Abstract: The present invention provides fingerprint-based verification system and fingerprint identification method. The fingerprint-based verification system verifies identify by analyzing biometric minutiae including the ridges and pores on a fingerprint. The fingerprint identification method comprises a step for obtaining a first fingerprint, a step for obtaining a second fingerprint, and a step for comparing the first fingerprint and the second fingerprint. The present invention provides effective systems and methods for mitigating identity fraud.

Abstract: The present invention provides fingerprint-based verification system and fingerprint identification method. The fingerprint-based verification system verifies identify by analyzing biometric minutiae including the ridges and pores on a fingerprint. The fingerprint identification method comprises a step for obtaining a first fingerprint, a step for obtaining a second fingerprint, and a step for comparing the first fingerprint and the second fingerprint. The present invention provides effective systems and methods for mitigating identity fraud.

Abstract: A fingerprint recognition system having detecting pore and a method are disclosed. The system comprises a fingerprint image capture apparatus, a pore detection apparatus, a fingerprint detection apparatus and a recognition apparatus. A fingerprint image is captured by the fingerprint image capture apparatus. A pore data of the fingerprint image is detected by the pore detection apparatus. A fingerprint data of the fingerprint image is detected by the fingerprint detection apparatus. The recognition apparatus is used to implement a comparison action for the fingerprint image and a pre-stored fingerprint image based on any one selection or combination from the pore data and the fingerprint data. The fingerprint recognition accuracy can be improved.

Abstract: An electrical switch device with feature identification and a method are applied for an electronic apparatus having a first power supply module. The electrical switch device comprises a switch, a feature identification module and a second power supply module. The second power supply module supplies power to the feature identification module. The switch generates a switch control signal based on an outside signal. The feature identification module is used to receive a feature signal and implements an identification action, then determines whether the first power supply module is activated based on the switch control signal and the identification result.

Abstract: A package for an image sensor and an identification module is disclosed. The package for image sensor and identification module includes a substrate having an image sensing device, a central processor and a memory thereon and a holder having a window which is onto the image sensing device, wherein the holder is mounted on the substrate and seals the image sensing device, the central processor and the memory.

Abstract: An optical apparatus comprises a light source, an optical sensing device and an optical element. The optical sensing device and the optical element are set at the same side. The optical element includes a reflector which is an arc. A light emitted by the light source can be reflected by the reflector of the optical element to the optical sensing device.

Abstract: A planar light source module for a fingerprint recognition apparatus is disclosed. A planar light source module comprises a planar light source and an optical element that includes a reflector. A planar incident light emitted by the planar light source can be reflected by the reflector of the optical element to an optical sensing device of the fingerprint recognition apparatus.

Abstract: An automatic integrated circuit testing system, device and method using an integrative computer. The system includes a machine frame having at least one testing computer for holding and testing the integrated circuit. The machine frame also has at least one automatic plugging/unplugging machine for engaging the integrated circuits with the computer system and removing the integrated circuits after testing has been completed. The machine frame further includes at least one controller device electrically connected to the testing computer and the automatic plugging/unplugging machine for controlling the movements of the automatic plugging/unplugging machine and the testing computer. The testing computer and the integrated circuit together form an integrative computer system capable of executing various general application programs and special testing programs for integrative testing and analysis.

Abstract: A control method for an automatic integrated circuit full testing system. A control device is utilized to control the testing process of the automatic integrated circuit full testing system. The steps for controlling the control device include driving an automatic transport device to fetch test integrated circuits from an integrated circuit supply rack to various testing computer stations. An automatic plug/unplug tool is driven so that each integrated circuit is plugged into the connector of a corresponding testing computer. All the testing computers are triggered to carry out respective preset testing programs. An image sensor is driven to monitor the an output image of the testing computers so that any abnormality in the integrated circuits can be determined. Thereafter, the automatic plug/unplug tool is driven to unload the tested integrated circuit from the testing computer.

Abstract: An automatic computer-system-level IC testing system comprises a testing computer, an IC mounting/retrieving mechanism, a temperature regulator, and a control unit. The testing computer connects and tests the IC that is arranged in the testing computer and retrieved there from via the IC mounting/retrieving mechanism. The temperature regulator regulates the testing temperature the IC being tested. The control unit is connected to the testing computer and the IC mounting/retrieving mechanism to supervise the testing process. Once the IC to be tested in connected therein, the testing computer forms a complete computer system through the operation of which the testing is performed.

Abstract: An automatic system-level test apparatus that includes a testing computer and at least one image sensor. The testing computer is used to carry and test an integrated circuit. The testing computer together with the integrated circuit incorporated therein forms a system-completed computer capable of conducting a system-level test. The testing computer includes at least one output device for outputting test images while running a pre-determined test program. An image sensor captures the images produced by the output device. The captured image is compared with an original image stored inside an image database to determine if a difference between the captured image and the stored image.

Abstract: A control method for an automatic integrated circuit full testing system. A control device is utilized to control the testing process of the automatic integrated circuit full testing system. The steps for controlling the control device include driving an automatic transport device to fetch test integrated circuits from an integrated circuit supply rack to various testing computer stations. An automatic plug/unplug tool is driven so that each integrated circuit is plugged into the connector of a corresponding testing computer. All the testing computers are triggered to carry out respective preset testing programs. An image sensor is driven to monitor the an output image of the testing computers so that any abnormality in the integrated circuits can be determined. Thereafter, the automatic plug/unplug tool is driven to unload the tested integrated circuit from the testing computer.

Abstract: An automatic integrated circuit testing system, device and method using an integrative computer. The system includes a machine frame having at least one testing computer for holding and testing the integrated circuit. The machine frame also has at least one automatic plugging/unplugging machine for engaging the integrated circuits with the computer system and removing the integrated circuits after testing has been completed. The machine frame further includes at least one controller device electrically connected to the testing computer and the automatic plugging/unplugging machine for controlling the movements of the automatic plugging/unplugging machine and the testing computer. The testing computer and the integrated circuit together form an integrative computer system capable of executing various general application programs and special testing programs for integrative testing and analysis.