computer and an under-test product. By changing the voltage level state of specified pins of the RS-232 ports, the master computer notifies the slave computer to test the under-test product. Moreover, by controlling the relay, the connection between the master computer and the under-test product is switched to the connection between the slave computer and the under-test product. Consequently, the under-test product is tested by the slave computer.

Abstract: The present invention provides an electronic device test system, configured to test functions of an electronic device. The electronic device test system includes: a test computer, configured to execute an electronic device test program; a scanning device, configured to scan a barcode number of the electronic device; and an optical sensor module, configured to detect a connection status of the electronic device and the test computer. When the optical sensor module confirms the connection status, the electronic device test program starts a test function to test the electronic device, records a test result of the electronic device according to the barcode number, and subsequently generates a retest rate according to the test result.

Abstract: The present invention provides a sound testing system and a sound testing method for an embedded system. The sound testing system includes: a silencing box, a sound receiving apparatus, and a processing apparatus. The embedded system and the sound receiving apparatus are provided in the silencing box; and the processing apparatus is configured to log in to the embedded system in a manner of remote connection, transmit at least one first sound file to the embedded system and control the embedded system to play the at least one first sound file to generate at least one first sound signal, and receive the at least one first sound signal by means of the sound receiving apparatus, and analyze the at least one first sound signal to verify sound output quality of the embedded system.

Abstract: The present invention provides a power consumption testing system and a power consumption testing method for a wireless mouse. The power consumption testing system includes: a platform; a flexible thin sheet; a first movable fixed component; a second movable fixed component; a vibration motor; and a processing apparatus. The first movable fixed component is configured to connect the flexible thin sheet and the platform. The second movable fixed component is configured to connect the wireless mouse to the flexible thin sheet or the platform. The vibration motor is connected to the flexible thin sheet and is configured to shake the flexible thin sheet so that the wireless mouse continuously moves on the flexible thin sheet. The processing apparatus is wirelessly connected to the wireless mouse and is configured to read and record a voltage value of the wireless mouse to determine a battery capacity of the wireless mouse.

Abstract: The present invention provides an electronic device test system and method, used to detect a memory serial number of an electronic device. The electronic device test system includes: a Macintosh system computer, configured to execute a serial number detection program to detect the memory serial number of the electronic device; and a Windows system computer, configured to execute a serial number comparison program to compare whether the memory serial number of the electronic device satisfies a coding rule. The Macintosh system computer transmits the memory serial number to the Windows system computer by means of an RS232 interface for printing.

Abstract: The present invention provides an input device test system, configured to test an input device having a plurality of functional elements. The input device test system includes: a test host, configured to execute a test program and a message interception program, and output a test message by means of the test program; and a test platform, configured to receive the test message and operate the input device according to the test message, where the input device outputs a response message to the test host in response to the operation, where the message interception program is used to intercept the response message and convert the response message into at least one code, and the test program determines whether the at least one code is consistent with the test message.

Abstract: An automatic instrument searching method and an automatic control system are provided. The automatic control system includes a computer, plural serial ports and at least one measuring instrument. The at least one measuring instrument is connected with computer through the plural serial ports. Firstly, the computer detects a number of the plural serial ports and arranges the serial ports. Then, the plural serial ports are inquired according to plural different communication protocols. Then, the at least one measuring instrument makes a response to a setting of the matched communication protocol. If one of the inquired serial ports receives the response, the computer judges that the serial port is connected with one measuring instrument and issues a verification command to the connected measuring instrument. If the measuring instrument complies with the verification command, the measuring instrument is addressed.

Abstract: A testing system uses different operating systems to test electronic products. The testing system includes a master computer, a slave computer and a relay. A first operating system is installed in the master computer. A second operating system is installed in the slave computer. The master computer and the slave computer are connected with each other through RS-232 ports. The relay is connected with the master computer, the slave computer and an under-test product. By changing the voltage level state of specified pins of the RS-232 ports, the master computer notifies the slave computer to test the under-test product. Moreover, by controlling the relay, the connection between the master computer and the under-test product is switched to the connection between the slave computer and the under-test product. Consequently, the under-test product is tested by the slave computer.

Abstract: A method for communicating with an under-test object and a communicating system are provided. The method includes the following steps. A command signal is provided from a processing unit of the communicating system to the under-test object, and the processing unit waits for receiving a response signal from the under-test object. If the response signal from the under-test object 5 has not been received by the processing unit for a predetermined waiting time period, the command signal is provided to the under-test object again and the predetermined waiting time period is adjusted. There is an exponential relation between the predetermined waiting time period and the number of times the command signal is provided to the under-test object.

Abstract: A detection data storage device includes a detection probe, an inspection instrument, a processor and a storage controller. The processor includes a software component. The storage controller includes a key and a prompt lamp. When a circuit is detected by the detection probe, a detection signal is generated. After the detection signal is received by the inspection instrument, a detection data is generated and transmitted to the software component of the processor. If the software component judges that the detection data matches a standard value, the software components issues a prompt signal to the prompt lamp of the storage controller. In response to the prompt signal, the prompt lamp emits a light beam. After the light beam from the prompt lamp is received by the user and the key is pressed, the detection data is stored in a storage unit.

Abstract: The present invention provides a circuit board testing system, including a computer host and a meter electrically connected to the computer host. A testing program is built in the computer host and displays a testing interface on a screen of the computer host. When a user inputs a circuit board serial number of a circuit board on the testing interface, the testing program displays at least one testing point name corresponding to the circuit board on the testing interface, and when the meter transmits an electrical value of the testing point to the computer host, records the electrical value in a testing result record chart. In the present invention, no jig is needed, and a testing result of a circuit board can be automatically recorded.

Abstract: A testing device includes a base body, a holder, an electrically conductive plate, plural testing probes and plural insulation structures. The testing device of the present invention uses the electrically conductive plate to replace the plastic plate of the conventional testing device. Consequently, the electrostatic discharge effect is avoided. Moreover, the insulation structure is arranged between the testing probe and the electrically conductive plate to separate the testing probe from the electrically conductive plate so as to avoid the electric leakage problem. Consequently, the testing device of the present invention is capable of avoiding the electrostatic discharge effect without causing damage of the under-test object and reducing the measurement accuracy.